CPC
G01N2021/258
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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B82 - NANO-TECHNOLOGY
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B82 - NANO-TECHNOLOGY
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G01 - MEASURING TESTING
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H01 - BASIC ELECTRIC ELEMENTS
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G01 - MEASURING TESTING
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B82 - NANO-TECHNOLOGY
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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G01 - MEASURING TESTING
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B82 - NANO-TECHNOLOGY
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Patent Application
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Min Hu
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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B82 - NANO-TECHNOLOGY
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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B82 - NANO-TECHNOLOGY
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Yu-Cheng LIN
G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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G01 - MEASURING TESTING
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C01 - INORGANIC CHEMISTRY
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G01 - MEASURING TESTING
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B82 - NANO-TECHNOLOGY
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Patent Application
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Xiangdong Jiang
G01 - MEASURING TESTING
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Andrea Tao
G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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TIAN YANG
G02 - OPTICS
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The Government of the United States of America, as represented by the Secreta...
MOHAMMAD M. JADIDI
H01 - BASIC ELECTRIC ELEMENTS
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MIN GON KIM
G01 - MEASURING TESTING
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Cheng Wang
G01 - MEASURING TESTING
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Kazuki IKEDA
G01 - MEASURING TESTING
