using permanent magnets only

Industry

CPC
H01J3/24

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J3/00Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps

Current Industry

H01J3/24using permanent magnets only

Industries

Patents Grantslast 30 patents

Information Patent Grant
Magnetically microfocused electron emission source
- Patent number 11,037,753
- Issue date Jun 15, 2021
- KLA Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable-focus magnetostatic lens
- Patent number 10,998,158
- Issue date May 4, 2021
- Triad National Security, LLC
- John Lewellen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tubular permanent magnet used in a multi-electron beam device
- Patent number 9,418,815
- Issue date Aug 16, 2016
- Param Corporation
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mass analyzer apparatus and systems operative for focusing ribbon i...
- Patent number 8,921,802
- Issue date Dec 30, 2014
- Nicholas R. White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid magnet for vacuum electronic device
- Patent number 8,723,137
- Issue date May 13, 2014
- InnoSys, Inc.
- Ruey-Jen Hwu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of addressing a magnetic matrix electron source flat panel d...
- Patent number 6,040,808
- Issue date Mar 21, 2000
- International Business Machines Corporation
- Andrew Knox
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Electron source with light shutter device
- Patent number 6,002,207
- Issue date Dec 14, 1999
- International Business Machines Corporation
- John Beeteson
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Method for optimizing the magnetic field of a periodic permanent ma...
- Patent number 6,002,988
- Issue date Dec 14, 1999
- Northrop Grumman Corporation
- David Riley Whaley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic matrix display device using orthogonal conductors
- Patent number 5,929,828
- Issue date Jul 27, 1999
- International Business Machines Corporation
- John Beeteson
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Electron source including a perforated permanent magnet
- Patent number 5,917,277
- Issue date Jun 29, 1999
- International Business Machines Corporation
- Andrew Knox
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Electron source with grid spacer
- Patent number 5,861,712
- Issue date Jan 19, 1999
- International Business Machines Corporation
- John Beetson
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Electron source
- Patent number 5,760,548
- Issue date Jun 2, 1998
- International Business Machines Corporation
- John Beeteson
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Magnetic matrix display device and computer system for displaying d...
- Patent number 5,753,998
- Issue date May 19, 1998
- International Business Machines Corporation
- John Beeteson
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Magnetic matrix display device and computer system for displaying d...
- Patent number 5,747,923
- Issue date May 5, 1998
- International Business Machines Corporation
- John Beeteson
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
3873869
- Patent number 3,873,869
- Issue date Mar 25, 1975
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Source
- Publication number 20160163500
- Publication date Jun 9, 2016
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON LENS AND THE ELECTRON BEAM DEVICE
- Publication number 20140252245
- Publication date Sep 11, 2014
- PARAM CORPORATION
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON LENS AND THE ELECTRON BEAM DEVICE
- Publication number 20130134322
- Publication date May 30, 2013
- PARAM CORPORATION
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
Mass analyzer apparatus and systems operative for focusing ribbon i...
- Publication number 20120235053
- Publication date Sep 20, 2012
- Nicholas R. White
- H01 - BASIC ELECTRIC ELEMENTS

using permanent magnets only

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Magnetically microfocused electron emission source

Variable-focus magnetostatic lens

Tubular permanent magnet used in a multi-electron beam device

Mass analyzer apparatus and systems operative for focusing ribbon i...

Hybrid magnet for vacuum electronic device

Method of addressing a magnetic matrix electron source flat panel d...

Electron source with light shutter device

Method for optimizing the magnetic field of a periodic permanent ma...

Magnetic matrix display device using orthogonal conductors

Electron source including a perforated permanent magnet

Electron source with grid spacer

Electron source

Magnetic matrix display device and computer system for displaying d...

Magnetic matrix display device and computer system for displaying d...

3873869

Patents Applicationslast 30 patents

Charged Particle Source

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

Mass analyzer apparatus and systems operative for focusing ribbon i...