In many electronic systems, manufacturers build protective technology (PT) features into the various hardware and software components of the electronic system product. The purpose of including PT in the product design is to protect information and proprietary features in component hardware, e.g., specialized integrated circuits, microprocessor software instructions, etc., that are considered highly-valuable intellectual property, and critical to continued success in the marketplace. In the case of highly-sensitive equipments, i.e., security monitoring and defense systems, any potential of tampering with and access to critical information must be mitigated to reduce the probability of a successful tampering attack.
In most instances, access to proprietary system components involves removing or circumventing, one or more layers of anti-tamper (AT) protection. Successful penetration or circumvention of one or more AT protection layers increases the risk of access to internal electronics by the perpetrator for the purpose of reverse engineering the design. Often, when an AT protection layer is disturbed, the reverse engineering attempt is hampered by a combination of AT features, such as: self-destroying components, encrypted software, and mechanical security keys. Security measures include multiple layers of security features, such as: tamper-proof enclosures and limited functionality if the system is disturbed without authorization.
However, additional physical barriers or partitions have the potential to damage and undermine regular operation of a system under even slightly abnormal operating conditions. With the addition of protective layering, especially tamper-proof enclosures, it is possible to create operating conditions that lead to a decrease in component life and overall performance. For example, the operating temperature inside the enclosure increases when additional physical barriers are installed. The potential for PT failure increases, especially when one or more AT mechanisms become overly reliant upon the actual electronics systems intended for protection. A current state of PT is limited by purely passive, i.e., unresponsive, methods of AT protection.
Embodiments of the present invention address problems with integrating protective technology with content-sensitive electronics and will be understood by reading and studying the following specification. Particularly, in one embodiment, a method for limiting access to content-sensitive electronics is provided. The method involves monitoring an active barrier partition surrounding the content-sensitive electronics independent of normal operating activity and generating a tamper signal upon separation of an outer layer from an active sensing layer that comprise the active barrier partition. The method further involves responding to an unauthorized attempt to tamper with the active barrier partition.
In the following detailed description, reference is made to the accompanying drawings that form a part hereof, and in which is shown by way of illustration specific illustrative embodiments in which the invention may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention, and it is to be understood that other embodiments may be utilized and that logical, mechanical, and electrical changes may be made without departing from the spirit and scope of the present invention. The following detailed description is, therefore, not to be taken in a limiting sense.
Embodiments of the present invention address problems with integrating protective technology with content-sensitive electronics and will be understood by reading and studying the following specification. Particularly, in one embodiment, a method for limiting access to content-sensitive electronics is provided. The method involves monitoring an active barrier partition surrounding the content-sensitive electronics independent of normal operating activity and generating a tamper signal upon separation of an outer layer from an active sensing layer that comprise the active barrier partition. The method further involves responding to an unauthorized attempt to tamper with the active barrier partition.
Although examples of embodiments in this specification are described in terms of integrating protective technology circuit partitions for an electronic chassis, embodiments of the present invention are not limited to protective technology circuit partitions for an electronic chassis. Embodiments of the present invention are applicable to any protective technology activity that requires active barrier partitioning of content-sensitive equipment with one or more separate barrier layers independent of normal operating activity. Alternate embodiments of the present invention utilize protective technology layers integrated as one or more partitions in a system. The one or more partitions comprise physical and active features that fill one or more free volumes within at least one series of content-sensitive electronic assemblies contained in the system. Active partitioning materials will act as barriers to diminish accessibility to proprietary hardware and software features of the system independent of normal operation. The active partitioning materials are capable of dissipating heat energy away from the content-sensitive electronic assemblies. The active partitioning materials also provide additional physical support for any co-existing protective technologies within the system.
In this example embodiment, partitions 104A to 104N occupy free space between an outer perimeter of electronics chassis 102 and the series of PWBAs 106A to 106N. Partitions 104A to 104N are embedded within the outer walls of chassis 102. In another example embodiment, partitions 104A to 104N occupy free space around an outer perimeter of each individual PWBA 106A to 106N. Partitions 104A to 104N surround each individual PWBA 106A to 106N. In a third example embodiment, both example embodiments described above are combined, i.e., partitions 104A to 104N are embedded within the outer walls of chassis 102 and surround each individual PWBA 106A to 106N. Once partitions 104A to 104N are integrated within chassis 102, partitions 104A to 104N are considered an independent active barrier. The independent active barrier limits access to the content-sensitive components residing on PWBAs 106A to 106N. The composition and operation of partitions 104A to 104N is further described in detail below with respect to
Examples of the metallic alloy include beryllium, beryllium-copper, aluminum alloy, tantalum alloy, tungsten alloy, galvanized aluminum and stainless steel, nickel-plated copper, and other similar metallic materials. The metallic alloy is either bulk, e.g., extruded, cast, or sheet-rolled, or sintered, i.e., bonded by heating without melting, depending on the metallic alloy material selected. Examples of the monolithic material include silicon nitrate, aluminum nitride, and graphite, i.e., isostatically pressed, cured sol-gel, or laminated resin, depending on the material used. The monolithic material is filled with refractory or thermally conductive particles. Examples of the polymer-based resin include polyimide-based, epoxy-based, tetrafunctional-based, phenolic-based, carborane-siloxane-based, silioxane-based, and other highly cross-linked thermo-set resins. The highly cross-linked thermo-set resins are filled with fibrous or particle materials to enhance strength and dimensional stability.
Primary outer layer 202 and secondary outer layer 206 encase active sensor layer 204 and sensor array 203. Sensor array 203 is embedded within active sensing layer 204. During assembly of panel 200, an adhesive material is applied to a side of primary outer layer 202 that integrates, i.e., embeds, active sensing layer 204 with sensor array 203. Other integration methods are possible. In an example embodiment, sensor array 203 comprises at least one array of piezoelectric sensor elements. Sensor array 203 generates a voltage value in response to applied mechanical stress. In some embodiments, sensor array 203 is operated by one or more internal power sources. In other embodiments, sensor array 203 is un-powered, and the voltage value is filtered and amplified to initiate an ignition sequence for an actuator. The voltage value is sufficient to begin a pyrotechnic heating reaction of a thermal battery (not shown). The operation of sensor array 203 in conjunction with an active anti-tamper barrier provided by partitions 104A to 104N is described in further detail below with respect to
Chassis 300 further includes filler material 312 indicated by a clouded area. Filler material 312 consists of one or more of a blown foam, glass wool, rubber silicone, cyclic butyl terephthalate, Neoprene, an acrylic bead-filled bladder, and the like. Filler material 312 is capable of high flow prior to cure, and eventually surrounds each of partitions 104A to 104N. Structural support provided by filler material 312 is beneficial for any co-existing PT mechanisms present within chassis 300. In the example embodiment shown, filler material 312 is allowed to expand and fill any open volumes within chassis 300. Filler material 312 dissipates heat energy away from PWBAs 106A to 106N. Further, filler material 312 is an additional AT barrier within chassis 300. For example, filler material 312 prevents acoustic imaging of content-sensitive components on PWBAs 106A to 106N already encapsulated by partitions 104A to 104N. Additionally, filler material 312 insulates the content-sensitive components from electrical shock, and further hinders removal of partitions 104A to 104N.
In operation, the components of chassis 300 discussed above are assembled as a functioning electronics chassis. When a sufficient unauthorized attempt is made to remove partition 104A, primary outer layer 202 and secondary outer layer 206 start to withdraw together. Inner layer 204 remains coupled to mounting bracket 304. As primary outer layer 202 and secondary outer layer 206 are withdrawn, piezosensors 310A to 310M generate a voltage in response to a sufficient increase in tensile stress, i.e., mechanical strain. Piezosensors 310A to 310M activate a built-in charging circuit to convert an electric charge to a tamper signal. The at least one response path 306 transfers the tamper signal to the at least one response device 308. The tamper signal is sufficient enough to activate the at least one response device 308 and begin the one or more protective measures discussed earlier. In the example embodiment described, inner layer 204 remains attached to chassis wall 302, subjected to a sufficient shearing force as outer layers 202 and 206 are withdrawn. Response device 308 activates only when piezosensors 310A to 310M determine at least one unauthorized removal of outer layers 202 and 206 is being attempted. Even under severe operating conditions, any premature activation of response device 308 will not occur unless a physical removal of at least partition 104A is attempted. Piezosensors 310A to 310M do not impede normal operation of the electronic components that comprise chassis 300.
At step 404, method 400 is continually monitoring if an attempt is made to remove one or more partitions from chassis wall 302, specifically one or more of partitions 104A to 104N. Once a sufficient attempt is made, a tamper signal is issued at step 406. Upon receipt of the tamper signal, one or more responses are initiated at step 408 to destroy and/or further conceal proprietary information residing on or within at least one PWBA 106A to 106N. The one or more responses function as discussed earlier with respect to
The description of the present invention has been presented for purposes of illustration and description, and is not intended to be exhaustive or limited to the invention in the form disclosed. Variations and modifications may occur, which fall within the scope of the present invention, as set forth in the following claims.