Word line control

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CPC
G11C2029/1202

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GPHYSICS G11Information storage G11CSTATIC STORES

Current Industry

G11C2029/1202Word line control

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self test circuit for segmented static random access memor...
- Patent number 12,170,120
- Issue date Dec 17, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Hitesh Chawla
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit, memory array, and testing method of memory array
- Patent number 12,170,123
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and method
- Patent number 12,165,725
- Issue date Dec 10, 2024
- Kioxia Corporation
- Ryo Yamaki
- G11 - INFORMATION STORAGE
Information Patent Grant
One-time programmable memory device and semiconductor memory device...
- Patent number 12,165,726
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Yeongmuk Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory control method, memory storage device and memory control cir...
- Patent number 12,147,674
- Issue date Nov 19, 2024
- Hefei Core Storage Electronic Limited
- Chih-Ling Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Early detection of programming failure for non-volatile memory
- Patent number 12,148,489
- Issue date Nov 19, 2024
- SANDISK TECHNOLOGIES LLC
- Yi Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Health scan for content addressable memory
- Patent number 12,142,334
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Tomoko Ogura Iwasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Repairable latch array
- Patent number 12,100,464
- Issue date Sep 24, 2024
- Advanced Micro Devices, Inc.
- Joel Thornton Irby
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory device, operating method thereof, controller fo...
- Patent number 12,094,552
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sehwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Fast search for leaky word line
- Patent number 12,094,550
- Issue date Sep 17, 2024
- SanDisk Technologies, Inc.
- Xingyan Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect detection during erase operations
- Patent number 12,094,549
- Issue date Sep 17, 2024
- Micron Technology, Inc.
- Jun Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
Skipping pages for weak wordlines of a memory device during pre-pro...
- Patent number 12,080,376
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Cheng Cheng Ang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic contact management systems and methods
- Patent number 12,079,819
- Issue date Sep 3, 2024
- LeadAssign Corporation
- Desmond Von Teichman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device and test method for the same
- Patent number 12,073,900
- Issue date Aug 27, 2024
- Renesas Electronics Corporation
- Haruyuki Okuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system
- Patent number 12,068,049
- Issue date Aug 20, 2024
- Kioxia Corporation
- Naomi Takeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Preserving blocks experiencing program failure in memory devices
- Patent number 12,068,052
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing data integrity checks to identify defective wordlines
- Patent number 12,062,394
- Issue date Aug 13, 2024
- Micron Technology, Inc.
- Jian Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory systems having memory devices therein with enhanced error co...
- Patent number 12,057,184
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND memory with different pass voltage ramp rates for binary and m...
- Patent number 12,046,314
- Issue date Jul 23, 2024
- SanDisk Technologies, Inc.
- Abu Naser Zainuddin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensionally stacked nonvolatile semiconductor memory
- Patent number RE50034
- Issue date Jul 9, 2024
- Kioxia Corporation
- Naoya Tokiwa
Information Patent Grant
Method, system and computer program product for memory repair
- Patent number 12,014,790
- Issue date Jun 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Katherine H. Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for detecting errors in a memory device
- Patent number 12,009,041
- Issue date Jun 11, 2024
- ARM Limited
- Siddharth Gupta
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and operation method of memory system
- Patent number 11,990,198
- Issue date May 21, 2024
- SK Hynix Inc.
- Chul Moon Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus of testing word line to detect fault after repair
- Patent number 11,984,176
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yulong Zhai
- G11 - INFORMATION STORAGE
Information Patent Grant
Cumulative wordline dispersion and deviation for read sense determi...
- Patent number 11,978,524
- Issue date May 7, 2024
- Western Digital Technologies, Inc.
- Jonas Goode
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repair circuit, memory, and repair method
- Patent number 11,972,828
- Issue date Apr 30, 2024
- Changxin Memory Technologies, Inc.
- Liang Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Stress test for grown bad blocks
- Patent number 11,967,388
- Issue date Apr 23, 2024
- Western Digital Technologies, Inc.
- Sarath Puthenthermadam
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing failure of memory, storage medium,...
- Patent number 11,967,392
- Issue date Apr 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chenggong Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Topology-based retirement in a memory system
- Patent number 11,942,174
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Chun S. Yeung
- G11 - INFORMATION STORAGE
Information Patent Grant
Linked XOR flash data protection scheme
- Patent number 11,935,609
- Issue date Mar 19, 2024
- Western Digital Technologies, Inc.
- Oleg Kragel
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
REDUCING PARTIAL BLOCK PROGRAMMING USING DYNAMIC TRIM SETTINGS
- Publication number 20240412803
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Qun Su
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECT DETECTION DURING ERASE OPERATIONS
- Publication number 20240404615
- Publication date Dec 5, 2024
- Micron Technology, Inc.
- Jun Xu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20240363186
- Publication date Oct 31, 2024
- KIOXIA Corporation
- Naomi TAKEDA
- G11 - INFORMATION STORAGE
Information Patent Application
PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES
- Publication number 20240363193
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Application
APPRATUS AND METHOD FOR CHANGING A READ VOLTAGE APPLIED FOR READING...
- Publication number 20240355405
- Publication date Oct 24, 2024
- SK HYNIX INC.
- Jae Yong SON
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES
- Publication number 20240347110
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Jian Huang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...
- Publication number 20240339168
- Publication date Oct 10, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR
- Publication number 20240331795
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. CHIANG
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE
- Publication number 20240321334
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Kosuke HATSUDA
- G11 - INFORMATION STORAGE
Information Patent Application
DATA INTEGRITY CHECK IN NON-VOLATILE STORAGE
- Publication number 20240312546
- Publication date Sep 19, 2024
- Western Digital Technologies, Inc.
- Sugandha Sharma
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE DETECTING DEFECT OF WORD LINE PATH AND OPERATING METH...
- Publication number 20240296898
- Publication date Sep 5, 2024
- Samsung Electronics Co., Ltd.
- Taehong KWON
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH FASTER POST-ERASE DEFECT TESTING
- Publication number 20240290412
- Publication date Aug 29, 2024
- SANDISK TECHNOLOGIES LLC
- Sai Gautham Thoppa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE FOR DETECTING DEFECT IN WORD LINE DRIVER
- Publication number 20240290415
- Publication date Aug 29, 2024
- SK HYNIX INC.
- Byeong Cheol LEE
- G11 - INFORMATION STORAGE
Information Patent Application
TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM
- Publication number 20240290411
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Chun S. Yeung
- G11 - INFORMATION STORAGE
Information Patent Application
Data Storage Device and Method for Runtime Exclusive-Or Zoning Duri...
- Publication number 20240274213
- Publication date Aug 15, 2024
- Western Digital Technologies, Inc.
- Pawan Negi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM
- Publication number 20240257894
- Publication date Aug 1, 2024
- SK HYNIX INC.
- Chul Moon JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM
- Publication number 20240257895
- Publication date Aug 1, 2024
- SK HYNIX INC.
- Chul Moon JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC WORD LINE ALLOCATION IN MEMORY SYSTEMS
- Publication number 20240249789
- Publication date Jul 25, 2024
- Micron Technology, Inc.
- Tarun Singh Yadav
- G11 - INFORMATION STORAGE
Information Patent Application
WORDLINE DEFECT DETECTION CIRCUIT, WORDLINE DEFECT DETECTION METHOD...
- Publication number 20240233850
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Jayang YOON
- G11 - INFORMATION STORAGE
Information Patent Application
VALLEY SEARCH SCAN BIT LINE SELECTION METHOD TO ADDRESS MEMORY HOLE...
- Publication number 20240194283
- Publication date Jun 13, 2024
- Western Digital Technologies, Inc.
- Chin-Yi Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME
- Publication number 20240194234
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Han Lin
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE LOGIC DEVICE WITH DESIGN FOR TEST FUNCTIONALITY
- Publication number 20240170087
- Publication date May 23, 2024
- QuickLogic Corporation
- Ket Chong Yap
- G11 - INFORMATION STORAGE
Information Patent Application
EARLY PROGRAM TERMINATION WITH ADAPTIVE TEMPERATURE COMPENSATION
- Publication number 20240168661
- Publication date May 23, 2024
- SANDISK TECHNOLOGIES LLC
- Sarath Puthenthermadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED...
- Publication number 20240161850
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- Byeongho Kim
- G11 - INFORMATION STORAGE
Information Patent Application
WORD LINE LAYER DEPENDENT STRESS AND SCREEN VOLTAGE
- Publication number 20240161849
- Publication date May 16, 2024
- Western Digital Technologies, Inc.
- Yidan Liu
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATE...
- Publication number 20240159818
- Publication date May 16, 2024
- SK HYNIX INC.
- Nam Cheol JEON
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
- Publication number 20240120014
- Publication date Apr 11, 2024
- SK HYNIX INC.
- Suk Hwan CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY
- Publication number 20240079080
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES FOR CONTROLLING REFRESH OPERATIONS CONSIDERIN...
- Publication number 20240079078
- Publication date Mar 7, 2024
- SK HYNIX INC.
- Sang Hyun KU
- G11 - INFORMATION STORAGE
Information Patent Application
NAND MEMORY WITH DIFFERENT PASS VOLTAGE RAMP RATES FOR BINARY AND M...
- Publication number 20240071544
- Publication date Feb 29, 2024
- SANDISK TECHNOLOGIES LLC
- Abu Naser Zainuddin
- G11 - INFORMATION STORAGE

Word line control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Built-in self test circuit for segmented static random access memor...

Memory test circuit, memory array, and testing method of memory array

Memory system and method

One-time programmable memory device and semiconductor memory device...

Memory control method, memory storage device and memory control cir...

Early detection of programming failure for non-volatile memory

Health scan for content addressable memory

Repairable latch array

Non-volatile memory device, operating method thereof, controller fo...

Fast search for leaky word line

Defect detection during erase operations

Skipping pages for weak wordlines of a memory device during pre-pro...

Dynamic contact management systems and methods

Semiconductor memory device and test method for the same

Memory system

Preserving blocks experiencing program failure in memory devices

Performing data integrity checks to identify defective wordlines

Memory systems having memory devices therein with enhanced error co...

NAND memory with different pass voltage ramp rates for binary and m...

Three-dimensionally stacked nonvolatile semiconductor memory

Method, system and computer program product for memory repair

Apparatus and method for detecting errors in a memory device

Memory system and operation method of memory system

Method and apparatus of testing word line to detect fault after repair

Cumulative wordline dispersion and deviation for read sense determi...

Repair circuit, memory, and repair method

Stress test for grown bad blocks

Method and apparatus for testing failure of memory, storage medium,...

Topology-based retirement in a memory system

Linked XOR flash data protection scheme

Patents Applicationslast 30 patents

REDUCING PARTIAL BLOCK PROGRAMMING USING DYNAMIC TRIM SETTINGS

DEFECT DETECTION DURING ERASE OPERATIONS

MEMORY SYSTEM

PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES

APPRATUS AND METHOD FOR CHANGING A READ VOLTAGE APPLIED FOR READING...

PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES

MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR

STORAGE DEVICE AND DRIVING METHOD OF STORAGE DEVICE

DATA INTEGRITY CHECK IN NON-VOLATILE STORAGE

MEMORY DEVICE DETECTING DEFECT OF WORD LINE PATH AND OPERATING METH...

NON-VOLATILE MEMORY WITH FASTER POST-ERASE DEFECT TESTING

SEMICONDUCTOR DEVICE FOR DETECTING DEFECT IN WORD LINE DRIVER

TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM

Data Storage Device and Method for Runtime Exclusive-Or Zoning Duri...

MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM

MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM

DYNAMIC WORD LINE ALLOCATION IN MEMORY SYSTEMS

WORDLINE DEFECT DETECTION CIRCUIT, WORDLINE DEFECT DETECTION METHOD...

VALLEY SEARCH SCAN BIT LINE SELECTION METHOD TO ADDRESS MEMORY HOLE...

MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME

PROGRAMMABLE LOGIC DEVICE WITH DESIGN FOR TEST FUNCTIONALITY

EARLY PROGRAM TERMINATION WITH ADAPTIVE TEMPERATURE COMPENSATION

MEMORY DEVICES AND ELECTRONIC DEVICES OUTPUTING EVENT DATA RELATED...

WORD LINE LAYER DEPENDENT STRESS AND SCREEN VOLTAGE

APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATE...

TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

MEMORY TEST CIRCUIT, MEMORY ARRAY, AND TESTING METHOD OF MEMORY ARRAY

SEMICONDUCTOR DEVICES FOR CONTROLLING REFRESH OPERATIONS CONSIDERIN...

NAND MEMORY WITH DIFFERENT PASS VOLTAGE RAMP RATES FOR BINARY AND M...