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G01K11/125

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GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K11/00Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00

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G01K11/125using change in reflectance

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and temperature measurement method
- Patent number 12,163,845
- Issue date Dec 10, 2024
- Fuji Electric Co., Ltd.
- Shinichi Masuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical sensor and physical quantity measurement device
- Patent number 12,104,933
- Issue date Oct 1, 2024
- Nagano Keiki Co., Ltd.
- Ayumu Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Substrate positioning device with remote temperature sensor
- Patent number 12,051,607
- Issue date Jul 30, 2024
- ASML Netherlands B.V.
- Patriek Adrianus Alphonsus Maria Bruurs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting processing apparatus
- Patent number 11,817,335
- Issue date Nov 14, 2023
- Tokyo Electron Limited
- Kippei Sugita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature measurement system and temperature measurement method
- Patent number 11,668,608
- Issue date Jun 6, 2023
- Tokyo Electron Limited
- Tong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal property probe
- Patent number 10,718,673
- Issue date Jul 21, 2020
- Utah State University
- Austin Fleming
- G01 - MEASURING TESTING
Information Patent Grant
Generative production device comprising a measuring device
- Patent number 10,695,983
- Issue date Jun 30, 2020
- APWORKS GmbH
- Franz Engel
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Metamaterial device and method of making the same
- Patent number 10,670,772
- Issue date Jun 2, 2020
- Purdue Research Foundation
- Urcan Guler
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal imaging with optical emissions from a...
- Patent number 10,670,475
- Issue date Jun 2, 2020
- MICROSANJ, LLC
- Dustin Kendig
- G01 - MEASURING TESTING
Information Patent Grant
Battery thermal run-away and combustion prevention system
- Patent number 10,665,909
- Issue date May 26, 2020
- International Business Machines Corporation
- Eric Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing system having optical temperature measurement subsystem
- Patent number 10,656,029
- Issue date May 19, 2020
- Applied Materials, Inc.
- Alvaro Garcia de Gorordo
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact temperature measurement by dual-wavelength shift in Bre...
- Patent number 10,458,861
- Issue date Oct 29, 2019
- Applied Materials, Inc.
- Theodore P. Moffitt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring temperatures of batteries
- Patent number 10,352,777
- Issue date Jul 16, 2019
- The Boeing Company
- Gary E. Georgeson
- G01 - MEASURING TESTING
Information Patent Grant
Honeycomb sandwich structure and method of manufacturing honeycomb...
- Patent number 10,161,810
- Issue date Dec 25, 2018
- Mitsubishi Electric Corporation
- Kazushi Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Temperature distribution measuring apparatus and method
- Patent number 10,139,284
- Issue date Nov 27, 2018
- Korea Basic Science Institute
- Ki Soo Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical temperature sensor and method for manufacturing optical tem...
- Patent number 10,139,290
- Issue date Nov 27, 2018
- Tokyo Electron Limited
- Takari Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic witness for thermal mapping and certification of heat bla...
- Patent number 10,101,287
- Issue date Oct 16, 2018
- The Boeing Company
- Jason A. Degaetano
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Temperature measuring method, substrate processing system and compo...
- Patent number 9,952,032
- Issue date Apr 24, 2018
- Tokyo Electron Limited
- Chishio Koshimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for measuring temperature distribution
- Patent number 9,816,868
- Issue date Nov 14, 2017
- Korea Basic Science Institute
- Ki Soo Chang
- G01 - MEASURING TESTING
Information Patent Grant
Fiber-optic sensor for strain-insensitive temperature measurements
- Patent number 9,677,949
- Issue date Jun 13, 2017
- Nutech Ventures
- Ming Han
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-responsive photonic crystal device
- Patent number 9,599,515
- Issue date Mar 21, 2017
- Opalux Incorporated
- Andre Arsenault
- G01 - MEASURING TESTING
Information Patent Grant
Probe sensor capable of measurement for temperature with stimulus
- Patent number 9,464,945
- Issue date Oct 11, 2016
- Korea Institute of Science and Technology
- Jin Seok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement apparatus and method
- Patent number 9,304,050
- Issue date Apr 5, 2016
- Tokyo Electron Limited
- Jun Abe
- G01 - MEASURING TESTING
Information Patent Grant
Pyrometer process temperature measurement for high power light sources
- Patent number 9,261,406
- Issue date Feb 16, 2016
- nLight Photonics Corporation
- R. Kirk Price
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method of making
- Patent number 9,064,798
- Issue date Jun 23, 2015
- University of Central Florida
- Nathaniel R. Quick
- G01 - MEASURING TESTING
Information Patent Grant
Plasma processing apparatus and temperature measuring method
- Patent number 9,022,645
- Issue date May 5, 2015
- Tokyo Electron Limited
- Tatsuo Matsudo
- G01 - MEASURING TESTING
Information Patent Grant
Light interference system and substrate processing apparatus
- Patent number 8,941,843
- Issue date Jan 27, 2015
- Tokyo Electron Limited
- Kenji Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Surface temperature measurement using hematite coating
- Patent number 8,936,395
- Issue date Jan 20, 2015
- The United States of America as Represented by the Administrator of National...
- Timothy J Bencic
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method of making
- Patent number 8,912,549
- Issue date Dec 16, 2014
- University of Central Florida
- Nathaniel R. Quick
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for gas measurements in a combustion chamber
- Patent number 8,873,053
- Issue date Oct 28, 2014
- Vattenfall AB
- Shahriar Badiei
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR MEASURING THE TEMPERATURE OF A SU...
- Publication number 20240377263
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tz-Shian CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS AND SEMICONDUCTOR DEVICE MANU...
- Publication number 20240264009
- Publication date Aug 8, 2024
- KIOXIA Corporation
- Ai FURUBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF MEASURING THERMAL PROPERTIES, AND RELATED APPARATUSES
- Publication number 20240151594
- Publication date May 9, 2024
- Battelle Energy Alliance, LLC
- Cody A. Dennett
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING THE SURFACE TEMPERATURE OF AN OB...
- Publication number 20240110837
- Publication date Apr 4, 2024
- California Institute of Technology
- Axel SCHERER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING HEATING AT A CONNECTOR BETWEEN ELEC...
- Publication number 20240060830
- Publication date Feb 22, 2024
- WIN MS
- Laurent Sommervogel
- G01 - MEASURING TESTING
Information Patent Application
GLASS-CERAMIC THERMAL PAINT SYSTEM AND METHOD USING UV:VIS SPECTROS...
- Publication number 20230365818
- Publication date Nov 16, 2023
- University of Rhode Island Board of Trustees
- Noah Burke
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
TEMPERATURE MEASUREMENT METHOD, SEMICONDUCTOR SUBSTRATE, AND SEMICO...
- Publication number 20230298948
- Publication date Sep 21, 2023
- KIOXIA Corporation
- Naoki KOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONFIGURABLE THERMAL TESTING SYSTEM AND METHOD
- Publication number 20230184595
- Publication date Jun 15, 2023
- Raytheon Company
- Adam C. Wood
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR MEASURING THE TEMPERATURE OF A SU...
- Publication number 20230060543
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tz-Shian CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD FOR P...
- Publication number 20230007961
- Publication date Jan 12, 2023
- RADIANT INNOVATION INC.
- YUNG-CHANG CHANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR AND PHYSICAL QUANTITY MEASUREMENT DEVICE
- Publication number 20220357185
- Publication date Nov 10, 2022
- NAGANO KEIKI CO., LTD.
- Ayumu Sakamoto
- G01 - MEASURING TESTING
Information Patent Application
USE OF A SPIN TRANSITION MATERIAL TO MEASURE AND/OR LIMIT THE TEMPE...
- Publication number 20220341792
- Publication date Oct 27, 2022
- Centre National de la Recherche Scientifique
- Azzedine BOUSSEKSOU
- G01 - MEASURING TESTING
Information Patent Application
ACTIVATABLE WARMING INDICATOR WITHOUT DYE
- Publication number 20220283041
- Publication date Sep 8, 2022
- Temptime Corporation
- John Olson
- B32 - LAYERED PRODUCTS
Information Patent Application
SEMICONDUCTOR DEVICE AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20220244111
- Publication date Aug 4, 2022
- Fuji Electric Co., Ltd.
- Shinichi MASUDA
- G02 - OPTICS
Information Patent Application
SUBSTRATE POSITIONING DEVICE WITH REMOTE TEMPERATURE SENSOR
- Publication number 20210272829
- Publication date Sep 2, 2021
- ASML NETHERLANDS B.V.
- Patriek Adrianus Alphonsus Maria BRUURS
- G01 - MEASURING TESTING
Information Patent Application
SMART LABEL ARCHITECTURE WITH ORGANIC LEDS
- Publication number 20200209162
- Publication date Jul 2, 2020
- Marco De Angeli
- G01 - MEASURING TESTING
Information Patent Application
THERMOCHROMIC CONTAINER FOR ELECTROMAGNETIC RADIATION PROTECTION
- Publication number 20190064241
- Publication date Feb 28, 2019
- Labcon, North America
- Thomas Moulton
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
BATTERY THERMAL RUN-AWAY AND COMBUSTION PREVENTION SYSTEM
- Publication number 20190020077
- Publication date Jan 17, 2019
- International Business Machines Corporation
- Eric Campbell
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
BATTERY THERMAL RUN-AWAY AND COMBUSTION PREVENTION SYSTEM
- Publication number 20190020076
- Publication date Jan 17, 2019
- International Business Machines Corporation
- Eric Campbell
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEMPERATURE MEASURING METHOD, SUBSTRATE PROCESSING SYSTEM AND COMPO...
- Publication number 20180231369
- Publication date Aug 16, 2018
- TOKYO ELECTRON LIMITED
- Chishio KOSHIMIZU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Thermal Imaging with Optical Emissions from a...
- Publication number 20180156673
- Publication date Jun 7, 2018
- Microsanj, LLC
- Dustin Kendig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Nanoscale Temperature Sensor
- Publication number 20170370783
- Publication date Dec 28, 2017
- The Regents of the University of Michigan
- Somin Eunice LEE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, ROBOT APPARATUS, ROBOT SYSTEM, MEASURING METHO...
- Publication number 20170328706
- Publication date Nov 16, 2017
- Canon Kabushiki Kaisha
- Tsuyoshi Kitamura
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEMPERATURE SENSOR AND METHOD FOR MANUFACTURING OPTICAL TEM...
- Publication number 20160363486
- Publication date Dec 15, 2016
- TOKYO ELECTRON LIMITED
- Takari YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
HONEYCOMB SANDWICH STRUCTURE AND METHOD OF MANUFACTURING HONEYCOMB...
- Publication number 20160109303
- Publication date Apr 21, 2016
- MITSUBISHI ELECTRIC CORPORATION
- Kazushi SEKINE
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT USING SILICON WAFER REFLECTION INTERFERENCE
- Publication number 20150221535
- Publication date Aug 6, 2015
- Andrew Nguyen
- G01 - MEASURING TESTING
Information Patent Application
FOREHEAD THERMOMETER
- Publication number 20150168233
- Publication date Jun 18, 2015
- MICROLIFE CORPORATION
- Chia-Chen HO
- G02 - OPTICS
Information Patent Application
THERMOREFLECTANCE-BASED CHARACTERIZATION OF THERMOELECTRIC MATERIAL...
- Publication number 20150110156
- Publication date Apr 23, 2015
- PHONONIC DEVICES, INC.
- Ian Patrick Wellenius
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD
- Publication number 20140286375
- Publication date Sep 25, 2014
- TOKYO ELECTRON LIMITED
- Jun Abe
- G01 - MEASURING TESTING
Information Patent Application
PROBE SENSOR CAPABLE OF MEASUREMENT FOR TEMPERATURE WITH STIMULUS
- Publication number 20140140372
- Publication date May 22, 2014
- Korea Institute of Science and Technology
- Jin Seok Kim
- G01 - MEASURING TESTING

using change in reflectance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and temperature measurement method

Optical sensor and physical quantity measurement device

Substrate positioning device with remote temperature sensor

Method and system for inspecting processing apparatus

Temperature measurement system and temperature measurement method

Thermal property probe

Generative production device comprising a measuring device

Metamaterial device and method of making the same

Method and system for thermal imaging with optical emissions from a...

Battery thermal run-away and combustion prevention system

Processing system having optical temperature measurement subsystem

Non-contact temperature measurement by dual-wavelength shift in Bre...

Systems and methods for monitoring temperatures of batteries

Honeycomb sandwich structure and method of manufacturing honeycomb...

Temperature distribution measuring apparatus and method

Optical temperature sensor and method for manufacturing optical tem...

Chromatic witness for thermal mapping and certification of heat bla...

Temperature measuring method, substrate processing system and compo...

Device for measuring temperature distribution

Fiber-optic sensor for strain-insensitive temperature measurements

Temperature-responsive photonic crystal device

Probe sensor capable of measurement for temperature with stimulus

Temperature measurement apparatus and method

Pyrometer process temperature measurement for high power light sources

Optical device and method of making

Plasma processing apparatus and temperature measuring method

Light interference system and substrate processing apparatus

Surface temperature measurement using hematite coating

Optical device and method of making

Method and system for gas measurements in a combustion chamber

Patents Applicationslast 30 patents

APPARATUS, SYSTEM, AND METHOD FOR MEASURING THE TEMPERATURE OF A SU...

SEMICONDUCTOR MANUFACTURING APPARATUS AND SEMICONDUCTOR DEVICE MANU...

METHODS OF MEASURING THERMAL PROPERTIES, AND RELATED APPARATUSES

SYSTEMS AND METHODS FOR MONITORING THE SURFACE TEMPERATURE OF AN OB...

METHOD AND SYSTEM FOR DETECTING HEATING AT A CONNECTOR BETWEEN ELEC...

GLASS-CERAMIC THERMAL PAINT SYSTEM AND METHOD USING UV:VIS SPECTROS...

TEMPERATURE MEASUREMENT METHOD, SEMICONDUCTOR SUBSTRATE, AND SEMICO...

CONFIGURABLE THERMAL TESTING SYSTEM AND METHOD

APPARATUS, SYSTEM, AND METHOD FOR MEASURING THE TEMPERATURE OF A SU...

TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD FOR P...

OPTICAL SENSOR AND PHYSICAL QUANTITY MEASUREMENT DEVICE

USE OF A SPIN TRANSITION MATERIAL TO MEASURE AND/OR LIMIT THE TEMPE...

ACTIVATABLE WARMING INDICATOR WITHOUT DYE

SEMICONDUCTOR DEVICE AND TEMPERATURE MEASUREMENT METHOD

SUBSTRATE POSITIONING DEVICE WITH REMOTE TEMPERATURE SENSOR

SMART LABEL ARCHITECTURE WITH ORGANIC LEDS

THERMOCHROMIC CONTAINER FOR ELECTROMAGNETIC RADIATION PROTECTION

BATTERY THERMAL RUN-AWAY AND COMBUSTION PREVENTION SYSTEM

BATTERY THERMAL RUN-AWAY AND COMBUSTION PREVENTION SYSTEM

TEMPERATURE MEASURING METHOD, SUBSTRATE PROCESSING SYSTEM AND COMPO...

Method and System for Thermal Imaging with Optical Emissions from a...

Nanoscale Temperature Sensor

MEASURING APPARATUS, ROBOT APPARATUS, ROBOT SYSTEM, MEASURING METHO...

OPTICAL TEMPERATURE SENSOR AND METHOD FOR MANUFACTURING OPTICAL TEM...

HONEYCOMB SANDWICH STRUCTURE AND METHOD OF MANUFACTURING HONEYCOMB...

TEMPERATURE MEASUREMENT USING SILICON WAFER REFLECTION INTERFERENCE

FOREHEAD THERMOMETER

THERMOREFLECTANCE-BASED CHARACTERIZATION OF THERMOELECTRIC MATERIAL...

TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD

PROBE SENSOR CAPABLE OF MEASUREMENT FOR TEMPERATURE WITH STIMULUS