using sequentially two or more inspection runs

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CPC
G01N2021/8867

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8867using sequentially two or more inspection runs

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System for inspecting thin glass
- Patent number 12,007,333
- Issue date Jun 11, 2024
- Samsung Display Co., Ltd.
- Janghoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Prediction device for predicting a growth direction of a crack in a...
- Patent number 11,913,889
- Issue date Feb 27, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yuki Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for in-situ optical inspection of laser-induce...
- Patent number 11,860,091
- Issue date Jan 2, 2024
- Iraj Kavosh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optimizing inspection of exterior of target object an...
- Patent number 11,747,284
- Issue date Sep 5, 2023
- Koh Young Technology Inc.
- Jin Man Kang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen inspection machine and operation method thereof
- Patent number 11,650,146
- Issue date May 16, 2023
- Wistron Corp.
- Chen-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for object examination
- Patent number 11,592,400
- Issue date Feb 28, 2023
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Support system for specified inspection, support method for specifi...
- Patent number 11,561,184
- Issue date Jan 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi Tada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic defect classification
- Patent number 11,300,521
- Issue date Apr 12, 2022
- Camtek Ltd.
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for optimizing inspection of exterior of target object an...
- Patent number 11,268,910
- Issue date Mar 8, 2022
- Koh Young Technology Inc.
- Jin Man Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection system, setting device, and inspection method
- Patent number 11,218,642
- Issue date Jan 4, 2022
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Methods of manufacturing a light source carrier and an electronic d...
- Patent number 11,150,189
- Issue date Oct 19, 2021
- Innolux Corporation
- Wan-Ting Ke
- G01 - MEASURING TESTING
Information Patent Grant
Image inspecting apparatus, image inspecting method and image inspe...
- Patent number 11,080,843
- Issue date Aug 3, 2021
- Omron Corporation
- Shingo Inazumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for material web monitoring and material web insp...
- Patent number 10,878,552
- Issue date Dec 29, 2020
- Texmag GmbH Vertriebsgesellschaft.
- Markus Herrmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for object examination
- Patent number 10,871,451
- Issue date Dec 22, 2020
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,861,145
- Issue date Dec 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Remote visual inspection method and system
- Patent number 10,853,645
- Issue date Dec 1, 2020
- COLLINEO INC.
- Guillaume Lambert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and machine for examining wafers
- Patent number 10,840,156
- Issue date Nov 17, 2020
- ASML Netherlands B.V.
- Chien-Hung Chou
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for imaging a surface defect on an object
- Patent number 10,823,681
- Issue date Nov 3, 2020
- Agency for Science, Technology and Research
- Wenyu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection system
- Patent number 10,809,635
- Issue date Oct 20, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,705,029
- Issue date Jul 7, 2020
- SCREEN Holdings Co., Ltd.
- Yasushi Nagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for compensating for a material web offset in mat...
- Patent number 10,690,601
- Issue date Jun 23, 2020
- Texmag GmbH Vertriebsgesellschaft.
- Markus Herrmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contrast-based imaging and analysis computer-implemented methods to...
- Patent number 10,620,133
- Issue date Apr 14, 2020
- United States of America as represented by the Administrator of the National...
- Ajay M Koshti
- G01 - MEASURING TESTING
Information Patent Grant
Metrology guided inspection sample shaping of optical inspection re...
- Patent number 10,598,617
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 10,593,032
- Issue date Mar 17, 2020
- Samsung Electronics Co., Ltd.
- Sung-Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Portable defect mitigator for electrochromic windows
- Patent number 10,532,948
- Issue date Jan 14, 2020
- View, Inc.
- Robert T. Rozbicki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of detecting defects of a moving sheet of flexible fibrous m...
- Patent number 10,458,922
- Issue date Oct 29, 2019
- PFNONWOVENS CZECH S.R.O.
- Frantisek Rezac
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical inspection system and operating method thereof
- Patent number 10,438,340
- Issue date Oct 8, 2019
- Test Research, Inc.
- Kuang-Pu Wen
- G01 - MEASURING TESTING
Information Patent Grant
Optical device for detecting an internal flaw of a transparent subs...
- Patent number 10,429,317
- Issue date Oct 1, 2019
- Saint-Gobain Glass France
- Yuan Zheng
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for object examination
- Patent number 10,408,764
- Issue date Sep 10, 2019
- Applied Materials Israel Ltd.
- Saar Shabtay
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTING METHOD,...
- Publication number 20240183792
- Publication date Jun 6, 2024
- Omron Corporation
- Takako ONISHI
- G01 - MEASURING TESTING
Information Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
- Publication number 20240102937
- Publication date Mar 28, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
- Publication number 20240102939
- Publication date Mar 28, 2024
- Apple Inc.
- Mikael B. MANNBERG
- G01 - MEASURING TESTING
Information Patent Application
GLASS INSPECTION
- Publication number 20240085342
- Publication date Mar 14, 2024
- PILKINGTON GROUP LIMITED
- Simon CHERRY
- G01 - MEASURING TESTING
Information Patent Application
CELL DETECTION METHOD, APPARATUS, AND SYSTEM, COMPUTER DEVICE, AND...
- Publication number 20240077432
- Publication date Mar 7, 2024
- Contemporary Amperex Technology Co., Limited
- Yinhang TU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR INSPECTING THIN GLASS
- Publication number 20230042179
- Publication date Feb 9, 2023
- SAMSUNG DISPLAY CO., LTD.
- JANGHOON LEE
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE...
- Publication number 20230003641
- Publication date Jan 5, 2023
- Omya International AG
- Roger BOLLSTROM
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DEFECT CLASSIFICATION
- Publication number 20220214287
- Publication date Jul 7, 2022
- Camtek LTD.
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR OPTIMIZING INSPECTION OF EXTERIOR OF TARGET OBJECT AN...
- Publication number 20220178841
- Publication date Jun 9, 2022
- KOH YOUNG TECHNOLOGY INC.
- Jin Man KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR IN-SITU OPTICAL INSPECTION OF LASER-INDUCE...
- Publication number 20220163445
- Publication date May 26, 2022
- Iraj Kavosh
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN INSPECTION MACHINE AND OPERATION METHOD THEREOF
- Publication number 20210208061
- Publication date Jul 8, 2021
- WISTRON CORP.
- Chen-Fa WANG
- G01 - MEASURING TESTING
Information Patent Application
PREDICTION DEVICE AND PREDICTION METHOD
- Publication number 20210116388
- Publication date Apr 22, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Yuki MARUYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR OPTIMIZING INSPECTION OF EXTERIOR OF TARGET OBJECT AN...
- Publication number 20200292463
- Publication date Sep 17, 2020
- KOH YOUNG TECHNOLOGY INC.
- Jin Man KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFI...
- Publication number 20200278303
- Publication date Sep 3, 2020
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi TADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Migdal Haemeq
- Publication number 20200141879
- Publication date May 7, 2020
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION
- Publication number 20190391085
- Publication date Dec 26, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Saar SHABTAY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOTE VISUAL INSPECTION METHOD AND SYSTEM
- Publication number 20190272424
- Publication date Sep 5, 2019
- COLLINEO INC.
- GUILLAUME LAMBERT
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMAGING A SURFACE DEFECT ON AN OBJECT
- Publication number 20190120770
- Publication date Apr 25, 2019
- Agency for Science, Technology and Research
- Wenyu CHEN
- G01 - MEASURING TESTING
Information Patent Application
Method Of Detecting Defects Of A Moving Sheet Of Flexible Fibrous M...
- Publication number 20190086339
- Publication date Mar 21, 2019
- Pegas Nonwovens Czech s.r.o.
- Frantisek Rezac
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A STEEL STRIP
- Publication number 20180172601
- Publication date Jun 21, 2018
- THYSSENKRUPP RASSELSTEIN GMBH
- Michael Wild
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND MACHINE FOR EXAMINING WAFERS
- Publication number 20180076099
- Publication date Mar 15, 2018
- HERMES MICROVISION, INC.
- CHIEN-HUNG CHOU
- G01 - MEASURING TESTING
Information Patent Application
Sensor Array for Verifying the Condition of an Electronic Device
- Publication number 20150293030
- Publication date Oct 15, 2015
- Tu Nguyen
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20140320837
- Publication date Oct 30, 2014
- Giora DISHON
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEVICE THEREFOR
- Publication number 20140204194
- Publication date Jul 24, 2014
- Hitachi High-Technologies Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Application
Detecting Defects on a Wafer
- Publication number 20140185919
- Publication date Jul 3, 2014
- KLA-Tencor Corporation
- Jun Lang
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Stand-Off Inspection of Aircraft Structures
- Publication number 20140184786
- Publication date Jul 3, 2014
- THE BOEING COMPANY
- Gary E. Georgeson
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method and Defect Inspection Device
- Publication number 20140169657
- Publication date Jun 19, 2014
- Hitachi High-Technologies Corporation
- Minoru Harada
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...
- Publication number 20130293872
- Publication date Nov 7, 2013
- Giora DISHON
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE IMAGE TRIGGER FOR A VISION SYSTEM AND METHOD FOR USING...
- Publication number 20130155220
- Publication date Jun 20, 2013
- COGNEX CORPORATION
- Tyson Mahuna
- G01 - MEASURING TESTING
Information Patent Application
FAULT INSPECTION DEVICE AND FAULT INSPECTION METHOD
- Publication number 20130141715
- Publication date Jun 6, 2013
- Yuta Urano
- G01 - MEASURING TESTING

using sequentially two or more inspection runs

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System for inspecting thin glass

Prediction device for predicting a growth direction of a crack in a...

Apparatus and method for in-situ optical inspection of laser-induce...

Apparatus for optimizing inspection of exterior of target object an...

Semiconductor wafer fault analysis system and operation method thereof

Specimen inspection machine and operation method thereof

System, method and computer program product for object examination

Support system for specified inspection, support method for specifi...

Automatic defect classification

Apparatus for optimizing inspection of exterior of target object an...

Appearance inspection system, setting device, and inspection method

Methods of manufacturing a light source carrier and an electronic d...

Image inspecting apparatus, image inspecting method and image inspe...

Method and device for material web monitoring and material web insp...

System, method and computer program product for object examination

Defect inspection device and defect inspection method

Remote visual inspection method and system

Method and machine for examining wafers

System and method for imaging a surface defect on an object

Defect inspection method and defect inspection system

Inspection apparatus and inspection method

Method and device for compensating for a material web offset in mat...

Contrast-based imaging and analysis computer-implemented methods to...

Metrology guided inspection sample shaping of optical inspection re...

Defect inspection method and defect inspection apparatus

Portable defect mitigator for electrochromic windows

Method of detecting defects of a moving sheet of flexible fibrous m...

Automatic optical inspection system and operating method thereof

Optical device for detecting an internal flaw of a transparent subs...

System, method and computer program product for object examination

Patents Applicationslast 30 patents

INSPECTION SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTING METHOD,...

HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS

LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS

GLASS INSPECTION

CELL DETECTION METHOD, APPARATUS, AND SYSTEM, COMPUTER DEVICE, AND...

SYSTEM FOR INSPECTING THIN GLASS

DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE...

AUTOMATIC DEFECT CLASSIFICATION

APPARATUS FOR OPTIMIZING INSPECTION OF EXTERIOR OF TARGET OBJECT AN...

APPARATUS AND METHOD FOR IN-SITU OPTICAL INSPECTION OF LASER-INDUCE...

SPECIMEN INSPECTION MACHINE AND OPERATION METHOD THEREOF

PREDICTION DEVICE AND PREDICTION METHOD

APPARATUS FOR OPTIMIZING INSPECTION OF EXTERIOR OF TARGET OBJECT AN...

SUPPORT SYSTEM FOR SPECIFIED INSPECTION, SUPPORT METHOD FOR SPECIFI...

Migdal Haemeq

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR OBJECT EXAMINATION

REMOTE VISUAL INSPECTION METHOD AND SYSTEM

SYSTEM AND METHOD FOR IMAGING A SURFACE DEFECT ON AN OBJECT

Method Of Detecting Defects Of A Moving Sheet Of Flexible Fibrous M...

METHOD OF INSPECTING A STEEL STRIP

METHOD AND MACHINE FOR EXAMINING WAFERS

Sensor Array for Verifying the Condition of an Electronic Device

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

DEFECT OBSERVATION METHOD AND DEVICE THEREFOR

Detecting Defects on a Wafer

Systems and Methods for Stand-Off Inspection of Aircraft Structures

Defect Inspection Method and Defect Inspection Device

MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGR...

CONFIGURABLE IMAGE TRIGGER FOR A VISION SYSTEM AND METHOD FOR USING...

FAULT INSPECTION DEVICE AND FAULT INSPECTION METHOD