using microprocessors

Industry

CPC
H03K2005/00254

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H03Electronic circuits H03KPULSE TECHNIQUE

Current Industry

H03K2005/00254using microprocessors

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Static compensation of an active clock edge shift for a duty cycle...
- Patent number 11,025,239
- Issue date Jun 1, 2021
- International Business Machines Corporation
- Andreas H. A. Arp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Static compensation of an active clock edge shift for a duty cycle...
- Patent number 10,622,981
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Andreas H. A. Arp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Static compensation of an active clock edge shift for a duty cycle...
- Patent number 10,361,689
- Issue date Jul 23, 2019
- International Business Machines Corporation
- Andreas H. A. Arp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RC lattice delay
- Patent number 9,762,221
- Issue date Sep 12, 2017
- Analog Devices Global
- Yunzhi Dong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Programmable delay line utilizing measured actual delays to provide...
- Patent number 5,013,944
- Issue date May 7, 1991
- International Business Machines Corporation
- Jeffrey H. Fischer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test period generator for automatic test equipment
- Patent number 4,849,702
- Issue date Jul 18, 1989
- Schlumberger Techologies, Inc.
- Burnell G. West
- G11 - INFORMATION STORAGE
Information Patent Grant
Delay line control system for automatic test equipment
- Patent number 4,837,521
- Issue date Jun 6, 1989
- Schlumberger Systems and Services, Inc.
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Digital delay circuit
- Patent number 4,825,109
- Issue date Apr 25, 1989
- American Home Products Corporation
- Charles A. Reynolds
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for dynamically controlling the timing of sign...
- Patent number 4,820,944
- Issue date Apr 11, 1989
- Schlumberger Systems and Services, Inc.
- Richard F. Herlein
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for obtaining high frequency resolution of a l...
- Patent number 4,818,894
- Issue date Apr 4, 1989
- Hughes Aircraft Company
- George D. Underwood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Control of signal timing apparatus in automatic test systems using...
- Patent number 4,789,835
- Issue date Dec 6, 1988
- Fairchild Camera and Instrument Corporation
- Richard F. Herlein
- G11 - INFORMATION STORAGE
Information Patent Grant
Pulse alignment system
- Patent number 4,686,458
- Issue date Aug 11, 1987
- Hughes Aircraft Company
- Daniel M. Beyerbach
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Graphical input of timing relationships
- Patent number 4,677,620
- Issue date Jun 30, 1987
- Tektronix, Inc.
- Steven R. Sutton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for dynamically controlling the timing of sign...
- Patent number 4,675,562
- Issue date Jun 23, 1987
- Fairchild Semiconductor Corporation
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Gate having temperature-stabilized delay
- Patent number 4,651,038
- Issue date Mar 17, 1987
- Fairchild Camera and Instrument Corporation
- Ronald L. Cline
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for applying and monitoring programmed test si...
- Patent number 4,646,299
- Issue date Feb 24, 1987
- Fairchild Semiconductor Corporation
- John Schinabeck
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring automated testing of electronic...
- Patent number 4,637,020
- Issue date Jan 13, 1987
- Fairchild Semiconductor Corporation
- John Schinabeck
- G01 - MEASURING TESTING
Information Patent Grant
Formatter for high speed test system
- Patent number 4,635,256
- Issue date Jan 6, 1987
- Fairchild Semiconductor Corporation
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring response signals during automat...
- Patent number 4,635,259
- Issue date Jan 6, 1987
- Fairchild Semiconductor Corporation
- John Schinabeck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STATIC COMPENSATION OF AN ACTIVE CLOCK EDGE SHIFT FOR A DUTY CYCLE...
- Publication number 20190280683
- Publication date Sep 12, 2019
- International Business Machines Corporation
- Andreas H. A. Arp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATIC COMPENSATION OF AN ACTIVE CLOCK EDGE SHIFT FOR A DUTY CYCLE...
- Publication number 20190097619
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Andreas H. A. Arp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RC LATTICE DELAY
- Publication number 20160373101
- Publication date Dec 22, 2016
- Yunzhi Dong
- H03 - BASIC ELECTRONIC CIRCUITRY

using microprocessors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Static compensation of an active clock edge shift for a duty cycle...

Static compensation of an active clock edge shift for a duty cycle...

Static compensation of an active clock edge shift for a duty cycle...

RC lattice delay

Programmable delay line utilizing measured actual delays to provide...

Test period generator for automatic test equipment

Delay line control system for automatic test equipment

Digital delay circuit

Method and apparatus for dynamically controlling the timing of sign...

Method and apparatus for obtaining high frequency resolution of a l...

Control of signal timing apparatus in automatic test systems using...

Pulse alignment system

Graphical input of timing relationships

Method and apparatus for dynamically controlling the timing of sign...

Gate having temperature-stabilized delay

Method and apparatus for applying and monitoring programmed test si...

Method and apparatus for monitoring automated testing of electronic...

Formatter for high speed test system

Method and apparatus for monitoring response signals during automat...

Patents Applicationslast 30 patents

STATIC COMPENSATION OF AN ACTIVE CLOCK EDGE SHIFT FOR A DUTY CYCLE...

STATIC COMPENSATION OF AN ACTIVE CLOCK EDGE SHIFT FOR A DUTY CYCLE...

RC LATTICE DELAY