78641626 - FEI COMPANY TOOLS FOR NANOTECH

Information

• Trademark
• 78641626

• Source

• Serial Number

  78641626

• Registration Number

  3431150

• International Classifications

  • 7 - Machines and machine tools
  • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
  • 37 - Building construction
  • 41 - Education
  • 42 - Scientific and technological services and research and design relating thereto

• Filing Date

  June 01, 2005
  19 years ago

• Registration Date

  May 20, 2008
  16 years ago

• Transaction Date

  February 03, 2015
  10 years ago

• Status Date

  December 26, 2014
  10 years ago

• Published for Opposition Date

  March 04, 2008
  16 years ago

• Location Date

  May 20, 2008
  16 years ago

• First Use Anywhere Date

  April 01, 2004
  20 years ago

• First Use In Commerce Date

  April 01, 2004
  20 years ago

• Status Code

  710

• Current Location

  PUBLICATION AND ISSUE SECTION

  Employee Name

  EISINGER, REBECCA MILE

• Attorney Docket Number

  27941-23

  Attorney Name

  Jere M. Webb

  Law Office Assigned Location Code

  L20

• Owners

  • FEI Company

Case File Statements

• CC0000: Color is not claimed as a feature of the mark.
• D10000: "COMPANY TOOLS FOR NANOTECH"
• GS0071: Components of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, high brightness, sub-micron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, imaging, and ion beam milling, secondary ion mass spectrometry, focused electron beam columns for electron beam lithography, and electron beam microscopy and analysis, ion beam source emitters, electron beam source emitters; accessories of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, sample preparation equipment that prepares biological samples for examination by microscopes
• GS0091: Focused ion beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; Microscopes, scanning electron microscopes, scanning ion microscopes, atomic-force microscopes, and transmission electron microscopes; Microscopic system navigational software, namely, software that visually enhances the navigational, functional capability of spectroscopic, lithographic, and microscopic components; Application software and operation system software for operation of all the foregoing equipment, namely, software for use in microscopic imaging, milling and analysis; Computer software for manufacturing semi-conductors; Computer software for manufacturing data storage components; and computer software for manufacturing micro-machinery
• GS0371: Repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes; post-warranty repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes
• GS0411: Training in the operation of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes
• GS0421: Scientific analysis and high resolution imaging, namely, scanning electron and focused ion beam microscopy, in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological sciences and manufacture of devices with sub-micron features; Computer software support services, namely, trouble shooting of computer software problems, providing back up for computer software programs; Computer software consultation services; design and updating of computer software; project management relating to computer software; Computer software installation and maintenance; Providing information and advice relating to computer software

Case File Event Statements

• 12/26/2014 - 10 years ago

  37 - CANCELLED SEC. 8 (6-YR) Type: C8..

• 5/20/2008 - 16 years ago

  36 - REGISTERED-PRINCIPAL REGISTER Type: R.PR

• 3/4/2008 - 16 years ago

  35 - PUBLISHED FOR OPPOSITION Type: PUBO

• 2/13/2008 - 16 years ago

  34 - NOTICE OF PUBLICATION Type: NPUB

• 1/31/2008 - 17 years ago

  33 - LAW OFFICE PUBLICATION REVIEW COMPLETED Type: PREV

• 1/11/2008 - 17 years ago

  32 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA

• 1/11/2008 - 17 years ago

  31 - EXAMINER'S AMENDMENT ENTERED Type: XAEC

• 1/11/2008 - 17 years ago

  30 - NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED Type: GNEN

• 1/11/2008 - 17 years ago

  29 - EXAMINERS AMENDMENT E-MAILED Type: GNEA

• 1/11/2008 - 17 years ago

  28 - EXAMINERS AMENDMENT -WRITTEN Type: CNEA

• 1/10/2008 - 17 years ago

  27 - ASSIGNED TO EXAMINER Type: DOCK

• 1/10/2008 - 17 years ago

  26 - PREVIOUS ALLOWANCE COUNT WITHDRAWN Type: ZZZX

• 1/10/2008 - 17 years ago

  25 - ASSIGNED TO EXAMINER Type: DOCK

• 1/7/2008 - 17 years ago

  24 - ASSIGNED TO EXAMINER Type: DOCK

• 8/6/2007 - 17 years ago

  23 - WITHDRAWN FROM PUB - OG REVIEW QUERY Type: PBCR

• 5/23/2007 - 17 years ago

  22 - LAW OFFICE PUBLICATION REVIEW COMPLETED Type: PREV

• 5/20/2007 - 17 years ago

  21 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA

• 5/20/2007 - 17 years ago

  20 - EXAMINER'S AMENDMENT ENTERED Type: XAEC

• 5/20/2007 - 17 years ago

  19 - EXAMINERS AMENDMENT E-MAILED Type: GNEA

• 5/20/2007 - 17 years ago

  18 - EXAMINERS AMENDMENT -WRITTEN Type: CNEA

• 5/16/2007 - 17 years ago

  17 - PREVIOUS ALLOWANCE COUNT WITHDRAWN Type: ZZZX

• 3/26/2007 - 17 years ago

  16 - WITHDRAWN FROM PUB - OG REVIEW QUERY Type: PBCR

• 3/1/2007 - 17 years ago

  15 - LAW OFFICE PUBLICATION REVIEW COMPLETED Type: PREV

• 2/17/2007 - 17 years ago

  14 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA

• 2/16/2007 - 17 years ago

  13 - EXAMINER'S AMENDMENT ENTERED Type: XAEC

• 2/16/2007 - 17 years ago

  12 - ASSIGNED TO LIE Type: ALIE

• 2/15/2007 - 17 years ago

  11 - EXAMINERS AMENDMENT E-MAILED Type: GNEA

• 2/15/2007 - 17 years ago

  10 - EXAMINERS AMENDMENT -WRITTEN Type: CNEA

• 8/15/2006 - 18 years ago

  9 - FINAL REFUSAL E-MAILED Type: GNFR

• 8/15/2006 - 18 years ago

  8 - FINAL REFUSAL WRITTEN Type: CNFR

• 7/27/2006 - 18 years ago

  7 - AMENDMENT FROM APPLICANT ENTERED Type: ACEC

• 7/3/2006 - 18 years ago

  6 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA

• 7/3/2006 - 18 years ago

  5 - PAPER RECEIVED Type: MAIL

• 1/5/2006 - 19 years ago

  4 - NON-FINAL ACTION E-MAILED Type: GNRT

• 1/5/2006 - 19 years ago

  3 - NON-FINAL ACTION WRITTEN Type: CNRT

• 12/21/2005 - 19 years ago

  2 - ASSIGNED TO EXAMINER Type: DOCK

• 6/8/2005 - 19 years ago

  1 - NEW APPLICATION ENTERED IN TRAM Type: NWAP