TREA

through a gas permeable barrier (membranes, porous layers)

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  • CPC
  • G01N30/722
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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange

Current Industry

G01N30/722through a gas permeable barrier (membranes, porous layers)
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Gas analyzer and membranes therefor
    • Patent number 11,569,079
    • Issue date Jan 31, 2023
    • Inficon, Inc.
    • Shawn M. Briglin
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Portable electronic system for the analysis of time-variable gaseou...
    • Patent number 10,697,944
    • Issue date Jun 30, 2020
    • Nanotech Analysis S.R.L.
    • Gianpiero Mensa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Detection apparatus and detection method
    • Patent number 10,539,531
    • Issue date Jan 21, 2020
    • Nuctech Company Limited
    • Qingjun Zhang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Detection apparatus and detection method
    • Patent number 10,429,348
    • Issue date Oct 1, 2019
    • Nuctech Company Limited
    • Qingjun Zhang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Detection apparatus and detection method
    • Patent number 10,281,432
    • Issue date May 7, 2019
    • Nuctech Company Limited
    • Qingjun Zhang
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Analytical instruments, assemblies, and methods
    • Patent number 9,347,920
    • Issue date May 24, 2016
    • FLIR Detection, Inc.
    • Dennis Barket
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analytical instruments, assemblies, and methods
    • Patent number 8,952,321
    • Issue date Feb 10, 2015
    • FLIR Detection, Inc.
    • Dennis Barket
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Calibration of mass spectrometry systems
    • Patent number 8,648,293
    • Issue date Feb 11, 2014
    • Agilent Technologies, Inc.
    • Raffaele Correale
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas sampling device and gas analyzer employing the same
    • Patent number 8,586,915
    • Issue date Nov 19, 2013
    • Agilent Technologies, Inc.
    • Raffaele Correale
    • G01 - MEASURING TESTING
  • Information Patent Grant

    GC-MS analysis apparatus
    • Patent number 8,237,116
    • Issue date Aug 7, 2012
    • Agilent Technologies, Inc.
    • Raffaele Correale
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Analyzer constituted by gas chromatograph combined with inductively...
    • Patent number 8,222,596
    • Issue date Jul 17, 2012
    • National Institue of Advanced Industrial Science and Technology
    • Hiroaki Tao
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Miniaturized mass spectrometer system
    • Patent number 5,313,061
    • Issue date May 17, 1994
    • Viking Instrument
    • Russell C. Drew
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    3811319
    • Patent number 3,811,319
    • Issue date May 21, 1974
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    3751880
    • Patent number 3,751,880
    • Issue date Aug 14, 1973
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    3712111
    • Patent number 3,712,111
    • Issue date Jan 23, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3662520
    • Patent number 3,662,520
    • Issue date May 16, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3471692
    • Patent number 3,471,692
    • Issue date Oct 7, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3455092
    • Patent number 3,455,092
    • Issue date Jul 15, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3430417
    • Patent number 3,430,417
    • Issue date Mar 4, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3429105
    • Patent number 3,429,105
    • Issue date Feb 25, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3421292
    • Patent number 3,421,292
    • Issue date Jan 14, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3400514
    • Patent number 3,400,514
    • Issue date Sep 10, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3398505
    • Patent number 3,398,505
    • Issue date Aug 27, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3291980
    • Patent number 3,291,980
    • Issue date Dec 13, 1966
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents