Stroboscopic illumination; synchronised illumination

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CPC
G01N2021/8838

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8838Stroboscopic illumination; synchronised illumination

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for calibrating and operating imaging systems w...
- Patent number 11,997,394
- Issue date May 28, 2024
- Zebra Technologies Corporation
- Paul D. Haist
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Displacement measurement device and defect detection device
- Patent number 11,977,032
- Issue date May 7, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical inspection device and method
- Patent number 11,549,891
- Issue date Jan 10, 2023
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Hailiang Lu
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device
- Patent number 11,391,700
- Issue date Jul 19, 2022
- Samsung Electronics Co., Ltd.
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for autonomous stroboscopic machine inspection...
- Patent number 10,775,229
- Issue date Sep 15, 2020
- TATA Consultancy Services Limited
- Sushovan Mukherjee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for controlling tyres in a production line
- Patent number 10,697,762
- Issue date Jun 30, 2020
- Pirelli Tyre S.p.A.
- Vincenzo Boffa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for controlling tyres in a production line
- Patent number 10,627,220
- Issue date Apr 21, 2020
- Pirelli Tyre S.p.A.
- Vincenzo Boffa
- G01 - MEASURING TESTING
Information Patent Grant
Multi-feature image tracking
- Patent number 10,599,941
- Issue date Mar 24, 2020
- Hamilton Sundstrand Corporation
- Michael C. Harke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image capture apparatus and method executed by image capture apparatus
- Patent number 10,397,486
- Issue date Aug 27, 2019
- Canon Kabushiki Kaisha
- Kotaro Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection apparatus
- Patent number 10,267,618
- Issue date Apr 23, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Container inspection device and container inspection method for ins...
- Patent number 10,261,029
- Issue date Apr 16, 2019
- Krones AG
- Christof Will
- G01 - MEASURING TESTING
Information Patent Grant
LED strobe
- Patent number 10,078,055
- Issue date Sep 18, 2018
- Avid Labs, LLC
- Joel Nichols
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Container inspection device and container inspection method for ins...
- Patent number 10,067,066
- Issue date Sep 4, 2018
- Krones AG
- Herbert Kolb
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus for performing correction processing for...
- Patent number 9,936,141
- Issue date Apr 3, 2018
- Canon Kabushiki Kaisha
- Kotaro Kitajima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for individually inspecting objects in a stream o...
- Patent number 9,924,105
- Issue date Mar 20, 2018
- VISYS NV
- Dirk Adams
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,464,992
- Issue date Oct 11, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Trigger for blade imaging based on a controller
- Patent number 9,462,183
- Issue date Oct 4, 2016
- SIEMENS ENERGY, INC.
- Binglong Xie
- F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Information Patent Grant
Systems and methods for controlling strobe illumination
- Patent number 9,234,852
- Issue date Jan 12, 2016
- MITUTOYO CORPORATION
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Removal of fusarium infected kernels for grain
- Patent number 8,227,719
- Issue date Jul 24, 2012
- Spectrum Scientific Inc.
- David A. Prystupa
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Systems and methods for controlling strobe illumination
- Patent number 8,045,002
- Issue date Oct 25, 2011
- Mitutoyo Corporation
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and methods for inspecting tape lamination
- Patent number 7,889,907
- Issue date Feb 15, 2011
- The Boeing Company
- Roger W Engelbart
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Fast variable angle of incidence illumination for a machine vision...
- Patent number 7,782,513
- Issue date Aug 24, 2010
- Mitutoyo Corporation
- Paul G. Gladnick
- G01 - MEASURING TESTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 7,729,528
- Issue date Jun 1, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for inspecting an object
- Patent number 7,271,889
- Issue date Sep 18, 2007
- Leica Microsystems CMS GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Strobe illumination
- Patent number 7,127,159
- Issue date Oct 24, 2006
- Mitutoyo Corporation
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,937,753
- Issue date Aug 30, 2005
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,826,298
- Issue date Nov 30, 2004
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical system
- Patent number 6,552,783
- Issue date Apr 22, 2003
- Teradyne, Inc.
- Peter E. Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,324,298
- Issue date Nov 27, 2001
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
STROBOSCOPIC STEPPED ILLUMINATION DEFECT DETECTION SYSTEM
- Publication number 20240118218
- Publication date Apr 11, 2024
- Casi Vision Technology (Luoyang) Co., Ltd.
- Xiaosong Hu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...
- Publication number 20230395366
- Publication date Dec 7, 2023
- FUJIFILM CORPORATION
- Akihiko OHTSU
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR
- Publication number 20230251198
- Publication date Aug 10, 2023
- Camtek LTD.
- Amnon Menachem
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE
- Publication number 20220034822
- Publication date Feb 3, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE
- Publication number 20210270777
- Publication date Sep 2, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20210096085
- Publication date Apr 1, 2021
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC OPTICAL INSPECTION DEVICE AND METHOD
- Publication number 20190293566
- Publication date Sep 26, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Hailiang LU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FEATURE IMAGE TRACKING
- Publication number 20190080194
- Publication date Mar 14, 2019
- HAMILTON SUNDSTRAND CORPORATION
- Michael C. Harke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR CONTROLLING TYRES IN A PRODUCTION LINE
- Publication number 20180266810
- Publication date Sep 20, 2018
- PIRELLI TYRE S.p.A.
- Vincenzo BOFFA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE CAPTURE APPARATUS AND METHOD EXECUTED BY IMAGE CAPTURE APPARATUS
- Publication number 20180191933
- Publication date Jul 5, 2018
- Canon Kabushiki Kaisha
- Kotaro Kitajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS
- Publication number 20170350690
- Publication date Dec 7, 2017
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER INSPECTION DEVICE AND CONTAINER INSPECTION METHOD FOR INS...
- Publication number 20160370299
- Publication date Dec 22, 2016
- KRONES AG
- Herbert KOLB
- G01 - MEASURING TESTING
Information Patent Application
LED STROBE
- Publication number 20160341669
- Publication date Nov 24, 2016
- AVID Labs, LLC
- Joel Nichols
- G01 - MEASURING TESTING
Information Patent Application
Automated Wafer Defect Inspection System and a Process of Performin...
- Publication number 20160223470
- Publication date Aug 4, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Individually Inspecting Objects in a Stream o...
- Publication number 20140333755
- Publication date Nov 13, 2014
- VISYS NV
- Dirk Adams
- G01 - MEASURING TESTING
Information Patent Application
TRIGGER FOR BLADE IMAGING BASED ON A CONTROLLER
- Publication number 20130162846
- Publication date Jun 27, 2013
- Siemens Corporation
- Binglong Xie
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20120087569
- Publication date Apr 12, 2012
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and methods for controlling strobe illumination
- Publication number 20110310270
- Publication date Dec 22, 2011
- MITUTOYO CORPORATION
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
REMOVAL OF FUSARIUM INFECTED KERNELS FOR GRAIN
- Publication number 20110094946
- Publication date Apr 28, 2011
- SPECTRUM SCIENTIFIC INC.
- David A. Prystupa
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20100239157
- Publication date Sep 23, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR DETECTING AND CLASSIFYING RESIDUAL OXIDE IN METAL SHEET...
- Publication number 20100128261
- Publication date May 27, 2010
- ACERINOX, S.A.
- Carlos Gonzalez Spinola
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Systems and methods for controlling strobe illumination
- Publication number 20070025709
- Publication date Feb 1, 2007
- Mitutoyo Corporation
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and methods for inspecting tape lamination
- Publication number 20060152712
- Publication date Jul 13, 2006
- Roger W. Engelbart
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Strobe illumination
- Publication number 20060024040
- Publication date Feb 2, 2006
- Mitutoyo Corporation
- Paul G. Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Device and method for inspecting an object
- Publication number 20050259245
- Publication date Nov 24, 2005
- LECIA MICROSYSTEMS SEMICONDUCTOR GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Automated wafer defect inspection system and a process of performin...
- Publication number 20050008218
- Publication date Jan 13, 2005
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Machine vision inspection system and method having improved operati...
- Publication number 20040223053
- Publication date Nov 11, 2004
- Mitutoyo Corporation
- Paul G. Gladnick
- G06 - COMPUTING CALCULATING COUNTING

Stroboscopic illumination; synchronised illumination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vibration measurement device

Systems and methods for calibrating and operating imaging systems w...

Displacement measurement device and defect detection device

Automatic optical inspection device and method

Defect detection device

Systems and methods for autonomous stroboscopic machine inspection...

Apparatus for controlling tyres in a production line

Apparatus for controlling tyres in a production line

Multi-feature image tracking

Image capture apparatus and method executed by image capture apparatus

Defect detection method and defect detection apparatus

Container inspection device and container inspection method for ins...

LED strobe

Container inspection device and container inspection method for ins...

Image processing apparatus for performing correction processing for...

System and method for individually inspecting objects in a stream o...

Automated wafer defect inspection system and a process of performin...

Trigger for blade imaging based on a controller

Systems and methods for controlling strobe illumination

Removal of fusarium infected kernels for grain

Systems and methods for controlling strobe illumination

Apparatus and methods for inspecting tape lamination

Fast variable angle of incidence illumination for a machine vision...

Automated wafer defect inspection system and a process of performin...

Device and method for inspecting an object

Strobe illumination

Automated wafer defect inspection system and a process of performin...

Automated wafer defect inspection system and a process of performin...

Optical system

Automated wafer defect inspection system and a process of performin...

Patents Applicationslast 30 patents

STROBOSCOPIC STEPPED ILLUMINATION DEFECT DETECTION SYSTEM

DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...

DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR

DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE

DEFECT DETECTION DEVICE

VIBRATION MEASUREMENT DEVICE

AUTOMATIC OPTICAL INSPECTION DEVICE AND METHOD

MULTI-FEATURE IMAGE TRACKING

APPARATUS FOR CONTROLLING TYRES IN A PRODUCTION LINE

IMAGE CAPTURE APPARATUS AND METHOD EXECUTED BY IMAGE CAPTURE APPARATUS

DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS

CONTAINER INSPECTION DEVICE AND CONTAINER INSPECTION METHOD FOR INS...

LED STROBE

Automated Wafer Defect Inspection System and a Process of Performin...

System and Method for Individually Inspecting Objects in a Stream o...

TRIGGER FOR BLADE IMAGING BASED ON A CONTROLLER

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...

Systems and methods for controlling strobe illumination

REMOVAL OF FUSARIUM INFECTED KERNELS FOR GRAIN

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...

DEVICE FOR DETECTING AND CLASSIFYING RESIDUAL OXIDE IN METAL SHEET...

Systems and methods for controlling strobe illumination

Apparatus and methods for inspecting tape lamination

Strobe illumination

Device and method for inspecting an object

Automated wafer defect inspection system and a process of performin...

Machine vision inspection system and method having improved operati...