Scanning-probe techniques or apparatus

Industry

US Classification
850

US Patent Classification (USPC) is no longer used by USPTO since June 2015. Please refer to similar CPC classifications / industries.

Current Industry

850Scanning-probe apparatus

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Near-field optical probe manufacturing using organo-mineral materia...
- Patent number 9,043,947
- Issue date May 26, 2015
- Centre National de la Recherche Scientifique
- Pascal Falgayrettes
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring the near-field signal
- Patent number 9,043,946
- Issue date May 26, 2015
- Neaspec GmbH
- Nenad Ocelic
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Beam pen lithography
- Patent number 9,021,611
- Issue date Apr 28, 2015
- Northwestern University
- Chad A. Mirkin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Modification of atomic force microscopy tips by deposition of nanop...
- Patent number 9,015,861
- Issue date Apr 21, 2015
- Consejo Superior de Investigaciones Cientificas (CSIC)
- Elisa Leonor Román García
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Substrate measurement apparatus with electron distortion unit
- Patent number 9,009,861
- Issue date Apr 14, 2015
- Korea Research Institute of Standards and Science
- Byong Chon Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for measuring distribution of atomic resolution d...
- Patent number 9,003,561
- Issue date Apr 7, 2015
- Korea Institute of Machinery & Materials
- Bong Kyun Jang
- G01 - MEASURING TESTING
Information Patent Grant
Processes for surface measurement and modification by scanning prob...
- Patent number 8,997,261
- Issue date Mar 31, 2015
- Centre National de la Recherche Scientifique CNRS
- Olivier Noel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated microscope and related methods and devices
- Patent number 8,997,260
- Issue date Mar 31, 2015
- Ryan Murdick
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of tuning a scanning probe microscope
- Patent number 8,997,259
- Issue date Mar 31, 2015
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscope probe and method for use of same
- Patent number 8,997,258
- Issue date Mar 31, 2015
- National Institute of Standards and Technology
- Vladimir Aksyuk
- G01 - MEASURING TESTING
Information Patent Grant
Microprobe and microprobe manufacturing method
- Patent number 8,988,065
- Issue date Mar 24, 2015
- Kabushiki Kaisha Toshiba
- Yongfang Li
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Non-linearity determination of positioning scanner of measurement tool
- Patent number 8,990,961
- Issue date Mar 24, 2015
- International Business Machines Corporation
- George W. Banke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probes for multidimensional nanospectroscopic imaging and methods o...
- Patent number 8,984,661
- Issue date Mar 17, 2015
- The Regents of the University of California
- Alexander Weber-Bargioni
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pump probe measuring device
- Patent number 8,982,451
- Issue date Mar 17, 2015
- Japan Science and Technology Agency
- Hidemi Shigekawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 8,978,161
- Issue date Mar 10, 2015
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dynamic adaptation of a dephasing gradient pair
- Patent number 8,975,893
- Issue date Mar 10, 2015
- Siemens Aktiengesellschaft
- Andreas Greiser
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe having a position measuring system
- Patent number 8,977,343
- Issue date Mar 10, 2015
- Koninklijke Philips N.V.
- Cornelius A. Hezemans
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for nanomechanical measurement using an atomic...
- Patent number 8,973,161
- Issue date Mar 3, 2015
- Rutgers, The State University of New Jersey
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for fabricating nanoscale probe and method thereof
- Patent number 8,966,661
- Issue date Feb 24, 2015
- Academia Sinica
- Wei-Tse Chang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Silicon pen nanolithography
- Patent number 8,961,853
- Issue date Feb 24, 2015
- Northwestern University
- Chad A. Mirkin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Atomic force microscope probe, method for preparing same, and uses...
- Patent number 8,959,661
- Issue date Feb 17, 2015
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Jérôme Polesel-Maris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Peakforce photothermal-based detection of IR nanoabsorption
- Patent number 8,955,161
- Issue date Feb 10, 2015
- Bruker Nano, Inc.
- Gregory O. Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring a piezoelectric response by means of a scannin...
- Patent number 8,950,010
- Issue date Feb 3, 2015
- Specs Zurich GmbH
- Jörg Rychen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for depth-resolved fluorescence, chromophore,...
- Patent number 8,948,851
- Issue date Feb 3, 2015
- The Trustees of Dartmouth College
- Frederic Leblond
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 8,950,011
- Issue date Feb 3, 2015
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe and method for obtaining three-dimensional compositional maps...
- Patent number 8,941,057
- Issue date Jan 27, 2015
- The United States of America, as represented by the Secretary, Department of...
- Sriram Subramaniam
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe module, method for making and use of same
- Patent number 8,943,611
- Issue date Jan 27, 2015
- National Institute of Standards and Technology
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Grant
Vertically mounted sample stage for microscopy and scanning probe m...
- Patent number 8,935,811
- Issue date Jan 13, 2015
- Samsung Electronics Co., Ltd.
- Hwan-soo Suh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 8,925,376
- Issue date Jan 6, 2015
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method of operating the same
- Patent number 8,925,111
- Issue date Dec 30, 2014
- Samsung Electronics Co., Ltd.
- Wan-Sung Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Modular atomic force microscope with environmental controls
- Publication number 20150150163
- Publication date May 28, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150135374
- Publication date May 14, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING DISTRIBUTION OF ATOMIC RESOLUTION D...
- Publication number 20150121575
- Publication date Apr 30, 2015
- Korea Institute of Machinery and Materials
- Bong Kyun JANG
- G01 - MEASURING TESTING
Information Patent Application
DETERMATION OF LOCAL CONTACT POTENTIAL DIFFERENCE BY NONCONTACT ATO...
- Publication number 20150121576
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Leo Gross
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20150113687
- Publication date Apr 23, 2015
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PRO...
- Publication number 20150106979
- Publication date Apr 16, 2015
- Fondazione Istituto Italiano Di Tecnologia
- Francesco Difato
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY MEASURING AND CONTROL APPARATUS WITH INTEGRATED PARALLEL...
- Publication number 20150101086
- Publication date Apr 9, 2015
- RHK Technology, Inc.
- Steffen Porthun
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION FOR CANONICAL SECOND ORDER SYSTEMS FOR ELIMINATING PEA...
- Publication number 20150101085
- Publication date Apr 9, 2015
- JONIX LLC
- Nicholas Paige
- G01 - MEASURING TESTING
Information Patent Application
MULTI-RESONANT DETECTION SYSTEM FOR ATOMIC FORCE MICROSCOPY
- Publication number 20150089693
- Publication date Mar 26, 2015
- UT-Battelle, LLC
- Stephen Jesse
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE NEAR-FIELD SIGNAL
- Publication number 20150089694
- Publication date Mar 26, 2015
- Neaspec GmbH
- Nenad Ocelic
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE WITH IMPROVED FEATURE LOCATION CAPABILITIES
- Publication number 20150082498
- Publication date Mar 19, 2015
- Bruker Nano, Inc.
- Charles Meyer
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT
- Publication number 20150075264
- Publication date Mar 19, 2015
- HYSITRON, INC.
- Syed Amanulla Syed Asif
- G02 - OPTICS
Information Patent Application
Low Drift Scanning Probe Microscope
- Publication number 20150074859
- Publication date Mar 12, 2015
- Bruker Nano, Inc.
- Anthonius G. Ruiter
- G01 - MEASURING TESTING
Information Patent Application
Method and Means for Coupling High-Frequency Energy to and/or from...
- Publication number 20150067931
- Publication date Mar 5, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20150067930
- Publication date Mar 5, 2015
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION FOR OPTICAL SCAN AND MEASUREMENT
- Publication number 20150067929
- Publication date Mar 5, 2015
- UNITED SCIENCES, LLC
- Keith A. Blanton
- G01 - MEASURING TESTING
Information Patent Application
AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...
- Publication number 20150067932
- Publication date Mar 5, 2015
- Purdue Research Foundation
- Corey P. Neu
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150059025
- Publication date Feb 26, 2015
- Kabushiki Kaisha Toshiba
- Hideo SHINOMIYA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTROCHEMICAL MICROSCOPY
- Publication number 20150059027
- Publication date Feb 26, 2015
- University of Warwick
- Patrick Unwin
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SURFACE CURVATURE
- Publication number 20150059026
- Publication date Feb 26, 2015
- UCL BUSINESS PLC
- Rodolfo Hermans
- G01 - MEASURING TESTING
Information Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
- Publication number 20150047079
- Publication date Feb 12, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tomokazu Kozakai
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICR...
- Publication number 20150047080
- Publication date Feb 12, 2015
- OLYMPUS CORPORATION
- Akira YAGI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE COMPRISING AN ISOTHERMAL ACTUATOR
- Publication number 20150047078
- Publication date Feb 12, 2015
- ICSPI CORP.
- Niladri Sarkar
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND MICROSCOPE
- Publication number 20150040273
- Publication date Feb 5, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Variable Density Scanning
- Publication number 20150026846
- Publication date Jan 22, 2015
- OXFORD INSTRUMENTS AFM INC
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Application
RADIO-FREQUENCY REFLECTOMETRY SCANNING TUNNELING MICROSCOPE
- Publication number 20150026847
- Publication date Jan 22, 2015
- National Taiwan University
- Woei-Wu PAI
- G01 - MEASURING TESTING
Information Patent Application
BEAM SCANNING SYSTEM
- Publication number 20150020244
- Publication date Jan 15, 2015
- Infinitesima Limited
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR OPTIMIZING FREQUENCY MODULATION ATOMIC FORC...
- Publication number 20150020245
- Publication date Jan 15, 2015
- The Royal Institute for the Advancement of Learning / McGill University
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE
- Publication number 20150020243
- Publication date Jan 15, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
- Publication number 20150013037
- Publication date Jan 8, 2015
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY

Scanning-probe techniques or apparatus

Industry

Current Industry

Patents Grantslast 30 patents

Near-field optical probe manufacturing using organo-mineral materia...

Method for measuring the near-field signal

Beam pen lithography

Modification of atomic force microscopy tips by deposition of nanop...

Substrate measurement apparatus with electron distortion unit

Device and method for measuring distribution of atomic resolution d...

Processes for surface measurement and modification by scanning prob...

Integrated microscope and related methods and devices

Method and apparatus of tuning a scanning probe microscope

Microscope probe and method for use of same

Microprobe and microprobe manufacturing method

Non-linearity determination of positioning scanner of measurement tool

Probes for multidimensional nanospectroscopic imaging and methods o...

Pump probe measuring device

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Dynamic adaptation of a dephasing gradient pair

Optical probe having a position measuring system

Method and apparatus for nanomechanical measurement using an atomic...

System for fabricating nanoscale probe and method thereof

Silicon pen nanolithography

Atomic force microscope probe, method for preparing same, and uses...

Peakforce photothermal-based detection of IR nanoabsorption

Method for measuring a piezoelectric response by means of a scannin...

Method and apparatus for depth-resolved fluorescence, chromophore,...

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Probe and method for obtaining three-dimensional compositional maps...

Probe module, method for making and use of same

Vertically mounted sample stage for microscopy and scanning probe m...

Fully digitally controller for cantilever-based instruments

Scanning probe microscope and method of operating the same

Patents Applicationslast 30 patents

Modular atomic force microscope with environmental controls

SCANNING PROBE MICROSCOPE

DEVICE AND METHOD FOR MEASURING DISTRIBUTION OF ATOMIC RESOLUTION D...

DETERMATION OF LOCAL CONTACT POTENTIAL DIFFERENCE BY NONCONTACT ATO...

Fully Digitally Controller for Cantilever-Based Instruments

OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PRO...

FREQUENCY MEASURING AND CONTROL APPARATUS WITH INTEGRATED PARALLEL...

COMPENSATION FOR CANONICAL SECOND ORDER SYSTEMS FOR ELIMINATING PEA...

MULTI-RESONANT DETECTION SYSTEM FOR ATOMIC FORCE MICROSCOPY

METHOD FOR MEASURING THE NEAR-FIELD SIGNAL

SCANNING PROBE MICROSCOPE WITH IMPROVED FEATURE LOCATION CAPABILITIES

MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT

Low Drift Scanning Probe Microscope

Method and Means for Coupling High-Frequency Energy to and/or from...

Method and Apparatus of Physical Property Measurement Using a Probe...

ILLUMINATION FOR OPTICAL SCAN AND MEASUREMENT

AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE...

SCANNING PROBE MICROSCOPE

SCANNING ELECTROCHEMICAL MICROSCOPY

MEASURING SURFACE CURVATURE

Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...

COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICR...

SCANNING PROBE MICROSCOPE COMPRISING AN ISOTHERMAL ACTUATOR

COMPOUND MICROSCOPE

Variable Density Scanning

RADIO-FREQUENCY REFLECTOMETRY SCANNING TUNNELING MICROSCOPE

BEAM SCANNING SYSTEM

METHODS AND SYSTEMS FOR OPTIMIZING FREQUENCY MODULATION ATOMIC FORC...

SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE

Thermal Measurements Using Multiple Frequency Atomic Force Microscopy