Word line control

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G11C2029/1202

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GPHYSICS G11Information storage G11CSTATIC STORES

Current Industry

G11C2029/1202Word line control

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory devices that support enhanced data recovery op...
- Patent number 12,308,082
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Seungjun Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory with layout adaptive problematic word line dete...
- Patent number 12,293,800
- Issue date May 6, 2025
- SanDisk Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 12,288,590
- Issue date Apr 29, 2025
- Samsung Electronics Co., Ltd.
- Eun Chu Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for detecting word line defect and semiconductor appar...
- Patent number 12,283,331
- Issue date Apr 22, 2025
- SK hynix Inc.
- Suk Hwan Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system
- Patent number 12,283,330
- Issue date Apr 22, 2025
- Kioxia Corporation
- Tsukasa Tokutomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technologies for repair of memory with access lines
- Patent number 12,277,985
- Issue date Apr 15, 2025
- Intel Corporation
- William K. Waller
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device configured to reduce degradation of adjacent word lin...
- Patent number 12,272,403
- Issue date Apr 8, 2025
- Samsung Electronics Co., Ltd.
- Myoung-Ho Son
- G11 - INFORMATION STORAGE
Information Patent Grant
Data integrity check in non-volatile storage
- Patent number 12,260,925
- Issue date Mar 25, 2025
- SanDisk Technologies, Inc.
- Sugandha Sharma
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device and method of operating nonvolatile memory
- Patent number 12,260,923
- Issue date Mar 25, 2025
- Samsung Electronics Co., Ltd.
- Hyunee Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Data storage device and method for runtime exclusive—or zoning duri...
- Patent number 12,254,936
- Issue date Mar 18, 2025
- SanDisk Technologies, Inc.
- Pawan Negi
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage system and method for proactive die retirement by fatal wor...
- Patent number 12,243,605
- Issue date Mar 4, 2025
- SanDisk Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
System and memory with configurable metadata portion
- Patent number 12,230,347
- Issue date Feb 18, 2025
- QUALCOMM Incorporated
- Jungwon Suh
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line layer dependent stress and screen voltage
- Patent number 12,230,344
- Issue date Feb 18, 2025
- SanDisk Technologies, Inc.
- Yidan Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array test structure and method of forming the same
- Patent number 12,217,826
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Meng-Han Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable logic device with design for test functionality
- Patent number 12,217,811
- Issue date Feb 4, 2025
- QuickLogic Corporation
- Ket Chong Yap
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for tracking word line accesses
- Patent number 12,217,813
- Issue date Feb 4, 2025
- Dong Pan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for checking data, electronic device, and storage...
- Patent number 12,190,976
- Issue date Jan 7, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jia Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self test circuit for segmented static random access memor...
- Patent number 12,170,120
- Issue date Dec 17, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Hitesh Chawla
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit, memory array, and testing method of memory array
- Patent number 12,170,123
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and method
- Patent number 12,165,725
- Issue date Dec 10, 2024
- Kioxia Corporation
- Ryo Yamaki
- G11 - INFORMATION STORAGE
Information Patent Grant
One-time programmable memory device and semiconductor memory device...
- Patent number 12,165,726
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Yeongmuk Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory control method, memory storage device and memory control cir...
- Patent number 12,147,674
- Issue date Nov 19, 2024
- Hefei Core Storage Electronic Limited
- Chih-Ling Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Early detection of programming failure for non-volatile memory
- Patent number 12,148,489
- Issue date Nov 19, 2024
- SANDISK TECHNOLOGIES LLC
- Yi Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Health scan for content addressable memory
- Patent number 12,142,334
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Tomoko Ogura Iwasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Repairable latch array
- Patent number 12,100,464
- Issue date Sep 24, 2024
- Advanced Micro Devices, Inc.
- Joel Thornton Irby
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device, operating method thereof, controller fo...
- Patent number 12,094,552
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Fast search for leaky word line
- Patent number 12,094,550
- Issue date Sep 17, 2024
- SanDisk Technologies, Inc.
- Xingyan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect detection during erase operations
- Patent number 12,094,549
- Issue date Sep 17, 2024
- Micron Technology, Inc.
- Jun Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Skipping pages for weak wordlines of a memory device during pre-pro...
- Patent number 12,080,376
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Cheng Cheng Ang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic contact management systems and methods
- Patent number 12,079,819
- Issue date Sep 3, 2024
- LeadAssign Corporation
- Desmond Von Teichman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...
- Publication number 20250181498
- Publication date Jun 5, 2025
- KIOXIA Corporation
- Bai-Jun XIAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE HAVING CELL OVER PERIPHERY STRUCTURE AND SEMICONDUCTO...
- Publication number 20250140332
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Changyoung Lee
- G11 - INFORMATION STORAGE
Information Patent Application
SCHEME TO FETCH OPTIMAL READ PARAMETERS BY SKIPPING INVALID WORDLINES
- Publication number 20250140331
- Publication date May 1, 2025
- Western Digital Technologies, Inc.
- DARSHAN PAGARIYA
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR TRACKING WORD LINE ACCESSES
- Publication number 20250131972
- Publication date Apr 24, 2025
- Lodestar Licensing Group LLC
- Dong Pan
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD THEREOF
- Publication number 20250124996
- Publication date Apr 17, 2025
- WINBOND ELECTRONICS CORP.
- Chih-Chiang Lai
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE FOR CONTROLLING OPERATING POWER SUPPLIED TO WO...
- Publication number 20250124998
- Publication date Apr 17, 2025
- SK HYNIX INC.
- Byeong Cheol LEE
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND MEMORY WITH CONFIGURABLE METADATA PORTION
- Publication number 20250111885
- Publication date Apr 3, 2025
- QUALCOMM Incorporated
- Jungwon Suh
- G11 - INFORMATION STORAGE
Information Patent Application
HEALTH SCAN FOR CONTENT ADDRESSABLE MEMORY
- Publication number 20250111884
- Publication date Apr 3, 2025
- Micron Technology, Inc.
- Tomoko Ogura Iwasaki
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND AN OPERATING METHOD THEREOF
- Publication number 20250104788
- Publication date Mar 27, 2025
- Yangtze Memory Technologies Co., Ltd.
- Shuai ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY
- Publication number 20250095762
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF TEST CIRCUIT FOR SEGMENTED STATIC RANDOM ACCESS MEMOR...
- Publication number 20250069678
- Publication date Feb 27, 2025
- STMicroelectronics International N.V.
- Hitesh CHAWLA
- G11 - INFORMATION STORAGE
Information Patent Application
ONE-TIME PROGRAMMABLE MEMORY DEVICE AND SEMICONDUCTOR MEMORY DEVICE...
- Publication number 20250054558
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Yeongmuk Cho
- G11 - INFORMATION STORAGE
Information Patent Application
SKIPPING PAGES FOR WEAK WORDLINES OF A MEMORY DEVICE DURING PRE-PRO...
- Publication number 20250054527
- Publication date Feb 13, 2025
- Micron Technology, Inc.
- Cheng Cheng Ang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORDLINE RAMP RATE MONITOR FOR EARLY DETECTION OF DEFECT ACTIVATION
- Publication number 20250046390
- Publication date Feb 6, 2025
- Micron Technology, Inc.
- Fulvio Rori
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH MULTIPLE DATA RESOLUTIONS
- Publication number 20250037783
- Publication date Jan 30, 2025
- Western Digital Technologies, Inc.
- Abhijith Prakash
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE DETERMINING DETERIORATION WORDLINE, AND METHOD OF OP...
- Publication number 20250014664
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Minji Cho
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETE...
- Publication number 20250006287
- Publication date Jan 2, 2025
- Western Digital Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Application
ABORTED OPERATION DETECTION FOR NONVOLATILE MEMORY WITH NON-UNIFORM...
- Publication number 20240428874
- Publication date Dec 26, 2024
- Western Digital Technologies, Inc.
- Huiwen Xu
- G11 - INFORMATION STORAGE
Information Patent Application
REDUCING PARTIAL BLOCK PROGRAMMING USING DYNAMIC TRIM SETTINGS
- Publication number 20240412803
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Qun Su
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECT DETECTION DURING ERASE OPERATIONS
- Publication number 20240404615
- Publication date Dec 5, 2024
- Micron Technology, Inc.
- Jun Xu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20240363186
- Publication date Oct 31, 2024
- KIOXIA Corporation
- Naomi TAKEDA
- G11 - INFORMATION STORAGE
Information Patent Application
PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES
- Publication number 20240363193
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Application
APPRATUS AND METHOD FOR CHANGING A READ VOLTAGE APPLIED FOR READING...
- Publication number 20240355405
- Publication date Oct 24, 2024
- SK HYNIX INC.
- Jae Yong SON
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES
- Publication number 20240347110
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Jian Huang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...
- Publication number 20240339168
- Publication date Oct 10, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR
- Publication number 20240331795
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. CHIANG
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE
- Publication number 20240321334
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Kosuke HATSUDA
- G11 - INFORMATION STORAGE
Information Patent Application
DATA INTEGRITY CHECK IN NON-VOLATILE STORAGE
- Publication number 20240312546
- Publication date Sep 19, 2024
- Western Digital Technologies, Inc.
- Sugandha Sharma
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE DETECTING DEFECT OF WORD LINE PATH AND OPERATING METH...
- Publication number 20240296898
- Publication date Sep 5, 2024
- Samsung Electronics Co., Ltd.
- Taehong KWON
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH FASTER POST-ERASE DEFECT TESTING
- Publication number 20240290412
- Publication date Aug 29, 2024
- SANDISK TECHNOLOGIES LLC
- Sai Gautham Thoppa
- G06 - COMPUTING CALCULATING COUNTING

Word line control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor memory devices that support enhanced data recovery op...

Non-volatile memory with layout adaptive problematic word line dete...

Storage devices and methods of operating storage devices

Test circuit for detecting word line defect and semiconductor appar...

Memory system

Technologies for repair of memory with access lines

Memory device configured to reduce degradation of adjacent word lin...

Data integrity check in non-volatile storage

Nonvolatile memory device and method of operating nonvolatile memory

Data storage device and method for runtime exclusive—or zoning duri...

Storage system and method for proactive die retirement by fatal wor...

System and memory with configurable metadata portion

Word line layer dependent stress and screen voltage

Memory array test structure and method of forming the same

Programmable logic device with design for test functionality

Apparatuses and methods for tracking word line accesses

Method and device for checking data, electronic device, and storage...

Built-in self test circuit for segmented static random access memor...

Memory test circuit, memory array, and testing method of memory array

Memory system and method

One-time programmable memory device and semiconductor memory device...

Memory control method, memory storage device and memory control cir...

Early detection of programming failure for non-volatile memory

Health scan for content addressable memory

Repairable latch array

Non-volatile memory device, operating method thereof, controller fo...

Fast search for leaky word line

Defect detection during erase operations

Skipping pages for weak wordlines of a memory device during pre-pro...

Dynamic contact management systems and methods

Patents Applicationslast 30 patents

SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...

MEMORY DEVICE HAVING CELL OVER PERIPHERY STRUCTURE AND SEMICONDUCTO...

SCHEME TO FETCH OPTIMAL READ PARAMETERS BY SKIPPING INVALID WORDLINES

APPARATUSES AND METHODS FOR TRACKING WORD LINE ACCESSES

SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD THEREOF

SEMICONDUCTOR DEVICE FOR CONTROLLING OPERATING POWER SUPPLIED TO WO...

SYSTEM AND MEMORY WITH CONFIGURABLE METADATA PORTION

HEALTH SCAN FOR CONTENT ADDRESSABLE MEMORY

MEMORY SYSTEM AND AN OPERATING METHOD THEREOF

MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY

BUILT-IN SELF TEST CIRCUIT FOR SEGMENTED STATIC RANDOM ACCESS MEMOR...

ONE-TIME PROGRAMMABLE MEMORY DEVICE AND SEMICONDUCTOR MEMORY DEVICE...

SKIPPING PAGES FOR WEAK WORDLINES OF A MEMORY DEVICE DURING PRE-PRO...

WORDLINE RAMP RATE MONITOR FOR EARLY DETECTION OF DEFECT ACTIVATION

NON-VOLATILE MEMORY WITH MULTIPLE DATA RESOLUTIONS

STORAGE DEVICE DETERMINING DETERIORATION WORDLINE, AND METHOD OF OP...

NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETE...

ABORTED OPERATION DETECTION FOR NONVOLATILE MEMORY WITH NON-UNIFORM...

REDUCING PARTIAL BLOCK PROGRAMMING USING DYNAMIC TRIM SETTINGS

DEFECT DETECTION DURING ERASE OPERATIONS

MEMORY SYSTEM

PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES

APPRATUS AND METHOD FOR CHANGING A READ VOLTAGE APPLIED FOR READING...

PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES

MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR

STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE

DATA INTEGRITY CHECK IN NON-VOLATILE STORAGE

MEMORY DEVICE DETECTING DEFECT OF WORD LINE PATH AND OPERATING METH...

NON-VOLATILE MEMORY WITH FASTER POST-ERASE DEFECT TESTING