The subject disclosure relates to cryogenic environments, and more specifically, to techniques of facilitating efficient thermal profile management within cryogenic environments.
A cryostat can maintain samples or devices positioned on a sample mounting surface located within the cryostat at temperatures approaching absolute zero to facilitate evaluating such samples or devices under cryogenic conditions. Cryostats generally provide such low temperatures utilizing five thermal stages that are mechanically coupled to a room temperature plate of an outer vacuum chamber that encloses the five thermal stages. The five thermal stages of a cryostat comprise a thermal profile in which each subsequent thermal stage has a progressively lower temperature than exists at a preceding thermal stage.
In addition to having progressively lower temperatures, each subsequent thermal stage generally has progressively lower cooling power available than is available at a preceding thermal stage. For example, while a 50 kelvin (50-K) stage can have 30 watts (W) of available cooling power at a temperature of 50 K, a 4 kelvin (4-K) stage may have 1.5 W of available cooling power at a temperature of 4 K, and a mixing chamber stage generally associated with a lowest temperature within a cryostat may have 20 microwatts (u W) of available cooling power at a temperature of 20 millikelvin (mK). As such, efficiently managing available cooling power can become increasingly important at lower temperature regions within a thermal profile of a cryostat.
The following presents a summary to provide a basic understanding of one or more embodiments of the invention. This summary is not intended to identify key or critical elements, or delineate any scope of the particular embodiments or any scope of the claims. Its sole purpose is to present concepts in a simplified form as a prelude to the more detailed description that is presented later. In one or more embodiments described herein, systems, devices, and/or methods that facilitate efficient thermal profile management within cryogenic environments are described.
According to an embodiment, a cryostat can comprise a plurality of thermal stages intervening between a 4-Kelvin (K) stage and a cold plate stage. The plurality of thermal stages can include a still stage and an intermediate thermal stage that provides additional cooling capacity for the cryostat. The intermediate thermal stage can be directly coupled mechanically to the still stage via a support rod. One aspect of such a cryostat is that the cryostat can facilitate efficient thermal profile management within cryogenic environments.
In an embodiment, the intermediate thermal stage can operate at a temperature of about 1 kelvin (K). One aspect of such a cryostat is that the cryostat can facilitate increasing the cooling power of the still stage, the cold plate stage, and/or the mixing chamber stage by exposing those stages to 1 K blackbody radiation instead of 4 K blackbody radiation.
According to another embodiment, a cryostat can comprise a still stage directly coupled mechanically to an intermediate thermal stage via a support rod. The intermediate thermal stage can provide additional cooling capacity for the cryostat. The still stage and the intermediate thermal stage can be included among a plurality of thermal stages intervening between a 4-K stage and a cold plate stage. One aspect of such a cryostat is that the cryostat can facilitate efficient thermal profile management within cryogenic environments.
In an embodiment, the intermediate thermal stage can operate at a temperature of about 300 millikelvin (mK). One aspect of such a cryostat is that the cryostat can facilitate increasing the cooling power of the cold plate stage and/or the mixing chamber stage by exposing those stages to 300 mK blackbody radiation instead of 700 mK blackbody radiation.
According to another embodiment, a cryostat can comprise a sealed pot that facilitates evaporative cooling of a helium medium. The sealed pot can be coupled to an intermediate thermal stage that provides additional cooling capacity for the cryostat. The intermediate thermal stage can be directly coupled mechanically to a still stage via a support rod. The still stage and the intermediate thermal stage can be included among a plurality of thermal stages intervening between a 4-K stage and a cold plate stage. One aspect of such a cryostat is that the cryostat can facilitate efficient thermal profile management within cryogenic environments.
In an embodiment, the sealed pot can comprise sintered material. One aspect of such a cryostat is that the cryostat can facilitate thermal budget optimization.
The following detailed description is merely illustrative and is not intended to limit embodiments and/or application or uses of embodiments. Furthermore, there is no intention to be bound by any expressed or implied information presented in the preceding Background or Summary sections, or in the Detailed Description section.
One or more embodiments are now described with reference to the drawings, wherein like referenced numerals are used to refer to like elements throughout. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a more thorough understanding of the one or more embodiments. It is evident, however, in various cases, that the one or more embodiments can be practiced without these specific details.
By way of example, superconducting qubits can be positioned on a sample mounting surface 260 of cryostat 200. Coupling the superconducting qubits positioned on sample mounting surface 260 to one or more devices external to cryostat 200 are four I/O lines: a drive line 271; a flux line 273; a pump line 275; and an output (or readout) line 277. One skilled in the art will appreciate that these four I/O lines can contribute to a heat load placed on cryostat 200 in a number ways. One way that the four I/O lines can contribute to the heat load is that each I/O line can provide a thermal path along which heat can be conducted from higher temperature thermal stages to lower temperature thermal stages. For example, in
Another way that the four I/O lines can contribute to the heat load relates to heat (e.g., Joule heating) generated due to dissipation of signals propagating along a given I/O line or via an intervening electrical component. For example, a microwave flux signal propagating along flux line 273 towards a SQUID loop associated with the superconducting qubits positioned on sample mounting surface 260 can introduce heat on a still stage 230 of cryostat 200 via a thermal coupling 274. As another example, a microwave pump signal propagating along flux line 273 for operation of a traveling wave parametric amplifier (TWPA) 283 can introduce heat on a Cold stage 240 via an attenuator 285 coupled to flux line 273 and Cold stage 240.
Another way that the four I/O lines can contribute to the heat load involves a radiative load that higher temperature thermal stages represent to lower temperature thermal stages. For example, direct current (DC) signals biasing a high electron mobility transistor (HEMT) amplifier 285 to facilitate measurement of the superconducting qubits positioned on sample mounting surface 260 via output line 277 can introduce heat on the 4-K stage 220. Such heat introduced on the 4-K stage 220 can expose lower temperature thermal stages (e.g., still stage 230) a radiative load that the 4-K stage 220 represents to the lower temperature thermal stages as 4 K blackbody radiation.
As discussed above, each subsequent thermal stage of a cryostat generally has progressively lower cooling power available than is available at a preceding thermal stage. Therefore, efficiently managing available cooling power can become increasingly important at lower temperature regions within a thermal profile of a cryostat. Embodiments described herein facilitating efficient thermal profile management within cryogenic environments by implementing intermediate thermal stages that can provide additional cooling capacity. For example, in accordance with various embodiments, additional cooling capacity provided by an intermediate thermal stage can improve thermal profile management efficiency by reducing heat that can be conducted from higher temperature thermal stages to lower temperature thermal stages via I/O lines. As another example, in accordance with various embodiments, intermediate thermal stages can improve thermal profile management efficiency by exposing lower temperature thermal stages to radiative load having lower-level blackbody radiation.
Intermediate thermal stage 330 can comprise a feedthrough element 334 that intervenes in a wiring structure 390 that facilitates propagation of electrical signals between 4-K stage 320 and cold plate stage 350. Wiring structure 390 can comprise an I/O line coupling a sample positioned within cryostat 300 and one or more devices external to cryostat 300. For example, wiring structure 390 can comprise an I/O line such as drive line 271, flux line 273, pump line 275, and/or output (or readout) line 277 of
Intermediate thermal stage 330 can provide additional cooling capacity for cryostat 300 via a sealed pot 370 coupled to intermediate thermal stage 330. To that end, sealed pot 370 facilitates evaporative cooling of a helium medium—helium-4. A condenser line 372 can couple an outlet port 382 of a pump 380 to sealed pot 370 via 4-K stage 320. In an embodiment, pump 380 can be a vacuum pump for circulating a helium medium through sealed pot 370. In an embodiment, pump 380 is located external to cryostat 300. In an embodiment, pump 380 is located within cryostat 300. In this embodiment, pump 380 can be implemented as a sorb pump. Condenser line 372 can provide a return path for the helium medium to sealed pot 370. A pumping line 374 can couple an inlet port 384 of pump 380 to sealed pot 370 via 4-K stage 320. 4-K stage 320 can provide passage for condenser line 372 and/or pumping line 374 via a feedthrough element, such as feedthrough element 323.
In operation, helium-4 can flow from outlet port 382 towards sealed pot 370 in a gaseous state. Feedthrough element 323 can thermally anchor condenser line 372 to 4-K stage 320. As the helium-4 flows past feedthrough element 323, the helium-4 can transition from the gaseous state to a liquid state. Helium-4 in the liquid state can collect in sealed pot 370. Inlet port 384 of pump 380 can reduce a pressure above the liquified helium-4 collected in sealed pot 370. Helium-4 in the gaseous state can form above the liquified helium-4 collected in sealed pot 370 through evaporation and flow to inlet port 384 of pump 380 via pumping line 374. Heat carried by the helium-4 in the gaseous state flowing through pumping line 374 can reduce a temperature of the liquified helium-4 remaining in sealed pot 370. Such evaporative cooling of the liquified helium-4 in sealed pot 370 can reduce a temperature of intermediate thermal stage 330 such that intermediate thermal stage 330 can operate at a temperature of about 1 K. In an embodiment, sealed pot 370 can be vacuum sealed or cryogenically sealed. In an embodiment, sealed pot 370 can comprise sintered material that facilitates thermal budget optimization. The sintered material can comprise silver, gold, copper, platinum, and the like.
Intermediate thermal stage 440 can comprise a feedthrough element 444 that intervenes in a wiring structure 490 that facilitates propagation of electrical signals between 4-K stage 420 and cold plate stage 450. Still stage 430 can also comprise a feedthrough element 434 that intervenes in wiring structure 490. Wiring structure 490 can comprise an I/O line coupling a sample positioned within cryostat 400 and one or more devices external to cryostat 400. For example, wiring structure 490 can comprise an I/O line such as drive line 271, flux line 273, pump line 275, and/or output (or readout) line 277 of
Intermediate thermal stage 440 can provide additional cooling capacity for cryostat 400 via a sealed pot 470 coupled to intermediate thermal stage 440. To that end, sealed pot 470 facilitates evaporative cooling of a helium medium—helium-3. A condenser line 472 can couple an outlet port 482 of a pump 480 to sealed pot 470 via 4-K stage 420. In an embodiment, pump 480 is located external to cryostat 400. In an embodiment, pump 480 can be a vacuum pump for circulating a helium medium through sealed pot 470. In an embodiment, pump 480 is located within cryostat 400. In this embodiment, pump 480 can be implemented as a sorb pump. Condenser line 472 can provide a return path for the helium medium to sealed pot 470. A pumping line 474 can couple an inlet port 484 of pump 480 to sealed pot 470 via 4-K stage 420. 4-K stage 420 can provide passage for condenser line 472 and/or pumping line 474 via a feedthrough element, such as feedthrough element 423. Still stage 430 can provide passage for condenser line 472 and/or pumping line 474 via a feedthrough element, such as feedthrough element 433.
In operation, helium-3 can flow from outlet port 482 towards sealed pot 470 in a gaseous state. Feedthrough elements 423 and/or 433 can thermally anchor condenser line 472 to 4-K stage 420 and/or still stage 430, respectively. As the helium-3 flows past feedthrough elements 423 and/or 433, the helium-3 can transition from the gaseous state to a liquid state. Helium-3 in the liquid state can collect in sealed pot 470. Inlet port 484 of pump 480 can reduce a pressure above the liquified helium-3 collected in sealed pot 470. Helium-3 in the gaseous state can form above the liquified helium-3 collected in sealed pot 470 through evaporation and flow to inlet port 484 of pump 480 via pumping line 474. Heat carried by the helium-3 in the gaseous state flowing through pumping line 474 can reduce a temperature of the liquified helium-3 remaining in sealed pot 470. Such evaporative cooling of the liquified helium-3 in sealed pot 470 can reduce a temperature of intermediate thermal stage 440 such that intermediate thermal stage 440 can operate at a temperature of about 300 mK. In an embodiment, sealed pot 470 can be vacuum sealed or cryogenically sealed. In an embodiment, sealed pot 470 can comprise sintered material that facilitates thermal budget optimization. The sintered material can comprise silver, gold, copper, platinum, and the like.
Intermediate thermal stage 515 is directly coupled mechanically to 4-K stage 510 via support rod 512 and still stage 520 via support rod 516. Intermediate thermal stage 515 is indirectly coupled mechanically to 50-K stage 505 via support rod 506, intermediate thermal stage 525 via support rod 522, cold plate stage 530 via support rod 526, and mixing chamber stage 535 via support rod 532. Intermediate thermal stage 525 is directly coupled mechanically to still stage 520 via support rod 522 and cold plate stage 530 via support rod 526. Intermediate thermal stage 525 is indirectly coupled mechanically to 50-K stage 505 via support rod 506, 4-K stage 510 via support rod 512, intermediate thermal stage 515 via support rod 516, and mixing chamber stage 535 via support rod 532. Intermediate thermal stages 515 and 525 are directly coupled mechanically to opposing sides of still stage 520 via support rods 516 and 522, respectively. Surfaces 519 and/or 529 of intermediate thermal stages 515 and 525, respectively, can be implemented in various shapes. For example, surfaces 519 and/or 529 can be implemented as a circle, a quadrant, a triangle, a quadrilateral, and the like. As another example, surfaces 519 and/or 529 can be implemented as an amorphous shape.
Intermediate thermal stages 515 and 525 can comprise feedthrough elements 518 and 528, respectively, that intervene in a wiring structure 580 that facilitates propagation of electrical signals between 4-K stage 510 and cold plate stage 530. Still stage 520 can also comprise a feedthrough element 524 that intervenes in wiring structure 580. Wiring structure 580 can comprise an I/O line coupling a sample positioned within cryostat 500 and one or more devices external to cryostat 500. For example, wiring structure 580 can comprise an I/O line such as drive line 271, flux line 273, pump line 275, and/or output (or readout) line 277 of
Intermediate thermal stage 515 can provide additional cooling capacity for cryostat 500 via a sealed pot 540 coupled to intermediate thermal stage 515. To that end, sealed pot 540 facilitates evaporative cooling of a helium medium—helium-4. A condenser line 542 can couple an outlet port 552 of a pump 550 to sealed pot 540 via 4-K stage 510. Condenser line 542 can provide a return path for that helium medium to sealed pot 540. A pumping line 544 can couple an inlet port 554 of pump 540 to sealed pot 540 via 4-K stage 510. 4-K stage 510 can provide passage for condenser line 542 and/or pumping line 544 via a feedthrough element, such as feedthrough element 513.
In operation, helium-4 can flow from outlet port 552 towards sealed pot 540 in a gaseous state. Feedthrough element 513 can thermally anchor condenser line 542 to 4-K stage 510. As the helium-4 flows past feedthrough element 513, the helium-4 can transition from the gaseous state to a liquid state. Helium-4 in the liquid state can collect in sealed pot 540. Inlet port 554 of pump 550 can reduce a pressure above the liquified helium-4 collected in sealed pot 540. Helium-4 in the gaseous state can form above the liquified helium-4 collected in sealed pot 540 through evaporation and flow to inlet port 554 of pump 550 via pumping line 554. Heat carried by the helium-4 in the gaseous state flowing through pumping line 554 can reduce a temperature of the liquified helium-4 remaining in sealed pot 540. Such evaporative cooling of the liquified helium-4 in sealed pot 540 can reduce a temperature of intermediate thermal stage 515 such that intermediate thermal stage 515 can operate at a temperature of about 1 K.
Intermediate thermal stage 525 can provide additional cooling capacity for cryostat 500 via a sealed pot 560 coupled to intermediate thermal stage 525. To that end, sealed pot 560 facilitates evaporative cooling of a helium medium—helium-3. A condenser line 562 can couple an outlet port 572 of a pump 570 to sealed pot 560 via 4-K stage 510. In an embodiment, pumps 550 and/or 570 can be a vacuum pump for circulating a corresponding helium medium through sealed pots 540 and/or 560, respectively. In an embodiment, pumps 570 and/or 550 can be located external to cryostat 500. In an embodiment, pumps 570 and/or 550 can be located within cryostat 500. In this embodiment, pumps 570 and/or 550 can be implemented as a sorb pump. Condenser line 562 can provide a return path for that helium medium to sealed pot 560. A pumping line 564 can couple an inlet port 574 of pump 570 to sealed pot 560 via 4-K stage 510. 4-K stage 510 can provide passage for condenser line 562 and/or pumping line 564 via a feedthrough element, such as feedthrough element 514. Intermediate thermal stage 515 can provide passage for condenser line 562 and/or pumping line 564 via a feedthrough element, such as feedthrough element 517. Still stage 520 can provide passage for condenser line 562 and/or pumping line 564 via a feedthrough element, such as feedthrough element 523.
In operation, helium-3 can flow from outlet port 572 towards sealed pot 560 in a gaseous state. Feedthrough elements 514, 517, and/or 523 can thermally anchor condenser line 562 to 4-K stage 510, intermediate thermal stage 515, and/or Still stage 520, respectively. As the helium-3 flows past feedthrough elements 515, 517, and/or 523, the helium-3 can transition from the gaseous state to a liquid state. Helium-3 in the liquid state can collect in sealed pot 560. Inlet port 574 of pump 570 can reduce a pressure above the liquified helium-3 collected in sealed pot 560. Helium-3 in the gaseous state can form above the liquified helium-3 collected in sealed pot 560 through evaporation and flow to inlet port 574 of pump 570 via pumping line 564. Heat carried by the helium-3 in the gaseous state flowing through pumping line 564 can reduce a temperature of the liquified helium-3 remaining in sealed pot 560. Such evaporative cooling of the liquified helium-3 in sealed pot 560 can reduce a temperature of intermediate thermal stage 525 such that intermediate thermal stage 525 can operate at a temperature of about 300 mK. In an embodiment, sealed pots 540 and/or 560 can be vacuum sealed or cryogenically sealed. In an embodiment, sealed pots 540 and/or 560 can comprise sintered material that facilitates thermal budget optimization. The sintered material can comprise silver, gold, copper, platinum, and the like.
Embodiments of the present invention may be a system, a method, and/or an apparatus at any possible technical detail level of integration. What has been described above includes mere examples of systems, methods, and apparatus. It is, of course, not possible to describe every conceivable combination of components or computer-implemented methods for purposes of describing this disclosure, but one of ordinary skill in the art can recognize that many further combinations and permutations of this disclosure are possible. Furthermore, to the extent that the terms “includes,” “has,” “possesses,” and the like are used in the detailed description, claims, appendices and drawings such terms are intended to be inclusive in a manner similar to the term “comprising” as “comprising” is interpreted when employed as a transitional word in a claim.
In addition, the term “or” is intended to mean an inclusive “or” rather than an exclusive “or.” That is, unless specified otherwise, or clear from context, “X employs A or B” is intended to mean any of the natural inclusive permutations. That is, if X employs A; X employs B; or X employs both A and B, then “X employs A or B” is satisfied under any of the foregoing instances. Moreover, articles “a” and “an” as used in the subject specification and annexed drawings should generally be construed to mean “one or more” unless specified otherwise or clear from context to be directed to a singular form. As used herein, the terms “example” and/or “exemplary” are utilized to mean serving as an example, instance, or illustration. For the avoidance of doubt, the subject matter disclosed herein is not limited by such examples. In addition, any aspect or design described herein as an “example” and/or “exemplary” is not necessarily to be construed as preferred or advantageous over other aspects or designs, nor is it meant to preclude equivalent exemplary structures and techniques known to those of ordinary skill in the art.
The descriptions of the various embodiments have been presented for purposes of illustration, but are not intended to be exhaustive or limited to the embodiments disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein was chosen to best explain the principles of the embodiments, the practical application or technical improvement over technologies found in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
While certain example embodiments have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope the disclosures herein. Thus, nothing in the foregoing description is intended to imply that any particular feature, characteristic, step, module, or block is necessary or indispensable. Indeed, the novel methods and systems described herein may be embodied in a variety of other forms; furthermore, various omissions, substitutions and changes in the form of the methods and systems described herein may be made without departing from the spirit of the disclosures herein. The accompanying claims and their equivalents are intended to cover such forms or modifications as would fall within the scope and spirit of certain of the disclosures herein.
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