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G01N2021/4721
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/4721
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Patents Grants
last 30 patents
Information
Patent Grant
Thermal compensation
Patent number
11,187,639
Issue date
Nov 30, 2021
Malvern Panalytical Limited
Rhys Poolman
G01 - MEASURING TESTING
Information
Patent Grant
Thermal compensation
Patent number
10,422,734
Issue date
Sep 24, 2019
MALVERN PANALYTICAL LIMITED
Rhys Poolman
G01 - MEASURING TESTING
Information
Patent Grant
Devices, systems and methods for detecting particles
Patent number
10,018,551
Issue date
Jul 10, 2018
Research Triangle Institute
Howard Jerome Walls
G01 - MEASURING TESTING
Information
Patent Grant
Devices, systems and methods for detecting particles
Patent number
9,915,600
Issue date
Mar 13, 2018
Research Triangle Institute
Howard Jerome Walls
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting the depth of the surface of cyl...
Patent number
5,426,309
Issue date
Jun 20, 1995
British Nuclear Fuels plc
Iain S. Davidson
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for analysis of particulate material, analytical method f...
Patent number
5,316,983
Issue date
May 31, 1994
Hitachi, Ltd.
Haruo Fujimori
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for detecting foreign particles on a surface of a reticle...
Patent number
4,999,510
Issue date
Mar 12, 1991
Nikon Corporation
Fuminori Hayano
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Particle size measuring system with coincidence detection
Patent number
4,984,889
Issue date
Jan 15, 1991
Pacific Scientific Company
Holger T. Sommer
G01 - MEASURING TESTING
Information
Patent Grant
Optical granulometry process and devices for broad measuring ranges
Patent number
4,929,079
Issue date
May 29, 1990
Office Natioanl D'Etudes Et De Recherches Aerospatiales styled O.N.E.R.A
Andre Delfour
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus with four light detectors for checking surface of mask wi...
Patent number
4,889,998
Issue date
Dec 26, 1989
Nikon Corporation
Fuminori Hayano
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of and apparatus for detecting foreign substances
Patent number
4,740,079
Issue date
Apr 26, 1988
Hitachi, Ltd.
Mitsuyoshi Koizumi
G01 - MEASURING TESTING
Information
Patent Grant
Optical scatterometer having improved sensitivity and bandwidth
Patent number
4,710,642
Issue date
Dec 1, 1987
John R. McNeil
G01 - MEASURING TESTING
Information
Patent Grant
In situ small particle diagnostics
Patent number
4,679,939
Issue date
Jul 14, 1987
The United States of America as represented by the Secretary of the Air Firce
Bill P. Curry
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICES, SYSTEMS AND METHODS FOR DETECTING PARTICLES
Publication number
20180149578
Publication date
May 31, 2018
Research Triangle Institute
Howard Jerome Walls
G01 - MEASURING TESTING
Information
Patent Application
THERMAL COMPENSATION
Publication number
20180038782
Publication date
Feb 8, 2018
Malvern Instruments Limited
Rhys POOLMAN
G01 - MEASURING TESTING