Information
-
Trademark
-
86292516
-
International Classifications
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
- 37 - Building construction
- 41 - Education
-
Filing Date
May 27, 2014
10 years ago
-
Transaction Date
June 18, 2019
5 years ago
-
Status Date
September 26, 2016
8 years ago
-
Published for Opposition Date
June 30, 2015
9 years ago
-
Location Date
August 25, 2015
9 years ago
-
Status Code
606
-
Current Location
INTENT TO USE SECTION
Employee Name
SCHIMPF, TIMOTHY O
-
Attorney Docket Number
0079660-0000
Attorney Name
Holly M. Ford
Law Office Assigned Location Code
M40
-
Owners
Case File Statements
- CC0000: Color is not claimed as a feature of the mark.
- DM0000: The mark consists of a shaded rectangle with a circle in the middle with a partially shaded triangular shaped beam piercing the rectangle from the top right hand corner of the rectangle through the center of the rectangle and circle to just before the bottom left hand corner of the rectangle.
- GS0091: Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely, electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron-beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for non-medical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments, namely, diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, microscope software that enhances the navigational and functional capability of microscopic, analytic, lithographic and spectroscopic components separately and in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and in integrated systems, namely, operating software for use in microscopic imaging, milling, deposition and analysis; image processing software
- GS0371: Installation, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; installation, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes in the nature of liquid-metal ion sources, and plasma sources; installation, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and instruments for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; installation, maintenance and repair of electron-beam lithography apparatus; installation, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; installation, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; installation, maintenance and repair of lasers for non-medical purposes; installation, maintenance and repair of optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; installation, maintenance and repair of diaphragms for scientific apparatus; installation, maintenance and repair of measuring instruments, namely, micrometer gauges; installation, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, and cathodoluminiscence detectors; installation, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges
- GS0411: Arranging and conducting conferences, colloquiums, congresses, courses, seminars, symposiums, and workshops all for training purposes in the field of microscopy and nanotechnology, specifically in the subject areas of scanning and transmission electron microscopy, ion beam microscopy, ion beam processing techniques, and complex methods combining the forgoing microscopy with Raman microscopy, atomic force microscopy and lasers, and holographic microscopy
Case File Event Statements
-
9/26/2016 - 8 years ago
30 - ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED
Type: MAB6
-
9/26/2016 - 8 years ago
29 - ABANDONMENT - NO USE STATEMENT FILED
Type: ABN6
-
2/25/2016 - 9 years ago
28 - NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED
Type: EXRA
-
2/23/2016 - 9 years ago
27 - EXTENSION 1 GRANTED
Type: EX1G
-
2/23/2016 - 9 years ago
26 - EXTENSION 1 FILED
Type: EXT1
-
2/23/2016 - 9 years ago
25 - TEAS EXTENSION RECEIVED
Type: EEXT
-
8/25/2015 - 9 years ago
24 - NOA E-MAILED - SOU REQUIRED FROM APPLICANT
Type: NOAM
-
6/30/2015 - 9 years ago
23 - OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Type: NPUB
-
6/30/2015 - 9 years ago
22 - PUBLISHED FOR OPPOSITION
Type: PUBO
-
6/10/2015 - 9 years ago
21 - NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
Type: NONP
-
4/28/2015 - 9 years ago
20 - WITHDRAWN FROM PUB - OG REVIEW QUERY
Type: PBCR
-
4/10/2015 - 9 years ago
19 - LAW OFFICE PUBLICATION REVIEW COMPLETED
Type: PREV
-
4/9/2015 - 9 years ago
18 - APPROVED FOR PUB - PRINCIPAL REGISTER
Type: CNSA
-
4/9/2015 - 9 years ago
17 - EXAMINER'S AMENDMENT ENTERED
Type: XAEC
-
4/9/2015 - 9 years ago
16 - NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
Type: GNEN
-
4/9/2015 - 9 years ago
15 - EXAMINERS AMENDMENT E-MAILED
Type: GNEA
-
4/9/2015 - 9 years ago
14 - EXAMINERS AMENDMENT -WRITTEN
Type: CNEA
-
3/27/2015 - 9 years ago
13 - TEAS/EMAIL CORRESPONDENCE ENTERED
Type: TEME
-
3/27/2015 - 9 years ago
12 - CORRESPONDENCE RECEIVED IN LAW OFFICE
Type: CRFA
-
3/20/2015 - 9 years ago
11 - ASSIGNED TO LIE
Type: ALIE
-
3/12/2015 - 9 years ago
10 - TEAS RESPONSE TO OFFICE ACTION RECEIVED
Type: TROA
-
9/12/2014 - 10 years ago
9 - NOTIFICATION OF NON-FINAL ACTION E-MAILED
Type: GNRN
-
9/12/2014 - 10 years ago
8 - NON-FINAL ACTION E-MAILED
Type: GNRT
-
9/12/2014 - 10 years ago
7 - NON-FINAL ACTION WRITTEN
Type: CNRT
-
9/9/2014 - 10 years ago
6 - ASSIGNED TO EXAMINER
Type: DOCK
-
8/13/2014 - 10 years ago
5 - TEAS AMENDMENT ENTERED BEFORE ATTORNEY ASSIGNED
Type: TAEA
-
8/13/2014 - 10 years ago
4 - TEAS VOLUNTARY AMENDMENT RECEIVED
Type: PARI
-
6/10/2014 - 10 years ago
3 - NOTICE OF DESIGN SEARCH CODE E-MAILED
Type: MDSC
-
6/9/2014 - 10 years ago
2 - NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM
Type: NWOS
-
5/30/2014 - 10 years ago
1 - NEW APPLICATION ENTERED IN TRAM
Type: NWAP