using semiconductor body comprising at least one PN junction as detecting element

Industry

CPC
G01L9/0098

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Parent Industries

GPHYSICS G01Measuring instruments G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE G01L9/00Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by electric or magnetic pressure-sensitive elements Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material by electric or magnetic means

Current Industry

G01L9/0098using semiconductor body comprising at least one PN junction as detecting element

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Integrated sensor apparatus with pressure sensing element and flow...
- Patent number 11,300,535
- Issue date Apr 12, 2022
- Honeywell International Inc.
- Richard Charles Sorenson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electric device for detecting pressure
- Patent number 10,488,287
- Issue date Nov 26, 2019
- City University of Hong Kong
- A. L. Roy Vellaisamy
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensing device
- Patent number 10,393,607
- Issue date Aug 27, 2019
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G01 - MEASURING TESTING
Information Patent Grant
Frequency shifted, vacuum pressure sensor
- Patent number 10,317,300
- Issue date Jun 11, 2019
- National Technology & Engineering Solutions of Sandia, LLC
- Juan M. Elizondo-Decanini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure sensing device having Dirac material and method of operati...
- Patent number 9,976,918
- Issue date May 22, 2018
- Industry-University Cooperation Foundation Hanyang University
- Seung-Beck Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Environmental sensor and a method for determining relative vapour p...
- Patent number 9,945,765
- Issue date Apr 17, 2018
- Provenance Asset Group LLC
- Richard White
- G01 - MEASURING TESTING
Information Patent Grant
Sensors and method of operating sensor
- Patent number 9,660,169
- Issue date May 23, 2017
- Honeywell International Inc.
- Viorel G. Dumitru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with lamella defined by singulation trench
- Patent number 9,527,725
- Issue date Dec 27, 2016
- Infineon Technologies AG
- Boris Binder
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for producing a microelectromechanical device and microelect...
- Patent number 9,435,699
- Issue date Sep 6, 2016
- Elmos Semiconductor AG
- Arnd Ten Have
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for measuring a microelectromechanical semiconductor component
- Patent number 9,322,731
- Issue date Apr 26, 2016
- Elmos Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of limiting capillary action of gel material during assembly...
- Patent number 9,190,339
- Issue date Nov 17, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Soon Kang Chan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromechanical sensor apparatus having a movable gate and correspo...
- Patent number 9,166,066
- Issue date Oct 20, 2015
- Robert Bosch GmbH
- Ando Feyh
- G01 - MEASURING TESTING
Information Patent Grant
Stacked die sensor package
- Patent number 9,134,193
- Issue date Sep 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chee Seng Foong
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for producing a microelectromechanical device and microelect...
- Patent number 9,034,680
- Issue date May 19, 2015
- Elmos Semiconductor AG
- Arnd Ten Have
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Solid state pressure sensor
- Patent number 8,984,953
- Issue date Mar 24, 2015
- STMicroelectronics S.R.L.
- Manuela Larosa
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring a microelectromechanical semiconduc...
- Patent number 8,943,907
- Issue date Feb 3, 2015
- Elmos Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor structure with lamella defined by singulation trench
- Patent number 8,723,276
- Issue date May 13, 2014
- Infineon Technologies AG
- Boris Binder
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
High temperature strain sensor
- Patent number 8,546,817
- Issue date Oct 1, 2013
- Honeywell International Inc.
- Viorel Georgel Dumitru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including a cavity
- Patent number 8,471,346
- Issue date Jun 25, 2013
- Infineon Technologies AG
- Thoralf Kautzsch
- G01 - MEASURING TESTING
Information Patent Grant
Sub-threshold elastic deflection FET sensor for sensing pressure/fo...
- Patent number 8,459,128
- Issue date Jun 11, 2013
- Indian Institute of Science
- Navakanta Bhat
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Force detection element
- Patent number 8,171,806
- Issue date May 8, 2012
- Kabushiki Kaisha Toyota Chuo Kenkyusho
- Kentaro Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Temperature extraction from a pressure sensor
- Patent number 8,082,796
- Issue date Dec 27, 2011
- Silicon Microstructures, Inc.
- Michael B. Doelle
- G01 - MEASURING TESTING
Information Patent Grant
Electronic pressure-sensing device
- Patent number 8,037,771
- Issue date Oct 18, 2011
- LSI Corporation
- Edward B. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Use of field oxidation to simplify chamber fabrication in microflui...
- Patent number 7,964,474
- Issue date Jun 21, 2011
- STMicroelectronics, Inc.
- Ming Fang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for MEMS threshold sensor packaging
- Patent number 7,927,906
- Issue date Apr 19, 2011
- Honeywell International Inc.
- Cornel P. Cobianu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device including a pressure sensor
- Patent number 7,832,279
- Issue date Nov 16, 2010
- Infineon Technologies AG
- Thoralf Kautzsch
- G01 - MEASURING TESTING
Information Patent Grant
Transistor-type pressure sensor and method for fabricating the same
- Patent number 7,743,664
- Issue date Jun 29, 2010
- Industrial Technology Research Institute
- Chao-Feng Sung
- G01 - MEASURING TESTING
Information Patent Grant
Quantum dot based pressure switch
- Patent number 7,358,581
- Issue date Apr 15, 2008
- Kulite Semiconductor Products, Inc.
- Anthony D. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor with improved vibrating microassembly and optical d...
- Patent number 7,334,481
- Issue date Feb 26, 2008
- Varian S.p.A.
- Raffaele Correale
- G01 - MEASURING TESTING
Information Patent Grant
MOS transistor with a deformable gate
- Patent number 7,304,358
- Issue date Dec 4, 2007
- STMicroelectronics S.A.
- Pascal Ancey
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
PRESSURE SENSOR AND METHOD OF MANUFACTURING PRESSURE SENSOR
- Publication number 20230417613
- Publication date Dec 28, 2023
- Rohm Co., Ltd.
- Martin Wilfried HELLER
- G01 - MEASURING TESTING
Information Patent Application
ADVANCED PRESSURE BASED MASS FLOW CONTROLLERS AND DIAGNOSTICS
- Publication number 20200348702
- Publication date Nov 5, 2020
- Illinois Tool Works Inc.
- Arun NAGARAJAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED SENSOR APPARATUS WITH PRESSURE SENSING ELEMENT AND FLOW...
- Publication number 20200319127
- Publication date Oct 8, 2020
- HONEYWELL INTERNATIONAL INC.
- Richard Charles Sorenson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SEMICONDUCTOR SENSING DEVICE
- Publication number 20170363494
- Publication date Dec 21, 2017
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PHYSICAL QUANTITY SENSOR DEVICE
- Publication number 20170045407
- Publication date Feb 16, 2017
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF LIMITING CAPILLARY ACTION OF GEL MATERIAL DURING ASSEMBLY...
- Publication number 20150221572
- Publication date Aug 6, 2015
- Soon Kang Chan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
LOW PRESSURE SENSORS AND FLOW SENSORS
- Publication number 20150192487
- Publication date Jul 9, 2015
- GENERAL ELECTRIC COMPANY
- Nickolai S. Belov
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
STACKED DIE SENSOR PACKAGE
- Publication number 20150160087
- Publication date Jun 11, 2015
- Chee Seng Foong
- B60 - VEHICLES IN GENERAL
Information Patent Application
Micromechanical Sensor Apparatus having a Movable Gate and Correspo...
- Publication number 20140374804
- Publication date Dec 25, 2014
- ROBERT BOSCH GmbH
- Ando Feyh
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH LAMELLA DEFINED BY SINGULATION TRENCH
- Publication number 20140227818
- Publication date Aug 14, 2014
- INFINEON TECHNOLOGIES AG
- Boris Binder
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SOLID STATE PRESSURE SENSOR
- Publication number 20130269443
- Publication date Oct 17, 2013
- Manuela LAROSA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING A MICROELECTROMECHANICAL SEMICONDUCTOR COMPONENT
- Publication number 20130263643
- Publication date Oct 10, 2013
- ELMOS Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND DEVICE FOR MEASURING A MICROELECTROMECHANICAL SEMICONDUC...
- Publication number 20130247688
- Publication date Sep 26, 2013
- ELMOS Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR HAVING NANOSTRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20130140611
- Publication date Jun 6, 2013
- Jin Seok KIM
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD FOR PRODUCING A MICROELECTROMECHANICAL DEVICE AND MICROELECT...
- Publication number 20130126948
- Publication date May 23, 2013
- ELMOS Semiconductor AG
- Arnd Ten Have
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SILICIDE GAP THIN FILM TRANSISTOR
- Publication number 20130050166
- Publication date Feb 28, 2013
- QUALCOMM MEMS TECHNOLOGIES, INC.
- John Hyunchul HONG
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE EXTRACTION FROM A PRESSURE SENSOR
- Publication number 20130008255
- Publication date Jan 10, 2013
- Silicon Microstructures, Inc.
- Michael B. Doelle
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE STRAIN SENSOR
- Publication number 20120161147
- Publication date Jun 28, 2012
- Honeywell International Inc.
- Viorel Georgel DUMITRU
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE INDEPENDENT PRESSURE SENSOR AND ASSOCIATED METHODS THEREOF
- Publication number 20110320142
- Publication date Dec 29, 2011
- GENERAL ELECTRIC COMPANY
- Cheryl Margaret Surman
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Detecting an Error Within a Plurality of C...
- Publication number 20110138249
- Publication date Jun 9, 2011
- INFINEON TECHNOLOGIES AG
- Thomas Kern
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PRESSURE SENSING
- Publication number 20110137184
- Publication date Jun 9, 2011
- Fan Ren
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Semiconductor Structure with Lamella Defined by Singulation Trench
- Publication number 20110068420
- Publication date Mar 24, 2011
- INFINEON TECHNOLOGIES AG
- Boris Binder
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SUB-THRESHOLD ELASTIC DEFLECTION FET SENSOR FOR SENSING PRESSURE/FO...
- Publication number 20110023632
- Publication date Feb 3, 2011
- INDIAN INSTITUTE OF SCIENCE
- Navakanta Bhat
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ELECTRONIC PRESSURE-SENSING DEVICE
- Publication number 20100288048
- Publication date Nov 18, 2010
- LSI Corporation
- Edward B. Harris
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A CAVITY
- Publication number 20100218613
- Publication date Sep 2, 2010
- INFINEON TECHNOLOGIES AG
- Thoralf Kautzsch
- G01 - MEASURING TESTING
Information Patent Application
Force detection element
- Publication number 20100206092
- Publication date Aug 19, 2010
- KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO
- Kentaro Mizuno
- G01 - MEASURING TESTING
Information Patent Application
USE OF FIELD OXIDATION TO SIMPLIFY CHAMBER FABRICATION IN MICROFLUI...
- Publication number 20100167497
- Publication date Jul 1, 2010
- STMicroelectronics, Inc.
- Ming Fang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A PRESSURE SENSOR
- Publication number 20100058876
- Publication date Mar 11, 2010
- INFINEON TECHNOLOGIES AG
- Thoralf Kautzsch
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR-TYPE PRESSURE SENSOR AND METHOD FOR FABRICATING THE SAME
- Publication number 20090199648
- Publication date Aug 13, 2009
- Industrial Technology Research Institute
- Chao-Feng Sung
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEMS THRESHOLD SENSOR PACKAGING
- Publication number 20090194828
- Publication date Aug 6, 2009
- Honeywell International Inc.
- Cornel P. Cobianu
- B81 - MICRO-STRUCTURAL TECHNOLOGY

using semiconductor body comprising at least one PN junction as detecting element

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated sensor apparatus with pressure sensing element and flow...

Electric device for detecting pressure

Semiconductor sensing device

Frequency shifted, vacuum pressure sensor

Pressure sensing device having Dirac material and method of operati...

Environmental sensor and a method for determining relative vapour p...

Sensors and method of operating sensor

Semiconductor structure with lamella defined by singulation trench

Method for producing a microelectromechanical device and microelect...

Method for measuring a microelectromechanical semiconductor component

Method of limiting capillary action of gel material during assembly...

Micromechanical sensor apparatus having a movable gate and correspo...

Stacked die sensor package

Method for producing a microelectromechanical device and microelect...

Solid state pressure sensor

Method and device for measuring a microelectromechanical semiconduc...

Semiconductor structure with lamella defined by singulation trench

High temperature strain sensor

Semiconductor device including a cavity

Sub-threshold elastic deflection FET sensor for sensing pressure/fo...

Force detection element

Temperature extraction from a pressure sensor

Electronic pressure-sensing device

Use of field oxidation to simplify chamber fabrication in microflui...

Method for MEMS threshold sensor packaging

Semiconductor device including a pressure sensor

Transistor-type pressure sensor and method for fabricating the same

Quantum dot based pressure switch

Pressure sensor with improved vibrating microassembly and optical d...

MOS transistor with a deformable gate

Patents Applicationslast 30 patents

PRESSURE SENSOR AND METHOD OF MANUFACTURING PRESSURE SENSOR

ADVANCED PRESSURE BASED MASS FLOW CONTROLLERS AND DIAGNOSTICS

INTEGRATED SENSOR APPARATUS WITH PRESSURE SENSING ELEMENT AND FLOW...

SEMICONDUCTOR SENSING DEVICE

SEMICONDUCTOR PHYSICAL QUANTITY SENSOR DEVICE

METHOD OF LIMITING CAPILLARY ACTION OF GEL MATERIAL DURING ASSEMBLY...

LOW PRESSURE SENSORS AND FLOW SENSORS

STACKED DIE SENSOR PACKAGE

Micromechanical Sensor Apparatus having a Movable Gate and Correspo...

SEMICONDUCTOR STRUCTURE WITH LAMELLA DEFINED BY SINGULATION TRENCH

SOLID STATE PRESSURE SENSOR

METHOD FOR MEASURING A MICROELECTROMECHANICAL SEMICONDUCTOR COMPONENT

METHOD AND DEVICE FOR MEASURING A MICROELECTROMECHANICAL SEMICONDUC...

PRESSURE SENSOR HAVING NANOSTRUCTURE AND MANUFACTURING METHOD THEREOF

METHOD FOR PRODUCING A MICROELECTROMECHANICAL DEVICE AND MICROELECT...

SILICIDE GAP THIN FILM TRANSISTOR

TEMPERATURE EXTRACTION FROM A PRESSURE SENSOR

HIGH TEMPERATURE STRAIN SENSOR

TEMPERATURE INDEPENDENT PRESSURE SENSOR AND ASSOCIATED METHODS THEREOF

Apparatus and Method for Detecting an Error Within a Plurality of C...

PRESSURE SENSING

Semiconductor Structure with Lamella Defined by Singulation Trench

SUB-THRESHOLD ELASTIC DEFLECTION FET SENSOR FOR SENSING PRESSURE/FO...

ELECTRONIC PRESSURE-SENSING DEVICE

SEMICONDUCTOR DEVICE INCLUDING A CAVITY

Force detection element

USE OF FIELD OXIDATION TO SIMPLIFY CHAMBER FABRICATION IN MICROFLUI...

SEMICONDUCTOR DEVICE INCLUDING A PRESSURE SENSOR

TRANSISTOR-TYPE PRESSURE SENSOR AND METHOD FOR FABRICATING THE SAME

METHOD FOR MEMS THRESHOLD SENSOR PACKAGING