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G01N24/006
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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N24/00
Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
Current Industry
G01N24/006
using optical pumping
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Patents Grants
last 30 patents
Information
Patent Grant
Atomic magnetometer system
Patent number
12,044,639
Issue date
Jul 23, 2024
NPL MANAGEMENT LIMITED
Witold Chalupczak
G01 - MEASURING TESTING
Information
Patent Grant
Controlling, detecting and entangling alkaline-earth rydberg atoms...
Patent number
12,039,406
Issue date
Jul 16, 2024
California Institute of Technology
Manuel Endres
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Physical state measurement device
Patent number
12,031,929
Issue date
Jul 9, 2024
Tokyo Institute of Technology
Yuji Hatano
G01 - MEASURING TESTING
Information
Patent Grant
NV-center-based microwave-free quantum sensor and uses and characte...
Patent number
11,988,619
Issue date
May 21, 2024
QUANTUM TECHNOLOGIES GMBH
Jan Berend Meijer
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Measuring device and measuring method
Patent number
11,988,729
Issue date
May 21, 2024
Kyoto University
Norikazu Mizuochi
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for quantum sensing using solid-state spin ense...
Patent number
11,940,399
Issue date
Mar 26, 2024
University of Maryland, College Park
Ronald Walsworth
G01 - MEASURING TESTING
Information
Patent Grant
PH-sensor for determining and/or measuring a pH-value of a medium
Patent number
11,906,452
Issue date
Feb 20, 2024
Endress + Hauser Conducta GmbH + Co. KG
Thomas Wilhelm
G01 - MEASURING TESTING
Information
Patent Grant
Controlling, detecting and entangling alkaline-earth Rydberg atoms...
Patent number
11,631,024
Issue date
Apr 18, 2023
California Institute of Technology
Manuel Endres
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic field measurement systems and methods employing feedback l...
Patent number
11,480,632
Issue date
Oct 25, 2022
HI LLC
Micah Ledbetter
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometer for measuring an unknown external magnetic field
Patent number
11,340,320
Issue date
May 24, 2022
Danmarks Tekniske Universitet
Alexander Huck
G01 - MEASURING TESTING
Information
Patent Grant
Cell for optically pumped magnetic sensor
Patent number
11,099,245
Issue date
Aug 24, 2021
Hamamatsu Photonics K.K.
Tetsuo Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Neural feedback loop filters for enhanced dynamic range magnetoence...
Patent number
11,022,658
Issue date
Jun 1, 2021
HI LLC
Micah Ledbetter
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for optically detecting magnetic resonance
Patent number
10,895,542
Issue date
Jan 19, 2021
Massachusetts Institute of Technology
Hannah A. Clevenson
G01 - MEASURING TESTING
Information
Patent Grant
Sensors and methods of identifying a gas, and levitated spin-optome...
Patent number
10,690,604
Issue date
Jun 23, 2020
Purdue Research Foundation
Tongcang Li
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for optically detecting magnetic resonance
Patent number
10,648,933
Issue date
May 12, 2020
Massachusetts Institute of Technology
Hannah A. Clevenson
G01 - MEASURING TESTING
Information
Patent Grant
Systems, apparatuses, and methods for optical focusing in scatterin...
Patent number
10,648,934
Issue date
May 12, 2020
Massachusetts Institute of Technology
Donggyu Kim
G02 - OPTICS
Information
Patent Grant
Optical pump beam control in a sensor system
Patent number
10,416,245
Issue date
Sep 17, 2019
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Method for the hyperpolarisation of nuclear spin in a diamond via a...
Patent number
10,345,400
Issue date
Jul 9, 2019
Universitaet Ulm
Fedor Jelezko
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scalar atomic magnetometer with heading error suppression
Patent number
10,274,549
Issue date
Apr 30, 2019
AOSense, Inc.
Micah Ledbetter
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for optically detecting magnetic resonance
Patent number
10,197,515
Issue date
Feb 5, 2019
Massachusetts Institute of Technology
Hannah A. Clevenson
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measurement device
Patent number
10,162,021
Issue date
Dec 25, 2018
Hitachi, Ltd.
Ryuzo Kawabata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for detecting zero-field resonance
Patent number
9,964,610
Issue date
May 8, 2018
QuSpinc, Inc.
Vishal Shah
G01 - MEASURING TESTING
Information
Patent Grant
Quantum mechanical measurement device
Patent number
9,726,626
Issue date
Aug 8, 2017
Geometrics, Inc.
Kenneth R. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for deterministic emitter switch microscopy
Patent number
9,632,045
Issue date
Apr 25, 2017
The Trustees of Columbia University In the City of New York
Dirk R. Englund
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measurement of spinning forces relating to molecules
Patent number
9,354,189
Issue date
May 31, 2016
President and Fellows of Harvard College
Wesley Philip Wong
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Grant
Method for detecting zero-field resonance
Patent number
9,116,201
Issue date
Aug 25, 2015
QuSpin Inc.
Vishal Shah
G01 - MEASURING TESTING
Information
Patent Grant
MRI thermometry combined with hyperpolarisation device using photon...
Patent number
8,636,980
Issue date
Jan 28, 2014
Koninklijke Philips N.V.
Daniel R. Elgort
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Nuclear magnetic resonance spectroscopy using light with orbital an...
Patent number
8,508,222
Issue date
Aug 13, 2013
Koninklijke Philips N.V.
Lucian Remus Albu
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
8,362,768
Issue date
Jan 29, 2013
Seiko Epson Corporation
Kimio Nagasaka
G01 - MEASURING TESTING
Information
Patent Grant
Detection with evanescent wave probe
Patent number
7,282,911
Issue date
Oct 16, 2007
Intematix Corporation
Xiao-Dong Xiang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NV-CENTER-BASED MICROWAVE-FREE QUANTUM SENSOR AND USES AND CHARACTE...
Publication number
20240264100
Publication date
Aug 8, 2024
Quantum Technologies GmbH
Jan Berend Meijer
C01 - INORGANIC CHEMISTRY
Information
Patent Application
DETECTION OF MAGNETIZATION INHOMOGENEITIES IN ULTRA-SCALED MAGNETIC...
Publication number
20240255468
Publication date
Aug 1, 2024
Qnami AG
Patrick Maletinsky
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR INTEGRATING DIAMOND WITH LED TOWARDS ON-C...
Publication number
20240167970
Publication date
May 23, 2024
Versitech Limited
Zhiqin CHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sensor Device for Magnetic Field Measurement by Means of Optical Ma...
Publication number
20240142396
Publication date
May 2, 2024
ROBERT BOSCH GmbH
Tino Fuchs
G01 - MEASURING TESTING
Information
Patent Application
Component Analysis Apparatus and Component Analysis Method
Publication number
20230400424
Publication date
Dec 14, 2023
HITACHI HIGH-TECH CORPORATION
Yoshiki YONAMOTO
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING, DETECTING AND ENTANGLING ALKALINE-EARTH RYDBERG ATOMS...
Publication number
20230342645
Publication date
Oct 26, 2023
California Institute of Technology
Manuel Endres
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL STATE MEASUREMENT DEVICE
Publication number
20230152258
Publication date
May 18, 2023
TOKYO INSTITUTE OF TECHNOLOGY
Yuji HATANO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR QUANTUM SENSING USING SOLID-STATE SPIN ENSE...
Publication number
20230084726
Publication date
Mar 16, 2023
University of Maryland, College Park
Ronald Walsworth
G01 - MEASURING TESTING
Information
Patent Application
PH-SENSOR
Publication number
20220373487
Publication date
Nov 24, 2022
Endress + Hauser Conducta GmbH + Co. KG
Thomas Wilhelm
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE AND MEASURING METHOD
Publication number
20220349964
Publication date
Nov 3, 2022
KYOTO UNIVERSITY
Norikazu MIZUOCHI
G01 - MEASURING TESTING
Information
Patent Application
NV-CENTER-BASED MICROWAVE-FREE QUANTUM SENSOR AND USES AND CHARACTE...
Publication number
20220307997
Publication date
Sep 29, 2022
Jan Berend Meijer
C01 - INORGANIC CHEMISTRY
Information
Patent Application
ATOMIC MAGNETOMETER SYSTEM
Publication number
20220260510
Publication date
Aug 18, 2022
NPL Management Limited
Witold Chalupczak
G01 - MEASURING TESTING
Information
Patent Application
NEURAL FEEDBACK LOOP FOR ENHANCED DYNAMIC RANGE MAGNETOENCEPHALOGRA...
Publication number
20210239772
Publication date
Aug 5, 2021
HI LLC
Micah Ledbetter
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OPTICALLY DETECTING MAGNETIC RESONANCE
Publication number
20200300792
Publication date
Sep 24, 2020
Massachusetts Institute of Technology
Hannah A. CLEVENSON
G01 - MEASURING TESTING
Information
Patent Application
A MAGNETOMETER USING OPTICALLY ACTIVE DEFECTS IN A SOLID STATE MATE...
Publication number
20200158798
Publication date
May 21, 2020
DANMARKS TEKNISKE UNIVERSITET
Alexander Huck
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE HYPERPOLARISATION OF NUCLEAR SPIN IN A DIAMOND VIA A...
Publication number
20190391216
Publication date
Dec 26, 2019
Universitaet Ulm
Fedor JELEZKO
B82 - NANO-TECHNOLOGY
Information
Patent Application
SYSTEMS, APPARATUSES, AND METHODS FOR OPTICAL FOCUSING IN SCATTERIN...
Publication number
20190219527
Publication date
Jul 18, 2019
DONGGYU KIM
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OPTICALLY DETECTING MAGNETIC RESONANCE
Publication number
20190145919
Publication date
May 16, 2019
Massachusetts Institute of Technology
Hannah A. Clevenson
G01 - MEASURING TESTING
Information
Patent Application
SENSORS AND METHODS OF IDENTIFYING A GAS, AND LEVITATED SPIN-OPTOME...
Publication number
20180059039
Publication date
Mar 1, 2018
Purdue Research Foundation
Tongcang Li
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETERMINISTIC EMITTER SWITCH MICROSCOPY
Publication number
20160161429
Publication date
Jun 9, 2016
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
Dirk R. Englund
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE HYPERPOLARISATION OF NUCLEAR SPIN IN A DIAMOND VIA...
Publication number
20160061914
Publication date
Mar 3, 2016
Universitaet Ulm
Fedor JELEZKO
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OPTICALLY DETECTING MAGNETIC RESONANCE
Publication number
20150192532
Publication date
Jul 9, 2015
Massachusetts Institute of Technology
Hannah A. Clevenson
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM MECHANICAL MEASUREMENT DEVICE
Publication number
20130214780
Publication date
Aug 22, 2013
GEOMETRICS, INC.
Kenneth R. SMITH
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MEASUREMENT OF SPINNING FORCES RELATING TO MOLECULES
Publication number
20130130884
Publication date
May 23, 2013
President and Fellows of Harvard College
Wesley Philip Wong
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Application
MRI BY DIRECT TRANSVERSE HYPERPOLARIZATION USING LIGHT ENDOWED WITH...
Publication number
20120150019
Publication date
Jun 14, 2012
Koninklijke Philips Electronics N.V.
Daniel Elgort
G01 - MEASURING TESTING
Information
Patent Application
MRI WITH HYPERPOLARISATION DEVICE USING PHOTONS WITH ORBITAL ANGULA...
Publication number
20120086453
Publication date
Apr 12, 2012
Koninklijke Philips Electronics N.V.
Lucian Remus Albu
G01 - MEASURING TESTING
Information
Patent Application
HYPERPOLARISATION DEVICE USING PHOTONS WITH ORBITAL ANGULAR MOMENTUM
Publication number
20120081120
Publication date
Apr 5, 2012
Koninklijke Philips Electronics N.V.
Daniel R. Elgort
G02 - OPTICS
Information
Patent Application
MRI THERMOMETRY COMBINED WITH HYPERPOLARISATION DEVICE USING PHOTON...
Publication number
20120078082
Publication date
Mar 29, 2012
Koninklijke Philips Electronics N.V.
Daniel R. Elgort
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY USING LIGHT WITH ORBITAL AN...
Publication number
20100327866
Publication date
Dec 30, 2010
Koninklijke Philips Electronics N.V.
Lucian Remus Albu
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20100327865
Publication date
Dec 30, 2010
SEIKO EPSON CORPORATION
Kimio Nagasaka
G01 - MEASURING TESTING