Information
-
Trademark
-
76162726
-
International Classifications
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
-
Filing Date
November 09, 2000
24 years ago
-
Transaction Date
October 24, 2004
20 years ago
-
Status Date
February 28, 2003
21 years ago
-
Published for Opposition Date
June 04, 2002
22 years ago
-
Location Date
May 29, 2003
21 years ago
-
Status Code
606
-
Current Location
FILE REPOSITORY (FRANCONIA)
Employee Name
ALI, STEPHANIE MARIE
-
Attorney Docket Number
09712-136001
Attorney Name
John A Mizhir
Law Office Assigned Location Code
L30
-
Owners
Mark Drawing Code
1000
Mark Identification
ENABLING THE PETA ERA
Case File Statements
- GS0091: MICRO-OPTICAL COMPONENTS, NAMELY, LENSES, BALL LENSES, LENS ARRAYS, MIRRORS, PRISMS, BEAM SPLITTERS, FIBER OPTIC ARRAYS, COLLIMATORS, COLLIMATOR ARRAYS FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; MICRO-BALL LENSES AND MICRO-LENSES FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS; MICRO-OPTICAL ASSEMBLIES, AND FIBER OPTIC ASSEMBLIES FOR USE IN OPTICAL NETWORKS; MICRO-OPTICAL MODULES FOR FIBER OPTIC NETWORKS AND SYSTEMS, MICRO-OPTIC INTERFEROMETERS FOR USE IN THE MEASUREMENT OF DEVIATION OF SURFACE SHAPE; DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; ATMOSPHERIC INSENSITIVE DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; RETICLE CRITICAL DIMENSION MEASURING EQUIPMENT PROVIDING NON-CONTAMINATED HANDS-OFF RETICLE MEASUREMENT AND INSPECTION; IN-PROCESS SILICON WAFER SURFACE TOPOGRAPHY MEASURING EQUIPMENT FOR USE IN PRECISION MEASUREMENT OF SILICON WAFER TOPOGRAPHY; OPTICAL DATA STORAGE HEADS AND DRIVES; SURFACE METROLOGY EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE HEADS AND SLIDERS; AND SURFACE EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE DISKS
Case File Event Statements
-
5/24/2003 - 21 years ago
10 - ABANDONMENT - NO USE STATEMENT FILED
Type: ABN6
-
8/27/2002 - 22 years ago
9 - NOA MAILED - SOU REQUIRED FROM APPLICANT
Type: NOAM
-
6/4/2002 - 22 years ago
8 - PUBLISHED FOR OPPOSITION
Type: PUBO
-
5/15/2002 - 22 years ago
7 - NOTICE OF PUBLICATION
Type: NPUB
-
3/5/2002 - 22 years ago
6 - APPROVED FOR PUB - PRINCIPAL REGISTER
Type: CNSA
-
9/17/2001 - 23 years ago
5 - CORRESPONDENCE RECEIVED IN LAW OFFICE
Type: CRFA
-
9/17/2001 - 23 years ago
4 - CORRESPONDENCE RECEIVED IN LAW OFFICE
Type: CRFA
-
3/15/2001 - 23 years ago
3 - NON-FINAL ACTION MAILED
Type: CNRT
-
3/12/2001 - 23 years ago
2 - ASSIGNED TO EXAMINER
Type: DOCK
-
3/8/2001 - 23 years ago
1 - ASSIGNED TO EXAMINER
Type: DOCK