using self-test structures integrated into the microstructure

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GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT

Current Industry

G01P2015/0868using self-test structures integrated into the microstructure

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Patents Grantslast 30 patents

Information Patent Grant
Robust inertial sensor self-test
- Patent number 12,227,409
- Issue date Feb 18, 2025
- Invensense, Inc.
- Aurelio Pellegrini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Differential mems device and methods
- Patent number 11,892,465
- Issue date Feb 6, 2024
- Movella Inc.
- Sanjay Bhandari
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Real-time isolation of self-test and linear acceleration signals
- Patent number 11,789,036
- Issue date Oct 17, 2023
- Invensense, Inc.
- Kevin Hughes
- G01 - MEASURING TESTING
Information Patent Grant
MEMS vibrating beam accelerometer with built-in test actuators
- Patent number 11,703,521
- Issue date Jul 18, 2023
- Honeywell International Inc.
- John Reinke
- G01 - MEASURING TESTING
Information Patent Grant
MEMS accelerometer self-test using an active mobile mass deflection...
- Patent number 11,320,452
- Issue date May 3, 2022
- STMicroelectronics, Inc.
- Yamu Hu
- G01 - MEASURING TESTING
Information Patent Grant
Real-time isolation of self-test and linear acceleration signals
- Patent number 11,307,218
- Issue date Apr 19, 2022
- Invensense, Inc.
- Kevin Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Continuous calibration of accelerometer sensitivity by proof-mass d...
- Patent number 11,287,442
- Issue date Mar 29, 2022
- Apple Inc.
- Wesley S. Smith
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Accelerometer sensitivity self-calibration with duty cycle control...
- Patent number 11,268,975
- Issue date Mar 8, 2022
- Invensense, Inc.
- Michele Folz
- G01 - MEASURING TESTING
Information Patent Grant
Differential MEMS device and methods
- Patent number 11,255,871
- Issue date Feb 22, 2022
- MCube, Inc.
- Sanjay Bhandari
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor blending with offset adjustment
- Patent number 11,061,051
- Issue date Jul 13, 2021
- Honeywell International Inc.
- Timothy J Hanson
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometers
- Patent number 10,571,485
- Issue date Feb 25, 2020
- ATLANTIC INERTIAL SYSTEMS, LIMITED
- Michael Durston
- G01 - MEASURING TESTING
Information Patent Grant
Stiction detection and recovery in a micro-electro-mechanical syste...
- Patent number 10,488,430
- Issue date Nov 26, 2019
- NXP USA, INC.
- Jerome Romain Enjalbert
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer with offset compensation
- Patent number 9,927,459
- Issue date Mar 27, 2018
- Analog Devices, Inc.
- William A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Self test of MEMS accelerometer with ASICS integrated capacitors
- Patent number 9,488,693
- Issue date Nov 8, 2016
- Fairchild Semiconductor Corporation
- Jonathan Adam Kleks
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ACCELERATION SENSOR
- Publication number 20240061010
- Publication date Feb 22, 2024
- Rohm Co., Ltd.
- Hiroki MIYABUCHI
- G01 - MEASURING TESTING
Information Patent Application
ROBUST INERTIAL SENSOR SELF-TEST
- Publication number 20230183058
- Publication date Jun 15, 2023
- InvenSense, Inc.
- Aurelio Pellegrini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DIFFERENTIAL MEMS DEVICE AND METHODS
- Publication number 20220229084
- Publication date Jul 21, 2022
- MCUBE, INC.
- Sanjay BHANDARI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
REAL-TIME ISOLATION OF SELF-TEST AND LINEAR ACCELERATION SIGNALS
- Publication number 20220229086
- Publication date Jul 21, 2022
- InvenSense, Inc.
- Kevin Hughes
- G01 - MEASURING TESTING
Information Patent Application
MEMS VIBRATING BEAM ACCELEROMETER WITH BUILT-IN TEST ACTUATORS
- Publication number 20220178963
- Publication date Jun 9, 2022
- Honeywell International Inc.
- John Reinke
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME ISOLATION OF SELF-TEST AND LINEAR ACCELERATION SIGNALS
- Publication number 20210364546
- Publication date Nov 25, 2021
- InvenSense, Inc.
- Kevin Hughes
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER SENSITIVITY SELF-CALIBRATION WITH DUTY CYCLE CONTROL...
- Publication number 20210190813
- Publication date Jun 24, 2021
- InvenSense, Inc.
- Michele Folz
- G01 - MEASURING TESTING
Information Patent Application
MEMS ACCELEROMETER SELF-TEST USING AN ACTIVE MOBILE MASS DEFLECTION...
- Publication number 20200408805
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
SENSOR BLENDING WITH OFFSET ADJUSTMENT
- Publication number 20200103436
- Publication date Apr 2, 2020
- HONEYWELL INTERNATIONAL INC.
- Timothy J. Hanson
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS CALIBRATION OF ACCELEROMETER SENSITIVITY BY PROOF-MASS D...
- Publication number 20190277877
- Publication date Sep 12, 2019
- Apple Inc.
- Wesley S. Smith
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
STICTION DETECTION AND RECOVERY IN A MICRO-ELECTRO-MECHANICAL SYSTE...
- Publication number 20180113147
- Publication date Apr 26, 2018
- NXP USA, Inc.
- Jerome Romain Enjalbert
- G01 - MEASURING TESTING
Information Patent Application
SELF TEST OF MEMS ACCELEROMETER WITH ASICS INTEGRATED CAPACITORS
- Publication number 20130265070
- Publication date Oct 10, 2013
- Fairchild Semiconductor Corporation
- Jonathan Adam Kleks
- B81 - MICRO-STRUCTURAL TECHNOLOGY

using self-test structures integrated into the microstructure

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Robust inertial sensor self-test

Differential mems device and methods

Real-time isolation of self-test and linear acceleration signals

MEMS vibrating beam accelerometer with built-in test actuators

MEMS accelerometer self-test using an active mobile mass deflection...

Real-time isolation of self-test and linear acceleration signals

Continuous calibration of accelerometer sensitivity by proof-mass d...

Accelerometer sensitivity self-calibration with duty cycle control...

Differential MEMS device and methods

Sensor blending with offset adjustment

Accelerometers

Stiction detection and recovery in a micro-electro-mechanical syste...

Accelerometer with offset compensation

Self test of MEMS accelerometer with ASICS integrated capacitors

Patents Applicationslast 30 patents

ACCELERATION SENSOR

ROBUST INERTIAL SENSOR SELF-TEST

DIFFERENTIAL MEMS DEVICE AND METHODS

REAL-TIME ISOLATION OF SELF-TEST AND LINEAR ACCELERATION SIGNALS

MEMS VIBRATING BEAM ACCELEROMETER WITH BUILT-IN TEST ACTUATORS

REAL-TIME ISOLATION OF SELF-TEST AND LINEAR ACCELERATION SIGNALS

ACCELEROMETER SENSITIVITY SELF-CALIBRATION WITH DUTY CYCLE CONTROL...

MEMS ACCELEROMETER SELF-TEST USING AN ACTIVE MOBILE MASS DEFLECTION...

SENSOR BLENDING WITH OFFSET ADJUSTMENT

CONTINUOUS CALIBRATION OF ACCELEROMETER SENSITIVITY BY PROOF-MASS D...

STICTION DETECTION AND RECOVERY IN A MICRO-ELECTRO-MECHANICAL SYSTE...

SELF TEST OF MEMS ACCELEROMETER WITH ASICS INTEGRATED CAPACITORS