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G01N2021/4721

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/4721using a PSD

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Patents Grantslast 30 patents

Information Patent Grant
Thermal compensation
- Patent number 11,187,639
- Issue date Nov 30, 2021
- Malvern Panalytical Limited
- Rhys Poolman
- G01 - MEASURING TESTING
Information Patent Grant
Thermal compensation
- Patent number 10,422,734
- Issue date Sep 24, 2019
- MALVERN PANALYTICAL LIMITED
- Rhys Poolman
- G01 - MEASURING TESTING
Information Patent Grant
Devices, systems and methods for detecting particles
- Patent number 10,018,551
- Issue date Jul 10, 2018
- Research Triangle Institute
- Howard Jerome Walls
- G01 - MEASURING TESTING
Information Patent Grant
Devices, systems and methods for detecting particles
- Patent number 9,915,600
- Issue date Mar 13, 2018
- Research Triangle Institute
- Howard Jerome Walls
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting the depth of the surface of cyl...
- Patent number 5,426,309
- Issue date Jun 20, 1995
- British Nuclear Fuels plc
- Iain S. Davidson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analysis of particulate material, analytical method f...
- Patent number 5,316,983
- Issue date May 31, 1994
- Hitachi, Ltd.
- Haruo Fujimori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting foreign particles on a surface of a reticle...
- Patent number 4,999,510
- Issue date Mar 12, 1991
- Nikon Corporation
- Fuminori Hayano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Particle size measuring system with coincidence detection
- Patent number 4,984,889
- Issue date Jan 15, 1991
- Pacific Scientific Company
- Holger T. Sommer
- G01 - MEASURING TESTING
Information Patent Grant
Optical granulometry process and devices for broad measuring ranges
- Patent number 4,929,079
- Issue date May 29, 1990
- Office Natioanl D'Etudes Et De Recherches Aerospatiales styled O.N.E.R.A
- Andre Delfour
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus with four light detectors for checking surface of mask wi...
- Patent number 4,889,998
- Issue date Dec 26, 1989
- Nikon Corporation
- Fuminori Hayano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of and apparatus for detecting foreign substances
- Patent number 4,740,079
- Issue date Apr 26, 1988
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Optical scatterometer having improved sensitivity and bandwidth
- Patent number 4,710,642
- Issue date Dec 1, 1987
- John R. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
In situ small particle diagnostics
- Patent number 4,679,939
- Issue date Jul 14, 1987
- The United States of America as represented by the Secretary of the Air Firce
- Bill P. Curry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICES, SYSTEMS AND METHODS FOR DETECTING PARTICLES
- Publication number 20180149578
- Publication date May 31, 2018
- Research Triangle Institute
- Howard Jerome Walls
- G01 - MEASURING TESTING
Information Patent Application
THERMAL COMPENSATION
- Publication number 20180038782
- Publication date Feb 8, 2018
- Malvern Instruments Limited
- Rhys POOLMAN
- G01 - MEASURING TESTING

using a PSD

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Thermal compensation

Thermal compensation

Devices, systems and methods for detecting particles

Devices, systems and methods for detecting particles

Method and apparatus for inspecting the depth of the surface of cyl...

Apparatus for analysis of particulate material, analytical method f...

Apparatus for detecting foreign particles on a surface of a reticle...

Particle size measuring system with coincidence detection

Optical granulometry process and devices for broad measuring ranges

Apparatus with four light detectors for checking surface of mask wi...

Method of and apparatus for detecting foreign substances

Optical scatterometer having improved sensitivity and bandwidth

In situ small particle diagnostics

Patents Applicationslast 30 patents

DEVICES, SYSTEMS AND METHODS FOR DETECTING PARTICLES

THERMAL COMPENSATION