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CPC
H03M3/378

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HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M3/00Conversion of analogue values to or from differential modulation

Current Industry

H03M3/378Testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vibration rectification error correction device, sensor module, and...
- Patent number 12,000,858
- Issue date Jun 4, 2024
- Seiko Epson Corporation
- Masayoshi Todorokihara
- G01 - MEASURING TESTING
Information Patent Grant
On chip test architecture for continuous time delta sigma analog-to...
- Patent number 11,901,919
- Issue date Feb 13, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Ankur Bal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Physical quantity sensor module, clinometer, and structure monitori...
- Patent number 11,733,262
- Issue date Aug 22, 2023
- Seiko Epson Corporation
- Kenta Sato
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Time-to-digital converter calibration
- Patent number 11,569,831
- Issue date Jan 31, 2023
- Infineon Technologies AG
- Luigi Grimaldi
- G04 - HOROLOGY
Information Patent Grant
Dynamic voltage reference for delta-sigma analog-to-digital convert...
- Patent number 11,502,700
- Issue date Nov 15, 2022
- Texas Instruments Incorporated
- Bradford Lawrence Hunter
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Calibration of digital-to-analog converter with low pin count
- Patent number 11,239,857
- Issue date Feb 1, 2022
- Cirrus Logic, Inc.
- John L. Melanson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and device for monitoring a power electronic assembly
- Patent number 11,209,495
- Issue date Dec 28, 2021
- IAV GmbH Ingenieurgesellschaft Auto und Verkehr
- Thomas Orlik
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
DAC error measurement method and apparatus
- Patent number 11,139,826
- Issue date Oct 5, 2021
- Huawei Technologies Co., Ltd.
- Haixi Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Filter apparatus and control method
- Patent number 11,115,041
- Issue date Sep 7, 2021
- Infineon Technologies AG
- Jan Witte
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Physical quantity sensor module, clinometer, and structure monitori...
- Patent number 11,079,403
- Issue date Aug 3, 2021
- Seiko Epson Corporation
- Kenta Sato
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic voltage reference for delta-sigma analog-to-digital convert...
- Patent number 10,958,285
- Issue date Mar 23, 2021
- Texas Instruments Incorporated
- Bradford Lawrence Hunter
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Correction method and correction circuit for sigma-delta modulator
- Patent number 10,742,230
- Issue date Aug 11, 2020
- Realtek Semiconductor Corporation
- Chih-Lung Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus to reduce effect of dielectric absorption in S...
- Patent number 10,615,812
- Issue date Apr 7, 2020
- Analog Devices Global Unlimited Company
- Sandeep Monangi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus to reduce effect of dielectric absorption in S...
- Patent number 10,256,831
- Issue date Apr 9, 2019
- Analog Devices Global
- Sandeep Monangi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delta-sigma modulator, and transmitter
- Patent number 10,090,855
- Issue date Oct 2, 2018
- Sumitomo Electric Industries, Ltd.
- Takashi Maehata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Frequency-domain ADC flash calibration
- Patent number 10,056,914
- Issue date Aug 21, 2018
- Analog Devices Global
- Zhao Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter verification using quantization noise p...
- Patent number 10,033,400
- Issue date Jul 24, 2018
- Schweitzer Engineering Laboratories, Inc.
- Travis C. Mallett
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter verification using quantization noise p...
- Patent number 9,985,646
- Issue date May 29, 2018
- Schweitzer Engineering Laboratories, Inc.
- Travis C. Mallett
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for identifying a failure in an analog to digit...
- Patent number 9,935,646
- Issue date Apr 3, 2018
- Schweitzer Engineering Laboratories, Inc.
- Travis C. Mallett
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dither injection for continuous-time MASH ADCS
- Patent number 9,838,031
- Issue date Dec 5, 2017
- Analog Devices Global
- Yunzhi Dong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of operation for an oversampled data converter
- Patent number 9,748,969
- Issue date Aug 29, 2017
- Infineon Technologies AG
- Elmar Bach
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital measurement of DAC switching mismatch error
- Patent number 9,716,509
- Issue date Jul 25, 2017
- Analog Devices, Inc.
- Jialin Zhao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement method and measurement unit for delta-sigma type data c...
- Patent number 9,705,528
- Issue date Jul 11, 2017
- Mitsutoshi Sugawara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and devices for determining root mean square of a delta-sig...
- Patent number 9,476,920
- Issue date Oct 25, 2016
- Smart Energy Instruments Inc.
- Donald Jeffrey Dionne
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test signal generator for sigma-delta ADC
- Patent number 9,401,728
- Issue date Jul 26, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Olivier Vincent Doare
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit generating an analog signal using a part of a sigma-delta ADC
- Patent number 9,350,381
- Issue date May 24, 2016
- Freescale Semiconductor Inc.
- Olivier Vincent Doare
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Estimation of digital-to-analog converter static mismatch errors
- Patent number 9,203,426
- Issue date Dec 1, 2015
- Analog Devices Global
- Jialin Zhao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and fault diagnosis system
- Patent number 9,157,948
- Issue date Oct 13, 2015
- Renesas Electronics Corporation
- Kazutoshi Tsuda
- G01 - MEASURING TESTING
Information Patent Grant
Sigma-delta ADC with test circuitry
- Patent number 8,830,098
- Issue date Sep 9, 2014
- STMicroelectronics International NV
- Salvador Mir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Simultaneously-sampling single-ended and differential two-input ana...
- Patent number 8,576,104
- Issue date Nov 5, 2013
- Linear Technology Corporation
- Jesper Steensgaard-Madsen
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ON CHIP TEST ARCHITECTURE FOR CONTINUOUS TIME DELTA SIGMA ANALOG-TO...
- Publication number 20240235573
- Publication date Jul 11, 2024
- STMicroelectronics International N.V.
- Ankur BAL
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR TESTING AN ANALOG-TO-DIGITAL CONVERTER UNIT HAVING DELTA...
- Publication number 20230198545
- Publication date Jun 22, 2023
- ROBERT BOSCH GmbH
- Rudolf Ritter
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ON CHIP TEST ARCHITECTURE FOR CONTINUOUS TIME DELTA SIGMA ANALOG-TO...
- Publication number 20220345149
- Publication date Oct 27, 2022
- STMicroelectronics International N.V.
- Ankur BAL
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Vibration Rectification Error Correction Device, Sensor Module, And...
- Publication number 20220206038
- Publication date Jun 30, 2022
- SEIKO EPSON CORPORATION
- Masayoshi TODOROKIHARA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Physical Quantity Sensor Module, Clinometer, And Structure Monitori...
- Publication number 20210325424
- Publication date Oct 21, 2021
- SEIKO EPSON CORPORATION
- Kenta SATO
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC VOLTAGE REFERENCE FOR DELTA-SIGMA ANALOG-TO-DIGITAL CONVERT...
- Publication number 20210211137
- Publication date Jul 8, 2021
- TEXAS INSTRUMENTS INCORPORATED
- BRADFORD LAWRENCE HUNTER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CALIBRATION OF DIGITAL-TO-ANALOG CONVERTER WITH LOW PIN COUNT
- Publication number 20210175898
- Publication date Jun 10, 2021
- Cirrus Logic International Semiconductor Ltd.
- John L. MELANSON
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND DEVICE FOR MONITORING A POWER ELECTRONIC ASSEMBLY
- Publication number 20210080510
- Publication date Mar 18, 2021
- IAV GMBH Ingenieurgesellschaft Auto und Verkehr
- Thomas ORLIK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DYNAMIC VOLTAGE REFERENCE FOR DELTA-SIGMA ANALOG-TO-DIGITAL CONVERT...
- Publication number 20200373940
- Publication date Nov 26, 2020
- TEXAS INSTRUMENTS INCORPORATED
- BRADFORD LAWRENCE HUNTER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DAC Error Measurement Method and Apparatus
- Publication number 20200366312
- Publication date Nov 19, 2020
- Huawei Technologies Co., Ltd
- Haixi Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Correction method and correction circuit for sigma-delta modulator
- Publication number 20200091929
- Publication date Mar 19, 2020
- REALTEK SEMICONDUCTOR CORPORATION
- CHIH-LUNG CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHYSICAL QUANTITY SENSOR MODULE, CLINOMETER, AND STRUCTURE MONITORI...
- Publication number 20190324052
- Publication date Oct 24, 2019
- SEIKO EPSON CORPORATION
- Kenta SATO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS TO REDUCE EFFECT OF DIELECTRIC ABSORPTION IN S...
- Publication number 20190173478
- Publication date Jun 6, 2019
- ANALOG DEVICES GLOBAL
- Sandeep Monangi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS TO REDUCE EFFECT OF DIELECTRIC ABSORPTION IN S...
- Publication number 20180083645
- Publication date Mar 22, 2018
- ANALOG DEVICES GLOBAL
- Sandeep Monangi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELTA-SIGMA MODULATOR, AND TRANSMITTER
- Publication number 20170331490
- Publication date Nov 16, 2017
- Sumitomo Electric Industries, Ltd.
- Takashi Maehata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL PROCESSING CIRCUIT, COULOMB COUNTER CIRCUIT, AND ELECTRONIC...
- Publication number 20170288439
- Publication date Oct 5, 2017
- Rohm Co., Ltd.
- Yoichi TAMEGAI
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL MEASUREMENT OF DAC SWITCHING MISMATCH ERROR
- Publication number 20170170840
- Publication date Jun 15, 2017
- Analog Devices, Inc.
- Jialin ZHAO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING SIGNAL-TO-QUANTIZATION-NOISE RATIO
- Publication number 20170099063
- Publication date Apr 6, 2017
- Marvell World Trade Ltd.
- Vijay Ganwani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR IDENTIFYING A FAILURE IN AN ANALOG TO DIGIT...
- Publication number 20170019120
- Publication date Jan 19, 2017
- Schweitzer Engineering Laboratories, Inc.
- Travis C. Mallett
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST SIGNAL GENERATOR FOR SIGMA-DELTA ADC
- Publication number 20160173120
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- OLIVIER VINCENT DOARE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT GENERATING AN ANALOG SIGNAL USING A PART OF A SIGMA-DELTA ADC
- Publication number 20160173121
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- OLIVIER VINCENT DOARE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND DEVICES FOR DETERMINING ROOT MEAN SQUARE OF A DELTA-SIG...
- Publication number 20150316587
- Publication date Nov 5, 2015
- SMART ENERGY INSTRUMENTS INC.
- Donald Jeffrey DIONNE
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION OF DIGITAL-TO-ANALOG CONVERTER STATIC MISMATCH ERRORS
- Publication number 20150288380
- Publication date Oct 8, 2015
- Analog Devices Technology
- JIALIN ZHAO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE AND FAULT DIAGNOSIS SYSTEM
- Publication number 20140009185
- Publication date Jan 9, 2014
- Kazutoshi TSUDA
- G01 - MEASURING TESTING
Information Patent Application
SIGMA-DELTA ADC WITH TEST CIRCUITRY
- Publication number 20130201046
- Publication date Aug 8, 2013
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Salvador Mir
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIMULTANEOUSLY-SAMPLING SINGLE-ENDED AND DIFFERENTIAL TWO-INPUT ANA...
- Publication number 20120326909
- Publication date Dec 27, 2012
- Linear Technology Corporation
- Jesper STEENSGAARD-MADSEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT TESTING
- Publication number 20100328121
- Publication date Dec 30, 2010
- Ateeda LTD
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device for testing an analog-to-digital converter
- Publication number 20070111670
- Publication date May 17, 2007
- Eric Compagne
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Reconfigurable switched- capacitor input circuit with digital-stimu...
- Publication number 20070063885
- Publication date Mar 22, 2007
- Hao-Chiao Hong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
IC WITH BUILT-IN SELF-TEST AND DESIGN METHOD THEREOF
- Publication number 20050174273
- Publication date Aug 11, 2005
- Pei-Wen Luo
- H03 - BASIC ELECTRONIC CIRCUITRY

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vibration rectification error correction device, sensor module, and...

On chip test architecture for continuous time delta sigma analog-to...

Physical quantity sensor module, clinometer, and structure monitori...

Time-to-digital converter calibration

Dynamic voltage reference for delta-sigma analog-to-digital convert...

Calibration of digital-to-analog converter with low pin count

Method and device for monitoring a power electronic assembly

DAC error measurement method and apparatus

Filter apparatus and control method

Physical quantity sensor module, clinometer, and structure monitori...

Dynamic voltage reference for delta-sigma analog-to-digital convert...

Correction method and correction circuit for sigma-delta modulator

Method and apparatus to reduce effect of dielectric absorption in S...

Method and apparatus to reduce effect of dielectric absorption in S...

Delta-sigma modulator, and transmitter

Frequency-domain ADC flash calibration

Analog-to-digital converter verification using quantization noise p...

Analog-to-digital converter verification using quantization noise p...

Systems and methods for identifying a failure in an analog to digit...

Dither injection for continuous-time MASH ADCS

Method of operation for an oversampled data converter

Digital measurement of DAC switching mismatch error

Measurement method and measurement unit for delta-sigma type data c...

Methods and devices for determining root mean square of a delta-sig...

Test signal generator for sigma-delta ADC

Circuit generating an analog signal using a part of a sigma-delta ADC

Estimation of digital-to-analog converter static mismatch errors

Semiconductor device and fault diagnosis system

Sigma-delta ADC with test circuitry

Simultaneously-sampling single-ended and differential two-input ana...

Patents Applicationslast 30 patents

ON CHIP TEST ARCHITECTURE FOR CONTINUOUS TIME DELTA SIGMA ANALOG-TO...

METHOD FOR TESTING AN ANALOG-TO-DIGITAL CONVERTER UNIT HAVING DELTA...

ON CHIP TEST ARCHITECTURE FOR CONTINUOUS TIME DELTA SIGMA ANALOG-TO...

Vibration Rectification Error Correction Device, Sensor Module, And...

Physical Quantity Sensor Module, Clinometer, And Structure Monitori...

DYNAMIC VOLTAGE REFERENCE FOR DELTA-SIGMA ANALOG-TO-DIGITAL CONVERT...

CALIBRATION OF DIGITAL-TO-ANALOG CONVERTER WITH LOW PIN COUNT

METHOD AND DEVICE FOR MONITORING A POWER ELECTRONIC ASSEMBLY

DYNAMIC VOLTAGE REFERENCE FOR DELTA-SIGMA ANALOG-TO-DIGITAL CONVERT...

DAC Error Measurement Method and Apparatus

Correction method and correction circuit for sigma-delta modulator

PHYSICAL QUANTITY SENSOR MODULE, CLINOMETER, AND STRUCTURE MONITORI...

METHOD AND APPARATUS TO REDUCE EFFECT OF DIELECTRIC ABSORPTION IN S...

METHOD AND APPARATUS TO REDUCE EFFECT OF DIELECTRIC ABSORPTION IN S...

DELTA-SIGMA MODULATOR, AND TRANSMITTER

SIGNAL PROCESSING CIRCUIT, COULOMB COUNTER CIRCUIT, AND ELECTRONIC...

DIGITAL MEASUREMENT OF DAC SWITCHING MISMATCH ERROR

METHOD AND APPARATUS FOR MEASURING SIGNAL-TO-QUANTIZATION-NOISE RATIO

SYSTEMS AND METHODS FOR IDENTIFYING A FAILURE IN AN ANALOG TO DIGIT...

TEST SIGNAL GENERATOR FOR SIGMA-DELTA ADC

CIRCUIT GENERATING AN ANALOG SIGNAL USING A PART OF A SIGMA-DELTA ADC

METHODS AND DEVICES FOR DETERMINING ROOT MEAN SQUARE OF A DELTA-SIG...

ESTIMATION OF DIGITAL-TO-ANALOG CONVERTER STATIC MISMATCH ERRORS

SEMICONDUCTOR DEVICE AND FAULT DIAGNOSIS SYSTEM

SIGMA-DELTA ADC WITH TEST CIRCUITRY

SIMULTANEOUSLY-SAMPLING SINGLE-ENDED AND DIFFERENTIAL TWO-INPUT ANA...

CIRCUIT TESTING

Device for testing an analog-to-digital converter

Reconfigurable switched- capacitor input circuit with digital-stimu...

IC WITH BUILT-IN SELF-TEST AND DESIGN METHOD THEREOF