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G01D5/56
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01D5/00
Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable
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G01D5/56
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Patents Grants
last 30 patents
Information
Patent Grant
Position encoder with fusion of different sensor types
Patent number
12,146,773
Issue date
Nov 19, 2024
Novanta Corporation
Daniel J. Holmes
G01 - MEASURING TESTING
Information
Patent Grant
Sensor element for storing rotation or position information
Patent number
11,796,301
Issue date
Oct 24, 2023
Dr. Johannes Heidenhain GmbH
Johannes Schneider
G11 - INFORMATION STORAGE
Information
Patent Grant
Encoder apparatus, drive apparatus, stage apparatus, and robot appa...
Patent number
11,385,081
Issue date
Jul 12, 2022
Nikon Corporation
Masahiko Goto
G01 - MEASURING TESTING
Information
Patent Grant
Encoder apparatus, drive apparatus, stage apparatus, and robot appa...
Patent number
11,243,096
Issue date
Feb 8, 2022
Nikon Corporation
Masahiko Goto
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Integrated optical/electrical probe card for testing optical, elect...
Patent number
10,996,081
Issue date
May 4, 2021
Newport Fab, LLC
Yasir Qamar
G02 - OPTICS
Information
Patent Grant
Position sensors for valve systems and related assemblies, systems...
Patent number
10,975,985
Issue date
Apr 13, 2021
Flowserve Management Company
Michael P. Nelson
G05 - CONTROLLING REGULATING
Information
Patent Grant
Integrated electronic device including a full scale adjustment stag...
Patent number
10,921,164
Issue date
Feb 16, 2021
STMicroelectronics S.r.l.
Matteo Quartiroli
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Monitoring of power cables with distributed fibre optic sensing
Patent number
10,775,425
Issue date
Sep 15, 2020
OPTASENSE HOLDINGS LIMITED
Alastair Godfrey
G01 - MEASURING TESTING
Information
Patent Grant
Rotating mirror facet identification
Patent number
10,436,614
Issue date
Oct 8, 2019
Hewlett-Packard Development Company, L.P.
Dan Rothenbuhler
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device
Patent number
10,149,405
Issue date
Dec 4, 2018
ASUSTeK COMPUTER Inc.
Yu-Chun Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Input device, electronic device including the same, and control met...
Patent number
10,082,893
Issue date
Sep 25, 2018
Samsung Electronics Co., Ltd.
Hee-Young Yun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Capacitor circuit, circuit device, physical quantity detecting devi...
Patent number
10,008,333
Issue date
Jun 26, 2018
Seiko Epson Corporation
Atsushi Tanaka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for controlling rotation recognition unit of rotating body a...
Patent number
9,904,380
Issue date
Feb 27, 2018
Samsung Electronics Co., Ltd.
Hyung-Jin Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Capacitor circuit, circuit device, physical quantity detecting devi...
Patent number
9,892,857
Issue date
Feb 13, 2018
Seiko Epson Corporation
Atsushi Tanaka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Encoder system, signal processing method, and transmission signal g...
Patent number
9,823,091
Issue date
Nov 21, 2017
Nikon Corporation
Hiroyuki Kishida
G05 - CONTROLLING REGULATING
Information
Patent Grant
Pitch angle indicator system
Patent number
9,796,461
Issue date
Oct 24, 2017
WARTSILA NETHERLANDS B.V.
Peter Schalk
G01 - MEASURING TESTING
Information
Patent Grant
Encoder system, signal processing method, and transmission signal g...
Patent number
9,020,774
Issue date
Apr 28, 2015
Nikon Corporation
Hiroyuki Kishida
G01 - MEASURING TESTING
Information
Patent Grant
Encoder system, signal processing method, and transmission signal g...
Patent number
8,977,516
Issue date
Mar 10, 2015
Nikon Corporation
Hiroyuki Kishida
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for determining and/or monitoring a process variable
Patent number
8,359,109
Issue date
Jan 22, 2013
Endress + Hauser GmbH + Co. KG
Volker Dreyer
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device with two-channel sampling
Patent number
8,239,161
Issue date
Aug 7, 2012
Baumer Electric AG
Michael Schneider
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measuring apparatus
Patent number
7,808,650
Issue date
Oct 5, 2010
Mori Seiki Co., Ltd
Masahito Kon
G01 - MEASURING TESTING
Information
Patent Grant
Combination optical and capacitive absolute position apparatus and...
Patent number
5,225,830
Issue date
Jul 6, 1993
Mitutoyo
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for transmitting data from high speed rotors
Patent number
4,671,117
Issue date
Jun 9, 1987
The United States of America as represented by the Secretary of the Air Force
Wayne K. Movick
G01 - MEASURING TESTING
Information
Patent Grant
Digital tachometer
Patent number
4,547,732
Issue date
Oct 15, 1985
Westinghouse Electric Corp.
Alan L. Husson
G01 - MEASURING TESTING
Information
Patent Grant
Position detecting signal generator
Patent number
4,438,398
Issue date
Mar 20, 1984
Sony Corporation
Tsunehiro Maruo
G01 - MEASURING TESTING
Information
Patent Grant
Magneto-optic transducer
Patent number
4,417,324
Issue date
Nov 22, 1983
SAB Industri AB
Bo B. Wikstrom
G02 - OPTICS
Information
Patent Grant
Displacement transducers
Patent number
4,100,420
Issue date
Jul 11, 1978
The Solartron Electronic Group Limited
Eric Metcalf
G01 - MEASURING TESTING
Information
Patent Grant
3005978
Patent number
3,005,978
Issue date
Oct 24, 1961
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
EXTERIOR GAUGE COMPONENT WITH ROTARY ENCODER WHEEL AND OPTICAL SENS...
Publication number
20240410737
Publication date
Dec 12, 2024
Service Insight LLC
Anthony Uzzo
G01 - MEASURING TESTING
Information
Patent Application
SENSOR TAG, METHOD FOR READING SENSOR TAG, AND SENSOR SYSTEM USING...
Publication number
20240318982
Publication date
Sep 26, 2024
Mitsubishi Electric Corporation
Koichi FURUYA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING THE AMOUNT OF BACKLASH IN AN ACTUAT...
Publication number
20240085221
Publication date
Mar 14, 2024
Honeywell International Inc.
David Podola
G01 - MEASURING TESTING
Information
Patent Application
EXTERIOR GAUGE COMPONENT WITH ROTARY ENCODER WHEEL AND OPTICAL SENS...
Publication number
20230067868
Publication date
Mar 2, 2023
Service Insight LLC
Anthony Uzzo
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION APPARATUS, CALIBRATION METHOD, AND NON-TRANSITORY COMPU...
Publication number
20220412782
Publication date
Dec 29, 2022
ASAHI KASEI MICRODEVICES CORPORATION
Shota KONNO
G01 - MEASURING TESTING
Information
Patent Application
INERTIA MEASUREMENT DEVICE
Publication number
20220412833
Publication date
Dec 29, 2022
WECE Innovations, LLC
William J. Endres
G01 - MEASURING TESTING
Information
Patent Application
Integrated Optical/Electrical Probe Card for Testing Optical, Elect...
Publication number
20210080295
Publication date
Mar 18, 2021
Newport Fab, LLC dba Jazz Semiconductor.
Yasir Qamar
G02 - OPTICS
Information
Patent Application
ROTARY CONTROLLER LOCKING CAP, METHOD OF USE, AND ROTARY CONTROLLER...
Publication number
20180335797
Publication date
Nov 22, 2018
LOKNOB LLC
Anthony LIVOLSI
G05 - CONTROLLING REGULATING
Information
Patent Application
ROTATING MIRROR FACET IDENTIFICATION
Publication number
20180274955
Publication date
Sep 27, 2018
Hewlett-Packard Development Company, L.P.
Dan Rothenbuhler
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE
Publication number
20180132378
Publication date
May 10, 2018
ASUSTEK COMPUTER INC.
Yu-Chun CHOU
G01 - MEASURING TESTING
Information
Patent Application
CAPACITOR CIRCUIT, CIRCUIT DEVICE, PHYSICAL QUANTITY DETECTING DEVI...
Publication number
20180130606
Publication date
May 10, 2018
SEIKO EPSON CORPORATION
Atsushi TANAKA
G01 - MEASURING TESTING
Information
Patent Application
CAPACITOR CIRCUIT, CIRCUIT DEVICE, PHYSICAL QUANTITY DETECTING DEVI...
Publication number
20170365414
Publication date
Dec 21, 2017
SEIKO EPSON CORPORATION
Atsushi TANAKA
G01 - MEASURING TESTING
Information
Patent Application
Sensor Fusion Method for Determining Orientation of an Object
Publication number
20170074689
Publication date
Mar 16, 2017
Dialog Semiconductor B.V.
Wessel Harm Lubberhuizen
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED ELECTRONIC DEVICE INCLUDING A FULL SCALE ADJUSTMENT STAG...
Publication number
20160370207
Publication date
Dec 22, 2016
STMicroelectronics S.r.l.
Matteo Quartiroli
G01 - MEASURING TESTING
Information
Patent Application
INPUT DEVICE, ELECTRONIC DEVICE INCLUDING THE SAME, AND CONTROL MET...
Publication number
20160252979
Publication date
Sep 1, 2016
SAMSUNG ELECTRONICS CO., LTD.
Hee-Young YUN
G01 - MEASURING TESTING
Information
Patent Application
Pitch Angle Indicator System
Publication number
20160144939
Publication date
May 26, 2016
WARTSILA NETHERLANDS B.V.
Peter SCHALK
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ARRANGEMENT
Publication number
20120146625
Publication date
Jun 14, 2012
MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
Werner Grommer
G01 - MEASURING TESTING
Information
Patent Application
ENCODER SYSTEM, SIGNAL PROCESSING METHOD, AND TRANSMISSION SIGNAL G...
Publication number
20110202308
Publication date
Aug 18, 2011
Nikon Corporation
Hiroyuki KISHIDA
G05 - CONTROLLING REGULATING
Information
Patent Application
Apparatus for Detemining and/or Monitoring a Process Variable
Publication number
20090312846
Publication date
Dec 17, 2009
Endress + Hauser GmbH + Co.KG
Franco Ferraro
G01 - MEASURING TESTING
Information
Patent Application
Measuring Device with Two-channel Sampling
Publication number
20090276180
Publication date
Nov 5, 2009
Michael Schneider
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT MEASURING APPARATUS
Publication number
20090033946
Publication date
Feb 5, 2009
SONY CORPORATION
Masahito Kon
G01 - MEASURING TESTING