with an illuminator over the whole width

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CPC
G01N2021/8627

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8627with an illuminator over the whole width

Industries

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method for inspection of the su...
- Patent number 10,215,708
- Issue date Feb 26, 2019
- EyeC GmbH
- Ansgar Kaupp
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for characterizing a surface structure
- Patent number 8,174,690
- Issue date May 8, 2012
- Argos Solutions AS
- Vidar Solli
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optically evaluating colorimetric coloration zones on...
- Patent number 5,397,538
- Issue date Mar 14, 1995
- Dragerwerk Aktiengesellschaft
- Hartmut Stark
- G01 - MEASURING TESTING
Information Patent Grant
Modular surface inspection method and apparatus using optical fibers
- Patent number 5,164,603
- Issue date Nov 17, 1992
- Reynolds Metals Company
- Nile F. Hartman
- G01 - MEASURING TESTING
Information Patent Grant
Light guided illuminating/sectioning device for sheet inspection sy...
- Patent number 4,954,891
- Issue date Sep 4, 1990
- Process Automation Business, Inc.
- Gary N. Burk
- G01 - MEASURING TESTING
Information Patent Grant
Light source assembly
- Patent number 4,824,209
- Issue date Apr 25, 1989
- Albany International Corporation
- Joseph A. Bolton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR CHARACTERIZING A SURFACE STRUCTURE
- Publication number 20100201973
- Publication date Aug 12, 2010
- ARGOS SOLUTIONS AS
- Vidar Solli
- G01 - MEASURING TESTING