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G01L9/065
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01L
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
G01L9/00
Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by electric or magnetic pressure-sensitive elements Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material by electric or magnetic means
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G01L9/065
with temperature compensating means
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Patents Grants
last 30 patents
Information
Patent Grant
MEMS sensor as well as method for operating a mems sensor
Patent number
12,145,840
Issue date
Nov 19, 2024
Robert Bosch GmbH
Arne Dannenberg
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Bipolar transistor type MEMS pressure sensor and preparation method...
Patent number
11,965,797
Issue date
Apr 23, 2024
Wuxi Sencoch Semiconductor Co., Ltd.
Tongqing Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Pressure sensor with trim resistors
Patent number
11,768,121
Issue date
Sep 26, 2023
Rosemount Aerospace Inc.
David P. Potasek
G01 - MEASURING TESTING
Information
Patent Grant
Pressure measuring apparatus for measuring a discharge pressure of...
Patent number
11,662,264
Issue date
May 30, 2023
Samsung Electronics Co., Ltd.
Inho Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Verification of correct operation of a physical parameter sensor
Patent number
11,630,015
Issue date
Apr 18, 2023
Rosemount Aerospace Inc.
Mark Buenz
G01 - MEASURING TESTING
Information
Patent Grant
Sensor drive circuit with improved temperature characteristic compe...
Patent number
11,525,751
Issue date
Dec 13, 2022
Mitsumi Electric Co., Ltd.
Hajime Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Increasing sensitivity of a sensor using an encoded signal
Patent number
11,435,242
Issue date
Sep 6, 2022
Sentons Inc.
Samuel W. Sheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sensor apparatus
Patent number
11,402,275
Issue date
Aug 2, 2022
Denso Corporation
Shogo Hikosaka
G01 - MEASURING TESTING
Information
Patent Grant
Piezoresistive sensor for detecting a physical disturbance
Patent number
11,340,124
Issue date
May 24, 2022
Sentons Inc.
Samuel W. Sheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Temperature-compensated strain gauge measurements
Patent number
11,287,347
Issue date
Mar 29, 2022
ABB Schweiz AG
Paul Szasz
G01 - MEASURING TESTING
Information
Patent Grant
Touch input detection using a piezoresistive sensor
Patent number
11,262,253
Issue date
Mar 1, 2022
Sentons Inc.
Samuel W. Sheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for extending frequency response of resonant tr...
Patent number
11,255,718
Issue date
Feb 22, 2022
Kulite Semiconductor Products, Inc.
Joe VanDeWeert
G01 - MEASURING TESTING
Information
Patent Grant
Piezoresistive sensor for detecting a physical disturbance
Patent number
11,231,334
Issue date
Jan 25, 2022
Sentons Inc.
Samuel W. Sheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of making a dual-cavity pressure sensor die
Patent number
11,226,251
Issue date
Jan 18, 2022
Chinese Academy of Sciences Institute of Geology and Geophysics
Yiming Zhang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
CMOS thermal fluid flow sensing device employing a flow sensor and...
Patent number
11,035,709
Issue date
Jun 15, 2021
Cambridge Enterprise Limited
Andrea De Luca
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Increasing sensitivity of a sensor using an encoded signal
Patent number
11,009,411
Issue date
May 18, 2021
Sentons Inc.
Samuel W. Sheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pressure sensor generating a transduced signal with reduced ambient...
Patent number
10,962,431
Issue date
Mar 30, 2021
STMicroelectronics S.r.l.
Enri Duqi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Dual pressure sensing module with a shared electrical substrate
Patent number
10,948,372
Issue date
Mar 16, 2021
Apple Inc.
Gregory B. Arndt
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Dual-cavity pressure sensor die and the method of making same
Patent number
10,809,141
Issue date
Oct 20, 2020
Chinese Academy of Sciences Institute of Geology and Geophysics
Yiming Zhang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Pressure sensor generating a transduced signal with reduced ambient...
Patent number
10,809,140
Issue date
Oct 20, 2020
STMicroelectronics S.r.l.
Enri Duqi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Component having a micromechanical sensor module
Patent number
10,788,387
Issue date
Sep 29, 2020
Robert Bosch GmbH
Uwe Hansen
G01 - MEASURING TESTING
Information
Patent Grant
Aircraft engine multi-channel pressure transducer
Patent number
10,718,678
Issue date
Jul 21, 2020
Hamilton Sundstrand Corporation
Bruce D. Paradise
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for extending frequency response of resonant tr...
Patent number
10,697,827
Issue date
Jun 30, 2020
Kulite Semiconductor Products, Inc.
Joe VanDeWeert
G01 - MEASURING TESTING
Information
Patent Grant
Self-heated pressure sensor assemblies
Patent number
10,656,036
Issue date
May 19, 2020
Kulite Semiconductor Products, Inc.
Wolf S. Landmann
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for switched multi-transducer pressure sensors...
Patent number
10,634,570
Issue date
Apr 28, 2020
Kulite Semiconductor Products, Inc.
Joseph VanDeWeert
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensor with resin portion and membrane having reduced temp...
Patent number
10,527,513
Issue date
Jan 7, 2020
Denso Corporation
Kazuyuki Oono
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensor temperature coefficient offset adjustment
Patent number
10,337,942
Issue date
Jul 2, 2019
Honeywell International Inc.
Carl Stewart
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure sensor
Patent number
10,317,297
Issue date
Jun 11, 2019
Melexis Technologies NV
Appolonius Jacobus Van Der Wiel
G01 - MEASURING TESTING
Information
Patent Grant
Sealed transducer with external adjustment port
Patent number
10,309,850
Issue date
Jun 4, 2019
Kulite Semiconductor Products, Inc.
Wolf Landmann
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensor having a multiple wheatstone bridge configuration o...
Patent number
10,302,514
Issue date
May 28, 2019
NXP USA, INC.
Lianjun Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PRESSURE SENSOR RESISTOR CONFIGURATION FOR STRESS COMPENSATION
Publication number
20240288325
Publication date
Aug 29, 2024
MELEXIS TECHNOLOGIES NV
Ben MAES
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE COEFFICIENT OF OFFSET COMPENSATION FOR RESISTANCE BRIDGE
Publication number
20240019321
Publication date
Jan 18, 2024
Qorvo US, Inc.
Mong Yang
G01 - MEASURING TESTING
Information
Patent Application
PIEZO-RESISTIVE PRESSURE CELL WITH REDUCED RADIATION INDUCED DRIFTS...
Publication number
20230332971
Publication date
Oct 19, 2023
AST Advanced Space Technologies GmbH
Hans-Peter Harmann
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR AND ELECTRONIC DEVICE
Publication number
20230324245
Publication date
Oct 12, 2023
Honor Device Co., Ltd.
Yabin AN
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR WITH TRIM RESISTORS
Publication number
20230160767
Publication date
May 25, 2023
Rosemount Aerospace Inc.
David P. Potasek
G01 - MEASURING TESTING
Information
Patent Application
VERIFICATION OF CORRECT OPERATION OF A PHYSICAL PARAMETER SENSOR
Publication number
20220050001
Publication date
Feb 17, 2022
Rosemount Aerospace Inc.
Mark Buenz
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
MEMS SENSOR AS WELL AS METHOD FOR OPERATING A MEMS SENSOR
Publication number
20220009769
Publication date
Jan 13, 2022
ROBERT BOSCH GmbH
Arne Dannenberg
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR DRIVE CIRCUIT
Publication number
20210381917
Publication date
Dec 9, 2021
MITSUMI ELECTRIC CO., LTD.
Hajime NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Method of Making a Dual-Cavity Pressure Sensor Die
Publication number
20210003468
Publication date
Jan 7, 2021
Chinese Academy of Sciences Institute of Geology and Geophysics
Yiming ZHANG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PRESSURE MEASURING APPARATUS
Publication number
20200370982
Publication date
Nov 26, 2020
Samsung Electronics Co., Ltd.
Inho Won
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR EXTENDING FREQUENCY RESPONSE OF RESONANT TR...
Publication number
20200271510
Publication date
Aug 27, 2020
Kulite Semiconductor Products, Inc.
Joe VanDeWeert
G01 - MEASURING TESTING
Information
Patent Application
Dual Pressure Sensing Module with a Shared Electrical Substrate
Publication number
20200103302
Publication date
Apr 2, 2020
Apple Inc.
Gregory B. Arndt
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
A SINGLE MEMBRANE FLOW-PRESSURE SENSING DEVICE
Publication number
20200049539
Publication date
Feb 13, 2020
CAMBRIDGE ENTERPRISE LIMITED
Andrea DE LUCA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
A DUAL-CAVITY PRESSURE SENSOR DIE AND THE METHOD OF MAKING SAME
Publication number
20190145842
Publication date
May 16, 2019
Institute of Geology and Geophysics, Chinese Academy of Sciences
Yiming ZHANG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SELF-HEATED PRESSURE SENSOR ASSEMBLIES
Publication number
20190145841
Publication date
May 16, 2019
Kulite Semiconductor Products, Inc.
Wolf S. Landmann
G01 - MEASURING TESTING
Information
Patent Application
SENSOR APPARATUS
Publication number
20190128747
Publication date
May 2, 2019
DENSO CORPORATION
Shogo HIKOSAKA
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR GENERATING A TRANSDUCED SIGNAL WITH REDUCED AMBIENT...
Publication number
20190120710
Publication date
Apr 25, 2019
STMicroelectronics S.r.l.
Enri Duqi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYSTEMS AND METHODS FOR SWITCHED MULTI-TRANSDUCER PRESSURE SENSORS...
Publication number
20190033154
Publication date
Jan 31, 2019
Kulite Semiconductor Products, Inc.
Joseph VanDeWeert
G01 - MEASURING TESTING
Information
Patent Application
COMPONENT HAVING A MICROMECHANICAL SENSOR MODULE
Publication number
20180266909
Publication date
Sep 20, 2018
ROBERT BOSCH GmbH
Uwe Hansen
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR
Publication number
20180195922
Publication date
Jul 12, 2018
Denso Corporation
Kazuyuki OONO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PRESSURE SENSOR, PRESSURE SENSOR MODULE, ELECTRONIC APPARATUS, AND...
Publication number
20180180501
Publication date
Jun 28, 2018
SEIKO EPSON CORPORATION
Takuya KINUGAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PRESSURE SENSOR HAVING A MULTIPLE WHEATSTONE BRIDGE CONFIGURATION O...
Publication number
20180172533
Publication date
Jun 21, 2018
NXP USA, Inc.
Lianjun Liu
G01 - MEASURING TESTING
Information
Patent Application
SEALED TRANSDUCER WITH EXTERNAL ADJUSTMENT PORT
Publication number
20170363495
Publication date
Dec 21, 2017
Kulite Semiconductor Products, Inc.
WOLF LANDMANN
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE SENSOR DEVICE FOR MEASURING A DIFFERENTIAL NORMAL PRESSURE...
Publication number
20170307456
Publication date
Oct 26, 2017
STMicroelectronics S.r. I.
Alessandro MOTTA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PRESS FORCE DETECTORS
Publication number
20170131160
Publication date
May 11, 2017
Interlink Electronics, Inc.
Chee Wai Lu
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PRESSURE SENSOR
Publication number
20160265999
Publication date
Sep 15, 2016
Appolonius Jacobus VAN DER WIEL
G01 - MEASURING TESTING
Information
Patent Application
SELF-HEATED PRESSURE SENSOR ASSEMBLIES
Publication number
20160245712
Publication date
Aug 25, 2016
Kulite Semiconductor Products, Inc.
Wolf S. Landmann
G01 - MEASURING TESTING
Information
Patent Application
Physical Quantity Sensor Apparatus, Altimeter, Electronic Apparatus...
Publication number
20150369682
Publication date
Dec 24, 2015
SEIKO EPSON CORPORATION
Satoshi Nakajima
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE TRANSDUCER USING SOI, SILICON CARBIDE OR GALLIUM N...
Publication number
20150300901
Publication date
Oct 22, 2015
Kulite Semiconductor Products, Inc.
Anthony D. Kurtz
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR COMPENSATING A SENSOR
Publication number
20150114128
Publication date
Apr 30, 2015
Kulite Semiconductor Products, Inc.
Haig Norian
G01 - MEASURING TESTING