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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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Patents Grantslast 30 patents

Information Patent Grant
Deflectometry devices, systems and methods
- Patent number 12,085,473
- Issue date Sep 10, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle detection system
- Patent number 11,933,602
- Issue date Mar 19, 2024
- Twinner GmbH
- Jozsef Bugovics
- G01 - MEASURING TESTING
Information Patent Grant
Structured light projector
- Patent number 11,835,732
- Issue date Dec 5, 2023
- Liqxtal Technology Inc.
- Hung-Shan Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Structured light projector
- Patent number 11,656,475
- Issue date May 23, 2023
- Liqxtal Technology Inc.
- Hung-Shan Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for finding dents on an automobile using a booth
- Patent number 11,560,730
- Issue date Jan 24, 2023
- Thomas Williams
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method to calibrate an uncollimated laser diode for 3D i...
- Patent number 11,425,356
- Issue date Aug 23, 2022
- Brown University
- Gabriel Taubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle surface scanning system
- Patent number 11,333,615
- Issue date May 17, 2022
- Vehicle Service Group, LLC
- Aivaras Grauzinis
- G01 - MEASURING TESTING
Information Patent Grant
Machine vision systems, illumination sources for use in machine vis...
- Patent number 11,328,380
- Issue date May 10, 2022
- Gilbert Pinter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical sensing device and structured light projector
- Patent number 11,269,193
- Issue date Mar 8, 2022
- Liqxtal Technology Inc.
- Hung-Shan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Structured illumination optical inspection platform for transparent...
- Patent number 11,226,293
- Issue date Jan 18, 2022
- Seagate Technology LLC
- Kaijun Feng
- G01 - MEASURING TESTING
Information Patent Grant
Light modulation for inspection probes
- Patent number 11,125,551
- Issue date Sep 21, 2021
- Baker Hughes, a GE company, LLC
- Zirong Zahi
- G01 - MEASURING TESTING
Information Patent Grant
Reference plate and method for calibrating and/or checking a deflec...
- Patent number 11,092,432
- Issue date Aug 17, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Stephan Zweckinger
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for optically inspecting an object, and object...
- Patent number 11,041,813
- Issue date Jun 22, 2021
- Robert Bosch GmbH
- Alexander Thobe
- G01 - MEASURING TESTING
Information Patent Grant
Image inspecting apparatus, image inspecting method and image inspe...
- Patent number 10,861,179
- Issue date Dec 8, 2020
- Omron Corporation
- Yutaka Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method for semiconductor substrates using slope data and...
- Patent number 10,782,242
- Issue date Sep 22, 2020
- Infineon Technologies AG
- Robert Muhr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,724,960
- Issue date Jul 28, 2020
- The University of Tokyo
- Toru Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspection of a machine part
- Patent number 10,648,794
- Issue date May 12, 2020
- SAFRAN AIRCRAFT ENGINES
- Fabien Jean-Guillaume Arquie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluation device and recording medium storing evaluation program
- Patent number 10,614,563
- Issue date Apr 7, 2020
- Ricoh Company, Ltd.
- Shuhei Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image inspection apparatus
- Patent number 10,591,285
- Issue date Mar 17, 2020
- Keyence Corporation
- Daisuke Ando
- G01 - MEASURING TESTING
Information Patent Grant
System and method for damage detection by cast shadows
- Patent number 10,473,593
- Issue date Nov 12, 2019
- United Technologies Corporation
- Ziyou Xiong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for measuring physical characteristics of semic...
- Patent number 10,352,877
- Issue date Jul 16, 2019
- Kulicke and Soffa Industries, Inc.
- Deepak Sood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus of inspecting a substrate with a component mou...
- Patent number 10,330,609
- Issue date Jun 25, 2019
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measuring apparatus
- Patent number 10,215,556
- Issue date Feb 26, 2019
- CKD Corporation
- Takahiro Mamiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus therefor
- Patent number 9,897,555
- Issue date Feb 20, 2018
- Honda Motor Co., Ltd.
- Junichi Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for measuring physical characteristics of semic...
- Patent number 9,810,641
- Issue date Nov 7, 2017
- Kulicke and Soffa Industries, Inc.
- Deepak Sood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for analysing phase distribution of fringe image...
- Patent number 9,389,068
- Issue date Jul 12, 2016
- National Institute of Advanced Industrial Science and Technology
- Shien Ri
- G01 - MEASURING TESTING
Information Patent Grant
Method for the detection of a possible joint defect in a friction s...
- Patent number 9,182,299
- Issue date Nov 10, 2015
- Airbus Operations GmbH
- Freerk Syassen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optically inspecting a test specimen havin...
- Patent number 8,823,869
- Issue date Sep 2, 2014
- Carl Zeiss OIM GmbH
- Rolf Beck
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three dimensional shape measurement apparatus
- Patent number 8,754,936
- Issue date Jun 17, 2014
- Koh Young Technology Inc.
- Jung Hur
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and measurement method
- Patent number 8,681,217
- Issue date Mar 25, 2014
- Olympus Corporation
- Fumio Hori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A REFLECTIVE SURFACE
- Publication number 20240319105
- Publication date Sep 26, 2024
- ISRA VISION GMBH
- Klaus VEIT
- G01 - MEASURING TESTING
Information Patent Application
PORE MEASUREMENT DEVICE
- Publication number 20220404276
- Publication date Dec 22, 2022
- The Regents of the University of California
- Niall O'Dowd
- G01 - MEASURING TESTING
Information Patent Application
DEFLECTOMETRY DEVICES, SYSTEMS AND METHODS
- Publication number 20220146370
- Publication date May 12, 2022
- Arizona Board of Regents on behalf of The University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD
- Publication number 20220099587
- Publication date Mar 31, 2022
- RICOH COMPANY, LTD.
- Hidenobu KISHI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED ILLUMINATION OPTICAL INSPECTION PLATFORM FOR TRANSPARENT...
- Publication number 20220042923
- Publication date Feb 10, 2022
- SEAGATE TECHNOLOGY LLC
- Kaijun FENG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20210150695
- Publication date May 20, 2021
- OPTON CO., LTD.
- Teruaki YOGO
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE SURFACE SCANNING SYSTEM
- Publication number 20210041371
- Publication date Feb 11, 2021
- VEHICLE SERVICE GROUP, LLC
- Aivaras GRAUZINIS
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE DETECTION SYSTEM
- Publication number 20210035169
- Publication date Feb 4, 2021
- TWINNER GMBH
- JOZSEF BUGOVICS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED CONTROL AND INSPECTION SYSTEM FOR MANUFACTURE AND MEASURE...
- Publication number 20200178632
- Publication date Jun 11, 2020
- VF Jeanswear Limited Partnership
- Dhruv Agarwal
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEXED ASSAY SYSTEMS AND METHODS
- Publication number 20200158628
- Publication date May 21, 2020
- Bioelectronica Corporation
- Roger CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT...
- Publication number 20200150050
- Publication date May 14, 2020
- ROBERT BOSCH GmbH
- Alexander THOBE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR DAMAGE DETECTION BY CAST SHADOWS
- Publication number 20190339206
- Publication date Nov 7, 2019
- United Technologies Corporation
- Ziyou Xiong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...
- Publication number 20190265026
- Publication date Aug 29, 2019
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Stephan ZWECKINGER
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method for Semiconductor Substrates Using Slope Data and...
- Publication number 20190178808
- Publication date Jun 13, 2019
- Robert Muhr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD TO CALIBRATE AN UNCOLLIMATED LASER DIODE FOR 3D I...
- Publication number 20190124320
- Publication date Apr 25, 2019
- Brown University
- Gabriel TAUBIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE AXIAL RUNOUT OF A PLANE SURFACE OF A WORKP...
- Publication number 20190094018
- Publication date Mar 28, 2019
- MARPOSS SOCIETA' PER AZIONI
- Domenico Malpezzi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTION OF A MACHINE PART
- Publication number 20190041191
- Publication date Feb 7, 2019
- SAFRAN AIRCRAFT ENGINES
- Fabien Jean-Guillaume Arquie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING PHYSICAL CHARACTERISTICS OF SEMIC...
- Publication number 20180038806
- Publication date Feb 8, 2018
- KULICKE AND SOFFA INDUSTRIES, INC.
- Deepak Sood
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS THEREFOR
- Publication number 20170356855
- Publication date Dec 14, 2017
- Honda Motor Co., Ltd.
- Junichi Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING AN OBJECT WITH A VISION PROBE
- Publication number 20170160077
- Publication date Jun 8, 2017
- RENISHAW PLC
- Timothy C FEATHERSTONE
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
- Publication number 20160054235
- Publication date Feb 25, 2016
- KOREA AEROSPACE RESEARCH INSTITUTE
- Hyun Woo KIM
- G01 - MEASURING TESTING
Information Patent Application
Structured Illumination Projection With Enhanced Exposure Control
- Publication number 20140362203
- Publication date Dec 11, 2014
- Mitutoyo Corporation
- Mark Lawrence Delaney
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASURING APPARATUS
- Publication number 20140078296
- Publication date Mar 20, 2014
- CKD CORPORATION
- Takahiro Mamiya
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20140043602
- Publication date Feb 13, 2014
- Carl Zeiss Industrielle Messtechnik GmbH
- Thomas ENGEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE DETECTION OF A POSSIBLE JOINT DEFECT IN A FRICTION S...
- Publication number 20130135460
- Publication date May 30, 2013
- AIRBUS OPERATIONS GMBH
- Freerk SYASSEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR OPTICALLY INSPECTING A TEST SPECIMEN HAVIN...
- Publication number 20120327295
- Publication date Dec 27, 2012
- Rolf Beck
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20120127463
- Publication date May 24, 2012
- KOH YOUNG TECHNOLOGY INC.
- Jong-Kyu Hong
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND MEASUREMENT METHOD
- Publication number 20120019653
- Publication date Jan 26, 2012
- OLYMPUS CORPORATION
- Fumio Hori
- G01 - MEASURING TESTING
Information Patent Application
THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS
- Publication number 20110001818
- Publication date Jan 6, 2011
- KOH YOUNG TECHNOLOGY INC.
- Jung HUR
- G01 - MEASURING TESTING

Shadow projection or structured background

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Deflectometry devices, systems and methods

Vehicle detection system

Structured light projector

Structured light projector

System and method for finding dents on an automobile using a booth

System and method to calibrate an uncollimated laser diode for 3D i...

Vehicle surface scanning system

Machine vision systems, illumination sources for use in machine vis...

Optical sensing device and structured light projector

Structured illumination optical inspection platform for transparent...

Light modulation for inspection probes

Reference plate and method for calibrating and/or checking a deflec...

Inspection apparatus for optically inspecting an object, and object...

Image inspecting apparatus, image inspecting method and image inspe...

Inspection method for semiconductor substrates using slope data and...

Inspection system and inspection method

Method for inspection of a machine part

Evaluation device and recording medium storing evaluation program

Image inspection apparatus

System and method for damage detection by cast shadows

Systems and methods for measuring physical characteristics of semic...

Method and apparatus of inspecting a substrate with a component mou...

Three-dimensional measuring apparatus

Defect inspection method and apparatus therefor

Systems and methods for measuring physical characteristics of semic...

Method and device for analysing phase distribution of fringe image...

Method for the detection of a possible joint defect in a friction s...

Method and apparatus for optically inspecting a test specimen havin...

Three dimensional shape measurement apparatus

Inspection apparatus and measurement method

Patents Applicationslast 30 patents

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A REFLECTIVE SURFACE

PORE MEASUREMENT DEVICE

DEFLECTOMETRY DEVICES, SYSTEMS AND METHODS

INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD

STRUCTURED ILLUMINATION OPTICAL INSPECTION PLATFORM FOR TRANSPARENT...

INSPECTION DEVICE

VEHICLE SURFACE SCANNING SYSTEM

VEHICLE DETECTION SYSTEM

AUTOMATED CONTROL AND INSPECTION SYSTEM FOR MANUFACTURE AND MEASURE...

MULTIPLEXED ASSAY SYSTEMS AND METHODS

INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT...

SYSTEM AND METHOD FOR DAMAGE DETECTION BY CAST SHADOWS

REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...

Inspection Method for Semiconductor Substrates Using Slope Data and...

SYSTEM AND METHOD TO CALIBRATE AN UNCOLLIMATED LASER DIODE FOR 3D I...

METHOD FOR MEASURING THE AXIAL RUNOUT OF A PLANE SURFACE OF A WORKP...

METHOD FOR INSPECTION OF A MACHINE PART

SYSTEMS AND METHODS FOR MEASURING PHYSICAL CHARACTERISTICS OF SEMIC...

DEFECT INSPECTION METHOD AND APPARATUS THEREFOR

METHOD OF INSPECTING AN OBJECT WITH A VISION PROBE

SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD

Structured Illumination Projection With Enhanced Exposure Control

THREE-DIMENSIONAL MEASURING APPARATUS

APPARATUS AND METHOD FOR INSPECTING AN OBJECT

METHOD FOR THE DETECTION OF A POSSIBLE JOINT DEFECT IN A FRICTION S...

METHOD AND APPARATUS FOR OPTICALLY INSPECTING A TEST SPECIMEN HAVIN...

INSPECTION APPARATUS

INSPECTION APPARATUS AND MEASUREMENT METHOD

THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS