with ionisation by means of thermionic cathodes

Industry

CPC
H01J41/04

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas Discharge tubes for evacuation by diffusion of ions

Current Industry

H01J41/04with ionisation by means of thermionic cathodes

Industries

Patents Grantslast 30 patents

Information Patent Grant
High power ion beam generator systems and methods
- Patent number 12,101,870
- Issue date Sep 24, 2024
- SHINE Technologies, LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power ion beam generator systems and methods
- Patent number 12,075,555
- Issue date Aug 27, 2024
- SHINE Technologies, LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power ion beam generator systems and methods
- Patent number 11,979,975
- Issue date May 7, 2024
- SHINE Technologies, LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power ion beam generator systems and methods
- Patent number 11,937,363
- Issue date Mar 19, 2024
- SHINE Technologies, LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power ion beam generator systems and methods
- Patent number 11,582,857
- Issue date Feb 14, 2023
- SHINE Technologies, LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact electrostatic ion pump
- Patent number 11,569,077
- Issue date Jan 31, 2023
- SRI International
- Sterling Eduardo McBride
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for characterizing homodyne transmitters and r...
- Patent number 11,268,997
- Issue date Mar 8, 2022
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Fast pressure sensing system
- Patent number 11,101,120
- Issue date Aug 24, 2021
- SRI International
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power ion beam generator systems and methods
- Patent number 10,701,792
- Issue date Jun 30, 2020
- PHOENIX LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power ion beam generator systems and methods
- Patent number 10,453,654
- Issue date Oct 22, 2019
- PHOENIX LLC
- Arne Kobernik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for feedthrough leakage current detection and d...
- Patent number 10,132,707
- Issue date Nov 20, 2018
- MKS Instruments, Inc.
- Stephen C. Blouch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,952,113
- Issue date Apr 24, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,593,996
- Issue date Mar 14, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode ionization vacuum gauge and inner wall protection member
- Patent number 9,316,555
- Issue date Apr 19, 2016
- Canon Anelva Corporation
- Itaru Enomoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for shielding feedthrough pin insulators in an...
- Patent number 7,847,559
- Issue date Dec 7, 2010
- Brooks Automation, Inc.
- Richard A. Knott
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Ionization vacuum gauge
- Patent number 7,741,852
- Issue date Jun 22, 2010
- Mori Patent Office
- Fumio Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for maintaining emission capabilities of hot c...
- Patent number 7,656,165
- Issue date Feb 2, 2010
- Brooks Automation, Inc.
- Larry K. Carmichael
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for shielding feedthrough pin insulators in an...
- Patent number 7,456,634
- Issue date Nov 25, 2008
- Brooks Automation, Inc.
- Richard A. Knott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for maintaining emission capabilities of hot c...
- Patent number 7,429,863
- Issue date Sep 30, 2008
- Brooks Automation, Inc.
- Larry K. Carmichael
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum measuring gauge
- Patent number 7,352,187
- Issue date Apr 1, 2008
- Inficon GmbH
- Wolfram Knapp
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge
- Patent number 7,295,015
- Issue date Nov 13, 2007
- Brooks Automation, Inc.
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge
- Patent number 7,030,619
- Issue date Apr 18, 2006
- Brooks Automation, Inc.
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Louvered beam stop for lowering x-ray limit of a total pressure gauge
- Patent number 6,476,612
- Issue date Nov 5, 2002
- Inficon Inc.
- Robert E. Ellefson
- G01 - MEASURING TESTING
Information Patent Grant
Penning vacuum meter
- Patent number 6,285,192
- Issue date Sep 4, 2001
- Leybold Vakuum GmbH
- Werner Grosse Bley
- G01 - MEASURING TESTING
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,198,105
- Issue date Mar 6, 2001
- Helix Technology Corporation
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,046,456
- Issue date Apr 4, 2000
- Helix Technology Corporation
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature ionization gauge utilizing multiple ion collectors
- Patent number 6,025,723
- Issue date Feb 15, 2000
- Granville-Phillips Company
- Daniel Granville Bills
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process and apparatus for measuring charge quantity flowing in a va...
- Patent number 5,644,220
- Issue date Jul 1, 1997
- Balzers Aktiengesellschaft
- Waelchli Urs
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum ionization gauging tube
- Patent number 5,602,441
- Issue date Feb 11, 1997
- Anelva Corporation
- Nobuharu Ohsako
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge and method of using and calibrating same
- Patent number 5,422,573
- Issue date Jun 6, 1995
- Granville-Phillips Company
- Daniel G. Bills
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH POWER ION BEAM GENERATOR SYSTEMS AND METHODS
- Publication number 20240357728
- Publication date Oct 24, 2024
- SHINE Technologies, LLC
- Arne KOBERNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION GAUGE FOR HIGH PRESSURE OPERATION
- Publication number 20170146420
- Publication date May 25, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
COLD CATHODE IONIZATION VACUUM GAUGE AND INNER WALL PROTECTION MEMBER
- Publication number 20140368210
- Publication date Dec 18, 2014
- Canon ANELVA Corporation
- ITARU ENOMOTO
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for shielding feedthrough pin insulators in an...
- Publication number 20090146665
- Publication date Jun 11, 2009
- Brooks Automation, Inc.
- Richard A. Knott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION VACUUM GAUGE
- Publication number 20090096460
- Publication date Apr 16, 2009
- Fumio Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for maintaining emission capabilities of hot c...
- Publication number 20080315887
- Publication date Dec 25, 2008
- Brooks Automation, Inc.
- Larry K. Carmichael
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for shielding feedthrough pin insulators in an...
- Publication number 20080100301
- Publication date May 1, 2008
- Richard A. Knott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for maintaining emission capabilities of hot c...
- Publication number 20080018337
- Publication date Jan 24, 2008
- Larry K. Carmichael
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel processing microfluidic chip
- Publication number 20070071638
- Publication date Mar 29, 2007
- Karsten Kraiczek
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Vacuum measuring gauge
- Publication number 20060202701
- Publication date Sep 14, 2006
- INFICON GMBH
- Wolfram Knapp
- G01 - MEASURING TESTING
Information Patent Application
Ionization gauge
- Publication number 20060197537
- Publication date Sep 7, 2006
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Ionization gauge
- Publication number 20050184735
- Publication date Aug 25, 2005
- Helix Technology Corporation
- Paul C. Arnold
- G01 - MEASURING TESTING

with ionisation by means of thermionic cathodes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High power ion beam generator systems and methods

High power ion beam generator systems and methods

High power ion beam generator systems and methods

High power ion beam generator systems and methods

High power ion beam generator systems and methods

Compact electrostatic ion pump

Method and apparatus for characterizing homodyne transmitters and r...

Fast pressure sensing system

High power ion beam generator systems and methods

High power ion beam generator systems and methods

Devices and methods for feedthrough leakage current detection and d...

Ionization gauge for high pressure operation

Ionization gauge for high pressure operation

Cold cathode ionization vacuum gauge and inner wall protection member

Method and apparatus for shielding feedthrough pin insulators in an...

Ionization vacuum gauge

Method and apparatus for maintaining emission capabilities of hot c...

Method and apparatus for shielding feedthrough pin insulators in an...

Method and apparatus for maintaining emission capabilities of hot c...

Vacuum measuring gauge

Ionization gauge

Ionization gauge

Louvered beam stop for lowering x-ray limit of a total pressure gauge

Penning vacuum meter

Miniature ionization gauge utilizing multiple ion collectors

Miniature ionization gauge utilizing multiple ion collectors

Miniature ionization gauge utilizing multiple ion collectors

Process and apparatus for measuring charge quantity flowing in a va...

Vacuum ionization gauging tube

Ionization gauge and method of using and calibrating same

Patents Applicationslast 30 patents

HIGH POWER ION BEAM GENERATOR SYSTEMS AND METHODS

IONIZATION GAUGE FOR HIGH PRESSURE OPERATION

COLD CATHODE IONIZATION VACUUM GAUGE AND INNER WALL PROTECTION MEMBER

Method and apparatus for shielding feedthrough pin insulators in an...

IONIZATION VACUUM GAUGE

Method and apparatus for maintaining emission capabilities of hot c...

Method and apparatus for shielding feedthrough pin insulators in an...

Method and apparatus for maintaining emission capabilities of hot c...

Parallel processing microfluidic chip

Vacuum measuring gauge

Ionization gauge

Ionization gauge