TREA

78161406 - EXTED

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Information

  • Trademark
  • 78161406
  • Serial Number
    78161406
  • Registration Number
    3058640
  • Filing Date
    September 06, 2002
    23 years ago
  • Registration Date
    February 14, 2006
    20 years ago
  • Transaction Date
    November 06, 2012
    13 years ago
  • Status Date
    September 28, 2012
    13 years ago
  • Published for Opposition Date
    July 12, 2005
    20 years ago
  • Location Date
    May 11, 2006
    20 years ago
  • Status Code
    710
  • Current Location
    POST REGISTRATION
    Employee Name
    VERHOSEK, WILLIAM T
  • Attorney Docket Number
    228023US35
    Attorney Name
    Roberta S. Bren
    Law Office Assigned Location Code
    M50
  • Owners
Information
Mark Drawing Code
1000
Mark Identification
EXTED
Case File Statements
  • B00001: In the statement, Column 4, line 17, "2015" should be deleted, and, 2013 should be inserted.
  • GS0091: Measuring or testing machines and instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of temperature and multifunctional equipment and apparatus for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof, especially, Multi-channel Digital Recorder, namely, temperature indicators incorporating voltmeter; electronic and magnetic measuring and testing instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, namely, current, voltage, impedance, frequency in the field of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof, namely, digital multimeters equipped with DC voltage/Current Generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain reflectmeters, frequency counters in the nature of meters and testers for measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, pulse pattern generators, error detectors, protocol analyzers, digital spectrum analyzers, Bluetooth testers, namely, radio communication testers for use in the analyzing and testing of radio communications comprised of primarily mainframe consisting of display and optical units, and connecting cables, emitters, detectors, and transceiver modules, wave-form distortion analyzers, ratio meters, wave-noise figure meters, electronic instruments for testing bit error rates, and laser diode test systems, namely, meters and testers for use in the analyzing and testing of laser beam comprised of primarily mainframe consisting of display and optical units, light source for probe signal, and connecting cables, emitters, detectors, wave-form distortion analyzers, ratio meters, wave-noise figure meters, and electronic instruments for testing bit error rates; electronic machines and apparatus equipped with test handler for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, and other semiconductor devices in the field of manufacturing or testing the foregoing, especially, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, mixed-signal test system, LCD (Liquid Crystal Display Driver) test system, image sensor test system, E-beam Test System; computer software for testing, measuring, analyzing, and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and electronic components and assemblies composed thereof used in connection with applied electronic machines and apparatus, namely, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, image sensor Test System, E-beam Test System; computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for testing, measuring, analyzing, and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and electronic components and assemblies composed thereof, pre-recorded video discs and video tapes featuring information in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and electronic components and assemblies composed thereof
Case File Event Statements
  • 9/28/2012 - 13 years ago
    32 - CANCELLED SEC. 8 (6-YR) Type: C8..
  • 5/11/2006 - 20 years ago
    31 - CERTIFICATE OF CORRECTION ISSUED Type: COC.
  • 4/28/2006 - 20 years ago
    30 - ASSIGNED TO PARALEGAL Type: PLGL
  • 2/28/2006 - 20 years ago
    29 - PAPER RECEIVED Type: MAIL
  • 2/14/2006 - 20 years ago
    28 - REGISTERED-PRINCIPAL REGISTER Type: R.PR
  • 12/30/2005 - 20 years ago
    27 - 1(B) BASIS DELETED; PROCEED TO REGISTRATION Type: DP1B
  • 11/28/2005 - 20 years ago
    26 - NOTICE OF ALLOWANCE CANCELLED Type: IUCN
  • 11/28/2005 - 20 years ago
    25 - TEAS DELETE 1(B) BASIS RECEIVED Type: D1BR
  • 10/13/2005 - 20 years ago
    24 - NOTICE OF ALLOWANCE CORRECTION ENTERED Type: ICNA
  • 10/12/2005 - 20 years ago
    23 - FAX RECEIVED Type: FAXX
  • 10/4/2005 - 20 years ago
    22 - NOA MAILED - SOU REQUIRED FROM APPLICANT Type: NOAM
  • 7/12/2005 - 20 years ago
    21 - PUBLISHED FOR OPPOSITION Type: PUBO
  • 6/22/2005 - 20 years ago
    20 - NOTICE OF PUBLICATION Type: NPUB
  • 4/13/2005 - 21 years ago
    19 - LAW OFFICE PUBLICATION REVIEW COMPLETED Type: PREV
  • 4/13/2005 - 21 years ago
    18 - ASSIGNED TO LIE Type: ALIE
  • 4/5/2005 - 21 years ago
    17 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA
  • 3/28/2005 - 21 years ago
    16 - AMENDMENT FROM APPLICANT ENTERED Type: ACEC
  • 2/24/2005 - 21 years ago
    15 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 2/24/2005 - 21 years ago
    14 - PAPER RECEIVED Type: MAIL
  • 8/29/2004 - 21 years ago
    13 - NON-FINAL ACTION E-MAILED Type: GNRT
  • 8/28/2004 - 21 years ago
    12 - AMENDMENT FROM APPLICANT ENTERED Type: ACEC
  • 7/23/2004 - 21 years ago
    11 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 8/27/2004 - 21 years ago
    10 - ASSIGNED TO LIE Type: ALIE
  • 7/23/2004 - 21 years ago
    9 - PAPER RECEIVED Type: MAIL
  • 4/24/2004 - 22 years ago
    8 - INQUIRY TO SUSPENSION E-MAILED Type: GNSI
  • 10/6/2003 - 22 years ago
    7 - LETTER OF SUSPENSION E-MAILED Type: GNSL
  • 8/25/2003 - 22 years ago
    6 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 9/16/2003 - 22 years ago
    5 - CASE FILE IN TICRS Type: CFIT
  • 8/25/2003 - 22 years ago
    4 - PAPER RECEIVED Type: MAIL
  • 2/26/2003 - 23 years ago
    3 - NON-FINAL ACTION E-MAILED Type: GNRT
  • 2/24/2003 - 23 years ago
    2 - ASSIGNED TO EXAMINER Type: DOCK
  • 11/29/2002 - 23 years ago
    1 - PAPER RECEIVED Type: MAIL