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G01D5/58
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01D5/00
Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable
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G01D5/58
using optical means
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Patents Grants
last 30 patents
Information
Patent Grant
Position encoder with fusion of different sensor types
Patent number
12,146,773
Issue date
Nov 19, 2024
Novanta Corporation
Daniel J. Holmes
G01 - MEASURING TESTING
Information
Patent Grant
Surface emitting laser element, illumination device, projection dev...
Patent number
11,527,867
Issue date
Dec 13, 2022
Ricoh Company, Ltd.
Kazuki Nagasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Encoder apparatus, drive apparatus, stage apparatus, and robot appa...
Patent number
11,385,081
Issue date
Jul 12, 2022
Nikon Corporation
Masahiko Goto
G01 - MEASURING TESTING
Information
Patent Grant
Encoder apparatus, drive apparatus, stage apparatus, and robot appa...
Patent number
11,243,096
Issue date
Feb 8, 2022
Nikon Corporation
Masahiko Goto
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Method of sensing rotation of rotation member and electronic device...
Patent number
10,845,220
Issue date
Nov 24, 2020
Samsung Electronics Co., Ltd.
Younghoon Song
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic device
Patent number
10,149,405
Issue date
Dec 4, 2018
ASUSTeK COMPUTER Inc.
Yu-Chun Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Input device, electronic device including the same, and control met...
Patent number
10,082,893
Issue date
Sep 25, 2018
Samsung Electronics Co., Ltd.
Hee-Young Yun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for the dimensional inspection of containers having contact...
Patent number
9,970,790
Issue date
May 15, 2018
MSC & SGCC
Etienne Leprat
G01 - MEASURING TESTING
Information
Patent Grant
Encoder system, signal processing method, and transmission signal g...
Patent number
9,823,091
Issue date
Nov 21, 2017
Nikon Corporation
Hiroyuki Kishida
G05 - CONTROLLING REGULATING
Information
Patent Grant
Rotational sensor and methods therefor
Patent number
9,664,538
Issue date
May 30, 2017
Airway Limited
Berwyn Lee Hoyt
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Encoder system, signal processing method, and transmission signal g...
Patent number
9,020,774
Issue date
Apr 28, 2015
Nikon Corporation
Hiroyuki Kishida
G01 - MEASURING TESTING
Information
Patent Grant
Encoder system, signal processing method, and transmission signal g...
Patent number
8,977,516
Issue date
Mar 10, 2015
Nikon Corporation
Hiroyuki Kishida
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device with two-channel sampling
Patent number
8,239,161
Issue date
Aug 7, 2012
Baumer Electric AG
Michael Schneider
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional position detecting device and method for using th...
Patent number
8,222,585
Issue date
Jul 17, 2012
Lite-On Semiconductor Corp.
Chia-Chu Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measuring apparatus
Patent number
7,808,650
Issue date
Oct 5, 2010
Mori Seiki Co., Ltd
Masahito Kon
G01 - MEASURING TESTING
Information
Patent Grant
Magneto-optically modulating system for monitoring relative relatio...
Patent number
6,072,174
Issue date
Jun 6, 2000
Teijin Seiki Co., Ltd.
Masayuki Togawa
G02 - OPTICS
Information
Patent Grant
Optical meter reader using a shadow
Patent number
5,880,464
Issue date
Mar 9, 1999
Diablo Research Corporation
Nick G. Vrionis
G01 - MEASURING TESTING
Information
Patent Grant
Control system for coupling redundant logic channels
Patent number
4,402,903
Issue date
Sep 6, 1983
Westinghouse Electric Corp.
Bruce N. Lenderking
G01 - MEASURING TESTING
Information
Patent Grant
Fiber optical devices for measuring physical phenomenon
Patent number
4,345,482
Issue date
Aug 24, 1982
Asea Aktiebolag
Morgan Adolfsson
G01 - MEASURING TESTING
Information
Patent Grant
Sequential beam switching of acousto-optic modulator
Patent number
4,321,564
Issue date
Mar 23, 1982
Litton Systems, Inc.
John L. Tregay
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
EXTERIOR GAUGE COMPONENT WITH ROTARY ENCODER WHEEL AND OPTICAL SENS...
Publication number
20240410737
Publication date
Dec 12, 2024
Service Insight LLC
Anthony Uzzo
G01 - MEASURING TESTING
Information
Patent Application
SENSOR TAG, METHOD FOR READING SENSOR TAG, AND SENSOR SYSTEM USING...
Publication number
20240318982
Publication date
Sep 26, 2024
Mitsubishi Electric Corporation
Koichi FURUYA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING THE AMOUNT OF BACKLASH IN AN ACTUAT...
Publication number
20240085221
Publication date
Mar 14, 2024
Honeywell International Inc.
David Podola
G01 - MEASURING TESTING
Information
Patent Application
EXTERIOR GAUGE COMPONENT WITH ROTARY ENCODER WHEEL AND OPTICAL SENS...
Publication number
20230067868
Publication date
Mar 2, 2023
Service Insight LLC
Anthony Uzzo
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION APPARATUS, CALIBRATION METHOD, AND NON-TRANSITORY COMPU...
Publication number
20220412782
Publication date
Dec 29, 2022
ASAHI KASEI MICRODEVICES CORPORATION
Shota KONNO
G01 - MEASURING TESTING
Information
Patent Application
SURFACE EMITTING LASER ELEMENT, ILLUMINATION DEVICE, PROJECTION DEV...
Publication number
20200303901
Publication date
Sep 24, 2020
Kazuki Nagasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL LINEAR ENCODER
Publication number
20180073899
Publication date
Mar 15, 2018
ZS Systems, LLC
Sergey I. Zakharov
G01 - MEASURING TESTING
Information
Patent Application
UV LASER BASED STAND-OFF ACOUSTIC SENSOR
Publication number
20180045544
Publication date
Feb 15, 2018
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Jay W. Dawson
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF SENSING ROTATION OF ROTATION MEMBER AND ELECTRONIC DEVICE...
Publication number
20170016748
Publication date
Jan 19, 2017
Samsung Electronics Co., Ltd.
Younghoon SONG
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR THE DIMENSIONAL INSPECTION OF CONTAINERS HAVING CONTACT...
Publication number
20160187165
Publication date
Jun 30, 2016
MSC & SGCC
Etienne LEPRAT
G01 - MEASURING TESTING
Information
Patent Application
ROTATIONAL SENSOR AND METHODS THEREFOR
Publication number
20140264037
Publication date
Sep 18, 2014
AIRWAY LIMITED
Berwyn Lee Hoyt
G01 - MEASURING TESTING
Information
Patent Application
ENCODER SYSTEM, SIGNAL PROCESSING METHOD, AND TRANSMISSION SIGNAL G...
Publication number
20110202308
Publication date
Aug 18, 2011
Nikon Corporation
Hiroyuki KISHIDA
G05 - CONTROLLING REGULATING
Information
Patent Application
Measuring Device with Two-channel Sampling
Publication number
20090276180
Publication date
Nov 5, 2009
Michael Schneider
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL DIRECTION DETECTING DEVICE AND METHOD FOR USING T...
Publication number
20090116730
Publication date
May 7, 2009
LITE-ON SEMICONDUCTOR CORP.
CHIA-CHU CHENG
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL POSITION DETECTING DEVICE AND METHOD FOR USING TH...
Publication number
20090116729
Publication date
May 7, 2009
LITE-ON SEMICONDUCTOR CORP.
CHIA-CHU CHENG
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT MEASURING APPARATUS
Publication number
20090033946
Publication date
Feb 5, 2009
SONY CORPORATION
Masahito Kon
G01 - MEASURING TESTING