with investigation of wavelength

Follow

Industry

CPC
G01N2021/438

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/438with investigation of wavelength

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and device for analysing a sample, implementing a resonant s...
- Patent number 12,072,282
- Issue date Aug 27, 2024
- Centre National de la Recherche Scientifique
- Mathieu Dupoy
- G01 - MEASURING TESTING
Information Patent Grant
Optical refractive index measuring system based on speckle correlation
- Patent number 9,404,856
- Issue date Aug 2, 2016
- Macau University of Science and Technology
- Jianqing Li
- G01 - MEASURING TESTING
Information Patent Grant
Optically amplified critical wavelength refractometer
- Patent number 7,619,725
- Issue date Nov 17, 2009
- Sealite Engineering, Inc.
- George A. Seaver
- G01 - MEASURING TESTING
Information Patent Grant
Refractometer
- Patent number 6,876,444
- Issue date Apr 5, 2005
- Franz Schmidt & Haensch GmbH & Co.
- Sükrü Yilmaz
- G01 - MEASURING TESTING
Information Patent Grant
Rolling multiple internal reflection spectroscopy
- Patent number 6,404,491
- Issue date Jun 11, 2002
- International Business Machines Corporation
- Gareth Geoffrey Hougham
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Refractive Index Measuring System Based on Speckle Correlation
- Publication number 20140354979
- Publication date Dec 4, 2014
- Macau University of Science and Technology
- Jianqing LI
- G01 - MEASURING TESTING
Information Patent Application
OPTICALLY AMPLIFIED CRITICAL WAVELENGTH REFRACTOMETER
- Publication number 20090279074
- Publication date Nov 12, 2009
- Sealite Engineering
- George A. Seaver
- G01 - MEASURING TESTING
Information Patent Application
Refractometer
- Publication number 20030156278
- Publication date Aug 21, 2003
- Sukru Yilmaz
- G01 - MEASURING TESTING