Membership
Tour
Register
Log in
the mass constituting a pendulum having the pivot axis disposed symmetrically between the longitudinal ends, the center of mass being shifted away from the plane of the pendulum which includes the pivot axis
Follow
Industry
CPC
G01P2015/0834
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
Current Industry
G01P2015/0834
the mass constituting a pendulum having the pivot axis disposed symmetrically between the longitudinal ends, the center of mass being shifted away from the plane of the pendulum which includes the pivot axis
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Accelerometric sensor in mems technology having high accuracy and l...
Patent number
11,408,904
Issue date
Aug 9, 2022
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Single axis accelerometer with inertial threshold
Patent number
10,900,993
Issue date
Jan 26, 2021
MECHOPTIX, INC.
Joseph McGinty
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical sensor and method for manufacturing a micromechanic...
Patent number
10,900,996
Issue date
Jan 26, 2021
Robert Bosch GmbH
Antoine Puygranier
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical sensor and method for producing a micromechanical s...
Patent number
10,294,095
Issue date
May 21, 2019
Robert Bosch GmbH
Benny Pekka Herzogenrath
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Acceleration sensor
Patent number
9,995,762
Issue date
Jun 12, 2018
Hitachi Automotive Systems, Ltd.
Masahide Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device
Patent number
9,550,663
Issue date
Jan 24, 2017
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Kazuo Goda
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS parameter identification using modulated waveforms
Patent number
9,475,689
Issue date
Oct 25, 2016
FREESCALE SEMICONDUCTOR, INC.
Raimondo P. Sessego
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Teeter totter accelerometer with unbalanced mass
Patent number
9,470,709
Issue date
Oct 18, 2016
Analog Devices, Inc.
Jianglong Zhang
G01 - MEASURING TESTING
Information
Patent Grant
MEMS parameter identification using modulated waveforms
Patent number
9,335,340
Issue date
May 10, 2016
FREESCALE SEMICONDUCTOR, INC.
Raimondo P. Sessego
G01 - MEASURING TESTING
Information
Patent Grant
Tilt mode accelerometer with improved offset and noise performance
Patent number
9,297,825
Issue date
Mar 29, 2016
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer systems and methods
Patent number
9,229,026
Issue date
Jan 5, 2016
Northrop Grumman Guaidance and Electronics Company, Inc.
Robert E. Stewart
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device with enhanced resistance to stiction
Patent number
8,555,720
Issue date
Oct 15, 2013
FREESCALE SEMICONDUCTOR, INC.
Peter S. Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer
Patent number
8,136,400
Issue date
Mar 20, 2012
Physical Logic AG
Noel Axelrod
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical capacitive acceleration sensor
Patent number
7,343,801
Issue date
Mar 18, 2008
Conti Temic microelectronic GmbH
Konrad Kapser
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical tilt sensor
Patent number
5,148,604
Issue date
Sep 22, 1992
Robert Bosch GmbH
Frank Bantien
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Single Axis Accelerometer with Inertial Threshold
Publication number
20200241034
Publication date
Jul 30, 2020
MechOptix, Inc.
Joseph McGinty
G01 - MEASURING TESTING
Information
Patent Application
Acceleration Sensor
Publication number
20170138981
Publication date
May 18, 2017
Hitachi Automotive Systems, Ltd.
Masahide HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Tilt Mode Accelerometer with improved Offset and Noise Performance
Publication number
20140251011
Publication date
Sep 11, 2014
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Application
Teeter Totter Accelerometer with Unbalanced Mass
Publication number
20140208849
Publication date
Jul 31, 2014
Analog Devices, Inc.
Jianglong Zhang
G01 - MEASURING TESTING
Information
Patent Application
MEMS ACCELERATION SENSOR
Publication number
20130167641
Publication date
Jul 4, 2013
Maxim Integrated Products, Inc.
Martin Heller
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE WITH THROUGH-ELECTRODE AND METHOD FOR PRODUCING SAME
Publication number
20130168141
Publication date
Jul 4, 2013
PANASONIC CORPORATION
Junichi Hozumi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETER SYSTEMS AND METHODS
Publication number
20120265481
Publication date
Oct 18, 2012
ROBERT E. STEWART
G01 - MEASURING TESTING
Information
Patent Application
MEMS Device With Enhanced Resistance to Stiction
Publication number
20120216616
Publication date
Aug 30, 2012
FREESCALE SEMICONDUCTOR, INC.
Peter S. Schultz
G01 - MEASURING TESTING
Information
Patent Application
Accelerometer
Publication number
20090139331
Publication date
Jun 4, 2009
Physical Logic AG
Noel Axelrod
G01 - MEASURING TESTING
Information
Patent Application
Micromechanical capacitive acceleration sensor
Publication number
20060156818
Publication date
Jul 20, 2006
Konrad Kapser
G01 - MEASURING TESTING
Information
Patent Application
Multiaxial monolithic acceleration sensor
Publication number
20060021436
Publication date
Feb 2, 2006
Konrad Kapser
G01 - MEASURING TESTING