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using turn-sensitive devices with vibrating masses
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CPC
G01P9/04
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
G01P9/00
Measuring speed by using gyroscopic effect
Current Industry
G01P9/04
using turn-sensitive devices with vibrating masses
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Patents Grants
last 30 patents
Information
Patent Grant
Vibrator and vibrating gyroscope
Patent number
9,851,373
Issue date
Dec 26, 2017
Murata Manufacturing Co., Ltd.
Katsumi Fujimoto
G01 - MEASURING TESTING
Information
Patent Grant
Sensing module and angular velocity sensor having the same
Patent number
9,625,484
Issue date
Apr 18, 2017
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Jong Woon Kim
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator element, method of manufacturing vibrator element, vibrato...
Patent number
9,546,869
Issue date
Jan 17, 2017
Seiko Epson Corporation
Keiichi Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
NBT-BT crystal piezoelectric film and piezoelectric stacking struct...
Patent number
9,482,688
Issue date
Nov 1, 2016
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yoshiaki Tanaka
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
MEMS device front-end charge amplifier
Patent number
9,444,404
Issue date
Sep 13, 2016
Fairchild Semiconductor Corporation
Ion Opris
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Vibrator element, method of manufacturing vibrator element, vibrato...
Patent number
9,341,643
Issue date
May 17, 2016
Seiko Epson Corporation
Keiichi Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS inertial sensor and method of inertial sensing
Patent number
9,261,525
Issue date
Feb 16, 2016
Cambridge Enterprise Limited
Pradyumna Thiruvenkatanathan
G01 - MEASURING TESTING
Information
Patent Grant
Inertia sensor
Patent number
9,182,421
Issue date
Nov 10, 2015
Hitachi Automotive Systems, Ltd.
Heewon Jeong
G01 - MEASURING TESTING
Information
Patent Grant
System and method for reducing offset variation in multifunction se...
Patent number
9,103,845
Issue date
Aug 11, 2015
Freescale Semiconductor Inc.
Mark E. Schlarmann
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Gyroscope
Publication number
20180259335
Publication date
Sep 13, 2018
Hitachi, Ltd
Joan GINER
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
NBT-BT CRYSTAL PIEZOELECTRIC FILM AND PIEZOELECTRIC STACKING STRUCT...
Publication number
20150243878
Publication date
Aug 27, 2015
PANASONIC CORPORATION
YOSHIAKI TANAKA
B32 - LAYERED PRODUCTS
Information
Patent Application
SENSING MODULE AND ANGULAR VELOCITY SENSOR HAVING THE SAME
Publication number
20150033852
Publication date
Feb 5, 2015
Samsung Electro-Mechanics Co., Ltd.
Jong Woon Kim
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING OFFSET VARIATION IN MULTIFUNCTION SE...
Publication number
20140251009
Publication date
Sep 11, 2014
FREESCALE SEMICONDUCTOR, INC.
Mark E. SCHLARMANN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VIBRATOR AND VIBRATING GYROSCOPE
Publication number
20140090470
Publication date
Apr 3, 2014
Murata Manufacturing Co., Ltd.
Katsumi FUJIMOTO
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR ELEMENT, METHOD OF MANUFACTURING VIBRATOR ELEMENT, VIBRATO...
Publication number
20140020503
Publication date
Jan 23, 2014
Keiichi YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
MEMS Inertial Sensor and Method of Inertial Sensing
Publication number
20130298675
Publication date
Nov 14, 2013
CAMBRIDGE ENTERPRISE LIMITED
Pradyumna Thiruvenkatanathan
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE FRONT-END CHARGE AMPLIFIER
Publication number
20130263665
Publication date
Oct 10, 2013
Fairchild Semiconductor Corporation
Ion Opris
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR ELEMENT, VIBRATING DEVICE, PHYSICAL QUANTITY DETECTING DEV...
Publication number
20130192367
Publication date
Aug 1, 2013
SEIKO EPSON CORPORATION
Seiji OSAWA
G01 - MEASURING TESTING
Information
Patent Application
Inertia Sensor
Publication number
20130098152
Publication date
Apr 25, 2013
Heewon Jeong
G01 - MEASURING TESTING