US Classification
374
Information
Patent Grant
SC2N
Dominique Le Bouquin
G01 - MEASURING TESTING
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Patent Grant
ABB Research Ltd.
Vinoth Sundaramoorthy
G01 - MEASURING TESTING
Information
Patent Grant
Purdue Research Foundation
Dimitrios Peroulis
G01 - MEASURING TESTING
Information
Patent Grant
Seiko Epson Corporation
Shinsuke Fujikawa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Taiwan Semiconductor Manufacturing Company, Ltd.
Mei-Chen Chuang
G01 - MEASURING TESTING
Information
Patent Grant
Heatflow Technologies Inc.
Warren L. Dinges
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
ANHARMONIC B.V.
Antonius Johannes Maria Montagne
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Nissan North America, Inc.
Greg Szleszynski
G01 - MEASURING TESTING
Information
Patent Grant
General Electric Company
Anthony Wayne Krull
F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
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Patent Grant
Toyota Jidosha Kabushiki Kaisha
Teruhiko Miyake
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information
Patent Grant
Hitachi High-Tech Science Corporation
Kanji Nagasawa
G01 - MEASURING TESTING
Information
Patent Grant
Nike, Inc.
Jeremy Snyder
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Rolls-Royce PLC
Bikramjit Bhangu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
United States of America as represented by the Administrator of the National...
Asia N. Quince
G01 - MEASURING TESTING
Information
Patent Grant
Danfoss A/S
Lars Finn Sloth Larsen
G05 - CONTROLLING REGULATING
Information
Patent Grant
Global Energy Innovations, Inc.
John McHardy
G01 - MEASURING TESTING
Information
Patent Grant
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Haykel Ben Jamaa
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Grant
Janesko Oy
Esko Kamrat
G01 - MEASURING TESTING
Information
Patent Grant
Hynix Semiconductor Inc.
Chun-Seok Jeong
G01 - MEASURING TESTING
Information
Patent Grant
Intel Corporation
Nachiket R. Raravikar
B82 - NANO-TECHNOLOGY
Information
Patent Grant
EPCOS AG
Oliver Bard
G01 - MEASURING TESTING
Information
Patent Grant
Carl Zeiss Microscopy, LLC
Richard Comunale
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The Boeing Company
Michael M. Ladd
G01 - MEASURING TESTING
Information
Patent Grant
BAE Systems Hagglunds Aktiebolag
Peder Sjölund
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Tokyo Electron Limited
Jun Yamawaku
G01 - MEASURING TESTING
Information
Patent Grant
PRC DeSoto International, Inc
Noel R. Vanier
B82 - NANO-TECHNOLOGY
Information
Patent Grant
SiTime Corporation
Carl Arft
G01 - MEASURING TESTING
Information
Patent Grant
SCREEN Holdings Co., Ltd.
Toru Kuroiwa
G01 - MEASURING TESTING
Information
Patent Grant
Tokyo Electron Limited
Tatsuo Matsudo
G01 - MEASURING TESTING
Information
Patent Grant
Ford Global Technologies, LLC
Robert Roy Jentz
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Application
BAKER HUGHES INCORPORATED
William Johnston
G01 - MEASURING TESTING
Information
Patent Application
FINETEK CO., LTD.
Chien-Lung Huang
G01 - MEASURING TESTING
Information
Patent Application
King Abdullah University of Science and Technology
Jesus Alfonso Caraveo Frescas
G01 - MEASURING TESTING
Information
Patent Application
ABBOTT CARDIOVASCULAR SYSTEMS INC.
Abigail Freeman
G01 - MEASURING TESTING
Information
Patent Application
Wistron Corporation
Yu-Tzu Zhu
G01 - MEASURING TESTING
Information
Patent Application
Council of Scientific and Industrial Research
Amol Arvind Kulkarni
G01 - MEASURING TESTING
Information
Patent Application
Christopher D. Prest
G01 - MEASURING TESTING
Information
Patent Application
KINSA, INC.
Edo Segal
G01 - MEASURING TESTING
Information
Patent Application
Jeong Hoon Lee
B60 - VEHICLES IN GENERAL
Information
Patent Application
Mark A. Rhodes
G01 - MEASURING TESTING
Information
Patent Application
STMicroelectronics S.r.l.
Alberto Pagani
G01 - MEASURING TESTING
Information
Patent Application
Jin Seong Park
C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
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Patent Application
Hyundai Motor Company
Hyung-Ki Kim
G01 - MEASURING TESTING
Information
Patent Application
Canara, Inc.
Brian Hanking
G01 - MEASURING TESTING
Information
Patent Application
AKER SUBSEA LIMITED
Philip Michael Bagley
G01 - MEASURING TESTING
Information
Patent Application
Siemens Aktiengesellschaft
Peter Krause
G01 - MEASURING TESTING
Information
Patent Application
LSIS CO., LTD
Woo Jin PARK
G01 - MEASURING TESTING
Information
Patent Application
Katherine O'Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Progress Rail Services Corporation
Alessandro Agostini
G01 - MEASURING TESTING
Information
Patent Application
SEIKO EPSON CORPORATION
Takayuki YONEMURA
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Wolfgang R. ADERHOLD
G01 - MEASURING TESTING
Information
Patent Application
Jennifer SUN
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
MITUTOYO CORPORATION
Hisayoshi SAKAI
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Kim VELLORE
G01 - MEASURING TESTING
Information
Patent Application
CCPI INC.
Gary W. Hallum
G01 - MEASURING TESTING
Information
Patent Application
King Abdullah University of Science and Technology
Robin Chrystie
G01 - MEASURING TESTING
Information
Patent Application
STONERIDGE CONTROL DEVICES, INC.
Kayvan Hedayat
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
RTL Materials Limited
Andrew James DATON-LOVETT
G02 - OPTICS
Information
Patent Application
Honeywell International Inc.
Girija Parthasarathy
G01 - MEASURING TESTING
