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G01N2021/95646
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/95646
Soldering
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Patents Grants
last 30 patents
Information
Patent Grant
Printing solder point quality identification and maintenance sugges...
Patent number
12,100,129
Issue date
Sep 24, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Meng Sun
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Inspection system
Patent number
12,066,388
Issue date
Aug 20, 2024
WIT CO., LTD.
Masato Utsumi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
11,971,367
Issue date
Apr 30, 2024
JUKI CORPORATION
Yasuyuki Nuriya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Appearance inspection device and defect inspection method
Patent number
11,936,985
Issue date
Mar 19, 2024
Omron Corporation
Shingo Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional measurement apparatus and three-dimensional measu...
Patent number
11,930,600
Issue date
Mar 12, 2024
CKD Corporation
Takayuki Shinyama
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
11,733,180
Issue date
Aug 22, 2023
JUKI CORPORATION
Yasuyuki Nuriya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Training device and training method for neural network model
Patent number
11,636,336
Issue date
Apr 25, 2023
Industrial Technology Research Institute
Mao-Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for inspecting fused plastic pipes
Patent number
11,448,604
Issue date
Sep 20, 2022
WorldWide Nondestructive Testing, Inc.
Kevin P. Bohne
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of generating control parameter of screen printer
Patent number
11,379,639
Issue date
Jul 5, 2022
Koh Young Technology Inc.
Duk Young Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for inspecting ball grid array-type semiconductor chip package
Patent number
11,150,198
Issue date
Oct 19, 2021
Korea Advanced Institute of Science and Technology
Seungryong Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection management system, inspection management apparatuses, an...
Patent number
11,154,001
Issue date
Oct 19, 2021
Omron Corporation
Hiroyuki Mori
G01 - MEASURING TESTING
Information
Patent Grant
Solder paste printing quality inspection system and method
Patent number
11,029,260
Issue date
Jun 8, 2021
HONGFUJIN PRECISION ELECTRONICS (CHENGDU) Co., Ltd.
Zi-Qing Xia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Soldering quality detection platform
Patent number
10,955,363
Issue date
Mar 23, 2021
Tyco Electronics (Shanghai) Co. Ltd.
Lei Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Soldering material
Patent number
10,888,957
Issue date
Jan 12, 2021
Senju Metal Industry Co., Ltd.
Hiroyoshi Kawasaki
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Appearance inspection device, appearance inspection method and program
Patent number
10,794,691
Issue date
Oct 6, 2020
Omron Corporation
Hiroyuki Hazeyama
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Inspection system and inspection method
Patent number
10,796,428
Issue date
Oct 6, 2020
Koh Young Technology Inc.
Seung Ae Seo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Solder printing inspection device
Patent number
10,679,332
Issue date
Jun 9, 2020
CKD Corporation
Manabu Okuda
G01 - MEASURING TESTING
Information
Patent Grant
Printed circuit board inspecting apparatus, method for determining...
Patent number
10,674,651
Issue date
Jun 2, 2020
Koh Young Technology Inc.
Jae Hyung Kim
G01 - MEASURING TESTING
Information
Patent Grant
Cu core ball, solder joint, solder paste and formed solder
Patent number
10,639,749
Issue date
May 5, 2020
Senju Metal Industry Co., Ltd.
Hiroyoshi Kawasaki
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Method of inspecting a terminal of a component mounted on a substra...
Patent number
10,533,952
Issue date
Jan 14, 2020
Koh Young Technology Inc.
Kye-Hoon Jeon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system and inspection method
Patent number
10,430,940
Issue date
Oct 1, 2019
Koh Young Technology Inc.
Seung Ae Seo
G05 - CONTROLLING REGULATING
Information
Patent Grant
Board inspection apparatus
Patent number
10,295,479
Issue date
May 21, 2019
CKD Corporation
Nobuyuki Umemura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Enhanced illumination control for three-dimensional imaging
Patent number
10,126,252
Issue date
Nov 13, 2018
CyberOptics Corporation
Paul R. Haugen
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring device using frequency scanning interferometer
Patent number
9,835,444
Issue date
Dec 5, 2017
Koh Young Technology Inc.
Jang-Il Ser
G01 - MEASURING TESTING
Information
Patent Grant
Image processing device, method for controlling same, program, and...
Patent number
9,752,994
Issue date
Sep 5, 2017
Omron Corporation
Takeshi Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Detection system for detecting a soldered joint
Patent number
9,645,098
Issue date
May 9, 2017
Robert Bosch GmbH
Stefan Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection device and component mounting device
Patent number
9,511,455
Issue date
Dec 6, 2016
CKD Corporation
Manabu Okuda
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Printed circuit board
Patent number
9,462,680
Issue date
Oct 4, 2016
ROBERT BOSCH (AUSTRALIA) PTY. LTD
Tony Rocco
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of measuring measurement target
Patent number
9,256,912
Issue date
Feb 9, 2016
Koh Young Technology Inc.
Joong-Ki Jeong
G01 - MEASURING TESTING
Information
Patent Grant
Board inspection method
Patent number
8,902,418
Issue date
Dec 2, 2014
Koh Young Technology Inc.
Joong-Ki Jeong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240369495
Publication date
Nov 7, 2024
WIT CO., LTD.
Masato UTSUMI
G01 - MEASURING TESTING
Information
Patent Application
SCREEN MASK INSPECTION DEVICE, SOLDER PRINTING INSPECTION DEVICE, A...
Publication number
20230014796
Publication date
Jan 19, 2023
CKD CORPORATION
Kazuyoshi Kikuchi
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
Printing Solder Point Quality Identification And Maintenance Sugges...
Publication number
20220398714
Publication date
Dec 15, 2022
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Meng Sun
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD
Publication number
20220360720
Publication date
Nov 10, 2022
Omron Corporation
Shingo HAYASHI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INSPECTION SYSTEM
Publication number
20220307988
Publication date
Sep 29, 2022
WIT CO., LTD.
Masato UTSUMI
G01 - MEASURING TESTING
Information
Patent Application
TRAINING DEVICE AND TRAINING METHOD FOR NEURAL NETWORK MODEL
Publication number
20210174200
Publication date
Jun 10, 2021
Industrial Technology Research Institute
Mao-Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20210172884
Publication date
Jun 10, 2021
Juki Corporation
Yasuyuki NURIYA
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Inspecting Fused Plastic Pipes
Publication number
20210010951
Publication date
Jan 14, 2021
WorldWide Nondestructive Testing, Inc
Kevin P. Bohne
G01 - MEASURING TESTING
Information
Patent Application
SOLDER PASTE PRINTING QUALITY INSPECTION SYSTEM AND METHOD
Publication number
20200292471
Publication date
Sep 17, 2020
HONGFUJIN PRECISION ELECTRONICS (CHENGDU) CO., LTD.
ZI-QING XIA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20190362483
Publication date
Nov 28, 2019
KOH YOUNG TECHNOLOGY INC.
Seung Ae SEO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
Publication number
20190223337
Publication date
Jul 18, 2019
Omron Corporation
Hiroyuki MORI
G01 - MEASURING TESTING
Information
Patent Application
PRINTED CIRCUIT BOARD INSPECTING APPARATUS, METHOD FOR DETERMINING...
Publication number
20190200494
Publication date
Jun 27, 2019
KOH YOUNG TECHNOLOGY INC.
Jae Hyung KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Soldering Quality Detection Platform
Publication number
20190187070
Publication date
Jun 20, 2019
Tyco Electronics (Shanghai) Co. Ltd.
Lei Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SOLDER PRINTING INSPECTION DEVICE
Publication number
20190114764
Publication date
Apr 18, 2019
CKD CORPORATION
Manabu Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF INSPECTING A TERMINAL OF A COMPONENT MOUNTED ON A SUBSTRA...
Publication number
20190094151
Publication date
Mar 28, 2019
KOH YOUNG TECHNOLOGY INC.
Kye-Hoon JEON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS
Publication number
20180128603
Publication date
May 10, 2018
KOH YOUNG TECHNOLOGY INC.
Moon Young JEON
G01 - MEASURING TESTING
Information
Patent Application
BOARD INSPECTION APPARATUS
Publication number
20170276617
Publication date
Sep 28, 2017
CKD CORPORATION
Nobuyuki Umemura
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...
Publication number
20140372075
Publication date
Dec 18, 2014
Takeshi KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED ILLUMINATION CONTROL FOR THREE-DIMENSIONAL IMAGING
Publication number
20140320633
Publication date
Oct 30, 2014
CyberOptics Corporation
Paul R. Haugen
G01 - MEASURING TESTING
Information
Patent Application
BOARD INSPECTION METHOD
Publication number
20140132953
Publication date
May 15, 2014
KOH YOUNG TECHNOLOGY INC.
Joong-Ki Jeong
G01 - MEASURING TESTING
Information
Patent Application
PRINTED CIRCUIT BOARD
Publication number
20130222796
Publication date
Aug 29, 2013
Robert Bosch (Australia) Pty. Ltd
Tony Rocco
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REGISTERING INSPECTION STANDARD FOR SOLDERING INSPECTION...
Publication number
20130182942
Publication date
Jul 18, 2013
Omron Corporation
Shinpei FUJII
G01 - MEASURING TESTING
Information
Patent Application
Automatic Optical Detection Method and Optical Automatic Detector
Publication number
20130141408
Publication date
Jun 6, 2013
Hao Kou
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS, PROCESSING APPARATUS, INFORMATION PROCESSING...
Publication number
20130110436
Publication date
May 2, 2013
SONY CORPORATION
Masayuki Ohta
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING MEASUREMENT TARGET
Publication number
20130010102
Publication date
Jan 10, 2013
KOH YOUNG TECHNOLOGY INC.
Joong-Ki JEONG
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20120149136
Publication date
Jun 14, 2012
Norio Watanabe
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING MEASUREMENT TARGET
Publication number
20100290696
Publication date
Nov 18, 2010
KOH YOUNG TECHNOLOGY INC.
Joong-Ki JEONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ILLUMINATION DEVICE FOR VISUAL INSPECTION AND VISUAL INSPECTION APP...
Publication number
20100246174
Publication date
Sep 30, 2010
SONY CORPORATION
Katsuya Ido
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20090221103
Publication date
Sep 3, 2009
Norio Watanabe
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20080232676
Publication date
Sep 25, 2008
Norio Watanabe
G01 - MEASURING TESTING