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G01P2015/0877
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PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
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G01P2015/0877
using integrated interconnect structures
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Patents Grants
last 30 patents
Information
Patent Grant
Strain gauge sensor accelerometer with improved accuracy
Patent number
11,085,945
Issue date
Aug 10, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Loïc Joet
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and method including an intertial mass element
Patent number
9,679,857
Issue date
Jun 13, 2017
NXP B.V.
Matthias Merz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micropatterned component and method for manufacturing a micropatter...
Patent number
9,229,020
Issue date
Jan 5, 2016
Robert Bosch GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical structure, in particular sensor arrangement, and co...
Patent number
8,901,679
Issue date
Dec 2, 2014
Robert Bosch GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor physical quantity sensor
Patent number
8,759,926
Issue date
Jun 24, 2014
Denso Corporation
Tetsuo Fujii
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Region divided substrate and semiconductor device
Patent number
8,455,973
Issue date
Jun 4, 2013
Denso Corporation
Tetsuo Fujii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IN-PLANE AND OUT-OF-PLANE ACCELEROMETER
Publication number
20240300805
Publication date
Sep 12, 2024
Murata Manufacturing Co., Ltd.
Ville-Pekka RYTKÖNEN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
THREE-AXIS ACCELEROMETER
Publication number
20200182903
Publication date
Jun 11, 2020
MiraMEMS Sensing Technology Co., Ltd
Li-Tien TSENG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
STRAIN GAUGE SENSOR ACCELEROMETER WITH IMPROVED ACCURACY
Publication number
20200025793
Publication date
Jan 23, 2020
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Loïc JOET
G01 - MEASURING TESTING
Information
Patent Application
MICROPATTERNED COMPONENT AND METHOD FOR MANUFACTURING A MICROPATTER...
Publication number
20140339654
Publication date
Nov 20, 2014
ROBERT BOSCH GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL STRUCTURE, IN PARTICULAR SENSOR ARRANGEMENT, AND CO...
Publication number
20140021515
Publication date
Jan 23, 2014
ROBERT BOSCH GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS SENSOR
Publication number
20120104520
Publication date
May 3, 2012
Alps Electric Co., Ltd.
Yoshitaka UTO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELEMENT STRUCTURE, INERTIA SENSOR, AND ELECTRONIC DEVICE
Publication number
20110291208
Publication date
Dec 1, 2011
SEIKO EPSON CORPORATION
Shigekazu TAKAGI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SEMICONDUCTOR PHYSICAL QUANTITY SENSOR AND METHOD OF MANUFACTURING...
Publication number
20110227174
Publication date
Sep 22, 2011
DENSO CORPORATION
Tetsuo FUJII
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
REGION DIVIDED SUBSTRATE AND SEMICONDUCTOR DEVICE
Publication number
20110133295
Publication date
Jun 9, 2011
DENSO CORPORATION
Tetsuo Fujii
G01 - MEASURING TESTING