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CPC
G01D11/06
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01D11/00
Component parts of measuring arrangements not specially adapted for a specific variable
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G01D11/06
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Patents Grants
last 30 patents
Information
Patent Grant
Tension measurement device
Patent number
10,302,513
Issue date
May 28, 2019
Bando Chemical Industries, Ltd.
Yuta Hamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Self-leveling device
Patent number
6,604,291
Issue date
Aug 12, 2003
Hilti Aktiengesellschaft
Reinhard Waibel
G01 - MEASURING TESTING
Information
Patent Grant
Taut band type instrument suitable for automatical assembly
Patent number
4,496,902
Issue date
Jan 29, 1985
Yokogawa Hokushin Electric Corporation
Shigetaka Miura
G01 - MEASURING TESTING
Information
Patent Grant
3681692
Patent number
3,681,692
Issue date
Aug 1, 1972
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
3491297
Patent number
3,491,297
Issue date
Jan 20, 1970
G01 - MEASURING TESTING
Information
Patent Grant
3406340
Patent number
3,406,340
Issue date
Oct 15, 1968
G01 - MEASURING TESTING
Information
Patent Grant
3277370
Patent number
3,277,370
Issue date
Oct 4, 1966
G01 - MEASURING TESTING
Information
Patent Grant
3221252
Patent number
3,221,252
Issue date
Nov 30, 1965
G01 - MEASURING TESTING
Information
Patent Grant
2623083
Patent number
2,623,083
Issue date
Dec 23, 1952
G01 - MEASURING TESTING
Information
Patent Grant
2623084
Patent number
2,623,084
Issue date
Dec 23, 1952
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Self-leveling device
Publication number
20020043000
Publication date
Apr 18, 2002
Reinhard Waibel
G01 - MEASURING TESTING