Testing of reflective surfaces

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G01M11/005

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GPHYSICS G01Measuring instruments G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR G01M11/00Testing of optical apparatus Testing structures by optical methods not otherwise provided for

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G01M11/005Testing of reflective surfaces

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Reflection rate detection device and reflection rate detection meth...
- Patent number 11,977,285
- Issue date May 7, 2024
- Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Bo Hai
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring mirror reflectance using solar illumination
- Patent number 11,971,321
- Issue date Apr 30, 2024
- Raytheon Company
- Stephen J. Schiller
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,927,500
- Issue date Mar 12, 2024
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for interferometrically determining a surface s...
- Patent number 11,892,283
- Issue date Feb 6, 2024
- Carl Zeiss SMT GmbH
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the reflectivity or transmittivi...
- Patent number 11,821,840
- Issue date Nov 21, 2023
- Ultrafast Innovations GmbH
- Daniel Cardenas
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection device
- Patent number 11,719,615
- Issue date Aug 8, 2023
- Mitsubishi Electric Corporation
- Kenya Nakai
- G01 - MEASURING TESTING
Information Patent Grant
Extreme ultraviolet (EUV) collector inspection apparatus and method
- Patent number 11,676,263
- Issue date Jun 13, 2023
- Samsung Electronics Co., Ltd.
- Dong-Hyub Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing tolerance distributions in a freeform surface...
- Patent number 11,435,261
- Issue date Sep 6, 2022
- Tsinghua University
- Jun Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Testing of curved X-ray gratings
- Patent number 11,421,984
- Issue date Aug 23, 2022
- Koninklijke Philips N.V.
- Andriy Yaroshenko
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Optical inspection device and optical inspection method
- Patent number 11,422,059
- Issue date Aug 23, 2022
- Hamamatsu Photonics K.K.
- Takashi Kasahara
- G02 - OPTICS
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,326,872
- Issue date May 10, 2022
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Compensation optical system for an interferometric measuring system
- Patent number 11,199,396
- Issue date Dec 14, 2021
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Single-shot, adaptive metrology of rotationally variant optical sur...
- Patent number 11,168,979
- Issue date Nov 9, 2021
- University of Rochester
- Romita Chaudhuri
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,118,900
- Issue date Sep 14, 2021
- Carl Zeiss SMT GmbH
- Frank Riepenhausen
- G01 - MEASURING TESTING
Information Patent Grant
Test of operational status of a digital scanner during lithographic...
- Patent number 11,099,007
- Issue date Aug 24, 2021
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,092,431
- Issue date Aug 17, 2021
- Carl Zeiss SMT GmbH
- Frank Riepenhausen
- G01 - MEASURING TESTING
Information Patent Grant
Optical table
- Patent number 11,092,512
- Issue date Aug 17, 2021
- attocube Systems AG
- Dirk Haft
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Global dynamic detection method and system for protective film of p...
- Patent number 10,877,371
- Issue date Dec 29, 2020
- Southern Taiwan University of Science and Technology
- Yu-Ching Lee
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining optical properties for light tr...
- Patent number 10,876,922
- Issue date Dec 29, 2020
- The Boeing Company
- Sahrudine Apdalhaliem
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront based characterization of lens surfaces based on reflections
- Patent number 10,876,924
- Issue date Dec 29, 2020
- AMO Groningen B.V.
- Robert Rosen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for rating eyeglass protection from infrared...
- Patent number 10,859,466
- Issue date Dec 8, 2020
- SHAMIR OPTICAL INDUSTRY LTD.
- Zohar Katzman
- G01 - MEASURING TESTING
Information Patent Grant
Determination of operability of a digital scanner with shearing int...
- Patent number 10,753,732
- Issue date Aug 25, 2020
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting concave cylinder and cylindrical...
- Patent number 10,663,289
- Issue date May 26, 2020
- Soochow University
- Peiji Guo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting cylinder and cylindrical converg...
- Patent number 10,627,222
- Issue date Apr 21, 2020
- Soochow University
- Peiji Guo
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer using tilted object waves and comprising a Fizeau in...
- Patent number 10,612,905
- Issue date Apr 7, 2020
- Universitaet Stuttgart
- Goran Baer
- G01 - MEASURING TESTING
Information Patent Grant
Rapid and wireless screening and health monitoring of materials and...
- Patent number 10,557,763
- Issue date Feb 11, 2020
- The Florida International University Board of Trustees
- Sakhrat Khizroev
- G01 - MEASURING TESTING
Information Patent Grant
Reflective detection method and reflectance detection apparatus
- Patent number 10,471,536
- Issue date Nov 12, 2019
- Disco Corporation
- Taiki Sawabe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Extreme ultraviolet mirrors and masks with improved reflectivity
- Patent number 10,468,149
- Issue date Nov 5, 2019
- GLOBALFOUNDRIES Inc.
- Yulu Chen
- G02 - OPTICS
Information Patent Grant
Silver reflector, and manufacture method and examination method the...
- Patent number 10,444,414
- Issue date Oct 15, 2019
- Konica Minolta, Inc.
- Munenori Kawaji
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL ELEMENT, OPTICAL UNIT, OPTICAL DEVICE, METHOD FOR ADJUSTING...
- Publication number 20240418599
- Publication date Dec 19, 2024
- Canon Kabushiki Kaisha
- MASATSUGU KOYAMA
- G01 - MEASURING TESTING
Information Patent Application
LED Wall Surface Reflectance
- Publication number 20240219260
- Publication date Jul 4, 2024
- Activision Publishing, Inc.
- Michael Sanders
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENTATION AND METHODS FOR OPTICAL METROLOGY OF HELIOSTATS
- Publication number 20240159432
- Publication date May 16, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Ryker EADS
- F24 - HEATING RANGES VENTILATING
Information Patent Application
METHOD FOR RECOGNIZING MISALIGNMENTS AND/OR CONTAMINATIONS OF OPTIC...
- Publication number 20230288286
- Publication date Sep 14, 2023
- ROBERT BOSCH GmbH
- Johannes Fischer
- G01 - MEASURING TESTING
Information Patent Application
DEFORMABLE MIRROR SYSTEMS AND METHODS OF DETECTING DISCONNECTED ACT...
- Publication number 20230204456
- Publication date Jun 29, 2023
- National Research Council of Canada
- Glen A. Herriot
- G01 - MEASURING TESTING
Information Patent Application
Object Reflectivity Estimation in a LIDAR System
- Publication number 20230194666
- Publication date Jun 22, 2023
- Aptiv Technologies Limited
- Denis Rainko
- G01 - MEASURING TESTING
Information Patent Application
REFLECTION RATE DETECTION DEVICE AND REFLECTION RATE DETECTION METH...
- Publication number 20230152612
- Publication date May 18, 2023
- Shenzhen china Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Bo HAI
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING APPARATUS, DATA PROCESSING METHOD, AND DATA PROCESS...
- Publication number 20220397481
- Publication date Dec 15, 2022
- TOPCON CORPORATION
- You SASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
- Publication number 20220349700
- Publication date Nov 3, 2022
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
EXTREME ULTRAVIOLET (EUV) COLLECTOR INSPECTION APPARATUS AND METHOD
- Publication number 20220309643
- Publication date Sep 29, 2022
- Samsung Electronics Co., Ltd.
- Dong-Hyub Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20220236139
- Publication date Jul 28, 2022
- Carl Zeiss SMT GMBH
- Steffen SIEGLER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...
- Publication number 20220221269
- Publication date Jul 14, 2022
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
MONITORING MIRROR REFLECTANCE USING SOLAR ILLUMINATION
- Publication number 20220214246
- Publication date Jul 7, 2022
- Raytheon Company
- Stephen J. Schiller
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THE REFLECTIVITY OR TRANSMITTIVI...
- Publication number 20220146423
- Publication date May 12, 2022
- UltraFast Innovations GmbH
- Daniel Cardenas
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS OF TESTING OPTICAL SYSTEMS
- Publication number 20210255058
- Publication date Aug 19, 2021
- AFL TELECOMMUNICATIONS LLC
- Fang Xu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20210140762
- Publication date May 13, 2021
- Carl Zeiss SMT GMBH
- Steffen SIEGLER
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-SHOT, ADAPTIVE METROLOGY OF ROTATIONALLY VARIANT OPTICAL SUR...
- Publication number 20200326182
- Publication date Oct 15, 2020
- University of Rochester
- Romita Chaudhuri
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD
- Publication number 20200278272
- Publication date Sep 3, 2020
- Hamamatsu Photonics K.K.
- Takashi KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20200225029
- Publication date Jul 16, 2020
- Carl Zeiss SMT GMBH
- Frank RIEPENHAUSEN
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION OPTICAL SYSTEM FOR AN INTERFEROMETRIC MEASURING SYSTEM
- Publication number 20200225028
- Publication date Jul 16, 2020
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
ECCENTRICITY MEASURING METHOD, LENS MANUFACTURING METHOD, AND ECCEN...
- Publication number 20200141832
- Publication date May 7, 2020
- Canon Kabushiki Kaisha
- Atsushi Maeda
- G01 - MEASURING TESTING
Information Patent Application
TEST OF OPERATIONAL STATUS OF A DIGITAL SCANNER DURING LITHOGRAPHIC...
- Publication number 20200096326
- Publication date Mar 26, 2020
- Nikon Corporation
- Eric Peter Goodwin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETECTION SYSTEM OF A FUNCTIONAL FAILURE OF MICROMIRRORS IN A DMD M...
- Publication number 20200072701
- Publication date Mar 5, 2020
- Varroc Lighting Systems, s.r.o
- Martin Svrcek
- F21 - LIGHTING
Information Patent Application
METROLOGY TARGET
- Publication number 20200011650
- Publication date Jan 9, 2020
- Carl Zeiss SMT GMBH
- Hans-Michael Stiepan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE
- Publication number 20190271532
- Publication date Sep 5, 2019
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF OPERABILITY OF A DIGITAL SCANNER WITH SHEARING INT...
- Publication number 20190204074
- Publication date Jul 4, 2019
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING TOLERANCE DISTRIBUTIONS IN A FREEFORM SURFACE...
- Publication number 20190049334
- Publication date Feb 14, 2019
- TSINGHUA UNIVERSITY
- JUN ZHU
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR RATING EYEGLASS PROTECTION FROM INFRARED...
- Publication number 20190033167
- Publication date Jan 31, 2019
- Zohar Katzman
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR A MAGNETICALLY-ACTUABLE DEVICE AND TEST SYSTEM INCLU...
- Publication number 20180237293
- Publication date Aug 23, 2018
- STMicroelectronics S.r.l.
- Marco Rossi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
EXTREME ULTRAVIOLET MIRRORS AND MASKS WITH IMPROVED REFLECTIVITY
- Publication number 20180226166
- Publication date Aug 9, 2018
- GLOBALFOUNDRIES INC.
- Yulu Chen
- G02 - OPTICS

Testing of reflective surfaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Reflection rate detection device and reflection rate detection meth...

Monitoring mirror reflectance using solar illumination

Method and device for characterizing the surface shape of an optica...

Measuring apparatus for interferometrically determining a surface s...

Apparatus and method for measuring the reflectivity or transmittivi...

Method for calibrating a measuring apparatus

Particle detection device

Extreme ultraviolet (EUV) collector inspection apparatus and method

Method for analyzing tolerance distributions in a freeform surface...

Testing of curved X-ray gratings

Optical inspection device and optical inspection method

Method and device for characterizing the surface shape of an optica...

Compensation optical system for an interferometric measuring system

Single-shot, adaptive metrology of rotationally variant optical sur...

Method and device for characterizing the surface shape of an optica...

Test of operational status of a digital scanner during lithographic...

Method and device for characterizing the surface shape of an optica...

Optical table

Global dynamic detection method and system for protective film of p...

Methods and systems for determining optical properties for light tr...

Wavefront based characterization of lens surfaces based on reflections

Methods and apparatus for rating eyeglass protection from infrared...

Determination of operability of a digital scanner with shearing int...

Method and apparatus for detecting concave cylinder and cylindrical...

Method and apparatus for detecting cylinder and cylindrical converg...

Interferometer using tilted object waves and comprising a Fizeau in...

Rapid and wireless screening and health monitoring of materials and...

Reflective detection method and reflectance detection apparatus

Extreme ultraviolet mirrors and masks with improved reflectivity

Silver reflector, and manufacture method and examination method the...

Patents Applicationslast 30 patents

OPTICAL ELEMENT, OPTICAL UNIT, OPTICAL DEVICE, METHOD FOR ADJUSTING...

LED Wall Surface Reflectance

INSTRUMENTATION AND METHODS FOR OPTICAL METROLOGY OF HELIOSTATS

METHOD FOR RECOGNIZING MISALIGNMENTS AND/OR CONTAMINATIONS OF OPTIC...

DEFORMABLE MIRROR SYSTEMS AND METHODS OF DETECTING DISCONNECTED ACT...

Object Reflectivity Estimation in a LIDAR System

REFLECTION RATE DETECTION DEVICE AND REFLECTION RATE DETECTION METH...

DATA PROCESSING APPARATUS, DATA PROCESSING METHOD, AND DATA PROCESS...

MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT

EXTREME ULTRAVIOLET (EUV) COLLECTOR INSPECTION APPARATUS AND METHOD

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...

MONITORING MIRROR REFLECTANCE USING SOLAR ILLUMINATION

APPARATUS AND METHOD FOR MEASURING THE REFLECTIVITY OR TRANSMITTIVI...

DEVICES AND METHODS OF TESTING OPTICAL SYSTEMS

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

SINGLE-SHOT, ADAPTIVE METROLOGY OF ROTATIONALLY VARIANT OPTICAL SUR...

OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

COMPENSATION OPTICAL SYSTEM FOR AN INTERFEROMETRIC MEASURING SYSTEM

ECCENTRICITY MEASURING METHOD, LENS MANUFACTURING METHOD, AND ECCEN...

TEST OF OPERATIONAL STATUS OF A DIGITAL SCANNER DURING LITHOGRAPHIC...

DETECTION SYSTEM OF A FUNCTIONAL FAILURE OF MICROMIRRORS IN A DMD M...

METROLOGY TARGET

METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE

DETERMINATION OF OPERABILITY OF A DIGITAL SCANNER WITH SHEARING INT...

METHOD FOR ANALYZING TOLERANCE DISTRIBUTIONS IN A FREEFORM SURFACE...

METHODS AND APPARATUS FOR RATING EYEGLASS PROTECTION FROM INFRARED...

PROBE CARD FOR A MAGNETICALLY-ACTUABLE DEVICE AND TEST SYSTEM INCLU...

EXTREME ULTRAVIOLET MIRRORS AND MASKS WITH IMPROVED REFLECTIVITY