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Spm scanning probe microscopy, stm scanning tunneling microscopy

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  • CPC
  • G05B2219/37127
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Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/37127Spm scanning probe microscopy, stm scanning tunneling microscopy
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method for validating measurement data
    • Patent number 11,353,324
    • Issue date Jun 7, 2022
    • Taiwan Semiconductor Manufacturing Company, Ltd
    • Chui-Jung Chiu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Method for validating measurement data
    • Patent number 10,520,303
    • Issue date Dec 31, 2019
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chui-Jung Chiu
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Method for validating measurement data
    • Patent number 9,823,066
    • Issue date Nov 21, 2017
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chui-Jung Chiu
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Method for validating measurement data
    • Patent number 9,404,743
    • Issue date Aug 2, 2016
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chui-Jung Chiu
    • G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents