This application claims priority from Korean Patent Application No. 10-2011-0109431, filed on Oct. 25, 2011, in the Korean Intellectual Property Office, the disclosures of which are incorporated herein in their entirety by reference.
1. Field
The present disclosure relates to 3-dimensional (3D) image acquisition apparatuses and methods of calculating depth information in the 3D image acquisition apparatuses.
2. Description of the Related Art
Recently, the importance of 3-dimensional (3D) content is increasing with the development and the increase in demand of 3D display devices for displaying images having depth perception. Accordingly, there is research being conducted into 3D image acquisition apparatuses, such as a 3D camera by which a user personally creates 3D content. Such a 3D camera acquires depth information in addition to existing 2D color image information in one capture.
Depth information regarding distances between surfaces of a subject and a 3D camera may be acquired using a stereo vision method using two cameras or a triangulation method using structured light and a camera. However, since the accuracy of depth information in these methods rapidly decreases as a distance to a subject increases and these methods depend on a surface state of the subject, it is difficult to acquire accurate depth information.
To improve this problem, a Time-of-Flight (TOF) method has been introduced. The TOF method is a method of measuring a light beam's flight time until the light reflected from a subject is received by a light-receiving unit after an illumination light is projected to the subject. According to the TOF method, light of a predetermined wavelength (e.g., Near Infrared (NIR) light of 850 nm) is irradiated to a subject by using an illumination optical system including a Light-Emitting Diode (LED) or a Laser Diode (LD). A light having the same wavelength is reflected from the subject and is received by a light-receiving unit. Thereafter, a series of processing processes for calculating depth information are performed. Various TOF technologies are introduced according to the series of processing processes.
In the TOF method described above, depth information is calculated by assuming an ideal environment without noise. However, when a 3D camera is used, ambient light, such as illumination in an indoor environment and sunlight in an outdoor environment, always exists in the surroundings. The ambient light is incident to the 3D camera and becomes noise in a process of calculating depth information.
Accordingly, it is necessary to reduce ambient light causing noise in the process of calculating depth information.
Provided are a method of calculating depth information by reducing captured ambient light and a 3D image acquisition apparatus therefor.
Additional aspects will be set forth in part in the description which follows and, in part, will be apparent from the description, or may be learned by practice of the exemplary embodiments.
According to an aspect of an exemplary embodiment, a 3-dimensional (3D) image acquisition apparatus includes: an optical modulator for modulating light reflected from a subject by sequentially projected N (N is 3 or a larger natural number) light beams; an image sensor for generating N sub-images by capturing the light modulated by the optical modulator; and a signal processor for calculating depth information regarding a distance to the subject by using the N sub-images.
The N light beams may be discontinuously projected.
The N projected light beams may be different from each other and be emitted by one or more light sources.
The one or more light sources may sequentially project the N light beams with a predetermined time interval.
An operating time of the optical modulator may be synchronized with a projecting time of each of the N light beams.
The operating time of the optical modulator may be shorter than the projecting time.
An exposure time of the image sensor may be synchronized with the operating time of the optical modulator.
The image sensor may be exposed during the light-projecting time to capture the modulated light and may form the N sub-images during at least a portion of a remaining time of the light-projecting time.
All pixels of the image sensor may be exposed to the modulated light during the light-projecting time.
The N light beams may be periodic waves having the same period and at least one selected from the group consisting of a different intensity and a different phase.
The optical modulator may modulate the reflected light with the same modulation signal.
The N light beams may be the same periodic waves.
The optical modulator may modulate the reflected light with different modulation signals.
A phase difference between any two light beams projected at adjacent times from among the N light beams may be a value obtained by equally dividing 360° by N.
The reflected light may include N reflection light beams obtained by reflecting the N light beams from the subject.
The N sub-images generated by the image sensor may sequentially one-to-one match the N reflection light beams.
If the N sub-images do not one-to-one match the N reflection light beams, the signal processor may convert the N sub-images on a line by line basis and sequentially one-to-one match the N line-based sub-images with the N reflection light beams.
The signal processor may generate a first average image by averaging the N sub-images multiplied by first weighting factors, generate a second average image by averaging the N sub-images multiplied by second weighting factors, and calculate the depth information from the first average image and the second average image.
The depth information may be calculated from an arctangent value of a ratio of the first average image to the second average image.
According to another aspect of an exemplary embodiment, a method of calculating depth information includes: modulating light reflected from a subject by sequentially projecting N (N is 3 or a larger natural number) light beams; generating N sub-images by capturing the light modulated by the optical modulator; and calculating depth information regarding a distance to the subject by using the N sub-images.
The N light beams may be discontinuously projected.
The N projected light beams may be different from each other and be emitted by one or more light sources.
The N light beams may be sequentially projected with a predetermined time interval.
An operating time of an optical modulator for modulating the light may be synchronized with a projecting time of each of the N light beams.
The operating time of the optical modulator may be shorter than the projecting time.
An exposure time of an image sensor for capturing the light may be synchronized with the operating time of the optical modulator.
All pixels of the image sensor may be exposed to the modulated light during the light-projecting time.
The N light beams may be periodic waves having the same period and at least one selected from the group consisting of a different intensity and a different phase, and the reflected light may be modulated with the same modulation signal.
The N light beams may be the same periodic waves, and the reflected light may be modulated with different modulation signals.
A phase difference between any two light beams projected at adjacent times from among the N light beams may be a value obtained by equally dividing 360° by N.
The generated N sub-images may sequentially one-to-one match the N reflection light beams.
The method may further include, if the N sub-images do not one-to-one match the N reflection light beams, converting the N sub-images on a line by line basis and sequentially one-to-one matching the N line-based sub-images with the N reflection light beams.
A first average image may be generated by averaging the N sub-images multiplied by first weighting factors, a second average image may be generated by averaging the N sub-images multiplied by second weighting factors, and the depth information may be calculated from the first average image and the second average image.
The depth information may be calculated from an arctangent value of a ratio of the first average image to the second average image.
These and/or other aspects will become apparent and more readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings in which:
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. In the drawings, the widths and thicknesses of layers and regions are exaggerated for the clarity of the specification. In the description, like reference numerals refer to like elements throughout. Expressions such as “at least one of,” when preceding a list of elements, modify the entire list of elements and do not modify the individual elements of the list.
In addition, the 3D image acquisition apparatus 100 may further include, in front of a light-incident face of the optical modulator 103, a filter 108 for transmitting only light having a predetermined wavelength from among the light reflected from the subject 200 and a first lens 109 for concentrating the reflected light within an area of the optical modulator 103, and a second lens 110 for concentrating the modulated light within an area of the image pickup device 105 between the optical modulator 103 and the image pickup device 105.
The light source 101 may be for example a Light-Emitting Diode (LED) or a Laser Diode (LD) capable of emitting light having a Near Infrared (NIR) wavelength of about 850 nm that is invisible to human eyes for safety. However, the light source 101 is not limited to a wavelength band or type.
Light projected from the light source 101 to the subject 200 may have a form of a periodic continuous function having a predetermined period. For example, the projected light may have a specifically defined waveform such as a sine wave, a ramp wave, or a square wave, or an undefined general waveform. In addition, the light source 101 may intensively project light to the subject 200 for only a predetermined time in a periodic manner under control of the controller 107. A time that light is projected to the subject 200 is called a light-projecting time.
The optical modulator 103 modulates light reflected from the subject 200 under control of the controller 107. For example, the optical modulator 103 may modulate the intensity of the reflected light by changing a gain in response to an optical modulation signal having a predetermined wavelength. To do this, the optical modulator 103 may have a variable gain.
The optical modulator 103 may operate at a high modulation frequency of tens to hundreds of MHz to identify a phase difference or a traveling time of light according to a distance. The optical modulator 103 satisfying this condition may be at least one of a sub-image intensifier including a Multi-Channel Plate (MCP), a solid optical modulator of the GaAs series, or a thin-type optical modulator using an electro-optic material. Although the optical modulator 103 is a transmission-type optical modulator in
Like the light source 101, the optical modulator 103 may also operate for a predetermined time to modulate the light reflected from the subject 200. A time that the optical modulator 103 operates to modulate light is called an operating time of the optical modulator 103. The light-projecting time of the light source 101 may be synchronized with the operating time of the optical modulator 103. Thus, the operating time of the optical modulator 103 may be the same as or shorter than the light-projecting time of the light source 101.
The image pickup device 105 generates a sub-image by detecting the reflected light modulated by the optical modulator 103 under control of the controller 107. If only a distance to any one point on the subject 200 is to be measured, the image pickup device 105 may use a single optical sensor such as, for example, a photodiode or an integrator. However, if distances to a plurality of points on the subject 200 are to be measured, the image pickup device 105 may have a plurality of photodiodes or a 2D or 1D array of other optical detectors. For example, the image pickup device 105 may include a Charge-Coupled Device (CCD) image sensor or a Complimentary Metal-Oxide Semiconductor (CMOS) image sensor. The image pickup device 105 may generate a single sub-image per reflected light beam.
The signal processor 106 calculates depth information based on a sub-image formed by the image pickup device 105 and generates a 3D image including the depth information. The signal processor 106 may be implemented by, for example, an exclusive Integrated Circuit (IC) or software installed in the 3D image acquisition apparatus 100. When the signal processor 106 is implemented by software, the signal processor 106 may be stored in a separate portable storage medium.
Hereinafter, an operation of the 3D image acquisition apparatus 100 having the above-described structure is described.
The light source 101 sequentially and intensively projects N different light beams having a predetermined period and waveform to the subject 200 under control of the controller 107, wherein N may be 3 or a larger natural number. The light source 101 may sequentially project the N different light beams continuously or within a predetermined time interval.
For example, when 4 different projection light beams are used, the light source 101 may generate and project a first projection light beam to the subject 200 for a time T1, a second projection light beam to the subject 200 for a time T2, a third projection light beam to the subject 200 for a time T3, and a fourth projection light beam to the subject 200 for a time T4. These first to fourth projection light beams sequentially projected to the subject 200 may have a form of a continuous function having a predetermined period, such as a sine wave. For example, the first to fourth projection light beams may be periodic waves having the same period and waveform and different intensities or phases.
When the N different light beams are projected, a phase difference between any two of the light beams projected at the same time may be 360°/N, and the period of each projected light beam may be shorter than the operating time of the light source 101. All of the N different light beams may be sequentially projected to the subject 200 within the operating time of the light source 101.
A light beam projected to the subject 200 is reflected on the surface of the subject 200 and incident to the first lens 109. In general, the subject 200 has a plurality of surfaces having different distances, i.e., depths, from the 3D image acquisition apparatus 100.
For example, 5 first reflection light beams having different phases are generated when a first projection light beam is reflected from the 5 surfaces P1 to P5 of the subject 200, and 5 second reflection light beams having different phases are generated when a second projection light beam is reflected from the 5 surfaces P1 to P5 of the subject 200. Likewise, 5×N reflection light beams having different phases are generated when an Nth projection light beam is reflected from the 5 surfaces P1 to P5 of the subject 200. A reflection light beam reflected from the surface P1 that is farthest from the 3D image acquisition apparatus 100 may arrive at the first lens 109 with a phase delay of ΦP1, and a reflection light beam reflected from the surface P5 that is nearest from the 3D image acquisition apparatus 100 may arrive at the first lens 109 with a phase delay of ΦP5 that is less than ΦP1.
The first lens 109 focuses the reflection light within an area of the optical modulator 103. The filter 108 for transmitting only light having a predetermined wavelength may be disposed between the first lens 109 and the optical modulator 103 to remove ambient light, such as background light, except for the predetermined wavelength. For example, when the light source 101 emits light having an NIR wavelength of about 850 nm, the filter 108 may be an NIR band pass filter for transmitting an NIR wavelength band of about 850 nm. Thus, although light incident to the optical modulator 103 may be mostly light emitted from the light source 101 and reflected from the subject 200, ambient light is also included therein. Although
The optical modulator 103 modulates the reflection light into an optical modulation signal having a predetermined wavelength. For convenience of description, it is assumed that the 5 surfaces P1 to P5 of the subject 200 correspond to pixels divided in 5 areas of the image pickup device 105. A period of a gain wavelength of the optical modulator 103 may be the same as a period of a projection light wavelength. In
The intensity-modulated light output from the optical modulator 103 is multiplication-adjusted and refocused by the second lens 110 and arrives at the image pickup device 105. Thus, the modulated light is concentrated within the area of the image pickup device 105 by the second lens 110. The image pickup device 105 may generate sub-images by receiving the modulated light for a predetermined time through synchronization with the light source 101 and the optical modulator 103. A time that the image pickup device 105 is exposed to receive the modulated light is an exposure time of the image pickup device 105.
A method of generating N sub-images from N reflection light beams will now be described.
As shown in
The first to Nth sub-images may be sub-frame images for generating a single frame of an image. For example, assuming that a period of a single frame is Td, an exposure time of the image pickup device 105 to obtain each of the first to Nth sub-images may be about Td/N.
In
Hereinafter, a method of generating sub-images by using signal waveforms is described.
For convenience of description, an embodiment in which the light source 101 projects N different projection light beams to the subject 200 and the optical modulator 103 uses a single same optical modulation signal is described as an example. However, the theoretical description below may be equally applied to a case where one same projection light beam and N different optical modulation signals are used. In addition, since a method of calculating depth information is equally applied to each pixel even for a case where a sub-image formed by the image pickup device 105 is a 2D array sub-image, only a method applied to a single pixel is described. However, when depth information is calculated from a plurality of pixels in a 2D array sub-image at the same time, a computation amount may be reduced by omitting a portion to be repetitively processed by efficiently processing data management and memory allocation.
First, a waveform Pe of general projection light having a period Te may be expressed by Equations 1-1 and 1-2.
Here, s denotes an identifier for identifying first to Nth projection light beams that are different from each other. For example, when N projection light beams are used, s=1, 2, . . . , N. In addition, ω denotes an angular frequency of a waveform of each projection light beam, wherein ω=2π/Te. An angular frequency may be in the range of 10 MHz-30 MHz used when capturing depth images ranging from 0-15 m. In addition, a(s) denotes the intensity of a projection light beam (s), and θ(s) denotes a phase of the projection light beam (s). In addition,
A waveform Pr of reflection light that returns to the 3D image acquisition apparatus 100 with a phase difference ΦTOF after the projection light is reflected from the subject 200 may be expressed by Equations 2-1 to 2-3.
Here, r denotes a reflection degree of each surface of the subject 200, and denotes an ambient light component incident to the 3D image acquisition apparatus 100 regardless of the projection light.
In addition, a waveform G of the optical modulation signal of the optical modulator 103 may be expressed by Equations 3-1 and 3-2. In Equation 3, a coefficient ‘c’ denotes the amount or gain of the optical modulation signal and may be in range of 0-1, and is usually 0.5.
A waveform of light arriving at the image pickup device 105 after passing through the optical modulator 103 may be a result obtained by multiplying the reflection light expressed by Equation 2 by the optical modulation signal. Thus, an instantaneous waveform Iinst of the light arriving at the image pickup device 105 may be expressed by Equation 4.
Iinst(s)(t)=Pr(s)(t)<G(t) (4)
The image pickup device 105 may generate a sub-image by receiving incident light for a predetermined exposure time T. Thus, the sub-image generated by the image pickup device 105 is obtained by integrating the instantaneous waveform expressed by Equation 4 for the exposure time T. Here, the exposure time T may be the same as a period of a sub-frame. For example, when capturing is performed at a speed of 30 frames per second and each frame has N sub-frames, the exposure time T may be about 0.033/N seconds. Although a predetermined conversion ratio may exist between the intensity of the light arriving at the image pickup device 105 and a sub-image formed by the image pickup device 105 according to the sensitivity of the image pickup device 105, the predetermined conversion ratio may be simplified for convenience of description to define a sub-image I(s) of the image pickup device 105 by Equation 5.
As expressed by Equation 5, the formed sub-image I(s) includes an ambient light component. The ambient light, such as sunlight or illumination light, has a basic characteristic that it always exists with a uniform amount. On the contrary, the waveform of the projection light may be adjusted as desired. Accordingly, the light source 101 is synchronized with the optical modulator 103 so that the projection light is intensively projected for a predetermined time and the optical modulator 103 operates for the predetermined time to modulate reflected light. In addition, the optical modulator 103 may not operate for a time interval for which the projection light is not projected to maintain a minimum transmittance, thereby preventing the ambient light from being received. By doing this, the ambient light component of Equation 5 may be reduced. Here, a ratio of a projecting time of the projection light to a non-projecting time of the projection light is called a duty rate. When a duty rate is less than 100%, light is discontinuously projected.
In
The light source 101 of
As described above, to reduce an ambient light component, the light source 101 is supposed to project light at a duty rate less than 100%. In addition, the operating time of the optical modulator 103 is supposed to be synchronized with the light-projecting time of the light source 101 and simultaneously operate at a high modulation frequency of tens to hundreds of MHz. The optical modulator 103 satisfying this condition may be, for example, a sub-image intensifier including an MCP, a solid optical modulator of the GaAs series, or a thin-type optical modulator using an electro-optic material.
The image pickup device 105 may operate as a global shutter or a rolling shutter. The operating principle of a global shutter is that all pixels are exposed at the same time when a single sub-image is generated. Thus, there is no exposure time difference between the pixels. However, the operating principle of a rolling shutter is that each pixel is sequentially exposed when a single sub-image is generated. Thus, there is an exposure time difference between every two pixels.
An exposure time of the image pickup device 105 may also be synchronized with the light-projecting time of the light source 101 and the operating time of the optical modulator 103. When the image pickup device 105 operates as a global shutter, the controller 107 synchronizes the exposure time of the image pickup device 105 with the operating time of the optical modulator 103. Even when the image pickup device 105 operates as a rolling shutter, if an exposure time of all pixels of the image pickup device 105 is equal to or longer than the operating time of the optical modulator 103, the controller 107 may synchronize the exposure time of the image pickup device 105 with the operating time of the optical modulator 103.
As shown in
In
When a single operating time of the optical modulator 103 is shorter than the exposure time of all pixels in the image pickup device 105, not all pixels of the image pickup device 105 may be exposed during the single operating time of the optical modulator 103.
As shown in
To do this, the signal processor 106 may apply a conversion matrix as expressed by Equation 6 to line sub-images formed on a line by line basis by the image pickup device 105. In Equation 6, a 4×4 conversion matrix for converting 4 line sub-images I1′, I2′, I3′, and I4′corresponding to 4 reflection light beams is shown. Of course, an N×N conversion matrix may be applied to N line sub-images.
Here, k denotes a line of the image pickup device 105, and Aij denotes a conversion value previously defined and stored based on an exposure time of the image pickup device 105 and an image-forming time of a sub-image.
For example, a conversion expression of a first line in
A conversion expression of the last line, i.e., 1238th line, is expressed by Equation 8.
A sub-image I(s) converted by the conversion matrix may be applied to Equation 5.
After one-to-one matching N line sub-images with N phase differences, the signal processor 106 generates N sub-images by combining line-based line sub-images and then calculates depth information from the N sub-images.
The weighting factors A1 to AN and B1 to BN applied to this embodiment may be previously defined and stored based on the number N of sub-images. For example, weighting factors Ak and Bk may be expressed by Equation 9.
Ak=sum[a(i)cos θ(i)−a(j)cos θ(j);(i,j) is N−1C2(≠k) of {1:N}]
Bk=sum[a(i)sin θ(i)−a(j)sin θ(j);(i,j) is N−1C2(≠k) of {1:N}] (9)
In Equation 9, i and j denote any other numbers different from k from among natural numbers 1 to N (i≠k, j≠k), a(i) denotes the intensity of a projection light beam i, and a phase θ(i) denotes a phase difference of the projection light beam i.
The weighting factors Ak and Bk may be used to calculate depth information in an operation of the 3D image acquisition apparatus 100 by being digitized using the predefined intensity a(i) and phase θ(i) of the projection light beam i.
In the table of
When previously calculated weighting factors, as shown in
Although the table of
The use of weighting factors as described above may allow the signal processor 106 to calculate depth information from which irregular noise is removed even using a weighted-averaging method using only multiplication and addition instead of using a complex averaging algorithm.
The signal processor 106 may calculate depth information from an arctangent value (arctan=tan−1) of a ratio V/U of the first average image V to the second average image U. The depth information is calculated by Equation 10.
In Equation 10, C denotes the speed of light and Te denotes a period of a projection light waveform.
Although it has been described in
For example, a method of calculating depth information from first to Nth sub-images is the same as the method described with reference to
In addition, although a method of adding a new sub-image one-by-one and simultaneously removing an existing sub-image one-by-one has been described, a plurality of new sub-images may be added at the same time as the same number of existing sub-images are removed. For example, the total number of sub-images may be maintained as N by adding new sub-images less than N and removing the same number of old sub-images.
Alternatively, to calculate the first average image V and the second average image U, the signal processor 106 may calculate the first average image V and the second average image U by using recursive summation expressed by Equation 11.
VN+1=VN+ANI(N)
UN+1=UN+BNI(N) (11)
In this case, when an Nth sub-image is captured, the signal processor 106 updates a first average image VN and a second average image UN and removes a first average image VN−1 and a second average image UN−1 generated when an (N−1)th sub-image is captured. As described above, if a first average image and a second average image are generated in the recursive summation method, all of N sub-images do not have to be stored, so a memory space may be saved. This memory space may be significant as a sub-image including depth information has high resolution more than a million pixels.
In this embodiment, a method of generating sub-images in the image pickup device 105 in which pixels are arranged in a 2D array form has been described. However, this sub-image generating method may be applied regardless of whether pixels are arranged in a 1D array form or a single pixel exists.
In operation (S3), the image pickup device 105 generates N sub-images by sequentially capturing the N modulated reflection light beams. An exposure time of the image pickup device 150 may also be synchronized with the operating time of the optical modulator 103. The N generated sub-images are delivered to the signal processor 106.
The N sub-images generated by the image pickup device 150 may sequentially one-to-one match the N reflection light beams. However, when the N sub-images do not sequentially one-to-one match the N reflection light beams, the signal processor 106 may convert the N sub-images on a line by line basis to one-to-one match the N line-based sub-images with the N reflection light beams.
In operation (S4), the signal processor 106 reads predetermined previously calculated weighting factors Ak and Bk from the memory. As described above, the weighting factors Ak and Bk may be defined based on the number N of used projection light beams, intensities of the projection light beams, and phases of the projection light beams. Various weighting factors Ak and Bk are previously calculated and stored in the memory according to various sets of the number N of projection light beams, intensities of the projection light beams, and phases of the projection light beams. The signal processor 106 may read weighting factors corresponding to the number N of actually used projection light beams, intensities of the projection light beams, and phases of the projection light beams from among the various weighting factors Ak and Bk stored in the memory.
In operation (S5), the signal processor 106 obtains a first average image V by multiplying the N sub-images one-to-one matching the N reflection light beams by first weighting factors Ak and averaging the multiplication results. Likewise, in operation (S6), the signal processor 106 obtains a second average image U by multiplying the N sub-images by second weighting factors Bk and averaging the multiplication results. In operation (S7), the signal processor 106 calculates depth information, which is a distance from the 3D image acquisition apparatus 100 to the subject 200, from an arctangent value of a ratio (V/U) of the first average image V to the second average image U. According to the current embodiment, even if the number N of sub-images increases, since only multiplication and addition operations to obtain the first average image V and the second average image U increase proportionally, an increase in a computation amount is very small. Thus, very accurate depth information from which irregular noise is removed may be obtained with only a relatively small computation amount.
Although the embodiment using N different projection light beams has been described in
The signal processor 106 for calculating depth information from which irregular noise is removed by performing the above-described operations may be implemented by an exclusive IC or software installed in a general computer device, such as a Personal Computer (PC), as described above. When the signal processor 106 is implemented by software, the signal processor 106 may be stored in a separate portable storage medium in a computer-executable format.
Exemplary embodiments of a 3D image acquisition apparatus and a method of calculating depth information in the 3D image acquisition apparatus have been described and shown in the accompanying drawings. However, it should be understood that the exemplary embodiments described therein should be considered in a descriptive sense only and not for purposes of limitation. Descriptions of features or aspects within each exemplary embodiment should typically be considered as available for other similar features or aspects in other exemplary embodiments.
Number | Date | Country | Kind |
---|---|---|---|
10-2011-0109431 | Oct 2011 | KR | national |
Number | Name | Date | Kind |
---|---|---|---|
3682553 | Kapany | Aug 1972 | A |
4935616 | Scott | Jun 1990 | A |
5081530 | Medina | Jan 1992 | A |
5694203 | Ogawa | Dec 1997 | A |
6057909 | Yahav et al. | May 2000 | A |
6088086 | Muguira et al. | Jul 2000 | A |
6091175 | Kinsinger | Jul 2000 | A |
6091905 | Yahav et al. | Jul 2000 | A |
6100517 | Yahav et al. | Aug 2000 | A |
6118946 | Ray et al. | Sep 2000 | A |
6288776 | Cahill et al. | Sep 2001 | B1 |
6323942 | Bamji | Nov 2001 | B1 |
6331911 | Manassen et al. | Dec 2001 | B1 |
6349174 | Ray et al. | Feb 2002 | B1 |
6456793 | Ray et al. | Sep 2002 | B1 |
6794628 | Yahav et al. | Sep 2004 | B2 |
6822681 | Aoki | Nov 2004 | B1 |
6856355 | Ray et al. | Feb 2005 | B1 |
7016519 | Nakamura et al. | Mar 2006 | B1 |
7060957 | Lange et al. | Jun 2006 | B2 |
7095487 | Gonzalez-Banos et al. | Aug 2006 | B2 |
7230685 | Suzuki et al. | Jun 2007 | B2 |
7995191 | Sandusky | Aug 2011 | B1 |
8289606 | Park et al. | Oct 2012 | B2 |
8432599 | Cho et al. | Apr 2013 | B2 |
8436370 | Park et al. | May 2013 | B2 |
8492683 | Challita et al. | Jul 2013 | B2 |
8581166 | Cho et al. | Nov 2013 | B2 |
8619354 | Park et al. | Dec 2013 | B2 |
8711463 | Han et al. | Apr 2014 | B2 |
8902411 | Park et al. | Dec 2014 | B2 |
8953238 | Kim et al. | Feb 2015 | B2 |
9123164 | Park et al. | Sep 2015 | B2 |
20060192938 | Kawahito | Aug 2006 | A1 |
20080231832 | Sawachi | Sep 2008 | A1 |
20090059201 | Willner et al. | Mar 2009 | A1 |
20100177372 | Park et al. | Jul 2010 | A1 |
20100182671 | Park | Jul 2010 | A1 |
20100321755 | Cho et al. | Dec 2010 | A1 |
20110058153 | Van Nieuwenhove et al. | Mar 2011 | A1 |
20110063437 | Watanabe et al. | Mar 2011 | A1 |
20110176709 | Park et al. | Jul 2011 | A1 |
20120069176 | Park et al. | Mar 2012 | A1 |
20120162380 | Cho et al. | Jun 2012 | A1 |
20120300038 | You et al. | Nov 2012 | A1 |
Number | Date | Country |
---|---|---|
1194056 | Sep 1998 | CN |
2000-121339 | Apr 2000 | JP |
2008-241259 | Oct 2008 | JP |
2010-071976 | Apr 2010 | JP |
2010-96568 | Apr 2010 | JP |
2010-520707 | Jun 2010 | JP |
10-2011-0051391 | May 2011 | KR |
10-2011-0085785 | Jul 2011 | KR |
10-2012-0069406 | Jun 2012 | KR |
2011020921 | Feb 2011 | WO |
Entry |
---|
Communication dated Feb. 8, 2013, issued by the European Patent Office in counterpart European Patent Application No. 12183111.9. |
Communication dated Sep. 28, 2015, issued by the State Intellectual Property Office of P.R. China in counterpart Chinese Application No. 201210315255.8. |
Miyagawa et al, “CCD-Based Range-Finding Sensor”, IEEE Transactions on Electron Devices, vol. 44, No. 10, Oct. 1997, pp. 1648-1652 (5 pages total). |
Communication from the Japanese Patent Office dated Mar. 29, 2016 in a counterpart Japanese application No. 2012-233225. |
Number | Date | Country | |
---|---|---|---|
20130101176 A1 | Apr 2013 | US |