Information
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Trademark
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76391052
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International Classifications
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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Filing Date
April 02, 2002
24 years ago
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Transaction Date
July 22, 2011
14 years ago
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Status Date
August 12, 2003
22 years ago
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Published for Opposition Date
November 19, 2002
23 years ago
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Location Date
October 07, 2003
22 years ago
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Status Code
606
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Current Location
FILE REPOSITORY (FRANCONIA)
Employee Name
FINK, GINA M
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Law Office Assigned Location Code
L30
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Owners
Mark Drawing Code
1000
Mark Identification
NANOOCS
Case File Statements
- GS0091: Overlay optical metrology systems comprised of measurement optics, wafer handling mechanisms and system control hardware and software for measuring the difference between two nearly coincident patterns on a sample, such as a semiconductor wafer, which patterns are formed by a process such as photolithography, and which patterns are overlaid, one on top of the other and the overlay difference or error may be fed back to the exposure system that created the patterns so that this difference may be corrected on future exposures
Case File Event Statements
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10/1/2003 - 22 years ago
9 - ABANDONMENT - NO USE STATEMENT FILED
Type: ABN6
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2/11/2003 - 23 years ago
8 - NOA MAILED - SOU REQUIRED FROM APPLICANT
Type: NOAM
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11/19/2002 - 23 years ago
7 - PUBLISHED FOR OPPOSITION
Type: PUBO
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10/30/2002 - 23 years ago
6 - NOTICE OF PUBLICATION
Type: NPUB
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9/16/2002 - 23 years ago
5 - APPROVED FOR PUB - PRINCIPAL REGISTER
Type: CNSA
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8/26/2002 - 23 years ago
4 - CORRESPONDENCE RECEIVED IN LAW OFFICE
Type: CRFA
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8/26/2002 - 23 years ago
3 - PAPER RECEIVED
Type: MAIL
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8/8/2002 - 23 years ago
2 - NON-FINAL ACTION MAILED
Type: CNRT
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7/25/2002 - 23 years ago
1 - ASSIGNED TO EXAMINER
Type: DOCK