Wafer or (micro)electronic parts

Industry

CPC
G01N2291/2697

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2291/00Indexing codes associated with group G01N29/00

Current Industry

G01N2291/2697Wafer or (micro)electronic parts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and metrology tool for determining information about a targe...
- Patent number 12,209,994
- Issue date Jan 28, 2025
- ASML Netherlands B.V.
- Zili Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,209,996
- Issue date Jan 28, 2025
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting imperfections in a screen
- Patent number 12,204,721
- Issue date Jan 21, 2025
- ESW Holdings, Inc.
- Amit Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating cleanliness of steel material
- Patent number 12,188,902
- Issue date Jan 7, 2025
- NSK Ltd.
- Tomoki Doshida
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,153,021
- Issue date Nov 26, 2024
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method of detecting defective electronic component
- Patent number 12,111,234
- Issue date Oct 8, 2024
- SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Heung Kil Park
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting the splitting of a substrate weakened by impla...
- Patent number 12,002,697
- Issue date Jun 4, 2024
- Soitec
- François Rieutord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterization of patterned structures using acoustic metrology
- Patent number 11,988,641
- Issue date May 21, 2024
- Onto Innovation Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Grant
Arrays of acoustic transducers for physical analysis of batteries
- Patent number 11,977,052
- Issue date May 7, 2024
- Liminal Insights, Inc.
- Andrew Gaheem Hsieh
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Systems and methods for acoustic emission monitoring of semiconduct...
- Patent number 11,977,053
- Issue date May 7, 2024
- AUGURY SYSTEMS LTD.
- Eduard Rudyk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining the position of a target stru...
- Patent number 11,927,891
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
CMOS integrated temperature insensitive, stable, and calibrated osc...
- Patent number 11,923,804
- Issue date Mar 5, 2024
- Geegah, LLC
- Amit Lal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement method and measurement system
- Patent number 11,906,466
- Issue date Feb 20, 2024
- Tokyo Electron Limited
- Takayuki Hatanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor apparatus for lithographic measurements
- Patent number 11,761,929
- Issue date Sep 19, 2023
- ASML Netherlands B.V.
- Alessandro Polo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for detecting imperfections in a screen
- Patent number 11,669,206
- Issue date Jun 6, 2023
- ESW Holdings, Inc.
- Amit Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device for determining insertion of connector, and robot...
- Patent number 11,668,679
- Issue date Jun 6, 2023
- FANUC CORPORATION
- Takahide Mine
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Ultrasonic bonding apparatus, ultrasonic bonding inspection method...
- Patent number 11,631,653
- Issue date Apr 18, 2023
- Mitsubishi Electric Corporation
- Minoru Egusa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Resonance detection system for peripheral interface device
- Patent number 11,598,751
- Issue date Mar 7, 2023
- Primax Electronics Ltd.
- Chin-Sung Pan
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic bonding apparatus, ultrasonic bonding inspection method...
- Patent number 11,569,197
- Issue date Jan 31, 2023
- Mitsubishi Electric Corporation
- Minoru Egusa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Battery state monitoring using ultrasonic guided waves
- Patent number 11,527,783
- Issue date Dec 13, 2022
- The Board of Trustees of the Leland Standford Junior Universitv
- Purim Ladpli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for acoustic emission monitoring of semiconduct...
- Patent number 11,493,482
- Issue date Nov 8, 2022
- AUGURY SYSTEMS LTD.
- Eduard Rudyk
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 11,460,447
- Issue date Oct 4, 2022
- Kioxia Corporation
- Sho Kawadahara
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection device
- Patent number 11,428,673
- Issue date Aug 30, 2022
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In operando, non-invasive state-of-charge monitoring for redox flow...
- Patent number 11,415,552
- Issue date Aug 16, 2022
- Battelle Memorial Institute
- Zhiqun Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detecting imperfections in a screen
- Patent number 11,397,491
- Issue date Jul 26, 2022
- ESW Holdings, Inc.
- Amit Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for non-destructive detection of defects...
- Patent number 11,346,818
- Issue date May 31, 2022
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical failure monitoring, detection, and classification in ele...
- Patent number 11,327,050
- Issue date May 10, 2022
- Intel Corporation
- Kyle Yazzie
- G01 - MEASURING TESTING
Information Patent Grant
Method, atomic force microscopy system and computer program product
- Patent number 11,289,367
- Issue date Mar 29, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic testing of batteries in portable devices
- Patent number 11,249,055
- Issue date Feb 15, 2022
- FEASIBLE, INC.
- Andrew Gaheem Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Determination of characteristics of electrochemical systems using a...
- Patent number 11,193,979
- Issue date Dec 7, 2021
- FEASIBLE, INC.
- Daniel A. Steingart
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR ACOUSTIC ANALYSIS OF SEI FORMATION IN BATTE...
- Publication number 20250035595
- Publication date Jan 30, 2025
- Liminal Insights, Inc.
- Austin Ryan DULANEY
- G01 - MEASURING TESTING
Information Patent Application
ULTRASOUND IMAGE APPARATUS AND LIQUID INFILTRATION PREVENTION METHO...
- Publication number 20230375507
- Publication date Nov 23, 2023
- Hitachi Power Solutions Co., Ltd.
- Shigeru OHNO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ACOUSTIC EMISSION MONITORING OF SEMICONDUCT...
- Publication number 20230273159
- Publication date Aug 31, 2023
- AUGURY SYSTEMS LTD.
- Eduard RUDYK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ACOUSTIC EMISSION MONITORING OF SEMICONDUCT...
- Publication number 20230076885
- Publication date Mar 9, 2023
- AUGURY SYSTEMS LTD.
- Eduard RUDYK
- G01 - MEASURING TESTING
Information Patent Application
Method for Evaluating Cleanliness of Steel Material
- Publication number 20220381740
- Publication date Dec 1, 2022
- NSK LTD.
- Tomoki DOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Detecting Imperfections in a Screen
- Publication number 20220350439
- Publication date Nov 3, 2022
- ESW Holdings, Inc.
- Amit GROSS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER CHUCK FOR HANDLING A WAFER
- Publication number 20220328341
- Publication date Oct 13, 2022
- PVA TePla Analytical Systems GmbH
- Peter HOFFROGGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS INTEGRATED TEMPERATURE INSENSITIVE, STABLE, AND CALIBRATED OSC...
- Publication number 20220294390
- Publication date Sep 15, 2022
- Amit Lal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND METROLOGY TOOL FOR DETERMINING INFORMATION ABOUT A TARGE...
- Publication number 20220283122
- Publication date Sep 8, 2022
- ASML NETHERLANDS B.V.
- Zili ZHOU
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD
- Publication number 20220163485
- Publication date May 26, 2022
- National University Corporation Toyohashi University of Technology
- Naohiro HOZUMI
- G01 - MEASURING TESTING
Information Patent Application
USING ULTRASOUND TO DETECT BOND-WIRE LIFT-OFF AND ESTIMATION OF DYN...
- Publication number 20210396714
- Publication date Dec 23, 2021
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Faisal KHAN
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Determining the Position of a Target Stru...
- Publication number 20210364936
- Publication date Nov 25, 2021
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR NON-DESTRUCTIVE DETECTION OF DEFECTS...
- Publication number 20210364474
- Publication date Nov 25, 2021
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF PATTERNED STRUCTURES USING ACOUSTIC METROLOGY
- Publication number 20210318270
- Publication date Oct 14, 2021
- ONTO INNOVATION INC.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20210262987
- Publication date Aug 26, 2021
- TOKYO ELECTRON LIMITED
- Takayuki HATANAKA
- G01 - MEASURING TESTING
Information Patent Application
Sensor Apparatus for Lithographic Measurements
- Publication number 20210239654
- Publication date Aug 5, 2021
- ASML NETHERLANDS B.V.
- Alessandro POLO
- G01 - MEASURING TESTING
Information Patent Application
ARRAYS OF ACOUSTIC TRANSDUCERS FOR PHYSICAL ANALYSIS OF BATTERIES
- Publication number 20210096104
- Publication date Apr 1, 2021
- Feasible, Inc.
- Andrew Gaheem HSIEH
- B60 - VEHICLES IN GENERAL
Information Patent Application
INSPECTION APPARATUS
- Publication number 20210072191
- Publication date Mar 11, 2021
- Kioxia Corporation
- Sho KAWADAHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING THE SPLITTING OF A SUBSTRATE WEAKENED BY IMPLA...
- Publication number 20210028036
- Publication date Jan 28, 2021
- SOITEC
- François Rieutord
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Detecting Failed Electronics Using Acoustics
- Publication number 20200355649
- Publication date Nov 12, 2020
- United States of America as represented by the Secretary of the Navy
- Russell Shannon
- G01 - MEASURING TESTING
Information Patent Application
METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20200227311
- Publication date Jul 16, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ACOUSTIC EMISSION MONITORING OF SEMICONDUCT...
- Publication number 20200033297
- Publication date Jan 30, 2020
- AUGURY SYSTEMS LTD.
- Eduard RUDYK
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING AN OVERLAY ERROR, METHOD FOR MANUFACTURING A...
- Publication number 20190310284
- Publication date Oct 10, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
MECHANICAL FAILURE MONITORING, DETECTION, AND CLASSIFICATION IN ELE...
- Publication number 20190257793
- Publication date Aug 22, 2019
- Intel Corporation
- Kyle Yazzie
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR PERFORMING DEFECT DETECTION ON OR CHARACTE...
- Publication number 20190227097
- Publication date Jul 25, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
BATTERY STATE MONITORING USING ULTRASONIC GUIDED WAVES
- Publication number 20190207274
- Publication date Jul 4, 2019
- The Board of Trustees of the Leland Stanford Junior University
- Purim LADPLI
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Detecting Failed Electronics Using Acoustics
- Publication number 20190041364
- Publication date Feb 7, 2019
- United States of America as represented by the Secretary of the Navy
- Russell Shannon
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD FOR WAFER
- Publication number 20180240708
- Publication date Aug 23, 2018
- Disco Corporation
- Hiroshi Morikazu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING IF DETERIORATION OCCURS IN INTERF...
- Publication number 20180188309
- Publication date Jul 5, 2018
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT-EMBEDDED SUBSTRATE AND SUBSTRATE FLAW DETECTING METHOD
- Publication number 20170176392
- Publication date Jun 22, 2017
- Murata Manufacturing Co., Ltd.
- Shigeru TAGO
- G01 - MEASURING TESTING

Wafer or (micro)electronic parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and metrology tool for determining information about a targe...

Ultrasonic testing device and ultrasonic testing method

System and method for detecting imperfections in a screen

Method for evaluating cleanliness of steel material

Ultrasonic testing device and ultrasonic testing method

Device and method of detecting defective electronic component

Method for detecting the splitting of a substrate weakened by impla...

Characterization of patterned structures using acoustic metrology

Arrays of acoustic transducers for physical analysis of batteries

Systems and methods for acoustic emission monitoring of semiconduct...

Apparatus and methods for determining the position of a target stru...

CMOS integrated temperature insensitive, stable, and calibrated osc...

Measurement method and measurement system

Sensor apparatus for lithographic measurements

System and method for detecting imperfections in a screen

Inspection device for determining insertion of connector, and robot...

Ultrasonic bonding apparatus, ultrasonic bonding inspection method...

Resonance detection system for peripheral interface device

Ultrasonic bonding apparatus, ultrasonic bonding inspection method...

Battery state monitoring using ultrasonic guided waves

Systems and methods for acoustic emission monitoring of semiconduct...

Inspection apparatus

Ultrasonic inspection device

In operando, non-invasive state-of-charge monitoring for redox flow...

System and method for detecting imperfections in a screen

Method, device and system for non-destructive detection of defects...

Mechanical failure monitoring, detection, and classification in ele...

Method, atomic force microscopy system and computer program product

Acoustic testing of batteries in portable devices

Determination of characteristics of electrochemical systems using a...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR ACOUSTIC ANALYSIS OF SEI FORMATION IN BATTE...

ULTRASOUND IMAGE APPARATUS AND LIQUID INFILTRATION PREVENTION METHO...

SYSTEMS AND METHODS FOR ACOUSTIC EMISSION MONITORING OF SEMICONDUCT...

SYSTEMS AND METHODS FOR ACOUSTIC EMISSION MONITORING OF SEMICONDUCT...

Method for Evaluating Cleanliness of Steel Material

System and Method for Detecting Imperfections in a Screen

WAFER CHUCK FOR HANDLING A WAFER

CMOS INTEGRATED TEMPERATURE INSENSITIVE, STABLE, AND CALIBRATED OSC...

METHOD AND METROLOGY TOOL FOR DETERMINING INFORMATION ABOUT A TARGE...

ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD

USING ULTRASOUND TO DETECT BOND-WIRE LIFT-OFF AND ESTIMATION OF DYN...

Apparatus and Methods for Determining the Position of a Target Stru...

METHOD, DEVICE AND SYSTEM FOR NON-DESTRUCTIVE DETECTION OF DEFECTS...

CHARACTERIZATION OF PATTERNED STRUCTURES USING ACOUSTIC METROLOGY

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

Sensor Apparatus for Lithographic Measurements

ARRAYS OF ACOUSTIC TRANSDUCERS FOR PHYSICAL ANALYSIS OF BATTERIES

INSPECTION APPARATUS

METHOD FOR DETECTING THE SPLITTING OF A SUBSTRATE WEAKENED BY IMPLA...

System and Method for Detecting Failed Electronics Using Acoustics

METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT

SYSTEMS AND METHODS FOR ACOUSTIC EMISSION MONITORING OF SEMICONDUCT...

METHOD OF DETERMINING AN OVERLAY ERROR, METHOD FOR MANUFACTURING A...

MECHANICAL FAILURE MONITORING, DETECTION, AND CLASSIFICATION IN ELE...

METHOD OF AND SYSTEM FOR PERFORMING DEFECT DETECTION ON OR CHARACTE...

BATTERY STATE MONITORING USING ULTRASONIC GUIDED WAVES

System and Method for Detecting Failed Electronics Using Acoustics

PROCESSING METHOD FOR WAFER

SYSTEM AND METHOD FOR DETERMINING IF DETERIORATION OCCURS IN INTERF...

COMPONENT-EMBEDDED SUBSTRATE AND SUBSTRATE FLAW DETECTING METHOD