Test of interface

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CPC
G05B2219/14075

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/14075Test of interface

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Patents Grantslast 30 patents

Information Patent Grant
Interface circuit, substrate, electronic device, and programmable c...
- Patent number 11,064,625
- Issue date Jul 13, 2021
- Mitsubishi Electric Corporation
- Hiroki Shionoya
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-adjusting test time estimation
- Patent number 10,162,326
- Issue date Dec 25, 2018
- International Business Machines Corporation
- David Monczynski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Self-adjusting test time estimation
- Patent number 9,811,070
- Issue date Nov 7, 2017
- International Business Machines Corporation
- David Monczynski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Diagnostics for a programmable logic controller
- Patent number 9,239,575
- Issue date Jan 19, 2016
- Siemens Aktiengesellschaft
- Robert Alan Weddle
- G05 - CONTROLLING REGULATING
Information Patent Grant
Input device of safety unit
- Patent number 7,555,353
- Issue date Jun 30, 2009
- Omron Corporation
- Keiichi Teranishi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Industrial control communication network and method
- Patent number 4,949,299
- Issue date Aug 14, 1990
- Allen-Bradley Company, Inc.
- Dennis C. Pickett
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SELF-ADJUSTING TEST TIME ESTIMATION
- Publication number 20180011464
- Publication date Jan 11, 2018
- International Business Machines Corporation
- DAVID MONCZYNSKI
- G05 - CONTROLLING REGULATING
Information Patent Application
SELF-ADJUSTING TEST TIME ESTIMATION
- Publication number 20160041543
- Publication date Feb 11, 2016
- International Business Machines Corporation
- DAVID MONCZYNSKI
- G05 - CONTROLLING REGULATING
Information Patent Application
DIAGNOSTICS FOR A PROGRAMMABLE LOGIC CONTROLLER
- Publication number 20130218493
- Publication date Aug 22, 2013
- SIEMENS INDUSTRY INC.
- Robert Alan Weddle
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM FOR TESTING ELECTRONIC CIRCUITS
- Publication number 20130218508
- Publication date Aug 22, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Deepak JINDAL
- G01 - MEASURING TESTING
Information Patent Application
Input device of safety unit
- Publication number 20060271833
- Publication date Nov 30, 2006
- OMRON CORPORATION
- Keiichi Teranishi
- G05 - CONTROLLING REGULATING