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with secondary-emission detectors optionally combined with scintillation counters
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G01T1/28
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PHYSICS
G01
Measuring instruments
G01T
MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/00
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
Current Industry
G01T1/28
with secondary-emission detectors optionally combined with scintillation counters
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Patents Grants
last 30 patents
Information
Patent Grant
Ion detector
Patent number
11,955,327
Issue date
Apr 9, 2024
HITACHI HIGH-TECH CORPORATION
Kiyomi Yoshinari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dosimeter
Patent number
11,914,083
Issue date
Feb 27, 2024
Centre National de la Recherche Scientifique
Sree Bash Chandra Debnath
G01 - MEASURING TESTING
Information
Patent Grant
Chip counter for semiconductor chip-mounted tape reel
Patent number
11,893,451
Issue date
Feb 6, 2024
Hyun Su Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detector comprising transmission secondary electron emission means
Patent number
11,869,757
Issue date
Jan 9, 2024
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer detector and system and method using the same
Patent number
11,823,883
Issue date
Nov 21, 2023
NOVA MEASURING INSTRUMENTS, INC.
Christopher F. Bevis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion filter using aperture plate with plurality of zones
Patent number
11,747,494
Issue date
Sep 5, 2023
Plasma-Therm LLC
Leslie Michael Lea
G01 - MEASURING TESTING
Information
Patent Grant
Neutron imaging system having neutron shield
Patent number
11,733,409
Issue date
Aug 22, 2023
Photonis Scientific, Inc.
Brian White
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Daly detector operable in negative ion and positive ion detection m...
Patent number
11,640,005
Issue date
May 2, 2023
Thermo Finnigan LLC.
Linfan Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shock resistant downhole gamma ray detector assembly
Patent number
11,520,063
Issue date
Dec 6, 2022
QCD Technology, Inc.
Cornel Dinica
E21 - EARTH DRILLING MINING
Information
Patent Grant
Channel electron multiplier and ion detector
Patent number
11,417,505
Issue date
Aug 16, 2022
Hamamatsu Photonics K.K.
Takeshi Endo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for characterizing a beam of charged particles and machine f...
Patent number
11,333,776
Issue date
May 17, 2022
Ecole Polytechnique
Denis Bernard
G01 - MEASURING TESTING
Information
Patent Grant
Neutron imaging system having neutron shield
Patent number
11,327,185
Issue date
May 10, 2022
Photonis Scientific, Inc.
Brian White
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multifunctional radiography, tomography and fluoroscopy device
Patent number
11,304,670
Issue date
Apr 19, 2022
Sociedad Española de Electromedicina y Calidad S.A
Jose Maria Ortega Jimenez
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer detector and system and method using the same
Patent number
11,183,377
Issue date
Nov 23, 2021
NOVA MEASURING INSTRUMENTS, INC.
Christopher F. Bevis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam system and method of operating a particle beam system
Patent number
11,092,702
Issue date
Aug 17, 2021
Carl Zeiss Microscopy GmbH
Jörg Fober
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, algorithm, and method using short pulse interrogation with...
Patent number
11,061,164
Issue date
Jul 13, 2021
National Technology & Engineering Solutions of Sandia, LLC
Mark S. Derzon
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for producing an image of radioactive emissions using a...
Patent number
10,884,139
Issue date
Jan 5, 2021
University of Maryland, Baltimore
Jerimy Polf
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Read network topology
Patent number
10,838,084
Issue date
Nov 17, 2020
General Equipment for Medical Imaging, S.A.
Liczandro Hernández Hernández
G01 - MEASURING TESTING
Information
Patent Grant
Photomultiplier tube and method of making it
Patent number
10,580,630
Issue date
Mar 3, 2020
Shenzhen Genorivision Technology Co., Ltd.
Peiyan Cao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radiation detector and uses thereof
Patent number
10,401,509
Issue date
Sep 3, 2019
Saint-Gobain Ceramics & Plastics, Inc.
Kan Yang
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector, medical image diagnosis apparatus, detector pac...
Patent number
10,330,801
Issue date
Jun 25, 2019
Canon Medical Systems Corporation
Kazuto Nishizawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Charged particle detector
Patent number
10,312,068
Issue date
Jun 4, 2019
Hamamatsu Photonics K.K.
Motohiro Suyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photomultiplier tube and method of making it
Patent number
10,262,847
Issue date
Apr 16, 2019
Shenzhen Genorivision Technology Co., Ltd.
Peiyan Cao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector for incident radiation
Patent number
10,134,571
Issue date
Nov 20, 2018
C-RAD IMAGING AB
Gunnar Norberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detector and method for detecting ionizing radiation
Patent number
10,054,692
Issue date
Aug 21, 2018
Koninklijke Philips N.V.
Ewald Roessl
G01 - MEASURING TESTING
Information
Patent Grant
Conversion of high-energy photons into electricity
Patent number
9,893,226
Issue date
Feb 13, 2018
TAE TECHNOLOGIES, INC.
Michl W. Binderbauer
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Photocathode
Patent number
9,837,238
Issue date
Dec 5, 2017
National Security Technologies, LLC
Yekaterina Opachich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gamma ray detector and method of detecting gamma rays
Patent number
9,733,365
Issue date
Aug 15, 2017
Infineon Technologies AG
Friedrich Kroener
G01 - MEASURING TESTING
Information
Patent Grant
Neutron detection
Patent number
9,651,688
Issue date
May 16, 2017
Nova Scientific, Inc.
Jon. H. Chappell
G01 - MEASURING TESTING
Information
Patent Grant
Source for selectively providing positively or negatively charged p...
Patent number
9,601,312
Issue date
Mar 21, 2017
FEI Company
Brian Roberts Routh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PHOTOELECTRIC CONVERSION DEVICE, ELECTROMAGNETIC WAVE DETECTION DEV...
Publication number
20240355601
Publication date
Oct 24, 2024
Hamamatsu Photonics K.K.
Naoya KAWAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MANUFACTURING A FLUX DETECTORE OF A FIRST AND A SECOND I...
Publication number
20240241274
Publication date
Jul 18, 2024
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Julien DARREON
G01 - MEASURING TESTING
Information
Patent Application
DALY DETECTOR OPERABLE IN NEGATIVE ION AND POSITIVE ION DETECTION M...
Publication number
20230243986
Publication date
Aug 3, 2023
Thermo Finnigan LLC
Linfan LI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NEUTRON IMAGING SYSTEM HAVING NEUTRON SHIELD
Publication number
20220342097
Publication date
Oct 27, 2022
PHOTONIS SCIENTIFIC, INC.
Brian White
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME
Publication number
20220223395
Publication date
Jul 14, 2022
NOVA MEASURING INSTRUMENTS, INC.
Christopher F. BEVIS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Detector
Publication number
20220181138
Publication date
Jun 9, 2022
Hitachi High-Tech Corporation
Kiyomi YOSHINARI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHANNEL ELECTRON MULTIPLIER AND ION DETECTOR
Publication number
20220020579
Publication date
Jan 20, 2022
HAMAMATSU PHOTONICS K. K.
Takeshi ENDO
G01 - MEASURING TESTING
Information
Patent Application
CHIP COUNTER FOR SEMICONDUCTOR CHIP-MOUNTED TAPE REEL
Publication number
20210397921
Publication date
Dec 23, 2021
NANODREAM CO.,LTD.
Hyun Su LEE
G01 - MEASURING TESTING
Information
Patent Application
Multifunctional Radiography, Tomography and Fluoroscopy Device
Publication number
20210059620
Publication date
Mar 4, 2021
Sociedad Española de Electromedicina y Calidad S.A
Jose Maria ORTEGA JIMENEZ
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR CHARACTERIZING A BEAM OF CHARGED PARTICLES AND MACHINE F...
Publication number
20200393578
Publication date
Dec 17, 2020
ECOLE POLYTECHNIQUE
Denis Bernard
G01 - MEASURING TESTING
Information
Patent Application
ION FILTER USING APERTURE PLATE WITH PLURALITY OF ZONES
Publication number
20200319356
Publication date
Oct 8, 2020
Plasma-Therm LLC
Leslie Michael Lea
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NEUTRON IMAGING SYSTEM HAVING NEUTRON SHIELD
Publication number
20200309973
Publication date
Oct 1, 2020
Nova Scientific, Inc.
Brian White
G01 - MEASURING TESTING
Information
Patent Application
SWITCHABLE RADIATION SOURCES AND ACTIVE INTERROGATION METHODS
Publication number
20200103537
Publication date
Apr 2, 2020
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Hyoung K. Lee
G01 - MEASURING TESTING
Information
Patent Application
Read Network Topology
Publication number
20190004188
Publication date
Jan 3, 2019
GENERAL EQUIPMENT FOR MEDICAL IMAGING, S.A.
Liczandro HERNÁNDEZ HERNÁNDEZ
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ARTICLE INCLUDING A BODY INCLUDING A FLUORESCENT MATERIAL AND A WAV...
Publication number
20180321418
Publication date
Nov 8, 2018
Saint-Gobain Ceramics & Plastics, Inc.
Michael R. KUSNER
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR AND USES THEREOF
Publication number
20180306934
Publication date
Oct 25, 2018
Saint-Gobain Ceramics & Plastics, Inc.
Kan Yang
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, MEDICAL IMAGE DIAGNOSIS APPARATUS, DETECTOR PAC...
Publication number
20180267183
Publication date
Sep 20, 2018
Canon Medical Systems Corporation
Kazuto NISHIZAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Filter
Publication number
20180143332
Publication date
May 24, 2018
Plasma-Therm LLC
Leslie Michael Lea
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR AND METHOD FOR DETECTING IONIZING RADIATION
Publication number
20170357013
Publication date
Dec 14, 2017
Ewald ROESSL
G01 - MEASURING TESTING
Information
Patent Application
CONVERSION OF HIGH-ENERGY PHOTONS INTO ELECTRICITY
Publication number
20170236967
Publication date
Aug 17, 2017
Tri Alpha Energy, Inc
Michl W. Binderbauer
G01 - MEASURING TESTING
Information
Patent Application
GAMMA RAY DETECTOR AND METHOD OF DETECTING GAMMA RAYS
Publication number
20170205518
Publication date
Jul 20, 2017
INFINEON TECHNOLOGIES AG
Friedrich KROENER
G01 - MEASURING TESTING
Information
Patent Application
Photocathode
Publication number
20170062169
Publication date
Mar 2, 2017
National Security Technologies, LLC
Yekaterina Opachich
G01 - MEASURING TESTING
Information
Patent Application
GAMMA RAY DETECTOR AND METHOD OF DETECTING GAMMA RAYS
Publication number
20160061967
Publication date
Mar 3, 2016
Friedrich Kroener
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Position Detector and Implementation in a Mirror Pointing Ser...
Publication number
20150276948
Publication date
Oct 1, 2015
Thomas A. Rabedeau
G01 - MEASURING TESTING
Information
Patent Application
Radiation Detector System and Method
Publication number
20150021489
Publication date
Jan 22, 2015
Canberra Industries, Inc.
Adam Gregory Bogorodzki
G01 - MEASURING TESTING
Information
Patent Application
Source for Selectively Providing Positively or Negatively Charged P...
Publication number
20140326877
Publication date
Nov 6, 2014
FEI Company
Brian Roberts Routh
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR AND IMAGING SYSTEM
Publication number
20140124676
Publication date
May 8, 2014
Harry Hedler
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR AND IMAGING SYSTEM
Publication number
20140103219
Publication date
Apr 17, 2014
Harry Hedler
G01 - MEASURING TESTING
Information
Patent Application
Neutron Detection
Publication number
20140077087
Publication date
Mar 20, 2014
Jon. H. Chappell
G01 - MEASURING TESTING
Information
Patent Application
GAMMA RAY DETECTING APPARATUS AND METHOD FOR DETECTING GAMMA RAY US...
Publication number
20140021362
Publication date
Jan 23, 2014
Industry-University Cooperation Foundation Hanyang University
Chan-Hyeong Kim
G01 - MEASURING TESTING