TREA

78161397 - OPENSTAR

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Information

  • Trademark
  • 78161397
  • Serial Number
    78161397
  • Registration Number
    2888848
  • Filing Date
    September 06, 2002
    22 years ago
  • Registration Date
    September 28, 2004
    20 years ago
  • Transaction Date
    October 21, 2011
    13 years ago
  • Status Date
    April 29, 2011
    13 years ago
  • Published for Opposition Date
    March 09, 2004
    21 years ago
  • Location Date
    January 26, 2005
    20 years ago
  • Status Code
    710
  • Current Location
    POST REGISTRATION
    Employee Name
    MARTIN, EUGENIA K
  • Attorney Docket Number
    228025US-195
    Attorney Name
    Robin S. Bren
    Law Office Assigned Location Code
    M50
  • Owners
Information
Mark Drawing Code
1000
Mark Identification
OPENSTAR
Case File Statements
  • B00001: In the statement, Column 2, line 4, "Multi Meters" should be deleted, and, "MULTIMETERS" should be inserted, and, In the statement, Column 2, line 9, "Reflect Meters" should be deleted, and, "REFLECTMETERS" should be inserted.
  • GS0071: Semiconductor manufacturing machines and systems; starters for motors and engines; AC motors and DC motors not including those for land vehicles; AC generators, DC generators, Dynamo brushes
  • GS0091: Measuring or testing machines and instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of temperature and multifunctional equipment and apparatus for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof, especially, Multi-channel Digital Recorder, namely, temperature indicators incorporating voltmeter; electronic and magnetic measuring and testing instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, namely, current, voltage, impedance, frequency in the field of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuits device, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof, namely, digital [ multi meters ] *multimeters* equipped with DC voltage/Current Generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain [ reflect meters ] *reflectmeters*, frequency counters in the nature of meters and testers for measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, pulse pattern generators, error detectors, protocol analyzers, digital spectrum analyzers, Bluetooth testers, namely, radio communication testers for use in the analyzing and testing of radio communications comprised of primarily mainframe consisting of display and optical units, connecting cables, emitters, detectors, transceiver modules, wave-form distortion analyzers, ratio meters, wave-noise figure meters, electronic instruments for testing bit error rates, and laser diode test systems, namely, meters and testers for use in the analyzing and testing of laser beam comprised of primarily mainframe consisting of display and optical units, light source for probe signal, and connecting cables, emitters, detectors, wave-form distortion analyzers, ratio meters, wave-noise figure meters, and electronic instruments for testing bit error rates; electronic machines and apparatus equipped with test handler for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices in the field of manufacturing or testing the foregoing, especially, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Imagesensor Test System, E-beam Test System; computer software for testing, measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof used in connection with applied electronic machines and apparatus, namely, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Imagesensor Test System, E-beam Test System; computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for testing, measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof; pre-recorded video discs and video tapes featuring information in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof; electronic publications and downloadable publications in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof
  • GS0371: Installation, electrical wiring services of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for use in testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and other construction; repair and maintenance of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; repair and maintenance of semiconductor manufacturing machines and systems; repair and maintenance of telecommunication machines and apparatus
  • GS0421: Technical consultation in the fields of installation of electrical works of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for use in testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and other construction; computer software design and maintenance for software for use with testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof in the fields of manufacturing and testing the foregoing; technical consultation in the field of computers and telecommunications relating to performance and operation of computers and other machines that require high levels of personal knowledge, skill or experience of the operators to meet the required accuracy in operating them for use in manufacturing and testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof; testing and research on measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; rental and leasing services for semiconductor manufacturing machines and systems; rental and leasing services for measuring or testing machines and systems; rental and leasing services for measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; rental and leasing services for computers, including computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for use in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electric components and electronic assemblies composed thereof; preparation of computer software operating manuals for others in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof
  • PM0000: OPEN STAR
Case File Event Statements
  • 4/29/2011 - 13 years ago
    22 - CANCELLED SEC. 8 (6-YR) Type: C8..
  • 10/28/2009 - 15 years ago
    21 - AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP Type: ASGN
  • 10/21/2009 - 15 years ago
    20 - AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP Type: ASGN
  • 12/7/2004 - 20 years ago
    19 - CERTIFICATE OF CORRECTION ISSUED Type: COC.
  • 10/21/2004 - 20 years ago
    18 - PAPER RECEIVED Type: MAIL
  • 9/28/2004 - 20 years ago
    17 - REGISTERED-PRINCIPAL REGISTER Type: R.PR
  • 7/29/2004 - 20 years ago
    16 - Sec. 1(B) CLAIM DELETED Type: 1.BD
  • 7/29/2004 - 20 years ago
    15 - NOTICE OF ALLOWANCE CANCELLED Type: IUCN
  • 7/29/2004 - 20 years ago
    14 - PAPER RECEIVED Type: MAIL
  • 6/1/2004 - 20 years ago
    13 - NOA MAILED - SOU REQUIRED FROM APPLICANT Type: NOAM
  • 3/9/2004 - 21 years ago
    12 - PUBLISHED FOR OPPOSITION Type: PUBO
  • 2/18/2004 - 21 years ago
    11 - NOTICE OF PUBLICATION Type: NPUB
  • 12/31/2003 - 21 years ago
    10 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA
  • 12/2/2003 - 21 years ago
    9 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 12/2/2003 - 21 years ago
    8 - PAPER RECEIVED Type: MAIL
  • 10/6/2003 - 21 years ago
    7 - LETTER OF SUSPENSION MAILED Type: CNSL
  • 8/25/2003 - 21 years ago
    6 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 9/15/2003 - 21 years ago
    5 - CASE FILE IN TICRS Type: CFIT
  • 8/25/2003 - 21 years ago
    4 - PAPER RECEIVED Type: MAIL
  • 2/24/2003 - 22 years ago
    3 - NON-FINAL ACTION E-MAILED Type: GNRT
  • 2/24/2003 - 22 years ago
    2 - ASSIGNED TO EXAMINER Type: DOCK
  • 11/29/2002 - 22 years ago
    1 - PAPER RECEIVED Type: MAIL