Test interface between tester and unit under test

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G06F11/2733

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GPHYSICS G06Computing G06FELECTRICAL DIGITAL DATA PROCESSING G06F11/00Error detection Error correction Monitoring

Current Industry

G06F11/2733Test interface between tester and unit under test

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for testing cxl enabled devices in parallel
- Patent number 12,197,303
- Issue date Jan 14, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for advanced communication interface analysis
- Patent number 12,147,319
- Issue date Nov 19, 2024
- Cable Television Laboratories, Inc.
- Bernardo Huberman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heterogeneous test equipment interfacing apparatus for weapon syste...
- Patent number 12,130,600
- Issue date Oct 29, 2024
- Agency for Defense Development
- Tae yeob Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SOC-oriented concurrent test system for multiple clock domains and...
- Patent number 12,130,718
- Issue date Oct 29, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leveraging low power states for fault testing of processing cores a...
- Patent number 12,124,346
- Issue date Oct 22, 2024
- NVIDIA Corporation
- Jonah Alben
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for device testing to avoid resource conflicts...
- Patent number 12,124,359
- Issue date Oct 22, 2024
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System directed testing
- Patent number 12,117,913
- Issue date Oct 15, 2024
- Future Dial, Inc.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Techniques for testing semiconductor devices
- Patent number 12,079,097
- Issue date Sep 3, 2024
- NVIDIA Corporation
- Animesh Khare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing AI chip computing performance, and...
- Patent number 12,072,780
- Issue date Aug 27, 2024
- Kunlunxin Technology (Beijing) Company Limited
- Zhao Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing system, related integrated circuit, device and method
- Patent number 12,061,530
- Issue date Aug 13, 2024
- STMicroelectronics Application GmbH
- Roberto Colombo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Margin test data tagging and predictive expected margins
- Patent number 12,061,232
- Issue date Aug 13, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Power supply health check system and method thereof
- Patent number 12,026,075
- Issue date Jul 2, 2024
- ASUSTeK COMPUTER Inc.
- Cheng-Wei Gu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programmable test compression architecture input/output shift regis...
- Patent number 12,013,434
- Issue date Jun 18, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart selection of test scripts for commodity testing on manufactur...
- Patent number 12,013,770
- Issue date Jun 18, 2024
- Dell Products L.P.
- Shibi Panikkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,982,597
- Issue date May 14, 2024
- Myung Ki Kim
- G01 - MEASURING TESTING
Information Patent Grant
Error rate measuring apparatus and error rate measuring method
- Patent number 11,977,464
- Issue date May 7, 2024
- Anritsu Corporation
- Ryo Sunayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Saturation of multiple PCIe slots in a server by multiple ports in...
- Patent number 11,966,309
- Issue date Apr 23, 2024
- Hewlett Packard Enterprise Development LP
- Hong-Jen Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
USB integrated circuit, testing platform and operating method for U...
- Patent number 11,914,491
- Issue date Feb 27, 2024
- VIA LABS, INC.
- Hao-Hsuan Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Baseboard management controller (BMC) test system and method
- Patent number 11,907,384
- Issue date Feb 20, 2024
- Dell Products, L.P.
- Timothy M. Lambert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning for taps to accelerate TDECQ and other measurements
- Patent number 11,907,090
- Issue date Feb 20, 2024
- Tektronix, Inc.
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced auxiliary memory mapped interface test systems and methods
- Patent number 11,899,550
- Issue date Feb 13, 2024
- Advantest Corporation
- Chi Yuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device verification method, UVM verification platform, electronic a...
- Patent number 11,893,331
- Issue date Feb 6, 2024
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Ying Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG-based burning device
- Patent number 11,874,323
- Issue date Jan 16, 2024
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Peng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for integration testing
- Patent number 11,868,222
- Issue date Jan 9, 2024
- EMTECH GROUP INC.
- Toni Jardini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed event-based test execution
- Patent number 11,803,456
- Issue date Oct 31, 2023
- National Instruments Corporation
- Sundeep Chandhoke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,796,423
- Issue date Oct 24, 2023
- Myung Ki Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic prediction of system resource requirement of network softwa...
- Patent number 11,797,408
- Issue date Oct 24, 2023
- Juniper Networks, Inc.
- Sanjeev Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for managing transactions burstiness and generati...
- Patent number 11,797,409
- Issue date Oct 24, 2023
- HCL America Inc.
- Manickam Muthiah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer and conduit for system testing
- Patent number 11,789,834
- Issue date Oct 17, 2023
- Visa International Service Association
- Yuexi Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...
- Publication number 20240419568
- Publication date Dec 19, 2024
- NVIDIA Corporation
- Jonah ALBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR AUTOMATICALLY CONFIGURING COMPUTING DEVIC...
- Publication number 20240403202
- Publication date Dec 5, 2024
- Communications Test Design, Inc.
- Stephen Tate DiJoseph
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST METHOD BASED ON DATA SWITCH, DATA SWITCH AND STORAGE MEDIUM
- Publication number 20240385938
- Publication date Nov 21, 2024
- Fulian Precision Electronics (Tianjin) Co., LTD.
- TENG-FEI MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD OF DEBUGGING
- Publication number 20240354211
- Publication date Oct 24, 2024
- Intel Corporation
- Aruni Nelson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER
- Publication number 20240337691
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM DIRECTED TESTING
- Publication number 20240320113
- Publication date Sep 26, 2024
- FUTURE DIAL, INC.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SEN...
- Publication number 20240281351
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Makoto Kitagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...
- Publication number 20240220381
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT, METHOD, AND APPARATUS FOR TO-BE-TESTED MODULE
- Publication number 20240211361
- Publication date Jun 27, 2024
- Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd.
- Jing LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE IN SEMICO...
- Publication number 20240160547
- Publication date May 16, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optimization of Process for Exiting Machines from Test Environments
- Publication number 20240160546
- Publication date May 16, 2024
- International Business Machines Corporation
- Christopher Mazile
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FIRMWARE FUNCTIONALITY TESTING OF GAS DETECTO...
- Publication number 20240143467
- Publication date May 2, 2024
- Honeywell International Inc.
- Sumit Suresh KULKARNI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT SCORE BASED OOM TEST BASELINE MECHANISM
- Publication number 20240126667
- Publication date Apr 18, 2024
- Dell Products L.P.
- Huijuan Fan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Battery Cell/Pack Testing Devices, Systems Including Such Devices,...
- Publication number 20240111647
- Publication date Apr 4, 2024
- SES Holdings Pte. Ltd.
- Younggyu Nam
- G01 - MEASURING TESTING
Information Patent Application
CXL PROTOCOL ENABLEMENT FOR TEST ENVIRONMENT SYSTEMS AND METHODS
- Publication number 20240095135
- Publication date Mar 21, 2024
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS UTILIZING DAX MEMORY MANAGEMENT FOR TESTING CXL...
- Publication number 20240095138
- Publication date Mar 21, 2024
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20240045778
- Publication date Feb 8, 2024
- Anritsu Corporation
- Hiroyuki ONUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SATURATION OF MULTIPLE PCIE SLOTS IN A SERVER BY MULTIPLE PORTS IN...
- Publication number 20240004769
- Publication date Jan 4, 2024
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Hong-Jen Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TRANSFER CONTROL METHOD, SIGNAL TRANSFER APPARATUS, AND TEST...
- Publication number 20230418719
- Publication date Dec 28, 2023
- Huawei Technologies Co., Ltd
- Hui WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEBUG FOR MULTI-THREADED PROCESSING
- Publication number 20230418718
- Publication date Dec 28, 2023
- TEXAS INSTRUMENTS INCORPORATED
- NIRAJ NANDAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER AND CONDUIT FOR SYSTEM TESTING
- Publication number 20230409453
- Publication date Dec 21, 2023
- VISA INTERNATIONAL SERVICE ASSOCIATION
- Yuexi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY TEST DRIVE
- Publication number 20230401133
- Publication date Dec 14, 2023
- Seoul National University R&DB Foundation
- U KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE VERIFICATION METHOD, UVM VERIFICATION PLATFORM, ELECTRONIC A...
- Publication number 20230394208
- Publication date Dec 7, 2023
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Ying WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SUPPLY HEALTH CHECK SYSTEM AND METHOD THEREOF
- Publication number 20230350772
- Publication date Nov 2, 2023
- ASUSTEK COMPUTER INC.
- Cheng-Wei GU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20230296481
- Publication date Sep 21, 2023
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC PREDICTION OF SYSTEM RESOURCE REQUIREMENT OF NETWORK SOFTWA...
- Publication number 20230214304
- Publication date Jul 6, 2023
- Juniper Networks, Inc.
- Sanjeev Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGNOSTIC TESTS FOR COMPUTING DEVICES
- Publication number 20230195586
- Publication date Jun 22, 2023
- Hewlett-Packard Development Company, L.P.
- SARIN SUSEELAN BHARGAVI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGIS...
- Publication number 20230176123
- Publication date Jun 8, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20230175930
- Publication date Jun 8, 2023
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INTEGRATION TESTING
- Publication number 20230168985
- Publication date Jun 1, 2023
- QA CONSULTANTS INC.
- Toni JARDINI
- G06 - COMPUTING CALCULATING COUNTING

Test interface between tester and unit under test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for testing cxl enabled devices in parallel

Systems and methods for advanced communication interface analysis

Heterogeneous test equipment interfacing apparatus for weapon syste...

SOC-oriented concurrent test system for multiple clock domains and...

Leveraging low power states for fault testing of processing cores a...

Systems and methods for device testing to avoid resource conflicts...

System directed testing

Techniques for testing semiconductor devices

Method and apparatus for testing AI chip computing performance, and...

Processing system, related integrated circuit, device and method

Margin test data tagging and predictive expected margins

Power supply health check system and method thereof

Programmable test compression architecture input/output shift regis...

Smart selection of test scripts for commodity testing on manufactur...

Automated functional testing systems and methods of making and usin...

Error rate measuring apparatus and error rate measuring method

Saturation of multiple PCIe slots in a server by multiple ports in...

Automated test equipment for testing one or more devices under test...

USB integrated circuit, testing platform and operating method for U...

Baseboard management controller (BMC) test system and method

Machine learning for taps to accelerate TDECQ and other measurements

Enhanced auxiliary memory mapped interface test systems and methods

Device verification method, UVM verification platform, electronic a...

JTAG-based burning device

System and method for integration testing

Distributed event-based test execution

Automated functional testing systems and methods of making and usin...

Dynamic prediction of system resource requirement of network softwa...

Method and system for managing transactions burstiness and generati...

Computer and conduit for system testing

Patents Applicationslast 30 patents

LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...

APPARATUS AND METHODS FOR AUTOMATICALLY CONFIGURING COMPUTING DEVIC...

TEST METHOD BASED ON DATA SWITCH, DATA SWITCH AND STORAGE MEDIUM

APPARATUS, SYSTEM, AND METHOD OF DEBUGGING

PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER

SYSTEM DIRECTED TESTING

POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SEN...

SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...

TEST CIRCUIT, METHOD, AND APPARATUS FOR TO-BE-TESTED MODULE

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE IN SEMICO...

Optimization of Process for Exiting Machines from Test Environments

METHOD AND SYSTEM FOR FIRMWARE FUNCTIONALITY TESTING OF GAS DETECTO...

INTELLIGENT SCORE BASED OOM TEST BASELINE MECHANISM

Battery Cell/Pack Testing Devices, Systems Including Such Devices,...

CXL PROTOCOL ENABLEMENT FOR TEST ENVIRONMENT SYSTEMS AND METHODS

SYSTEMS AND METHODS UTILIZING DAX MEMORY MANAGEMENT FOR TESTING CXL...

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

SATURATION OF MULTIPLE PCIE SLOTS IN A SERVER BY MULTIPLE PORTS IN...

SIGNAL TRANSFER CONTROL METHOD, SIGNAL TRANSFER APPARATUS, AND TEST...

DEBUG FOR MULTI-THREADED PROCESSING

COMPUTER AND CONDUIT FOR SYSTEM TESTING

MEMORY TEST DRIVE

DEVICE VERIFICATION METHOD, UVM VERIFICATION PLATFORM, ELECTRONIC A...

POWER SUPPLY HEALTH CHECK SYSTEM AND METHOD THEREOF

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

DYNAMIC PREDICTION OF SYSTEM RESOURCE REQUIREMENT OF NETWORK SOFTWA...

DIAGNOSTIC TESTS FOR COMPUTING DEVICES

PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGIS...

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

SYSTEM AND METHOD FOR INTEGRATION TESTING