TREA

with only analogue scales or both analogue and incremental scales

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  • CPC
  • G01D5/34784
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Parent Industries

GPHYSICS G01Measuring instruments G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR G01D5/00Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable

Current Industry

G01D5/34784with only analogue scales or both analogue and incremental scales
Industries

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    DEVICES, SYSTEMS, AND METHODS FOR CONTROLLING THE POSITION OF ELECT...
    • Publication number 20240302189
    • Publication date Sep 12, 2024
    • JMX AUDIO PTY LIMITED
    • Ian OVERLIESE
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Application

    ABSOLUTE LINEAR ENCODER
    • Publication number 20210108948
    • Publication date Apr 15, 2021
    • DMG MORI CO.,LTD.
    • Akira KIMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Encoder System for Position Determination with Inclined Scale
    • Publication number 20200232826
    • Publication date Jul 23, 2020
    • Rockwell Automation Technologies, Inc.
    • Peter M. Smit
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER
    • Publication number 20190376817
    • Publication date Dec 12, 2019
    • FANUC CORPORATION
    • Masao FUKUDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Encoder System for Position Determination with Inclined Scale
    • Publication number 20190368903
    • Publication date Dec 5, 2019
    • Rockwell Automation Technologies, Inc.
    • Peter M. Smit
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ENCODER
    • Publication number 20170227384
    • Publication date Aug 10, 2017
    • Mitutoyo Corporation
    • Yoshiaki Kato
    • G01 - MEASURING TESTING
  • Information Patent Application

    ABSOLUTE ENCODER
    • Publication number 20160003645
    • Publication date Jan 7, 2016
    • Canon Kabushiki Kaisha
    • Makiko Ogasawara
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER, MOTOR WITH ENCODER, AND SERVO SYSTEM
    • Publication number 20160003646
    • Publication date Jan 7, 2016
    • KABUSHIKI KAISHA YASKAWA DENKI
    • Yasushi YOSHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ENCODER
    • Publication number 20150060653
    • Publication date Mar 5, 2015
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL POSITION-MEASURING DEVICE
    • Publication number 20140146326
    • Publication date May 29, 2014
    • Dr. Johannes Heidenhain Gmbh
    • Mario Himmel
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER
    • Publication number 20130320201
    • Publication date Dec 5, 2013
    • MITSUBISHI ELECTRIC CORPORATION
    • Takuya Noguchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Rotary Position Sensor
    • Publication number 20120271457
    • Publication date Oct 25, 2012
    • Caterpillar Inc.
    • Isaac J. Sachs
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER
    • Publication number 20120261561
    • Publication date Oct 18, 2012
    • Canon Kabushiki Kaisha
    • Haruhiko Horiguchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER
    • Publication number 20120217384
    • Publication date Aug 30, 2012
    • Canon Kabushiki Kaisha
    • Chihiro NAGURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER
    • Publication number 20120018626
    • Publication date Jan 26, 2012
    • Canon Kabushiki Kaisha
    • Chihiro NAGURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ABSOLUTE OPTICAL ENCODER WITH LONG RANGE INTENSITY MODULATION ON SCALE
    • Publication number 20110304482
    • Publication date Dec 15, 2011
    • Mitutoyo Corporation
    • Daniel John Kapner
    • G01 - MEASURING TESTING
  • Information Patent Application

    METROLOGICAL SCALE
    • Publication number 20110024022
    • Publication date Feb 3, 2011
    • RENISHAW PLC
    • Marcus Ardron
    • B32 - LAYERED PRODUCTS
  • Information Patent Application

    OPTICAL SENSOR FOR POSITIONING TASKS
    • Publication number 20100315653
    • Publication date Dec 16, 2010
    • Thomas Weingartz
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER AND PHOTODETECTOR FOR ENCODER
    • Publication number 20100006748
    • Publication date Jan 14, 2010
    • HAMAMATSU PHOTONICS K. K.
    • Seiichiro Mizuno
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTENSITY-BASED OPTICAL ENCODER USING DIGITAL DIFFRACTIVE OPTIC REG...
    • Publication number 20090166519
    • Publication date Jul 2, 2009
    • Christopher C. Chang
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scale and Readhead System
    • Publication number 20090064524
    • Publication date Mar 12, 2009
    • RENISHAW PLC
    • Colin Keith Howley
    • G01 - MEASURING TESTING
  • Information Patent Application

    GUIDE RAIL WITH AN ABSOLUTE DIMENSIONAL STANDARD
    • Publication number 20090064523
    • Publication date Mar 12, 2009
    • Guenter Reusing
    • G01 - MEASURING TESTING
  • Information Patent Application

    ABSOLUTE POSITION ENCODER
    • Publication number 20080315076
    • Publication date Dec 25, 2008
    • Mitutoyo Corporation
    • Kouhei Kusano
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contactless switches
    • Publication number 20080283733
    • Publication date Nov 20, 2008
    • Laruent Tupinier
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    Optical Potentiometer with Temperature Drift Compensation
    • Publication number 20080283732
    • Publication date Nov 20, 2008
    • Aimbridge Pty. Ltd.
    • Hans-Gunther Rosenkranz
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER
    • Publication number 20080258050
    • Publication date Oct 23, 2008
    • Nikon Corporation
    • Susumu Makinouchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Device and method for sensing a position of a drive unit
    • Publication number 20080177501
    • Publication date Jul 24, 2008
    • Siemens Aktiengesellschaft
    • Uwe Krause
    • G01 - MEASURING TESTING
  • Information Patent Application

    Position detection device, rotating body detection control device,...
    • Publication number 20080174791
    • Publication date Jul 24, 2008
    • Koichi Kudo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Encoder
    • Publication number 20080083869
    • Publication date Apr 10, 2008
    • Seiichiro Mizuno
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION-MEASURING DEVICE
    • Publication number 20080067333
    • Publication date Mar 20, 2008
    • Wolfgang Holzapfel
    • G01 - MEASURING TESTING