Solid samples

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CPC
G01N2021/4735

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/4735Solid samples

Industries

Patents Grantslast 30 patents

Information Patent Grant
Monitoring copper corrosion in an integrated circuit device
- Patent number 12,130,241
- Issue date Oct 29, 2024
- Microchip Technology Incorporated
- Yaojian Leng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 12,017,278
- Issue date Jun 25, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Metrology method
- Patent number 12,013,647
- Issue date Jun 18, 2024
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device, measurement system, measurement program, and me...
- Patent number 11,874,225
- Issue date Jan 16, 2024
- THE UNIVERSITY OF TOKYO
- Yoshihiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Light source intensity control systems and methods for improved lig...
- Patent number 11,860,090
- Issue date Jan 2, 2024
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of additive man...
- Patent number 11,668,658
- Issue date Jun 6, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems and methods for monitoring copper corrosion in an integrate...
- Patent number 11,573,189
- Issue date Feb 7, 2023
- Microchip Technology Incorporated
- Yaojian Leng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation method for thermal expansion properties of titania-conta...
- Patent number 11,555,796
- Issue date Jan 17, 2023
- AGC Inc.
- Kazuya Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus, and method for detecting microbes
- Patent number 11,513,049
- Issue date Nov 29, 2022
- THE WAVE TALK, INC.
- Young Dug Kim
- G01 - MEASURING TESTING
Information Patent Grant
High-brightness illumination source for optical metrology
- Patent number 11,156,846
- Issue date Oct 26, 2021
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Rapid and non-destructive detection of infection
- Patent number 11,137,384
- Issue date Oct 5, 2021
- Arizona Board of Regents on behalf of the University of Arizona
- Jeong-Yeol Yoon
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 11,105,754
- Issue date Aug 31, 2021
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems and methods for characterizing high-scatter glass-based sam...
- Patent number 11,035,730
- Issue date Jun 15, 2021
- Corning Incorporated
- William John Furnas
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber inspecting device, optical fiber manufacturing appara...
- Patent number 11,022,549
- Issue date Jun 1, 2021
- Sumitomo Electric Industries, Ltd.
- Hiroshi Kohda
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Distributed measurement of minimum and maximum in-situ stress in su...
- Patent number 11,022,717
- Issue date Jun 1, 2021
- Luna Innovations Incorporated
- Osgar John Ohanian
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry system and method of using the same
- Patent number 10,989,656
- Issue date Apr 27, 2021
- 3M Innovative Properties Company
- Matthew R. C. Atkinson
- G01 - MEASURING TESTING
Information Patent Grant
On-device metrology using target decomposition
- Patent number 10,983,227
- Issue date Apr 20, 2021
- KLA-Tencor Corporation
- John Hench
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting an object with circular-arc-shap...
- Patent number 10,880,538
- Issue date Dec 29, 2020
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Reimar Tausch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, method of deriving reflection cha...
- Patent number 10,837,903
- Issue date Nov 17, 2020
- Canon Kabushiki Kaisha
- Toshiyuki Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Display apparatus having display panel and humidity detection metho...
- Patent number 10,832,635
- Issue date Nov 10, 2020
- Himax Display, Inc.
- Hsiu-Yin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Stage system and metrology tool
- Patent number 10,809,634
- Issue date Oct 20, 2020
- ASML Netherlands B.V.
- Peter Paul Hempenius
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring particle on surface of wafer
- Patent number 10,782,247
- Issue date Sep 22, 2020
- SK SILTRON CO., LTD.
- Kang San Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable device for measuring the geometry of an object and its spa...
- Patent number 10,764,482
- Issue date Sep 1, 2020
- CESKE VYSOKE UCENI TECHNICKE V PRAZE JUGOSLAVSKYCH PARTYZANU
- Vlastimil Havran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cure monitoring systems and methods
- Patent number 10,746,660
- Issue date Aug 18, 2020
- 3M Innovative Properties Company
- Douglas L. Elmore
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber inspecting device, optical fiber manufacturing appara...
- Patent number 10,551,307
- Issue date Feb 4, 2020
- Sumitomo Electric Industries, Ltd.
- Hiroshi Kohda
- G02 - OPTICS
Information Patent Grant
Optical characterization of fiber reinforced plastic composites bas...
- Patent number 10,527,543
- Issue date Jan 7, 2020
- General Photonics Corporation
- Anton Khomenko
- G01 - MEASURING TESTING
Information Patent Grant
Collection optics system for spectrometer and Raman spectral system
- Patent number 10,520,438
- Issue date Dec 31, 2019
- Samsung Electronics Co., Ltd.
- Unjeong Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing a wafer patterned using at lea...
- Patent number 10,509,330
- Issue date Dec 17, 2019
- Carl Zeiss SMT GmbH
- Hans-Michael Stiepan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface measurement system
- Patent number 10,436,580
- Issue date Oct 8, 2019
- CHROMA ATE INC.
- Yi-Chang Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for customized hair-coloring
- Patent number 10,416,078
- Issue date Sep 17, 2019
- ColoRight Ltd.
- Efraim Miklatzky
- A45 - HAND OR TRAVELLING ARTICLES

Patents Applicationslast 30 patents

Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20240342804
- Publication date Oct 17, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
MEASUREMENT METHOD, MEASUREMENT DEVICE, AND NONTRANSITORY COMPUTER-...
- Publication number 20240241047
- Publication date Jul 18, 2024
- NEC Corporation
- John Kenji CLARK
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTU...
- Publication number 20240159669
- Publication date May 16, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING A DEFECT ON A SEMI-REFLECTIVE FILM...
- Publication number 20240077425
- Publication date Mar 7, 2024
- HUA YANG Precision Machinery Co.,Ltd
- Hsien-Te HSIAO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FOREIGN MATTER INSPECTION DEVICE
- Publication number 20240044806
- Publication date Feb 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hisaaki KANAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING AN AMORPHOUS AND/OR CRYSTALLINE...
- Publication number 20240019361
- Publication date Jan 18, 2024
- Omya International AG
- Roger BOLLSTROM
- G01 - MEASURING TESTING
Information Patent Application
FOAMED GLASS AGGREGATE LAYER COMPACTION
- Publication number 20230348320
- Publication date Nov 2, 2023
- Aero Aggregates of North America, LLC
- Archibald Stewart Filshill
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
SYSTEM AND METHOD OF DYNAMIC MICRO-OPTICAL COHERENCE TOMOGRAPHY FOR...
- Publication number 20230280271
- Publication date Sep 7, 2023
- The General Hospital Corporation
- Hui Min Leung
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20230258578
- Publication date Aug 17, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
MONITORING COPPER CORROSION IN AN INTEGRATED CIRCUIT DEVICE
- Publication number 20230160836
- Publication date May 25, 2023
- MICROCHIP TECHNOLOGY INCORPORATED
- Yaojian Leng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR EXAMINING ROD-SHAPED PRODUCTS OF THE CIGARETT...
- Publication number 20230073296
- Publication date Mar 9, 2023
- Focke & Co. (GmbH & Co. KG)
- Michael Czarnotta
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20230060883
- Publication date Mar 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeru UTSUGI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE...
- Publication number 20230003641
- Publication date Jan 5, 2023
- Omya International AG
- Roger BOLLSTROM
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE INTENSITY CONTROL SYSTEMS AND METHODS FOR IMPROVED LIG...
- Publication number 20220317041
- Publication date Oct 6, 2022
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD
- Publication number 20220075276
- Publication date Mar 10, 2022
- ASML NETHERLANDS B.V.
- Simon Gijsbert Josephus MATHIJSSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPACT IN-LINE NON-CONTACT OPTICAL PROPERTY MEASUREMENT SYSTEM
- Publication number 20220065779
- Publication date Mar 3, 2022
- NDC Technologies Inc.
- Wilhelm WAGNER
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20210356408
- Publication date Nov 18, 2021
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
SYSTEM, APPARATUS, AND METHOD FOR DETECTING MICROBES
- Publication number 20210270713
- Publication date Sep 2, 2021
- The Wave Talk, Inc.
- Young Dug KIM
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT PROGRAM, AND ME...
- Publication number 20210262934
- Publication date Aug 26, 2021
- THE UNIVERSITY OF TOKYO
- Yoshihiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
High-Brightness Illumination Source for Optical Metrology
- Publication number 20200333612
- Publication date Oct 22, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD FOR THERMAL EXPANSION PROPERTIES OF TITANIA-CONTA...
- Publication number 20200319124
- Publication date Oct 8, 2020
- AGC Inc.
- Kazuya Sasaki
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
DISPLAY APPARATUS HAVING DISPLAY PANEL AND HUMIDITY DETECTION METHO...
- Publication number 20200294467
- Publication date Sep 17, 2020
- HIMAX DISPLAY, INC.
- Hsiu-Yin Cheng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING COPPER CORROSION IN AN INTEGRATE...
- Publication number 20200225169
- Publication date Jul 16, 2020
- MICROCHIP TECHNOLOGY INCORPORATED
- Yaojian Leng
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR HANDLING AND/OR MACHINING A WORKPIECE, AND METHOD
- Publication number 20200173917
- Publication date Jun 4, 2020
- Homag Bohrsysteme GmbH
- Thomas BETTERMANN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING PARTICLE ON SURFACE OF WAFER
- Publication number 20200158660
- Publication date May 21, 2020
- SK Siltron Co., Ltd.
- Kang San KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CHARACTERIZING HIGH-SCATTER GLASS-BASED SAM...
- Publication number 20200132548
- Publication date Apr 30, 2020
- Corning Incorporated
- William John Furnas
- G01 - MEASURING TESTING
Information Patent Application
SCATTEROMETRY SYSTEM AND METHOD OF USING THE SAME
- Publication number 20200124528
- Publication date Apr 23, 2020
- Matthew R. C. Atkinson
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20200110025
- Publication date Apr 9, 2020
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
PORTABLE DEVICE FOR MEASURING THE GEOMETRY OF AN OBJECT AND ITS SPA...
- Publication number 20190342478
- Publication date Nov 7, 2019
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Vlastimil HAVRAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, METHOD OF DERIVING REFLECTION CHA...
- Publication number 20190120764
- Publication date Apr 25, 2019
- Canon Kabushiki Kaisha
- Toshiyuki Ishii
- G01 - MEASURING TESTING

Solid samples

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Monitoring copper corrosion in an integrated circuit device

Multi-parameter inspection apparatus for monitoring of manufacturin...

Metrology method

Measurement device, measurement system, measurement program, and me...

Light source intensity control systems and methods for improved lig...

Multi-parameter inspection apparatus for monitoring of additive man...

Systems and methods for monitoring copper corrosion in an integrate...

Evaluation method for thermal expansion properties of titania-conta...

System, apparatus, and method for detecting microbes

High-brightness illumination source for optical metrology

Rapid and non-destructive detection of infection

Multi-parameter inspection apparatus for monitoring of manufacturin...

Systems and methods for characterizing high-scatter glass-based sam...

Optical fiber inspecting device, optical fiber manufacturing appara...

Distributed measurement of minimum and maximum in-situ stress in su...

Scatterometry system and method of using the same

On-device metrology using target decomposition

Method and apparatus for detecting an object with circular-arc-shap...

Information processing apparatus, method of deriving reflection cha...

Display apparatus having display panel and humidity detection metho...

Stage system and metrology tool

Apparatus and method for measuring particle on surface of wafer

Portable device for measuring the geometry of an object and its spa...

Cure monitoring systems and methods

Optical fiber inspecting device, optical fiber manufacturing appara...

Optical characterization of fiber reinforced plastic composites bas...

Collection optics system for spectrometer and Raman spectral system

Method and device for characterizing a wafer patterned using at lea...

Surface measurement system

Apparatus and method for customized hair-coloring

Patents Applicationslast 30 patents

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

MEASUREMENT METHOD, MEASUREMENT DEVICE, AND NONTRANSITORY COMPUTER-...

IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTU...

METHOD AND SYSTEM FOR DETECTING A DEFECT ON A SEMI-REFLECTIVE FILM...

OPTICAL FOREIGN MATTER INSPECTION DEVICE

METHOD AND APPARATUS FOR DETECTING AN AMORPHOUS AND/OR CRYSTALLINE...

FOAMED GLASS AGGREGATE LAYER COMPACTION

SYSTEM AND METHOD OF DYNAMIC MICRO-OPTICAL COHERENCE TOMOGRAPHY FOR...

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

MONITORING COPPER CORROSION IN AN INTEGRATED CIRCUIT DEVICE

METHOD AND DEVICE FOR EXAMINING ROD-SHAPED PRODUCTS OF THE CIGARETT...

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE...

LIGHT SOURCE INTENSITY CONTROL SYSTEMS AND METHODS FOR IMPROVED LIG...

METROLOGY METHOD

COMPACT IN-LINE NON-CONTACT OPTICAL PROPERTY MEASUREMENT SYSTEM

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

SYSTEM, APPARATUS, AND METHOD FOR DETECTING MICROBES

MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT PROGRAM, AND ME...

High-Brightness Illumination Source for Optical Metrology

EVALUATION METHOD FOR THERMAL EXPANSION PROPERTIES OF TITANIA-CONTA...

DISPLAY APPARATUS HAVING DISPLAY PANEL AND HUMIDITY DETECTION METHO...

SYSTEMS AND METHODS FOR MONITORING COPPER CORROSION IN AN INTEGRATE...

DEVICE FOR HANDLING AND/OR MACHINING A WORKPIECE, AND METHOD

APPARATUS AND METHOD FOR MEASURING PARTICLE ON SURFACE OF WAFER

SYSTEMS AND METHODS FOR CHARACTERIZING HIGH-SCATTER GLASS-BASED SAM...

SCATTEROMETRY SYSTEM AND METHOD OF USING THE SAME

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

PORTABLE DEVICE FOR MEASURING THE GEOMETRY OF AN OBJECT AND ITS SPA...

INFORMATION PROCESSING APPARATUS, METHOD OF DERIVING REFLECTION CHA...