using electric discharge tubes with thermionic cathodes

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G01L21/32

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GPHYSICS G01Measuring instruments G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE G01L21/00Vacuum gauges

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G01L21/32using electric discharge tubes with thermionic cathodes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for characterizing homodyne transmitters and r...
- Patent number 11,268,997
- Issue date Mar 8, 2022
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Fast pressure sensing system
- Patent number 11,101,120
- Issue date Aug 24, 2021
- SRI International
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryopump, cryopumped gas amount estimation device, and cryopumped g...
- Patent number 10,495,082
- Issue date Dec 3, 2019
- Sumitomo Heavy Industries, Ltd.
- Kakeru Takahashi
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Cold cathode ionization vacuum gauge with multiple cathodes
- Patent number 10,337,940
- Issue date Jul 2, 2019
- MKS Instruments, Inc.
- Timothy C. Swinney
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for feedthrough leakage current detection and d...
- Patent number 10,132,707
- Issue date Nov 20, 2018
- MKS Instruments, Inc.
- Stephen C. Blouch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,952,113
- Issue date Apr 24, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization pressure gauge with bias voltage and emission current co...
- Patent number 9,927,317
- Issue date Mar 27, 2018
- MKS Instruments, Inc.
- Douglas C. Hansen
- G01 - MEASURING TESTING
Information Patent Grant
Wireless thermionic sensor
- Patent number 9,903,767
- Issue date Feb 27, 2018
- Palo Alto Research Center Incorporated
- Saroj Kumar Sahu
- G01 - MEASURING TESTING
Information Patent Grant
Wireless thermionic sensor package and methods of using
- Patent number 9,903,768
- Issue date Feb 27, 2018
- Palo Alto Research Center Incorporated
- Saroj Kumar Sahu
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,593,996
- Issue date Mar 14, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Long lifetime cold cathode ionization vacuum gauge design
- Patent number 9,588,004
- Issue date Mar 7, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 9,404,827
- Issue date Aug 2, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 9,383,286
- Issue date Jul 5, 2016
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Cold cathode ionization vacuum gauge and inner wall protection member
- Patent number 9,316,555
- Issue date Apr 19, 2016
- Canon Anelva Corporation
- Itaru Enomoto
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 8,947,098
- Issue date Feb 3, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum measurement device with ion source mounted
- Patent number 8,729,465
- Issue date May 20, 2014
- Vaclab Inc.
- Fumio Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 8,648,604
- Issue date Feb 11, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring mean free path, vacuum gauge, and method for m...
- Patent number 8,436,295
- Issue date May 7, 2013
- Canon Anelva Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Grant
Electron source for a vacuum pressure measuring device
- Patent number 8,018,234
- Issue date Sep 13, 2011
- Inficon GmbH
- Wolfram Knapp
- G01 - MEASURING TESTING
Information Patent Grant
Ionization vacuum gauge
- Patent number 7,791,350
- Issue date Sep 7, 2010
- Tsinghua University
- Lin Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Ionization vacuum gauge
- Patent number 7,741,852
- Issue date Jun 22, 2010
- Mori Patent Office
- Fumio Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Electronic portion of an ion gauge with ion collectors bowed out of...
- Patent number 7,609,067
- Issue date Oct 27, 2009
- Hewlett-Packard Development Company, L.P.
- Chien-Hua Chen
- G01 - MEASURING TESTING
Information Patent Grant
Wide-range combination vacuum gauge
- Patent number 7,418,869
- Issue date Sep 2, 2008
- Brooks Automation, Inc.
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum measuring gauge
- Patent number 7,352,187
- Issue date Apr 1, 2008
- Inficon GmbH
- Wolfram Knapp
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge
- Patent number 7,295,015
- Issue date Nov 13, 2007
- Brooks Automation, Inc.
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Wide-range combination vacuum gauge
- Patent number 7,207,224
- Issue date Apr 24, 2007
- Brooks Automation, Inc.
- Paul M. Rutt
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge
- Patent number 7,030,619
- Issue date Apr 18, 2006
- Brooks Automation, Inc.
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Pressure controlled degas system for hot cathode ionization pressur...
- Patent number 6,756,785
- Issue date Jun 29, 2004
- MKS Instruments, Inc.
- Neil T. Peacock
- G01 - MEASURING TESTING
Information Patent Grant
Ionization vacuum gauge
- Patent number 6,515,482
- Issue date Feb 4, 2003
- Anelva Corporation
- Yousuke Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
Bayard-alpert vacuum gauge with neutralization of x-ray effect
- Patent number 6,257,069
- Issue date Jul 10, 2001
- The Fredericks Company
- Howard M. Brady
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPERATING METHOD FOR A GROUP OF PRESSURE SENSORS
- Publication number 20230366766
- Publication date Nov 16, 2023
- INFICON AG
- Christian BERG
- G01 - MEASURING TESTING
Information Patent Application
DIAPHRAGM PRESSURE GAUGE AND COMPOUND PRESSURE GAUGE
- Publication number 20230304883
- Publication date Sep 28, 2023
- VACUUM PRODUCTS CORPORATION
- Hisao HOJOH
- G01 - MEASURING TESTING
Information Patent Application
CRYOPUMP, CRYOPUMPED GAS AMOUNT ESTIMATION DEVICE, AND CRYOPUMPED G...
- Publication number 20170276129
- Publication date Sep 28, 2017
- Sumitomo Heavy Industries, Ltd.
- Kakeru Takahashi
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
IONIZATION GAUGE FOR HIGH PRESSURE OPERATION
- Publication number 20170146420
- Publication date May 25, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Ionization Pressure Gauge With Bias Voltage And Emission Current Co...
- Publication number 20170010172
- Publication date Jan 12, 2017
- MKS Instruments, Inc.
- Douglas C. Hansen
- G01 - MEASURING TESTING
Information Patent Application
Devices And Methods For Feedthrough Leakage Current Detection And D...
- Publication number 20170010171
- Publication date Jan 12, 2017
- MKS Instruments, Inc.
- Stephen C. Blouch
- G01 - MEASURING TESTING
Information Patent Application
COLD CATHODE IONIZATION VACUUM GAUGE AND INNER WALL PROTECTION MEMBER
- Publication number 20140368210
- Publication date Dec 18, 2014
- Canon ANELVA Corporation
- ITARU ENOMOTO
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...
- Publication number 20140152320
- Publication date Jun 5, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
VACUUM MEASUREMENT DEVICE WITH ION SOURCE MOUNTED
- Publication number 20120241604
- Publication date Sep 27, 2012
- Fumio Watanabe
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...
- Publication number 20120235034
- Publication date Sep 20, 2012
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Emission Current And Bias Potential Control
- Publication number 20110163754
- Publication date Jul 7, 2011
- Brooks Automation, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Operational Parameters And Geometry Designed...
- Publication number 20110062961
- Publication date Mar 17, 2011
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SOURCE FOR A VACUUM PRESSURE MEASURING DEVICE
- Publication number 20100066380
- Publication date Mar 18, 2010
- Wolfram Knapp
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION VACUUM GAUGE
- Publication number 20090096460
- Publication date Apr 16, 2009
- Fumio Watanabe
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION VACUUM GAUGE
- Publication number 20080278173
- Publication date Nov 13, 2008
- TSINGHUA UNIVERSITY
- LIN XIAO
- G01 - MEASURING TESTING
Information Patent Application
Wide-range combination vacuum gauge
- Publication number 20070012116
- Publication date Jan 18, 2007
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Wide-range combination vacuum gauge
- Publication number 20060278004
- Publication date Dec 14, 2006
- Helix Technology Corporation
- Paul M. Rutt
- G01 - MEASURING TESTING
Information Patent Application
Vacuum measuring gauge
- Publication number 20060202701
- Publication date Sep 14, 2006
- INFICON GMBH
- Wolfram Knapp
- G01 - MEASURING TESTING
Information Patent Application
Ionization gauge
- Publication number 20060197537
- Publication date Sep 7, 2006
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Ionization gauge
- Publication number 20050184735
- Publication date Aug 25, 2005
- Helix Technology Corporation
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Pressure controlled degas system for hot cathode ionization pressur...
- Publication number 20040017202
- Publication date Jan 29, 2004
- Neil T. Peacock
- G01 - MEASURING TESTING
Information Patent Application
Micro high-vacuum pressure sensor
- Publication number 20020186017
- Publication date Dec 12, 2002
- John Liebeskind
- G01 - MEASURING TESTING
Information Patent Application
Ionization vacuum gauge
- Publication number 20010011890
- Publication date Aug 9, 2001
- ANELVA CORPORATION
- Yousuke Kawasaki
- G01 - MEASURING TESTING

using electric discharge tubes with thermionic cathodes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for characterizing homodyne transmitters and r...

Fast pressure sensing system

Cryopump, cryopumped gas amount estimation device, and cryopumped g...

Cold cathode ionization vacuum gauge with multiple cathodes

Devices and methods for feedthrough leakage current detection and d...

Ionization gauge for high pressure operation

Ionization pressure gauge with bias voltage and emission current co...

Wireless thermionic sensor

Wireless thermionic sensor package and methods of using

Ionization gauge for high pressure operation

Long lifetime cold cathode ionization vacuum gauge design

Ionization gauge with operational parameters and geometry designed...

Ionization gauge with emission current and bias potential control

Cold cathode ionization vacuum gauge and inner wall protection member

Ionization gauge with emission current and bias potential control

Vacuum measurement device with ion source mounted

Ionization gauge with operational parameters and geometry designed...

Device for measuring mean free path, vacuum gauge, and method for m...

Electron source for a vacuum pressure measuring device

Ionization vacuum gauge

Ionization vacuum gauge

Electronic portion of an ion gauge with ion collectors bowed out of...

Wide-range combination vacuum gauge

Vacuum measuring gauge

Ionization gauge

Wide-range combination vacuum gauge

Ionization gauge

Pressure controlled degas system for hot cathode ionization pressur...

Ionization vacuum gauge

Bayard-alpert vacuum gauge with neutralization of x-ray effect

Patents Applicationslast 30 patents

OPERATING METHOD FOR A GROUP OF PRESSURE SENSORS

DIAPHRAGM PRESSURE GAUGE AND COMPOUND PRESSURE GAUGE

CRYOPUMP, CRYOPUMPED GAS AMOUNT ESTIMATION DEVICE, AND CRYOPUMPED G...

IONIZATION GAUGE FOR HIGH PRESSURE OPERATION

Ionization Pressure Gauge With Bias Voltage And Emission Current Co...

Devices And Methods For Feedthrough Leakage Current Detection And D...

COLD CATHODE IONIZATION VACUUM GAUGE AND INNER WALL PROTECTION MEMBER

IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...

VACUUM MEASUREMENT DEVICE WITH ION SOURCE MOUNTED

DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...

Ionization Gauge With Emission Current And Bias Potential Control

Ionization Gauge With Operational Parameters And Geometry Designed...

ELECTRON SOURCE FOR A VACUUM PRESSURE MEASURING DEVICE

IONIZATION VACUUM GAUGE

IONIZATION VACUUM GAUGE

Wide-range combination vacuum gauge

Wide-range combination vacuum gauge

Vacuum measuring gauge

Ionization gauge

Ionization gauge

Pressure controlled degas system for hot cathode ionization pressur...

Micro high-vacuum pressure sensor

Ionization vacuum gauge