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with provision for operation by a null method
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G01D3/06
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PHYSICS
G01
Measuring instruments
G01D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01D3/00
Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
Current Industry
G01D3/06
with provision for operation by a null method
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Patents Grants
last 30 patents
Information
Patent Grant
Methods for closed loop operation of capacitive accelerometers
Patent number
11,662,361
Issue date
May 30, 2023
Atlantic Inertial Systems Limited
Christopher Paul Fell
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Position sensor and method of position sensing
Patent number
10,415,997
Issue date
Sep 17, 2019
Melexis Technologies SA
Samuel Huber Lindenberger
G01 - MEASURING TESTING
Information
Patent Grant
Measurement result display device and measurement result display me...
Patent number
10,279,376
Issue date
May 7, 2019
Anritsu Corporation
Ryota Takasu
G01 - MEASURING TESTING
Information
Patent Grant
Compani bridge, nut, and fingerboard combination designs for string...
Patent number
9,134,139
Issue date
Sep 15, 2015
Behrooz Compani-Tabrizi
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining at least one first internal parameter of a s...
Patent number
8,456,174
Issue date
Jun 4, 2013
Continental Teves AG & Co. oHG
Joerg Eckrich
G01 - MEASURING TESTING
Information
Patent Grant
Current generating device for the generation and simultaneous monit...
Patent number
8,405,378
Issue date
Mar 26, 2013
Vega Grieshaber KG
Andreas Blessing
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for alerting a driver that a motive power system...
Patent number
7,699,129
Issue date
Apr 20, 2010
Ford Global Technologies, LLC
William David Treharne
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Amplifier device for sensors
Patent number
7,009,184
Issue date
Mar 7, 2006
Centre National de la Recherche Scientifique
Pierre Temple-Boyer
G01 - MEASURING TESTING
Information
Patent Grant
Sensor readout circuit
Patent number
6,972,553
Issue date
Dec 6, 2005
The Charles Stark Draper Laboratory, Inc.
Anthony Petrovich
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for detecting displacements using micro-electrom...
Patent number
6,753,691
Issue date
Jun 22, 2004
STMicroelectronics S.r.l.
Ernesto Lasalandra
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for automatic calibration of a microelectromechan...
Patent number
6,577,975
Issue date
Jun 10, 2003
STMicroelectronics S.r.l.
Enrico Chiesa
G01 - MEASURING TESTING
Information
Patent Grant
Position detector utilizing magnetic sensors and a bias magnetic fi...
Patent number
6,541,960
Issue date
Apr 1, 2003
Sony Precision Technology Inc.
Yasuo Nekado
G01 - MEASURING TESTING
Information
Patent Grant
High accuracy measuring system
Patent number
6,215,319
Issue date
Apr 10, 2001
Kevin G. Hafer
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
6,049,075
Issue date
Apr 11, 2000
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
6,049,087
Issue date
Apr 11, 2000
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
5,955,728
Issue date
Sep 21, 1999
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for detecting origin point of position sensor
Patent number
5,534,692
Issue date
Jul 9, 1996
Sony Corporation
Akihito Nakayama
G05 - CONTROLLING REGULATING
Information
Patent Grant
Electrode structure and method for anodically-bonded capacitive sen...
Patent number
5,446,616
Issue date
Aug 29, 1995
Litton Systems, Inc.
Keith O. Warren
G01 - MEASURING TESTING
Information
Patent Grant
Servo-controlled pendular micro-sensor
Patent number
5,440,939
Issue date
Aug 15, 1995
Sextant Avionique
Herve Barny
G01 - MEASURING TESTING
Information
Patent Grant
Linear-output, temperature-stable rotational sensor including magne...
Patent number
5,270,645
Issue date
Dec 14, 1993
Nartron Corporation
Mark Wheeler
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information
Patent Grant
Filter with hysteresis for trip point applications
Patent number
5,233,329
Issue date
Aug 3, 1993
Delco Electronics Corporation
Raymond Lippmann
G01 - MEASURING TESTING
Information
Patent Grant
Process for identifying discrete data representative of an input sa...
Patent number
5,214,580
Issue date
May 25, 1993
Hewlett-Packard Company
Richard Aparo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic interface device between a sensor and a display unit
Patent number
4,810,953
Issue date
Mar 7, 1989
Veglia
Tan D. Huynh
G01 - MEASURING TESTING
Information
Patent Grant
Digital display measuring apparatus
Patent number
4,689,890
Issue date
Sep 1, 1987
Mitutoyo Mfg., Co., Ltd.
Shingo Nishina
G01 - MEASURING TESTING
Information
Patent Grant
Programmable multi-channel tool monitor with multiple alarm limits...
Patent number
4,633,424
Issue date
Dec 30, 1986
Santrade Ltd.
Rolf Norberg
G01 - MEASURING TESTING
Information
Patent Grant
Scanning signal balancing circuit
Patent number
4,628,201
Issue date
Dec 9, 1986
Dr. Johannes Heidenhain GmbH
Walter Schmitt
G01 - MEASURING TESTING
Information
Patent Grant
Method of setting a reference value, for example to zero-set a sign...
Patent number
4,612,450
Issue date
Sep 16, 1986
Bosch und Pierburg System oHG
Gunter Gilz
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for digitally subdividing analog periodic signals
Patent number
4,594,579
Issue date
Jun 10, 1986
Dr. Johannes Heidenhain GmbH
Walter Schmitt
G01 - MEASURING TESTING
Information
Patent Grant
Digital display measuring apparatus
Patent number
4,593,473
Issue date
Jun 10, 1986
Mitutoyo Mfg. Co., Ltd.
Toshitaka Shimomura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reproducing a reference position in an inc...
Patent number
4,530,155
Issue date
Jul 23, 1985
Dr. Johannes Heidenhain GmbH
Horst Burkhardt
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Multi-dimensional precision spot inspection method and system for t...
Publication number
20240280378
Publication date
Aug 22, 2024
Huaneng Jinan Huangtai Power Generation Co., Ltd.
Jun Luan
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC APPARATUS FOR CONTROLLING SENSOR AND OPERATION METHOD TH...
Publication number
20220187100
Publication date
Jun 16, 2022
AGENCY FOR DEFENSE DEVELOPMENT
Chang Min LEE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR RECALIBRATING A MEASUREMENT INSTRUMENT
Publication number
20180246142
Publication date
Aug 30, 2018
West Energy Support & Technology, Inc.
James Glover
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT RESULT DISPLAY DEVICE AND MEASUREMENT RESULT DISPLAY ME...
Publication number
20180236496
Publication date
Aug 23, 2018
Anritsu Corporation
Ryota TAKASU
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
METHOD FOR DETERMINING AT LEAST ONE FIRST INTERNAL PARAMETER OF A S...
Publication number
20110089930
Publication date
Apr 21, 2011
Continental Teves AG & Co. OHG
Joerg Eckrich
G01 - MEASURING TESTING
Information
Patent Application
Current Generating Device for the Generation and Simultaneous Monit...
Publication number
20100211342
Publication date
Aug 19, 2010
Andreas Blessing
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ALERTING A DRIVER THAT A MOTIVE POWER SYSTEM...
Publication number
20090112382
Publication date
Apr 30, 2009
FORD GLOBAL TECHNOLOGIES, L.L.C.
William David Treharne
B60 - VEHICLES IN GENERAL
Information
Patent Application
Sensor readout circuit
Publication number
20030151400
Publication date
Aug 14, 2003
Anthony Petrovich
G01 - MEASURING TESTING
Information
Patent Application
Amplifier device for sensors
Publication number
20030147451
Publication date
Aug 7, 2003
Pierre Temple-Boyer
G01 - MEASURING TESTING
Information
Patent Application
Method and circuit for detecting displacements using micro-electrom...
Publication number
20030052699
Publication date
Mar 20, 2003
STMicroelectronics S.r.l.
Ernesto Lasalandra
G01 - MEASURING TESTING
Information
Patent Application
Device and method for automatic calibration of a microelectromechan...
Publication number
20020143484
Publication date
Oct 3, 2002
STMicroelectronics S.r.l.
Enrico Chiesa
G01 - MEASURING TESTING
Information
Patent Application
Magnetic sensor and position transducer
Publication number
20010026154
Publication date
Oct 4, 2001
Yasuo Nekado
G01 - MEASURING TESTING