TREA

79045546 - EVG

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Information

  • Trademark
  • 79045546
  • Serial Number
    79045546
  • Registration Number
    3612566
  • Filing Date
    August 13, 2007
    16 years ago
  • Registration Date
    April 28, 2009
    15 years ago
  • Transaction Date
    June 11, 2020
    3 years ago
  • Status Date
    April 18, 2019
    5 years ago
  • Published for Opposition Date
    February 10, 2009
    15 years ago
  • Location Date
    April 18, 2019
    5 years ago
  • Status Code
    706
  • Current Location
    GENERIC WEB UPDATE
    Employee Name
    FRENCH, CURTIS W
  • Attorney Name
    Patricia A. Walker
    Law Office Assigned Location Code
    M60
  • Owners
Information
Mark Drawing Code
3000
Mark Identification
EVG
Case File Statements
  • CC0000: The color(s) dark grey and yellow is/are claimed as a feature of the mark.
  • DM0000: The mark consists of the color dark grey appearing in the wording "EVG" and in the design in the middle of the ellipse. The color yellow fills in the ellipse around the design element.
  • GS0071: Machines and structural parts therefore, for the production, treatment, transport and processing of electronic components, namely, semiconductors, in the field of microelectronic, medical technology, biotechnology, semiconductor technology and microsystems technology; machines and structural parts therefor, for the production, treatment and processing of semiconductors; machines and structural parts therefore for treatment of surfaces of electronic components, especially wafers
  • GS0091: Scientific apparatus and instruments for microelectronics, biotechnology, microsystem techniques, semiconductor and nanotechnology, namely, exposure systems for 1X lithography applications, namely, mask aligners and contact and proximity printers and devices for joining one or multiple substrates temporarily or permanently, namely, substrate bonding systems comprised of UV-radiation/UV-light source devices, heaters, and pneumatic and hydraulic piston setups and spindles; systems for the application of coatings to work pieces, namely, resist coaters, developer systems for developing lithographically structured layers, namely, resist developers, imprinting systems used to imprint pattern onto surfaces on work pieces, namely, imprint lithography systems comprised of one or more of the following components, alignment stages for substrate to stamp alignment suitable for a single step or step and repeat alignment, means to apply imprinting force, means to cure the imprint resist such as a UV- light source and heaters, measurement apparatus that can detect the relative position of the stamp versus the substrate and provide the input for the alignment procedure; lamination equipment used to coat surfaces with tape like materials; surveying instruments; electric, photographic, optical, measuring, signal, and monitoring devices, namely, precision systems in the semiconductor technology, in microelectronics, in medical equipment techniques, biotechnology, microsystem techniques, and nanotechnology, namely, front to backside alignment accuracy measurement systems comprised of one or more of the following: measurement apparatus that detects a reference pattern on both the front and on the backside of a substrate and stages that allow for moving the substrate so that the measurement apparatus can detect the pattern at the desired location of the substrate, as well as computer hardware that can analyze the data and calculate misalignment values between the pattern on the front and on the backside; infrared microscopes, metrology systems comprised of one or more of the following, infrared light source devices for infrared inspection of the bonding interface, infrared detectors to detect the infrared light passing through the bond interface, ultrasonic transducers and detectors, x-ray transducers and detectors, visible light light-sources and cameras, microscope setups, computer hardware and operating software for data analysis for the inspection of wafer bonding interfaces; overlay accuracy measurement systems comprised of optical detection devices, namely, microscopes and lasers to detect the positions of two patterns in reference to each other, computer hardware for data analysis and collection, as well as mapping; critical dimension metrology systems comprised of optical detection devices, namely, microscopes and lasers to detect the two or more features of a specific pattern on the wafer and allow for calculation of the distance between them, as well as a computer hardware for data analysis, collection and mapping; pressure uniformity metrology apparatus; apparatus for analysis, namely, front to backside alignment accuracy measurement system comprised of one or more of the following: measurement apparatus that detects a reference pattern on both the front and on the backside of a substrate and stages that allow for moving the substrate so that the measurement apparatus can detect the pattern at the desired location of the substrate, as well as computer hardware and software that can analyze the data and calculate misalignment values between the pattern on the front and on the backside; [ semiconductor chips, integrated circuits; ] computer operation programs; [ peripheral equipment for computers; ] data processing units, data processors and computer hardware; computer software related to the analysis of lithography results, software for the analysis of wafer bonding results, aligning software; scientific diagnosis devices in bio-chip format, namely, oligonucleotide-arrays, miniaturized immunologic test-arrays, substance libraries, combinatorial substance libraries on chip surfaces for scientific purposes; [ remote controls for electric systems for remote controlled industrial operational processes, namely, laboratory robots; ] electric control panels for manufacturing facilities for microelectronics, medical equipment techniques, biotechnology, microsystem techniques, and nanotechnology; [ filters and masks for photographic and photolithographic equipment; telescopes; telephones; semiconductors; ] monitoring devices, namely, oscillographs, indicators, surveying instruments; [ data processing coupler; special furniture for laboratories; ] laser for non-medical purposes; [ reading devices for processing electronic data; ] measuring instruments and measuring devices, namely, laser measuring devices; material testing instruments and machines, namely, machines for testing bonding strength in bonded substrates, front to backside alignment accuracy measurement systems comprised of one or more of the following: measurement apparatus that detect a reference pattern on both the front and on the backside of a substrate and stages that allow for moving the substrate so that the measurement apparatus can detect the pattern at the desired location of the substrate, as well as computer hardware and related software that can analyze the data and calculate misalignment values between the pattern on the front and on the backside; infrared microscopes, metrology systems comprised of one or more of the following; infrared light source devices for infrared inspection of the bonding interface, infrared detectors to detect the infrared light passing through the bond interface, ultrasonic transducers and detectors, x-ray transducers and detectors, visible light light-sources and cameras, microscope setups, computer hardware and related software for data analysis for the inspection of wafer bonding interfaces; optical apparatus and instruments, namely, microscopes; photographic apparatus and instruments, namely, cameras; [ video projectors; controlled volume pumps; protective clothing, in particular for clean-rooms; silicon wafers; probes for scientific purposes; spectroscopes; photographic range finders ]
  • GS0101: Medical diagnosis devices in bio-chip format, namely, oligonucleotide-arrays, miniaturized immunologic test-arrays, substance libraries for medical purposes, combinatorial substance libraries on chip surfaces for medical purposes [ ; medical diagnostic devices, namely, micro-titer plates and nano-titer plates; analyzers for medical purposes, namely, machines used to carry out automatic testing of biological samples; bio-array chips for being used as diagnosis means for bio-chemical applications, namely, for tissue and secretory tests, as well as for indication of physiologic parameters or of genetic information, for screening in the pharmaceutical industry for developing drugs, for process monitoring with biotechnological processes; miniaturized sensors for use in gene analysis and diagnosis; medical devices, namely, accessories for bio-chips for filling and manipulating the same by machine as well as manually, namely, chip-holders, chip reader devices, as well as electronic, fluidal, and mechanic control therefor ]
  • GS0421: Engineering services; development of precision systems and devices for the semiconductor technology; development of devices for microsystem techniques, microelectronics, medical techniques, biotechnology and telecommunication for others; consulting in the fields of medical and scientific equipment; research services in the field of microsystem technology and nanotechnology; research services in the field of bio-sensorics and chemical sensorics; technical consulting for third parties concerning handling production plants and process equipment; providing temporary use of non-downloadable software for data processing; designing of computer software for others
  • PM0001: EV GROUP
Case File Event Statements
  • 6/11/2020 - 3 years ago
    54 - NEW REPRESENTATIVE AT IB RECEIVED Type: NREP
  • 2/28/2020 - 4 years ago
    53 - PARTIAL INVALIDATION PROCESSED BY THE IB Type: INNP
  • 1/16/2020 - 4 years ago
    52 - PARTIAL INVALIDATION OF REG EXT PROTECTION SENT TO IB Type: INPS
  • 1/16/2020 - 4 years ago
    51 - INVALIDATION PROCESSED Type: INPC
  • 12/18/2019 - 4 years ago
    50 - PARTIAL INVALIDATION OF REG EXT PROTECTION CREATED Type: INPR
  • 4/18/2019 - 5 years ago
    49 - NOTICE OF ACCEPTANCE OF SEC. 71 - E-MAILED Type: NA71
  • 4/18/2019 - 5 years ago
    48 - REGISTERED-SEC.71 ACCEPTED Type: 71AG
  • 3/28/2019 - 5 years ago
    47 - REGISTERED-SEC.71 FILED Type: 71AF
  • 4/16/2019 - 5 years ago
    46 - CASE ASSIGNED TO POST REGISTRATION PARALEGAL Type: APRE
  • 4/28/2018 - 6 years ago
    45 - COURTESY REMINDER - SEC. 71 (10-YR) E-MAILED Type: REM4
  • 8/31/2017 - 6 years ago
    44 - INTERNATIONAL REGISTRATION RENEWED Type: RNWL
  • 5/16/2014 - 10 years ago
    43 - NOTICE OF ACCEPTANCE OF SEC. 71 & 15 - E-MAILED Type: NA75
  • 5/16/2014 - 10 years ago
    42 - REGISTERED - SEC. 71 ACCEPTED & SEC. 15 ACK. Type: C75A
  • 4/29/2014 - 10 years ago
    41 - REGISTERED - SEC. 71 & SEC. 15 FILED Type: 715F
  • 5/16/2014 - 10 years ago
    40 - CASE ASSIGNED TO POST REGISTRATION PARALEGAL Type: APRE
  • 4/29/2014 - 10 years ago
    39 - TEAS SECTION 71 & 15 RECEIVED Type: ES75
  • 1/12/2013 - 11 years ago
    38 - FINAL DECISION TRANSACTION PROCESSED BY IB Type: FINO
  • 8/7/2009 - 14 years ago
    37 - FINAL DISPOSITION NOTICE SENT TO IB Type: FICS
  • 8/7/2009 - 14 years ago
    36 - FINAL DISPOSITION PROCESSED Type: FIMP
  • 7/28/2009 - 14 years ago
    35 - FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB Type: FICR
  • 6/11/2009 - 14 years ago
    34 - CHANGE OF NAME/ADDRESS REC'D FROM IB Type: ADCH
  • 5/7/2009 - 15 years ago
    33 - NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB Type: OPNX
  • 4/28/2009 - 15 years ago
    32 - REGISTERED-PRINCIPAL REGISTER Type: R.PR
  • 4/23/2009 - 15 years ago
    31 - NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB Type: OPNS
  • 4/23/2009 - 15 years ago
    30 - NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB Type: OPNR
  • 2/10/2009 - 15 years ago
    29 - PUBLISHED FOR OPPOSITION Type: PUBO
  • 1/21/2009 - 15 years ago
    28 - NOTICE OF PUBLICATION Type: NPUB
  • 1/6/2009 - 15 years ago
    27 - LAW OFFICE PUBLICATION REVIEW COMPLETED Type: PREV
  • 1/5/2009 - 15 years ago
    26 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA
  • 12/16/2008 - 15 years ago
    25 - TEAS/EMAIL CORRESPONDENCE ENTERED Type: TEME
  • 12/15/2008 - 15 years ago
    24 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 12/15/2008 - 15 years ago
    23 - TEAS RESPONSE TO OFFICE ACTION RECEIVED Type: TROA
  • 7/30/2008 - 15 years ago
    22 - NOTIFICATION OF NON-FINAL ACTION E-MAILED Type: GNRN
  • 7/30/2008 - 15 years ago
    21 - NON-FINAL ACTION E-MAILED Type: GNRT
  • 7/30/2008 - 15 years ago
    20 - NON-FINAL ACTION WRITTEN Type: CNRT
  • 6/26/2008 - 15 years ago
    19 - TEAS/EMAIL CORRESPONDENCE ENTERED Type: TEME
  • 6/25/2008 - 15 years ago
    18 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 6/26/2008 - 15 years ago
    17 - ASSIGNED TO LIE Type: ALIE
  • 6/25/2008 - 15 years ago
    16 - TEAS RESPONSE TO OFFICE ACTION RECEIVED Type: TROA
  • 4/29/2008 - 16 years ago
    15 - NOTIFICATION OF NON-FINAL ACTION E-MAILED Type: GNRN
  • 4/29/2008 - 16 years ago
    14 - NON-FINAL ACTION E-MAILED Type: GNRT
  • 4/29/2008 - 16 years ago
    13 - NON-FINAL ACTION WRITTEN Type: CNRT
  • 3/28/2008 - 16 years ago
    12 - TEAS CHANGE OF CORRESPONDENCE RECEIVED Type: TCCA
  • 3/29/2008 - 16 years ago
    11 - TEAS/EMAIL CORRESPONDENCE ENTERED Type: TEME
  • 3/28/2008 - 16 years ago
    10 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 3/28/2008 - 16 years ago
    9 - TEAS RESPONSE TO OFFICE ACTION RECEIVED Type: TROA
  • 12/21/2007 - 16 years ago
    8 - REFUSAL PROCESSED BY IB Type: RFNT
  • 12/4/2007 - 16 years ago
    7 - NON-FINAL ACTION MAILED - REFUSAL SENT TO IB Type: RFCS
  • 12/4/2007 - 16 years ago
    6 - REFUSAL PROCESSED BY MPU Type: RFRR
  • 12/4/2007 - 16 years ago
    5 - NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW Type: RFCR
  • 12/3/2007 - 16 years ago
    4 - NON-FINAL ACTION WRITTEN Type: CNRT
  • 11/26/2007 - 16 years ago
    3 - ASSIGNED TO EXAMINER Type: DOCK
  • 11/26/2007 - 16 years ago
    2 - NEW APPLICATION ENTERED IN TRAM Type: NWAP
  • 11/22/2007 - 16 years ago
    1 - SN ASSIGNED FOR SECT 66A APPL FROM IB Type: REPR