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G01
Measuring instruments
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MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
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G01P2015/0828
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last 30 patents
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Capacitive microelectromechanical device and method for forming a c...
Patent number
11,422,151
Issue date
Aug 23, 2022
Infineon Technologies AG
Thoralf Kautzsch
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
Fiber-optic acceleration sensor having lever arm
Patent number
11,243,224
Issue date
Feb 8, 2022
FOS4X GMBH
Sascha Kienitz
G01 - MEASURING TESTING
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Patent Grant
Composite sensor and manufacturing method thereof
Patent number
11,243,226
Issue date
Feb 8, 2022
AUTOCHIPS WUHAN CO., LTD.
Senlin Li
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Inertial sensor with suspension spring structure surrounding anchor
Patent number
11,029,327
Issue date
Jun 8, 2021
NXP USA, INC.
Andrew C. McNeil
G01 - MEASURING TESTING
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Resonant sensor device
Patent number
10,955,434
Issue date
Mar 23, 2021
Yokogawa Electric Corporation
Shigeto Iwai
G01 - MEASURING TESTING
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Physical quantity sensor, electronic apparatus, and vehicle
Patent number
10,866,260
Issue date
Dec 15, 2020
Seiko Epson Corporation
Tetsuya Otsuki
G01 - MEASURING TESTING
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MEMS pendulum accelerometer having two measurement ranges
Patent number
10,866,261
Issue date
Dec 15, 2020
SAFRAN ELECTRONICS & DEFENSE
Vincent Ragot
G01 - MEASURING TESTING
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Patent Grant
Reducing thermal expansion induced errors in a magnetic circuit ass...
Patent number
10,859,593
Issue date
Dec 8, 2020
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
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Micromechanical component for a pressure sensor device
Patent number
10,845,262
Issue date
Nov 24, 2020
Robert Bosch GmbH
Jochen Reinmuth
G01 - MEASURING TESTING
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Patent Grant
Acceleration event detection and differential sensory devices and m...
Patent number
10,775,403
Issue date
Sep 15, 2020
Omnitek Partners LLC
Jahangir S Rastegar
F42 - AMMUNITION BLASTING
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Patent Grant
Micromechanical spring for a sensor element
Patent number
10,739,373
Issue date
Aug 11, 2020
Robert Bosch GmbH
Monika Koster
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Capacitive microelectromechanical device and method for forming a c...
Patent number
10,684,306
Issue date
Jun 16, 2020
Infineon Technologies AG
Steffen Bieselt
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
Physical quantity detector, physical quantity detection device, ele...
Patent number
10,677,813
Issue date
Jun 9, 2020
Seiko Epson Corporation
Kenta Sato
G01 - MEASURING TESTING
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System and method for pulse-width modulation using an adjustable co...
Patent number
10,673,368
Issue date
Jun 2, 2020
The Boeing Company
Douglas C. Cameron
G01 - MEASURING TESTING
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Out-of plane-accelerometer
Patent number
10,598,689
Issue date
Mar 24, 2020
SAFRAN COLIBRYS SA
Pascal Zwahlen
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Very low power microelectromechanical devices for the internet of e...
Patent number
10,580,605
Issue date
Mar 3, 2020
University of Utah Research Foundation
Massood Tabib-Azar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Optical sensor device, sensor apparatus and cable
Patent number
10,551,255
Issue date
Feb 4, 2020
Fugro Technology B.V.
Martijn Matthijssen
G01 - MEASURING TESTING
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Patent Grant
Dynamic self-calibration of an accelerometer system
Patent number
10,495,664
Issue date
Dec 3, 2019
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
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Accelerometer
Patent number
10,401,378
Issue date
Sep 3, 2019
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
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Acceleration sensor
Patent number
10,191,078
Issue date
Jan 29, 2019
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Atsuhiro Fujii
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Reducing bias in an accelerometer via a pole piece
Patent number
10,161,956
Issue date
Dec 25, 2018
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
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Dynamic self-calibration of an accelerometer system
Patent number
10,126,324
Issue date
Nov 13, 2018
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
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Resonant sensor
Patent number
9,952,250
Issue date
Apr 24, 2018
Yokogawa Electric Corporation
Yusaku Yoshida
G01 - MEASURING TESTING
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Acceleration sensor
Patent number
9,753,057
Issue date
Sep 5, 2017
Murata Manufacturing Co., Ltd.
Takuo Hada
G01 - MEASURING TESTING
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Patent Grant
Dynamic self-calibration of an accelerometer system
Patent number
9,702,897
Issue date
Jul 11, 2017
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
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Reducing hysteresis effects in accelerometer
Patent number
9,658,244
Issue date
May 23, 2017
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
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Patent Grant
Electromechanical device including a suspended structure and method...
Patent number
9,650,237
Issue date
May 16, 2017
Agency for Science, Technology and Research
Ilker E. Ocak
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
Range-dependent bias calibration of an accelerometer sensor system
Patent number
9,612,256
Issue date
Apr 4, 2017
Northrop Grumman Guidance and Electronics Company, Inc.
Michael D. Bulatowicz
G01 - MEASURING TESTING
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Patent Grant
Range-dependent bias calibration of an accelerometer sensor system
Patent number
9,612,255
Issue date
Apr 4, 2017
Northrop Grumman Guidance and Electronic Company, Inc.
Michael D. Bulatowicz
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Capacitive micromechanical acceleration sensor
Patent number
9,575,088
Issue date
Feb 21, 2017
Murata Manufacturing Co., Ltd.
Matti Liukku
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CAPACITIVE MICROELECTROMECHANICAL DEVICE AND METHOD FOR FORMING A C...
Publication number
20220326275
Publication date
Oct 13, 2022
INFINEON TECHNOLOGIES AG
Thoralf KAUTZSCH
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
CAPACITIVE MICROELECTROMECHANICAL DEVICE AND METHOD FOR FORMING A C...
Publication number
20200300886
Publication date
Sep 24, 2020
INFINEON TECHNOLOGIES AG
Thoralf KAUTZSCH
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
FIBER-OPTIC ACCELERATION SENSOR HAVING LEVER ARM
Publication number
20200233008
Publication date
Jul 23, 2020
fos4X GmbH
Sascha KIENITZ
G01 - MEASURING TESTING
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Patent Application
RESONANT SENSOR DEVICE
Publication number
20200166538
Publication date
May 28, 2020
YOKOGAWA ELECTRIC CORPORATION
Shigeto IWAI
G01 - MEASURING TESTING
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Patent Application
INERTIAL SENSOR WITH SUSPENSION SPRING STRUCTURE SURROUNDING ANCHOR
Publication number
20200132713
Publication date
Apr 30, 2020
NXP USA, Inc.
Andrew C. McNeil
G01 - MEASURING TESTING
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Patent Application
SYSTEM AND METHOD FOR PULSE-WIDTH MODULATION USING AN ADJUSTABLE CO...
Publication number
20190294200
Publication date
Sep 26, 2019
The Boeing Company
Douglas C. Cameron
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20190049485
Publication date
Feb 14, 2019
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
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Patent Application
SMART ACCELEROMETER CANTILEVER
Publication number
20190004083
Publication date
Jan 3, 2019
Intell IP Corporation
Sonja Koller
G01 - MEASURING TESTING
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Patent Application
MEMS PENDULUM ACCELEROMETER HAVING TWO MEASUREMENT RANGES
Publication number
20180335445
Publication date
Nov 22, 2018
SAFRAN ELECTRONICS & DEFENSE
Vincent RAGOT
G01 - MEASURING TESTING
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Patent Application
PHYSICAL QUANTITY DETECTOR, PHYSICAL QUANTITY DETECTION DEVICE, ELE...
Publication number
20180267078
Publication date
Sep 20, 2018
SEIKO EPSON CORPORATION
Kenta SATO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR DEVICE, SENSOR APPARATUS AND CABLE
Publication number
20180149532
Publication date
May 31, 2018
FUGRO TECHNOLOGY B.V.
Martijn MATTHIJSSEN
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20170269122
Publication date
Sep 21, 2017
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
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Patent Application
ACCELEROMETER
Publication number
20140290364
Publication date
Oct 2, 2014
Oren Levy
G01 - MEASURING TESTING
Information
Patent Application
RANGE-DEPENDENT BIAS CALIBRATION OF AN ACCELEROMETER SENSOR SYSTEM
Publication number
20140236522
Publication date
Aug 21, 2014
NORTHROP GRUMMAN SYSTEMS CORPORATION
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
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Patent Application
RANGE-DEPENDENT BIAS CALIBRATION OF AN ACCELEROMETER SENSOR SYSTEM
Publication number
20140230520
Publication date
Aug 21, 2014
Michael D. BULATOWICZ
G01 - MEASURING TESTING
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Patent Application
RESONANT SENSOR WITH ASYMMETRIC GAPPED CANTILEVERS
Publication number
20140183669
Publication date
Jul 3, 2014
Wayne State University
Yong Xu
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
PHYSICAL QUANTITY DETECTING DEVICE, ELECTRONIC APPARATUS, AND MOVIN...
Publication number
20140123754
Publication date
May 8, 2014
SEIKO EPSON CORPORATION
Jun WATANABE
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC SELF-CALIBRATION OF AN ACCELEROMETER SYSTEM
Publication number
20140096587
Publication date
Apr 10, 2014
Northrop Grumman Systems Corporation
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Application
TRI-AXIAL MEMS INERTIAL SENSOR
Publication number
20140090468
Publication date
Apr 3, 2014
ADVANCED NUMICRO SYSTEMS, INC.
Yee-Chung Fu
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
ACCELERATION SENSOR
Publication number
20130340527
Publication date
Dec 26, 2013
Murata Manufacturing Co., Ltd.
Takahiro KONISHI
G01 - MEASURING TESTING
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Patent Application
METHOD AND APPARATUS FOR SENSING UNDERWATER SIGNALS
Publication number
20130319118
Publication date
Dec 5, 2013
ION Geophysical Corporation
Ken Kan Deng
G01 - MEASURING TESTING
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Patent Application
METHOD AND APPARATUS FOR SENSING UNDERWATER SIGNALS
Publication number
20130312522
Publication date
Nov 28, 2013
ION Geophysical Corporation
Ken Kan Deng
G01 - MEASURING TESTING
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Patent Application
METHOD FOR MANUFACTURING MEMS DEVICE
Publication number
20130309797
Publication date
Nov 21, 2013
Lexvu Opto Microelectronics Technology (Shanghai) Ltd
Jianhong Mao
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
PHYSICAL QUANTITY DETECTION DEVICE, PHYSICAL QUANTITY DETECTOR, ELE...
Publication number
20130263661
Publication date
Oct 10, 2013
SEIKO EPSON CORPORATION
Jun WATANABE
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
Thin Plate Vibration Device and a Method of Producing the Same
Publication number
20130241351
Publication date
Sep 19, 2013
NGK Insulators, Ltd.
Jungo Kondo
G01 - MEASURING TESTING
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Patent Application
PHYSICAL QUANTITY DETECTION DEVICE, PHYSICAL QUANTITY DETECTOR, AND...
Publication number
20130112019
Publication date
May 9, 2013
SEIKO EPSON CORPORATION
Jun WATANABE
G01 - MEASURING TESTING
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Patent Application
PHYSICAL QUANTITY DETECTION DEVICE, PHYSICAL QUANTITY DETECTOR, AND...
Publication number
20130104677
Publication date
May 2, 2013
SEIKO EPSON CORPORATION
Jun WATANABE
G01 - MEASURING TESTING
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Patent Application
ELECTROSTATICALLY COUPLED PRESSURE SENSOR
Publication number
20130042695
Publication date
Feb 21, 2013
FREDERICK JAMES BARR
G01 - MEASURING TESTING
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Patent Application
FERROELECTRIC DEVICE
Publication number
20130032906
Publication date
Feb 7, 2013
PANASONIC CORPORATION
Junya Ogawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
METHOD FOR MANUFACTURING PHYSICAL QUANTITY DETECTOR, AND PHYSICAL Q...
Publication number
20120304769
Publication date
Dec 6, 2012
SEIKO EPSON CORPORATION
Jun WATANABE
G01 - MEASURING TESTING