Printing devices are widely used and may include fluid ejection elements enabling formation of text or images on a print medium. For instance, a piezoelectric printing device may employ membranes that deform when electric energy is applied. The membrane deformation causes ejection of fluid.
As printing technology improves, the ability to provide improved features and higher resolution becomes increasingly possible. Consumers may want, among other things, higher levels of image resolution, realistic colors, and an increased printing rate (e.g., pages per minute) from a printhead. Consumers may, for example, include commercial printing owners and/or business staff, among others. However, as the level of resolution and/or the printing rate increases so too do an amount of oscillations and/or a magnitude of the oscillations experienced by the printhead following ejection of fluid (e.g., a drop of ink).
As described herein, oscillations refer to pressure fluctuations within a firing chamber of the printhead following ejection of a drop. The oscillations can result in an increase and/or a decrease in a pressure in the chamber. For example, such oscillations may increase or decrease pressure in amounts as large as 10 atmospheres. As illustrated in
Some previous approaches attempting to provide reliable and/or efficient control may have relied upon allowing oscillations to dissipate with time, passive dampening (e.g., printhead cavities that increase viscous losses or compliantly absorb pressure waves to reduce oscillations), and/or employing active dampening (e.g., a non-ejection waveform emitted in an effort counter oscillations). Each of these approaches has limitations such as decreasing the maximum printing rate and/or increasing the energy needed to operate the fluid ejection devices. Some other previous approaches may have included calibration, such as, calibration on individual nozzles to account for differences in fluid volume emitted between various nozzles of a printhead. Calibration improves uniformity of output but does not reduce the effect of oscillations. In contrast to the present disclosure, such previous approaches, alone or in combination, do not account for the oscillations and/or do not account for the oscillations experienced over a range of printing frequencies, as described herein.
In contrast, examples of the present disclosure include methods, systems, drive circuits, and computer-readable and executable instructions for accounting for oscillations with drop ejection waveforms. Accounting for oscillations refers to identifying a previous ejection waveform having a first plurality of parameters including a time interval from a final pulse of the previous ejection waveform and/or determining (e.g., varying) a second plurality of parameters based on the identified first plurality of parameters. The second plurality of parameters can define the current ejection waveform that accounts for oscillations caused by the previous ejection waveform. In various examples, the second plurality of parameters can be applied to an ejection nozzle (e.g., to a piezoelectric actuator of an ejection nozzle), as described herein, to cause the ejection nozzle to generate a desired drop (e.g., having a desired drop volume (DV) and/or a desired drop speed (DS)). As described herein, an ejection waveform refers to a waveform that can be applied to an ejection nozzle to cause the ejection nozzle to generate a fluid drop (e.g., a desired ink drop).
The second plurality of parameters can be varied (e.g., incrementally varied) to experimentally determine a particular combination of the second plurality of parameters that can effectively account for oscillations caused by a particular combination of the first plurality of parameters. In some examples, the second plurality of parameters can be varied to modulate DV to the desired DV while maintaining DS (e.g., an undesired DS). Conversely, in some examples, DS can be modulated while maintaining DV or both DS and DV can be simultaneously modulated. Accounting for oscillations (e.g., printhead oscillations) with drop ejection waveforms can promote reliable and/or efficient control of the printheads across a wide range of printing frequencies. As described herein, printing frequency refers to a measure of a speed at which printing can occur (i.e., a rate at which a number of pixel locations on a given media pass by the printhead).
In various examples, a previous ejection waveform can be identified. A previous ejection waveform refers to an ejection waveform that was initiated (e.g., pulses of the previous ejection waveform were emitted) prior to a given time and/or time period. In various examples, the previous ejection waveform can have a first plurality of parameters, for example, a time interval from a final pulse of the previous ejection waveform, a drive voltage parameter, a pulse width parameter, among others as described herein.
In various examples, a second plurality of parameters based on the first plurality of parameters can be determined. In various examples, the second plurality of parameters can define a current ejection waveform that can account for oscillations caused by the previous ejection waveform. A current ejection waveform refers to a waveform that is initiated (e.g., pulses of the current ejection waveform are generated and/or applied) at a current time and/or during a current time period. For example, a current ejection waveform can include multiple ejection pulses occurring over a period of time. In various examples, the current ejection waveform can be applied to cause an ejection nozzle of the printhead to generate a desired fluid drop. A desired fluid drop refers to a fluid drop having a desired DV and/or a desired DS.
In the following detailed description of the present disclosure, reference is made to the accompanying drawings that form a part hereof, and in which is shown by way of illustration how examples of the present disclosure can be practiced. These examples are described in sufficient detail to enable those of ordinary skill in the art to practice the examples of this disclosure, and it is to be understood that other examples can be utilized and that process, electrical, and/or structural changes can be made without departing from the scope of the present disclosure.
As will be appreciated, elements shown in the various examples herein can be added, exchanged, and/or eliminated so as to provide a number of additional examples of the present disclosure. In addition, the proportion and the relative scale of the elements provided in the figures are intended to illustrate the examples of the present disclosure, and should not be taken in a limiting sense. As used herein, “a number of” an element and/or feature can refer to one or more of such elements and/or features. In addition, “for example” and similar phrasing is intended to mean, “by way of example and not by way of limitation”.
Examples of the present disclosure, therefore, will be described in reference to a piezoelectric ejector structure. Examples, however, are not limited to such structures, but may be implemented in other structures such as electrostatic inkjet structures, among others.
Referring to
Referring to
During contraction, the pressure in the firing chamber 216 increases and fluid is expelled from the firing chamber through the fluid ejection orifice 218. During expansion, the pressure in the firing chamber 216 decreases and fluid refills the firing chamber through the inlet supply channel 220. The oscillations can be formed, for example, as a result of expansion and/or contraction of the flexible membrane 224 for the ejector structures (e.g., the ejector structure 214).
The ejection orifices (e.g., the ejection orifice 218) can be formed in an exposed face 230 of a cap 226. The cap 226, which is can be referred to as an “orifice plate” or a “nozzle plate,” can be formed in a silicon or metal sheet, although other suitable materials or configurations may be used. The flexible membrane 224 may be formed, for example, on the underlying structure as a comparatively thin oxide layer. As an alternative to the “face shooter” shown in
With continued reference to
The piezoelectric plates 234 can be coupled to the flexible membrane 224 through a flexible backing 260, a rigid elongate post 262, and a rigid pusher plate 264. For clarity, piezoelectric plates 234 and the rigid elongate post 262 are shown in the plan view of
A single rigid elongate post 262 interposed between the flexible backing 260 and pusher plate 264 extends laterally across the chamber 216 at the free ends 246 of cantilever piezoelectric plates 234 such that the rigid elongate post 262 transmits the movement of piezoelectric plates 234 toward the firing chamber 216 to a rigid pusher plate 264 along a line extending laterally across the firing chamber 216. For the cantilever plates 234, the greatest displacement occurs at the free ends 246. The single rigid elongate post 262 can be positioned along the free ends 246 and therefore may be used to receive and transmit maximum displacement from both of the piezoelectric plates 234. The rigid pusher plate 264 transmits the movement and distributes the lifting force of the rigid elongate post 262 across the flexible membrane 224 in a rigid, or near rigid, piston-like manner that can help increase the displacement of the piezoelectric plates 234 into the firing chamber 216 (e.g., the piezoelectric plates 234 vibrate “up” and “down” to alternately contract and expand a volume of the firing chamber 216).
The present disclosure is not limited to the number and/or orientation of the elements depicted in
The printing device 310 can be coupled to a memory storing a lookup table. That is, in some examples, the lookup table can be in communication with the printhead, for example, via a network (e.g., a local area network, etc.) and/or the lookup table can be disposed on the printhead 310.
The lookup table refers to a set of data for a plurality of waveforms (e.g., previous ejection waveforms and/or current ejection waveforms). For instance, the set of data including a first plurality of parameters of a previous ejection waveform and a corresponding set of data including a second plurality of parameters of current ejection waveforms, among others. That is, such data can correspond to the first plurality of parameters and/or the second plurality of parameters can promote accounting for oscillations in printheads caused by the previous ejection waveform. For instance, in some examples, a second plurality of parameters defining a current ejection waveform that accounts for oscillations caused by a previous ejection waveform can be determined from the lookup table (e.g., from the lookup table data). Such a determined second plurality of parameters (e.g., a current ejection waveform defined by the second plurality of parameters) can be applied to cause an ejection nozzle of the printhead to generate a desired fluid drop.
The corresponding set of data including a second plurality of parameters of a current ejection waveforms can be determined (e.g., experimentally determined) to include a second plurality of parameters that can define a current ejection waveform that accounts for oscillations caused by the previous ejection waveform. For example, the data can be a function (e.g., a response function) derived (e.g., graphically determined from the experimentally measured impact on jetted drops). More specifically, a correlation for each of the second plurality of parameters can be determined (e.g., a correlation between a voltage parameter and drop speed). Such determination of a correlation can result in a scaling factor (e.g., 0.85 volts per meter/second) being applied (e.g., to a current ejection waveform and/or a parameter of the second plurality of parameters) to generate a current ejection waveform that can be applied to an ejection nozzle of the printhead to generate a desired drop. That is, such application can combine and/or superpose pressure oscillations associated with the current ejection waveform with residual oscillations (e.g., oscillations caused by the previous ejection waveform).
That is, such a determined correlation can be used to increase and/or decrease a given parameter of the second plurality of parameters, for example, as described herein with respect to
Given sufficient time (e.g., a time interval from the final pulse of the previous ejection waveform having a sufficiently long duration) an amount of adjustment (e.g., an adjustment to account for the oscillations) may effectively approach zero (e.g., dissipate). However, for the purposes of the present disclosure, such dissipation can be accounted for by use of a time interval (e.g., a time interval from an end of the final pulse), as described herein, to promote varying a second plurality of parameters to account for the oscillations, rather than letting oscillations dissipate after a given amount of time (e.g., 35 microseconds).
In some examples, the first plurality of parameters and/or the second plurality of parameters can be superposed on trimming compensation (e.g., trimming compensation can, for example, correspond to an amount (e.g., a difference) of the DS or DV from a mean of the DS or DV measured for a plurality of ejection nozzles of the printhead and/or with reference to a performance standard. The amount of such trimming compensation can be measured and/or stored in memory, for example, at a production factory. In some examples, the first plurality of parameters and/or the second plurality of parameters can be superposed on such trimming compensation. For example, a trimming compensation can provide a voltage parameter compensation of an addition of 0.03 volts for a given ejection nozzle and a parameter of the second plurality of parameters can provide a voltage parameter of 10.05 volts to be applied to the given ejection nozzle. Superposition can include summing the trimming compensation and the parameter of the second plurality of parameters to provide a total compensated parameter for the given nozzle. However, the disclosure is not so limited. That is, superposition can include a suitable approach for superposing trimming compensation on the first plurality of parameters and/or the second plurality of parameters. Such superposition can promote a similar (e.g., equal) response for each nozzle of the plurality of nozzles (e.g., the plurality of nozzles 318).
The first plurality of parameters of a previous ejection waveform and the corresponding second plurality of parameters can, for example, include a number of pulses of a current ejection waveform, a duration (e.g., pulse width) of each of the number of pulses, a voltage of each of the number of pulses, a time interval between each of the number of pulses, a duration of pauses within rises and/or falls in the voltage of each of the number of pulses, slew rates (e.g., slew rates based on the duration of pauses within the rises and/or the falls) for each of the number of pulses, and/or a time interval from the final pulse of the number of pulses (e.g., a time interval to a current time from the final pulse of the number of pulses), among others. A waveform having a given set of corresponding parameters (e.g., a second plurality of parameters) can be determined, as described herein, and applied to cause an ejection nozzle of the printhead to generate a desired drop by (e.g., by accounting for oscillations caused by the previous ejection waveform in the current ejection waveform).
Alternatively or in addition, the set of data (e.g., lookup table data) can promote approximations of the first plurality of parameters and/or the corresponding second plurality of parameters. For a given previous ejection waveform having a first plurality of parameters, an approximated value of the first plurality of parameters may be provided. For instance, a suitable number of the first plurality of parameters can be approximated. For example, a previous ejection waveform having a voltage parameter of a given identified value (e.g., 20.047 volts) can be approximated to a value of the first plurality of parameters in the set of data (e.g., 20.050 volts) having a corresponding parameter included in the second plurality of parameters (e.g., 19.750) to generate a desired drop. That is, the desired drop can have a voltage parameter of approximately 20.000. Such approximation ensures that for a previous waveform having a first plurality of parameters a corresponding value (e.g., corresponding to an approximation of a parameters of the first plurality of parameters) can readily be identified. However, the disclosure is not so limited. For instance, parameters of the first plurality of parameters and/or parameters of the second plurality of parameters can have a given fineness (e.g., round-off) that can depend on an associated memory size, a necessary level of precision, a desired parameter gradation, a number of steps available for the control parameters, and/or by availability of experimental data. That is, a suitable number of the first plurality of parameters and/or the corresponding second plurality of parameters can be approximated in a suitable manner to promote accounting for oscillations with drop ejection waveforms.
Advantageously, compensating for variations in DV and/or DS, for example caused by the oscillations, as described herein, can be efficiently done using a lookup table. The lookup table contains data (e.g., experimental data) for a given data (e.g., a first plurality of parameters) and corresponding data for a second plurality of parameters that can facilitate accounting for oscillations with drop ejection waveforms. That is, in some examples, the lookup table can store data associated with the previous number of pulses associated with a given ejection nozzle. In some examples, the lookup table can be coupled to the plurality of ejection nozzles to supply each ejection nozzle of the plurality of ejection nozzles with data from the lookup table. In addition, the second plurality of parameters in the lookup table can include a printing stop time and/or start time parameters, pulse width parameters, voltage parameters, pulse amplitude parameters, a rise time parameter, a push time parameter, a pull time parameter, a fill pause parameter, a delay (e.g., time delay) from a center dot of the current ejection waveform, and/or a time for a given pulse of the current ejection waveform, among others.
In various examples, a current ejection waveform based on the second plurality of parameters can be generated to account for oscillations caused by the previous ejection waveform. That is, such a current ejection waveform can be applied to cause an ejection nozzle of the printhead to generate a desired fluid drop. As described herein in, to “cause” can include executing instructions stored in memory to directly cause an ejection nozzle to generate a desired fluid drop and/or to communicate data that is processed by another device to cause the ejection nozzle to generate a desired fluid drop (e.g., generate the desired fluid drop using the applied current ejection waveform).
Such application can be provided by the drive circuits 367. The example drive circuits as discussed with respect to
The AWG 472 refers to hardware, software, and/or logic to generate an electrical waveform (e.g., the current ejection waveform). Such a waveform can include a number of pulses (e.g., in a range from one pulse to four pulses). Such pulses may be simple (e.g., square shape pulses) or complex (e.g., non-square shaped pulses). The AWG 472 can generate an arbitrarily defined waveform, for example, a waveform stored in the lookup table 475, as an output. The waveform can be defined as a series of “waypoints” specific voltage targets (e.g., specific voltage targets included in the second plurality of parameters stored in the lookup table) occurring at specific times along the waveform and/or the AWG can either jump to those levels or interpolate between those levels. In some examples, the drive circuit can include a digital to analogue converter (DAC)(not shown), for example, provided at an input to AMP 473 to facilitate generation of a given waveform (e.g., a current waveform) via an ejection nozzle coupled to the drive circuit.
In some examples, the lookup table 475 includes a scaling voltage that can be applied to at least one of the plurality of ejection nozzles by multiplying a scaling voltage to the AWG waveform. Hence, in some examples, the voltage scale 471 can be coupled to the AWG in order to scale a waveform therefrom. In some examples, the lookup table 475 includes a scaling voltage that can be applied to at least one of the plurality of ejection nozzles, for example, by utilizing the voltage scale 471 to multiply a scaling voltage to a waveform generated by the AWG 472.
Data representing such a scaling voltage can, in some examples, be stored in the voltage scale memory 470. The voltage scale memory refers to logic and/or hardware to store values (e.g., such as those contained in the lookup table 475) for the ejection nozzle 418. That is, the voltage scale memory can receive the values (e.g., provided by the second plurality of parameters) via a register bus, among other components suitable to provide the stored values. In some examples, the voltage scale memory storage 470 can store pixel data (e.g., pixel data that can be received over time in correspondence with the lookup table 475). The voltage scale memory 470 stores at least a current pixel data for a current pixel in accordance with which the ejection nozzle 418 to eject fluid. The voltage scale memory 470 may be implemented as a combination of logic and/or hardware memory. Such an ability to store values and pixel data can promote the voltage scale memory to account for a wide range of print frequency. Print frequency refers to a frequency (e.g., a rate) at which the pixels pass by a given position of the printhead (e.g., a region of a print medium passes by the given position of the printhead). Scaling of the second plurality of parameters (e.g., a voltage parameter) can promote generation of a desired drop for a given frequency.
As used herein, “logic” is an alternative or additional processing resource to execute the actions and/or functions, etc., described herein, which includes hardware (e.g., various forms of transistor logic, application specific integrated circuits (ASICs), etc.), as opposed to computer executable instructions (e.g., software, firmware, etc.) stored in memory and executable by a processing resource.
The amplifier 473 refers to a suitable device to provide amplification of a signal (e.g., a waveform generated by the AWG), for example, a current ejection waveform. For example, the amplifier 473 can provide amplification based upon the stored data stored at the voltage scale memory 470.
The protective ground (PGND) 474 refers to a suitable device to maintain a printhead (e.g., printhead 310 as illustrated in
The memory resource 684 can be in communication with a processing resource 682. A memory resource 684, as used herein, can include a number of memory components capable of storing instructions that can be executed by processing resource 682. Such memory resource 684 can be a non-transitory CRM. Memory resource 684 may be integrated in a single device or distributed across devices. Further, memory resource 684 may be fully or partially integrated in the same device as processing resource 682 or it may be separate but accessible to that device and processing resource 682. The system 680 may be implemented printhead, as described herein.
The processing resource 682 can be in communication with a memory resource 684 storing a set of CRI executable by the processing resource 682, as described herein. The CRI can also be stored in remote memory managed by a server and represent an installation package that can be downloaded, installed, and executed.
Processing resource 682 can execute CRI that can be stored on an internal or external memory resource 684. The processing resource 682 can execute CRI to perform various functions, including the functions described herein. For example, the processing resource 682 can execute CRI to account for oscillations with drop ejection waveforms.
The CRI can include a number of modules 685, 686, 687, 688. The number of modules 685, 686, 687, 688, can include CRI that when executed by the processing resource 682 can perform a number of functions. The number of modules 685, 686, 687, 688 can be sub-modules of other modules. For example, the identify module 685 and the store module 686 can be sub-modules and/or contained within the same computing device. In another example, the number of modules 685, 686, 687, 688 can include individual modules at separate and distinct locations (e.g., CRM, etc.).
In various examples, the system can include an identifying module 685. An identifying module 685 can include CRI that when executed by the processing resource 682 can provide a number of identifying functions. In various examples, the identify module 685 can identify a previous ejection waveform having a first plurality of parameters including a time interval from a final pulse of a plurality of pulses of the previous ejection waveform, as described herein. For instance, the instructions can, in some examples, include instructions to identify a total number of the plurality of pulses (e.g., two pulses) of the previous ejection waveform and to identify an amplitude associated with each of the plurality of pulses. The total number of the plurality of pulses can, for example, be in a range of from one pulse to four pulses. Pulses can be determined to be of the same waveform when, for example, by identifying pulses (e.g., fluid ejections) ejected prior to a dampening time elapsing (e.g., 35 microseconds).
In some examples, the plurality of pulses can be a result of a plurality of actuator movements of an actuator (e.g., piezoelectric actuator 228 as illustrated in
A determining module 686 can include CRI that when executed by the processing resource 682 can perform a number of determining functions. The determine module 686 can include instructions to determine a second plurality of parameters based on the first plurality of parameters, where the second plurality of parameters define a current ejection waveform that accounts for oscillations caused by the previous ejection waveform. Examples of such instructions include JavaScript® instructions, among others suitable to determine the second plurality of parameters based on the first plurality of parameters The instructions can, for example, be stored in an internal or external non-transitory CRM coupled to the printing device (e.g., the printing device 310 as illustrated in
In some examples, the system can include a store module 687. A storing module 687 can include CRI that when executed by the processing resource 682 can provide a number of storing functions. The store module 687 can store the first plurality of parameters and/or a corresponding second plurality of parameters in a lookup table, as described herein, in response to identification thereof. For example, a first plurality of parameters can be identified by the identify module 685 can be stored by the store module 687 in a lookup table. For example, the lookup table can be stored in a CRM. In some examples, the CRM can be included in a cloud system (e.g., a public and/or private cloud system) that can include a number of cloud resources (e.g., cloud servers).
In some examples, the store module 687 can store a plurality of current ejection waveforms and/or a first plurality of parameters for each of the plurality of current ejection waveforms. As described herein, the plurality of current ejection waveforms and/or a plurality of first parameters for each of the plurality of current ejection waveforms can be identified experimentally. Such experiments can include wet (e.g., fluid filled printhead) and/or dry (e.g., a printhead being void of fluid) experiments, among other experiments. Wet experiments can include observation of the speed and/or dimensions of fluid drops in flight, for example. Wet experiments can, for example, include observation of a location and/or a size of dots (e.g., dots associated with the fluid drops) on a given medium. Dry experiments can, for example, include observation of a mechanical motion, for instance, a mechanical motion induced in an ejection nozzle due to mechanical cross-talk, among other mechanical motions.
A user (e.g., an employee) can, for example, conduct such experimental tests. Such tests can identify plurality of current ejection waveforms and/or a second plurality of parameters by experimentally identifying those that account for (e.g., effectively account for) oscillations to generate a desired drop by identification of a previous ejection waveform (e.g., a first plurality of parameters of the previous ejection waveform). That is, sequentially testing of a plurality of previous ejection waveforms each having varying values of the first plurality of parameters can facilitate production of the lookup table (e.g., lookup table data), as described herein. The desired DV and DS may or may not be substantially the same as a previous drop. In some examples, the desired DV and DS of the desired fluid drop can be equal (e.g., substantially equal) to a DV and/or a DS of a fluid drop associated with the previous ejection waveform (e.g., a drop generated as a result of the previous ejection waveform). In some examples, the desired DV and DS of the desired fluid drop can be different than a DV and a DS of a fluid drop associated with the previous ejection waveform.
An applying module 688 can include CRI that when executed by the processing resource 682 can perform a number of applying functions. An applying module 688 applies the current ejection waveform to cause an ejection nozzle of the printhead to generate a desired fluid drop, the desired fluid drop having a desired drop volume and desired drop speed. In various examples, the desired drop can include a desired DV or a desired DS. For example, a desired fluid drop can be generated by applying the current ejection waveform (e.g., a second plurality of parameters of the current ejection waveform) to an actuator of an ejection nozzle of the printhead to generate the desired fluid drop.
The memory resource 684 can be integral, or communicatively coupled, to a computing device, in a wired and/or a wireless manner. For example, the memory resource 684 can be an internal memory, a portable memory, a portable disk, or a memory associated with another computing resource (e.g., enabling CRIs to be transferred and/or executed across a network such as the Internet).
The memory resource 684 can be in communication with the processing resource 682 via a communication path 683. The communication path 683 can be local or remote to a computing device) associated with the processing resource 682. Examples of a local communication path 683 can include an electronic bus internal to a computing device where the memory resource 684 is one of volatile, non-volatile, fixed, and/or removable storage medium in communication with the processing resource 682 via the electronic bus.
The communication path 683 can be such that the memory resource 684 is remote from the processing resource (e.g., 682), such as in a network connection between the memory resource 684 and the processing resource (e.g., 682). That is, the communication path 683 can be a network connection. Examples of such a network connection can include a local area network (LAN), wide area network (WAN), personal area network (PAN), and the Internet, among others. In such examples, the memory resource 684 can be associated with a first computing device and the processing resource 682 can be associated with a second computing device (e.g., a Java® server). For example, a processing resource 682 can be in communication with a memory resource 684, where the memory resource 684 includes a set of instructions and where the processing resource 682 is designed to carry out the set of instructions.
The processing resource 682 coupled to the memory resource 684 can execute CRI to perform various functions. CRI can be executed to identify a previous ejection waveform having a first plurality of parameters that can a time interval from a final pulse of a plurality of pulses of the previous ejection waveform and an amplitude of the each of the plurality of pulses. CRI can be executed to determine a second plurality of parameters based on the first plurality of parameters, wherein the second plurality of parameters define a current ejection waveform that accounts for oscillations caused by the previous ejection waveform. CRI can be executed to apply the current ejection waveform to cause an ejection nozzle of the printhead to generate a desired fluid drop, the desired fluid drop having a desired drop volume and desired drop speed.
In some example, the method can include identifying the previous ejection waveform having a single pulse (e.g., a single pulse as the total number of pulses). However, the disclosure is not so limited. That is, the total number of the plurality of pulses can, for example, be in a range of from one pulse to four pulses, among others.
As shown at 792, in various examples, the method can include determining a second plurality of parameters based on the first plurality of parameters, where the second plurality of parameters define a current ejection waveform that accounts for oscillations caused by the previous ejection waveform. That is, determining a second plurality of parameters can include executing instructions stored in memory to determine a second plurality of parameters based on the first plurality of parameters, where the second plurality of parameters define a current ejection waveform that accounts for oscillations caused by the previous ejection waveform. In some examples, accounting for the oscillations caused by the previous ejection waveform can include accounting for oscillations that would otherwise result in a deviation from the desired drop, the desired drop. The desired drop can include a desired drop speed and/or a desired drop volume
As shown at 794, in various examples, the method can include to apply the current ejection waveform to cause an ejection nozzle (e.g., of the plurality of ejection nozzles) of the printhead to generate a desired fluid drop, the desired fluid drop having a desired drop volume and desired drop speed. Applying the current ejection waveform can include executing instructions stored in memory to apply the current ejection waveform to cause an ejection nozzle of the printhead to generate a desired fluid drop. The current ejection waveform can, for example, include a second plurality of parameters that can account for oscillations caused by the previous ejection waveform. In some examples, applying the current ejection waveform to the ejection nozzle of the printhead to generate a desired fluid drop can include modulating a voltage parameter of the second plurality of parameters relative to the time interval. For example, the voltage parameter can be increased or decreased with respect to a print frequency, as described herein. In some examples, applying the current ejection waveform to the ejection nozzle of the printhead to generate a desired fluid drop can include modulating a number of the second plurality of parameters to modulate a shape of the current ejection waveform.
In some examples, accounting for the oscillations can include accounting for the oscillations caused by cross-talk from a different ejection nozzle of the printhead. In this case, cross-talk refers to oscillations experienced in response to the jetting of a different ejection nozzle of the printhead that is actuated with a known ejection waveform within a pre-determined window of time that can include a time interval starting before and extending to after the affected jet (e.g., the ejection nozzle of the printhead the current ejection waveform is applied to) is fired. The cross-talk can be mechanical (e.g., pressure transmitted through a structure of the printhead) and/or fluidic (e.g., pressure transmitted through the fluid in the printhead). The window represents the period in which the jetting chamber may be vulnerable to mechanical or fluidic disturbances from its neighbors. Accounting for oscillations caused by cross-talk can include selecting a second plurality of parameters that account for such oscillations. Such a second plurality of parameters (e.g., accounting for cross-talk) can be applied, for example globally and/or individually to ejection nozzle(s), as described herein, to reduce and/or eliminate oscillations from cross-talk.
As described herein, accounting for such oscillations can be advantageous.
In some examples, accounting for such oscillations can include accounting for previous adjustments made to a previous waveform (e.g., a previous waveform modulated to account for oscillations). Such adjustment can be indentified, for example, similar to the identification functions described with respect to the identifying module 685, described herein. In some examples, such previous adjustments can impact a subsequent time interval. Accounting for previous adjustments can include accounting for such an impact on the time interval (e.g., a time interval associated with a most recent ejection waveform applied to an ejection nozzle). For example, previous adjustments to a waveform (e.g., a modulated waveform) can result in a comparatively shortened and/or lengthened a time interval with respect to a time interval from an unmodulated previous waveform. Examples of accounting for such an impact on the time interval can include introducing time advances or time delays associated with a current waveform (e.g., adjusting a time parameter of the second plurality of parameters of the current waveform) to account for the impact of the time interval from previous waveforms. Such accounting for an impact on the time interval can, in some examples, promote accounting for oscillations with drop ejection waveforms and/or promote achieving a desired printing frequency.
As illustrated in
Examples results of such modulation are illustrated and described with respect to
In contrast,
The specification examples provide a description of the applications and use of the system and method of the present disclosure. Since many examples can be made without departing from the spirit and scope of the system and method of the present disclosure, this specification sets forth some of the many possible example configurations and implementations.
Filing Document | Filing Date | Country | Kind |
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PCT/US2013/024103 | 1/31/2013 | WO | 00 |