using microprocessors for control of a sequence of operations

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CPC
G01N2021/0162

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/0162using microprocessors for control of a sequence of operations

Industries

Patents Grantslast 30 patents

Information Patent Grant
Automatic optical inspection device and method
- Patent number 11,549,891
- Issue date Jan 10, 2023
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Hailiang Lu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measuring stress-based characteristics of a...
- Patent number 11,442,008
- Issue date Sep 13, 2022
- Corning Incorporated
- Norman Henry Fontaine
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 11,131,621
- Issue date Sep 28, 2021
- JVC Kenwood Corporation
- Atsushi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
All-optical write/read scheme for magnetic nanostructures
- Patent number 11,119,042
- Issue date Sep 14, 2021
- Purdue Research Foundation
- Aveek Dutta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface-plasmon opto-magnetic field enhancement for all-optical mag...
- Patent number 10,739,261
- Issue date Aug 11, 2020
- Purdue Research Foundation
- Aveek Dutta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analyzer and warm-up determination method
- Patent number 10,648,902
- Issue date May 12, 2020
- Shimadzu Corporation
- Jumpei Zushi
- G01 - MEASURING TESTING
Information Patent Grant
Flow cell liquid degassing system and method
- Patent number 10,591,503
- Issue date Mar 17, 2020
- Illumina, Inc.
- Bradley Kent Drews
- G01 - MEASURING TESTING
Information Patent Grant
Airborne particle measuring device
- Patent number 10,184,880
- Issue date Jan 22, 2019
- Pedro Godoy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Airborne particle measuring device
- Patent number 10,151,682
- Issue date Dec 11, 2018
- Teilch LLC
- Pedro Godoy
- G02 - OPTICS
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 10,110,854
- Issue date Oct 23, 2018
- Gatan, Inc.
- John Andrew Hunt
- G02 - OPTICS
Information Patent Grant
Optical measuring apparatus and method for the analysis of samples...
- Patent number 9,488,576
- Issue date Nov 8, 2016
- Tecan Trading AG
- Torleif Ove Bjornson
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
System and method for rigging a control surface of an aircraft
- Patent number 9,216,829
- Issue date Dec 22, 2015
- Airbus Operations GmbH
- Gerd Stahl
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Optical object detection system
- Patent number 9,040,920
- Issue date May 26, 2015
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Compact optical detection system for a microfluidic device
- Patent number 7,518,726
- Issue date Apr 14, 2009
- Caliper LifeSciences, Inc.
- Aaron Rulison
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting a substrate
- Patent number 7,289,661
- Issue date Oct 30, 2007
- Samsung Electronics Co., Ltd.
- Chung-Sam Jun
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus and method for controlling an analysis...
- Patent number 7,225,360
- Issue date May 29, 2007
- Shimadzu Corporation
- Takayuki Kihara
- G01 - MEASURING TESTING
Information Patent Grant
Multiple discrete analyzer test apparatus and method
- Patent number 5,369,484
- Issue date Nov 29, 1994
- Akzo nv
- Douglas G. Haugen
- G01 - MEASURING TESTING
Information Patent Grant
Dual function readhead for a reflectance instrument
- Patent number 5,321,492
- Issue date Jun 14, 1994
- Miles Inc.
- Paul S. Detwiler
- G01 - MEASURING TESTING
Information Patent Grant
Automated strip reader densitometer
- Patent number 5,118,183
- Issue date Jun 2, 1992
- X-Rite, Incorporated
- Mark A. Cargill
- G01 - MEASURING TESTING
Information Patent Grant
Method of optical density correction
- Patent number 5,016,203
- Issue date May 14, 1991
- Fuji Photo Film Co., Ltd.
- Tomoaki Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Automated process monitoring
- Patent number 4,938,602
- Issue date Jul 3, 1990
- Electronic Instrumentation and Technology, Inc.
- Joe T. May
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of optical density measurement and apparatus therefor
- Patent number 4,937,764
- Issue date Jun 26, 1990
- Fuji Photo Film Co., Ltd.
- Tomoaki Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
System for optically interrogating liquid samples and for withdrawi...
- Patent number 4,873,875
- Issue date Oct 17, 1989
- Prism Technology, Inc.
- William H. Cork
- G01 - MEASURING TESTING
Information Patent Grant
Automated paint film characterization system
- Patent number 4,853,879
- Issue date Aug 1, 1989
- Robert J. Matzoll
- G01 - MEASURING TESTING
Information Patent Grant
Luminometer apparatus
- Patent number 4,818,883
- Issue date Apr 4, 1989
- Biolite Ltd.
- Joseph C. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection and reset in surface reflectance meter
- Patent number 4,761,676
- Issue date Aug 2, 1988
- ATI Systems Inc.
- Gregory R. Wiles
- G01 - MEASURING TESTING
Information Patent Grant
Automated system for determining the molecular weight and/or concen...
- Patent number 4,609,991
- Issue date Sep 2, 1986
- The United States of America as represented by the Department of Health and H...
- Allen P. Minton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240103027
- Publication date Mar 28, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20220357285
- Publication date Nov 10, 2022
- Hitachi High-Tech Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING STRESS-BASED CHARACTERISTICS OF A...
- Publication number 20210033530
- Publication date Feb 4, 2021
- Corning Incorporated
- Norman Henry Fontaine
- G01 - MEASURING TESTING
Information Patent Application
ALL-OPTICAL WRITE/READ SCHEME FOR MAGNETIC NANOSTRUCTURES
- Publication number 20200371026
- Publication date Nov 26, 2020
- Purdue Research Foundation
- Aveek Dutta
- B82 - NANO-TECHNOLOGY
Information Patent Application
SURFACE-PLASMON OPTO-MAGNETIC FIELD ENHANCEMENT FOR ALL-OPTICAL MAG...
- Publication number 20190331598
- Publication date Oct 31, 2019
- Purdue Research Foundation
- Aveek Dutta
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC OPTICAL INSPECTION DEVICE AND METHOD
- Publication number 20190293566
- Publication date Sep 26, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Hailiang LU
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER AND WARM-UP DETERMINATION METHOD
- Publication number 20190195780
- Publication date Jun 27, 2019
- Shimadzu Corporation
- Jumpei ZUSHI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20190145885
- Publication date May 16, 2019
- JVC KENWOOD CORPORATION
- Atsushi SAITO
- G01 - MEASURING TESTING
Information Patent Application
FLOW CELL LIQUID DEGASSING SYSTEM AND METHOD
- Publication number 20180188281
- Publication date Jul 5, 2018
- Illumina, Inc.
- Bradley Kent Drews
- G01 - MEASURING TESTING
Information Patent Application
AIRBORNE PARTICLE MEASURING DEVICE
- Publication number 20170328825
- Publication date Nov 16, 2017
- Teilch LLC
- Pedro GODOY
- G02 - OPTICS
Information Patent Application
OPTICAL MEASURING APPARATUS AND METHOD FOR THE ANALYSIS OF SAMPLES...
- Publication number 20150308944
- Publication date Oct 29, 2015
- Tecan Trading AG
- Torleif Ove Bjornson
- G01 - MEASURING TESTING
Information Patent Application
REAGENT KIT AND MEASUREMENT SOFTWARE SERVER
- Publication number 20150057962
- Publication date Feb 26, 2015
- Ushio Denki Kabushiki Kaisha
- Kinichi MORITA
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Express Analysis of Acetone Traces in Gases
- Publication number 20150013429
- Publication date Jan 15, 2015
- PositiveID Corporation
- Benjamin Atkin
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20140028828
- Publication date Jan 30, 2014
- GATAN, INC.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR RIGGING A CONTROL SURFACE OF AN AIRCRAFT
- Publication number 20140007397
- Publication date Jan 9, 2014
- Gerd STAHL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR EXPRESS ANALYSIS OF ACETONE TRACES IN GASES
- Publication number 20090290161
- Publication date Nov 26, 2009
- Benjamin Atkin
- G01 - MEASURING TESTING
Information Patent Application
Compact optical detection system for a microfluidic device
- Publication number 20060227325
- Publication date Oct 12, 2006
- Caliper Life Sciences, Inc.
- Aaron Rulison
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic analysis apparatus and method for controlling an analysis...
- Publication number 20040216009
- Publication date Oct 28, 2004
- Shimadzu Corporation
- Takayuki Kihara
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting a substrate
- Publication number 20040086171
- Publication date May 6, 2004
- Chung-Sam Jun
- G01 - MEASURING TESTING

using microprocessors for control of a sequence of operations

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automatic optical inspection device and method

Systems and methods for measuring stress-based characteristics of a...

Analysis device and analysis method

All-optical write/read scheme for magnetic nanostructures

Surface-plasmon opto-magnetic field enhancement for all-optical mag...

Analyzer and warm-up determination method

Flow cell liquid degassing system and method

Airborne particle measuring device

Airborne particle measuring device

Ion beam sample preparation apparatus and methods

Optical measuring apparatus and method for the analysis of samples...

System and method for rigging a control surface of an aircraft

Optical object detection system

Compact optical detection system for a microfluidic device

Apparatus and method for inspecting a substrate

Automatic analysis apparatus and method for controlling an analysis...

Multiple discrete analyzer test apparatus and method

Dual function readhead for a reflectance instrument

Automated strip reader densitometer

Method of optical density correction

Automated process monitoring

Method of optical density measurement and apparatus therefor

System for optically interrogating liquid samples and for withdrawi...

Automated paint film characterization system

Luminometer apparatus

Fault detection and reset in surface reflectance meter

Automated system for determining the molecular weight and/or concen...

Patents Applicationslast 30 patents

AUTOMATIC ANALYZER

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

SYSTEMS AND METHODS FOR MEASURING STRESS-BASED CHARACTERISTICS OF A...

ALL-OPTICAL WRITE/READ SCHEME FOR MAGNETIC NANOSTRUCTURES

SURFACE-PLASMON OPTO-MAGNETIC FIELD ENHANCEMENT FOR ALL-OPTICAL MAG...

AUTOMATIC OPTICAL INSPECTION DEVICE AND METHOD

ANALYZER AND WARM-UP DETERMINATION METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

FLOW CELL LIQUID DEGASSING SYSTEM AND METHOD

AIRBORNE PARTICLE MEASURING DEVICE

OPTICAL MEASURING APPARATUS AND METHOD FOR THE ANALYSIS OF SAMPLES...

REAGENT KIT AND MEASUREMENT SOFTWARE SERVER

Method and Device for Express Analysis of Acetone Traces in Gases

Ion Beam Sample Preparation Apparatus and Methods

SYSTEM AND METHOD FOR RIGGING A CONTROL SURFACE OF AN AIRCRAFT

METHOD AND DEVICE FOR EXPRESS ANALYSIS OF ACETONE TRACES IN GASES

Compact optical detection system for a microfluidic device

Automatic analysis apparatus and method for controlling an analysis...

Apparatus and method for inspecting a substrate